1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with N.O.R. 5962-R124-93. 93-05-05 M. A. FRYE B Changes in accordance with N.O.R. 5962-R014-94. 93-11-08 M. A. FRYE C Drawing updated to reflect current requirements. Redrawn. - ro 01-01-16 R. MONNIN D Five year review requi
2、rement. - ro 07-06-12 R. HEBER THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E.
3、 BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-02-03 MICROCIRCUIT, LINEAR, HIGH SPEED, OUTPUT CLAMPING, OPERATIONAL AMPLIFIER, MONOLITHIC SILI
4、CON AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-89974 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E445-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89974 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS,
5、OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as show
6、n in the following example: 5962-89974 01 P A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 CLC501 High speed output clamping opera
7、tional amplifier 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as speci
8、fied in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VS) 7 V dc Output current (IOUT) 70 mA Common mode input voltage (VCM) . VSPower dissipation (PD): Case P 1.2 W Case 2 . 1.2 W Junction temperature (TJ) . +175C Storage temperature range . -65C to +150C Lead temperature
9、 (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA) 100C/W 1.4 Recommended operating conditions. Supply voltage (VS) 5 V dc Gain range (AV) +7 to +50 and -1 to -50 Ambient operating temperature range (TA) . -55C t
10、o +125C Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89974 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government spe
11、cification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-P
12、RF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircu
13、it Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order
14、 of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Ite
15、m requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufac
16、turer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may mak
17、e modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option
18、 is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal conn
19、ections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The el
20、ectrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufactu
21、rers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devi
22、ces built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without lice
23、nse from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89974 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgrou
24、ps Device type Limits 2/ Unit Min Max Open loop characteristics +IINRS= 50 1 01 25 A Input bias current (noninverting) 2 35 3 37 -IINRS= 50 1 01 30 A Input bias current (inverting) 2 40 3 46 Input offset voltage VIORS= 50 1 01 3.0 mV 2 5.0 3 4.6 TCRS= 50 3/ 2 01 100 nA/C Average +input bias current
25、drift (+IIN) 3 150 TCRS= 50 3/ 2 01 100 nA/C Average -input bias current drift (-IIN) 3 200 Average offset voltage drift TC(VIO) RS= 50 3/ 1,2,3 01 20 V/C Supply current ISNo load 1,2 01 24 mA 3 25 PSRR +VS= +4.5 V to +5.0 V, 1,2 01 60 dB Power supply rejection ratio -VS= -4.5 V to -5.0 V 3 55 CMRR
26、VCM= 1 V 4,5 01 60 dB Common mode 4/ rejection ratio 6 55 Output current IOUTRL= 100 3/ 1,2 01 50 mA 3 30 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89974 DEFENSE SUPPLY CE
27、NTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Open loop characteristics continue
28、d. Output impedance at dc ROUTRL= 100 3/ 1,2,3 01 0.3 Input resistance +RIN3/ 1,2 01 100 k 3 50 Input capacitance CINSee 4.3.1c, TA= +25C 3/ 4 01 7 pF Output voltage swing VOUTRL= 100 4/ 4,5,6 01 2.4 V Clamping characteristics Clamp accuracy VOC1,2,3 01 0.2 V ICL 3/ 1,2 01 50 A Input bias current on
29、 VHIGHand VLOW3 100 Input offset voltage drift after recovery CDR 3/ 1,2,3 01 200 V Overshoot in clamp OVC 3/ 4 01 15 % Clamping range CMC At VHIGHor VLOW3/ 4,5 01 3.3 V 6 3.0 Overload recovery from clamp TSO 3/ 9,10,11 01 3 ns Frequency domain characteristics Small signal bandwidth SSBW -3 dB bandw
30、idth, 4 01 60 MHz VOUT15 MHz, 4 01 0.2 dB VOUT1 MHz 3/ 4,6 01 -156 dBm 5 -155 (1 Hz) Integrated noise INV 1 MHz to 100 MHz 3/ 4,6 01 35 V 5 40 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWIN
31、G SIZE A 5962-89974 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min M
32、ax Time domain characteristics Slew rate 3/ SR CL 10 pF, measured at 4,6 01 800 V/s 1 V with 3 V step 5 700 Rise and fall times 3/ tR2 V step, CL 10 pF 9,11 01 5.8 ns 10 7.8 tF5 V step, CL 10 pF 9,11 6.5 10 8 Settling time 3/ tS2 V step at 0.05% of the 9,11 01 18 ns fixed value, CL 10 pF 10 24 Overs
33、hoot 3/ OS 2 V step, CL 10 pF 9,10,11 01 5 % 1/ Unless otherwise specified, RL= 100 , VS= 5 V dc, VHIGH= +3 V, VLOW= -3 V, AV= +32, feedback resistance (RF) = 1.5 k, and gain setting resistance (RG) = 48.3 . 2/ The limiting terms, “min” (minimum) and “max” (maximum) shall be considered to apply to m
34、agnitudes only. Negative current shall be defined as conventional current flow out of a device terminal. 3/ If not tested, shall be guaranteed to the limits specified in table I herein. 4/ Group A testing only. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manuf
35、acturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the
36、requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that a
37、ffects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for R
38、esaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89974 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outlines P 2 Terminal number Terminal symbol 1 NC NC 2
39、 -INPUT NC 3 +INPUT NC 4 -VSNC 5 VLOW(see note 1) NC 6 OUTPUT -INPUT 7 +VSNC 8 VHIGH(see note 1) +INPUT 9 - -VS10 - NC 11 - NC 12 - NC 13 - VLOW(see note 1) 14 - OUTPUT 15 - NC 16 - +VS17 - NC 18 - VHIGH(see note 1) 19 - NC 20 - NC NC = No connection NOTES: 1. VHIGH= high clamping voltage level and
40、VLOW= low clamping voltage level. FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89974 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 9 DSCC F
41、ORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance i
42、nspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request.
43、 The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim e
44、lectrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shal
45、l apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7 and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (CINmeasurement) shall be measured only for the initial test and after process or design changes which may affect input ca
46、pacitance. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level con
47、trol and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,
48、000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89974 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 10 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 50
