1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make change to output voltage test as specified in table I. - ro 98-10-23 R. MONNIN B Make changes to paragraphs 3.1 and 3.5.1. -rrp 00-01-25 R. MONNIN C Drawing updated to reflect current requirements. - ro 03-06-03 R. MONNIN D Update drawing to
2、 current requirements of MIL-PRF-38535. -rrp 11-06-22 C. SAFFLE E Make correction to VREFtest in Table I from 7.27 V min to -7.27 V min and 7.83 V max to -7.83 V max. Make correction to group A subgroups for VOUT/ TJtest in Table I from 1,2,3 to 1. Make correction to group A subgroups for VOUT/ T te
3、st in Table I from 1,2,3 to 1. -rrp 13-03-13 C. SAFFLE REV SHEET REV SHEET REV STATUS REV E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY MARCIA B. KELLEHER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS D
4、RAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH PITHADIA APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, DUAL POLARITY TRACKING VOLTAGE REGULATOR, MONOLITHIC SILICON DRAWING APPROVAL DATE 94-08-09 AMSC N/A REVISION LEVEL E SIZE A CAGE CODE
5、 67268 5962-89930 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E312-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89930 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234
6、APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When
7、 available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 89930 01 M I A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) L
8、ead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA lev
9、els and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 LM126 Dual polarity tracking voltage regulator 1.2.3 Device class designato
10、r. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, append
11、ix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style I MACY1-X10 10 Can 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-385
12、35 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89930 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DS
13、CC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (VIN) 30 V dc Output short-current duration (to GND or VIN) . Indefinite Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) 300C Junction temperature (TJ) +150C Power dissipation (PD) 2.0 W Forced outpu
14、t voltage, positive (VO+) -0.5 V dc min 2/ Forced output voltage, negative (VO-) . +0.5 V dc max 2/ Thermal resistance, junction-to-case (JC) . 20C/W Thermal resistance, junction-to-ambient (JA) . 150C/W 1.4 Recommended operating conditions. Input voltage (VIN) 20 V dc Ambient operating temperature
15、range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
16、solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTM
17、ENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Phila
18、delphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been
19、 obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ That voltage to which the output may be forced without damage to the device. Provided by IHSNot for ResaleN
20、o reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89930 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classe
21、s Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall
22、 be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-385
23、35, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unle
24、ss otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups spec
25、ified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limit
26、ations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-
27、38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device cl
28、asses Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved sour
29、ce of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and
30、herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcirc
31、uits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and revi
32、ew for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewe
33、r. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 59 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT D
34、RAWING SIZE A 5962-89930 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C VIN= 20 V, IL= 0 mA Group A subgroups Device type Limits 1/ Unit unless otherwise specified Mi
35、n Max Output voltage VOUT1 01 11.75 12.3 V 2,3 11.63 12.42 VIN= 14.2 V, 1 11.75 12.3 0 mA IL 50 mA 2,3 11.63 12.42 15 VIN 30 V, 1 11.68 12.32 0 mA IL 50 mA 2,3 11.63 12.42 Output voltage balance VO(BAL)TA= +25C 1 01 125 mV Positive standby current IQ+VIN= 30 V, TA= +25C 1 01 3 mA Negative standby cu
36、rrent IQ-VIN= 30 V, TA= +25C 1 01 -5 mA Line regulation VRLINE-VIN-= -15 V to -30 V, 1 01 10 mV IL= 20 mA 2,3 20 VRLINE+VIN+= +15 V to +30 V, 1 10 mV IL= 20 mA 2,3 20 Load regulation VRLOAD0 mA IL 50 mA, 1 01 10 mV VIN= 30 V 2,3 20 Short-circuit current ISCVIN= 18 V, TA= +25C 1 01 207 394 mA Referen
37、ce voltage VREFTA= +25C 1 01 -7.27 -7.83 V Negative current limit sense voltage VSENSE-Output shorted, TA= +25C 1 01 560 740 mV Positive current limit sense voltage VSENSE+Output shorted, TA= +25C 1 01 590 770 mV Input-output voltage differential VDIFF1,2,3 01 2 V Temperature stability of output vol
38、tage VOUT/ TJ2/ 1 01 1 % Long term stability VOUT/ T 2/ 1 01 1 % / 1000 hrs 1/ The algebraic convention, whereby the most negative value is a minimum and the most positive a maximum is used in this table. Negative current shall be defined as conventional current flow out of a device terminal. 2/ Gua
39、ranteed, if not tested, to the limits specified in table I herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89930 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234
40、 APR 97 Device type 01 Case outline I Terminal number Terminal symbol 1 CURRENT LIMIT + 2 SENSE + 3 BOOST + 4 VIN+ 5 VIN- 6 CURRENT LIMIT - 7 VOUT-8 BOOST- 9 REFERENCE 10 GND FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS
41、-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89930 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or
42、 as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For dev
43、ice classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices pr
44、ior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acqui
45、ring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table
46、II herein. 4.2.1 Additional criteria for device classes Q and V. a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
47、document revision level control of the device manufacturers Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable
48、, in accordance with the intent specified in method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein. c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in MIL-PRF-38535, appendix B. 4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in M
