1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add case outline 2. Make changes to 1.3 and Figure 1. Make changes to ENDand VOUTtests as specified under Table I. Changes in accordance with N.O.R. 5962-R228-92. 92-08-11 M. A. FRYE B Add case outline D. Make changes to 1.2.2 and Figure 1. Chang
2、es in accordance with N.O.R. 5962-R047-95. 94-12-14 M. A. FRYE C Make changes to EN, END, and AVOtests as specified under Table I. Changes in accordance with N.O.R. 5962-R190-95. 95-08-16 M. A. FRYE D Add case outline X. Make changes to 1.2.2 and Figure 1. Changes in accordance with N.O.R. 5962-R146
3、-97. 96-12-03 R. MONNIN E Make changes to slew rate test as specified under TABLE I herein. Redrawn. ro 98-12-11 R. MONNIN F Drawing updated to reflect current requirements. -rrp 03-07-01 R. MONNIN G Corrected typo by renumbering the pages. - gt 04-02-06 R. MONNIN H Update boilerplate paragraphs. -
4、ro 09-08-24 C. SAFFLE REV SHET REV SHET REV STATUS REV H H H H H H H H H H OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY RICK OFFICER DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEP
5、ARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY CHARLES REUSING APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, QUAD PRECISION OPERATIONAL AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 89-10-19 AMSC N/A REVISION LEVEL H SIZE A CAGE CODE 67268 5962-89677 SHEET 1 OF 10 DSCC FORM
6、2233 APR 97 5962-E452-09 Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89677 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant,
7、 non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89677 01 C A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s).
8、 The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 LT1014A Quad precision operational amplifier 02 LT1014 Quad precision operational amplifier 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outlin
9、e letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack X CDFP3-F14 14 Flat pack2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute max
10、imum ratings. 1/ Positive supply voltage (V+) . +22 V Negative supply voltage (V-) . -22 V Power dissipation (PD) . 500 mW 2/ Differential input voltage . 30 V Input voltage . Equal to positive supply voltage 5 V below negative supply voltage Output short-circuit duration . Indefinite Storage temper
11、ature range . -65C to +150C Lead temperature (soldering, 60 seconds): Cases C, D, and X +300C Case 2 . +260C Junction temperature (TJ) . -65C to +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Cases C and X 100C/W Case D 180C/W Case 2
12、. 65C/W _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Must withstand the added PDdue to short circuit test; e.g., IOS. Provided by IHSNot for ResaleNo reproduction
13、or networking permitted without license from IHSSTANDARD MICROCIRCUIT DRAWING SIZE A 5962-89677 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Positive supply voltage (V+) . +15 V Negative supply voltage (
14、V-) . -15 V Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues
15、of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard E
16、lectronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Orde
17、r Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and re
18、gulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualif
19、ied Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PR
20、F-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark i
21、n accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall b
22、e in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the fu
23、ll ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89677
24、DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset voltage 1/ VOS1 01 1
25、80 V 2,3 350 1 02 300 2,3 550 Input offset current 1/ IOS1 01 0.8 nA 2,3 2.8 1 02 1.5 2,3 5 Input bias current 1/ IB1 01 20 nA 2,3 30 1 02 30 2,3 45 Input voltage range 1/ 2/ IVR 1 01 -15.0 +13.5 V 2,3 -14.9 +13.0 1 02 -15.0 +13.5 2,3 -14.9 +13.0 Common mode 1/ rejection ratio CMRR VCM= +13.5 V, -15
26、.0 V 1 01 100 dB VCM= +13.0 V, -14.9 V 2,3 96 VCM= +13.5 V, -15.0 V 1 02 97 VCM= +13.0 V, -14.9 V 2,3 94 Power supply rejection 1/ ratio PSRR V+ = +2 V to +18 V, 1 01 103 dB V- = -2 V to 18 V 2,3 100 V+ = +2 V to +18 V, 1 02 100 V- = -2 V to 18 V 2,3 97 Output voltage swing 1/ VOUTRL 2 k 4 01 13 V 5
27、,6 12 4 02 12.5 5,6 11.5 Large signal voltage 1/ gain AVORL 2 k, VO= 10 V 4 01 1.5 V/V 5,6 0.4 4 02 1.2 5,6 0.25 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHSSTANDARD MICROCIRCUIT DRAWING SIZE A 5962-89677 DEFENSE SUPPLY
28、CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Power supply current 1/ ISYNo load eac
29、h amplifier 1 01 0.5 mA 2,3 0.6 1 02 0.55 2,3 0.70 Power dissipation 1/ PDNo load each amplifier, 1 01 15 mW guaranteed by ISYlimits 2,3 18 1 02 16.5 2,3 21 Channel separation 1/ 3/ CS TA= +25C 7 01 123 dB 7 02 120 Input noise voltage 1/ 3/ ENf = 0.1 Hz to 10 Hz 4 All 1.1 VP-PInput noise voltage 1/
30、3/ density ENDfO= 10 Hz 4 All 40 nV / fO= 1 kHz 4 30 Hz Output short circuit 1/ 3/ current ISC-TA= +25C 1 All -60 mA ISC+1 60Input resistance 1/ 3/ RIN01 100 M differential mode 1 02 70 Slew rate 1/ 3/ SR 4 All 0.2 V/s Input offset voltage 1/ match VOSGuaranteed by VOSlimits 1 01 360 V 2,3 700 1 02
31、600 2,3 1100 Input offset voltage 4/ VOS1 01 280 V VCM= 0.1 V 2,3 01 480 2 01 960 3 01 480 1 02 450 VCM= 0.1 V 2,3 02 750 2 02 1500 3 02 750 See footnotes at end of table. Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89677 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO
32、43218-3990 REVISION LEVEL H SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset current 4/ IOS1 01 1.3 nA 2,3 7.0 1 02 2.0 2,3 10.0 Inpu
33、t bias current 4/ IB1 01 35 nA 2,3 90 1 02 50 2,3 120 Input voltage range 4/ IVR 1 01 0 3.5 V 1 02 0 3.5 Output voltage swing 4/ VOUTNo load, output low 4 All 25 mV No load, output high 4 All 4 V Output low, sink = 1 mA 4 All 350 mV 600 load, output low 4 All 10 600 load, output high 4 All 3.4 V 600
34、 load, output low 5,6 01 15 mV 02 18 600 load, output high 5,6 01 3.2 V 02 3.1 Supply current 4/ ISYPer amplifier 1 01 .45 mA 2,3 .55 1 02 .5 2,3 .65 Large signal voltage 3/ 4/ gain AVORL= 2 k to GND, 4 All 0.5 V/V VO= 0.1 V to 3.4 V Power dissipation 4/ PDNo load each amplifier, 1 01 2.25 mW guaran
35、teed by ISYlimits 2,3 2.75 1 02 2.5 2,3 3.25 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHSSTANDARD MICROCIRCUIT DRAWING SIZE A 5962-89677 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 7 D
36、SCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Power supply 4/ rejection ratio PSRR V+ = +2 V to +18 V 1 01 103 dB V- = -2 V to 18 V 2,3 100 V+ = +2 V to
37、 +18 V 1 02 100 V- = -2 V to 18 V 2,3 97 1/ Unless otherwise specified, V = 15 V and VCM= 0 V. 2/ IVR is guaranteed by CMRR test. 3/ If not tested, shall be guaranteed to the limits specified in table I herein. 4/ Unless otherwise specified, V+ = +5 V, V- = 0 V, VCM= 0 V, and VOUT= 1.4 V. 3.5 Markin
38、g. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has
39、the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accor
40、dance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to D
41、SCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided
42、 with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturer
43、s facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89677 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 8
44、DSCC FORM 2234 APR 97 Device types 01 and 02 02 02 01 and 02 Case outlines C D X 2 Terminal number Terminal symbol 1 OUT A OUT A OUT A NC 2 -IN A -IN A -IN A OUT A 3 +IN A +IN A +IN A -IN A 4 V+ V+ V+ +IN A 5 +IN B +IN B +IN B NC 6 -IN B -IN B -IN B V+ 7 OUT B OUT B OUT B NC 8 OUT C OUT C OUT C +IN
45、B 9 -IN C -IN C -IN C -IN B 10 +IN C +IN C +IN C OUT B 11 V- V- V- NC 12 +IN D +IN D +IN D OUT C 13 -IN D -IN D -IN D -IN C 14 OUT D OUT D OUT D +IN C 15 - - - NC 16 - - - V- 17 - - - NC 18 - - - +IN D 19 - - - -IN D 20 - - - OUT D FIGURE 1. Terminal connections. Provided by IHSNot for Resale-,-,-ST
46、ANDARD MICROCIRCUIT DRAWING SIZE A 5962-89677 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening.
47、Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be mai
48、ntained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter test
