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    DLA SMD-5962-89623 REV A-2007 MICROCIRCUIT LINEAR VIDEO LINE DRIVER MONOLITHIC SILICON《硅单片 视频线路驱动器 数字微型电路》.pdf

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    DLA SMD-5962-89623 REV A-2007 MICROCIRCUIT LINEAR VIDEO LINE DRIVER MONOLITHIC SILICON《硅单片 视频线路驱动器 数字微型电路》.pdf

    1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to current requirements. Editorial changes throughout. - drw 07-02-22 Joseph Rodenbeck THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 PMIC

    2、 N/A PREPARED BY Joseph A. Kerby DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Charles E. Besore COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, VIDEO LINE DRIVER, AND AG

    3、ENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-05-24 MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-89623 SHEET 1 OF 8 DSCC FORM 2233 APR 97 5962-E280-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD

    4、 MICROCIRCUIT DRAWING SIZE A 5962-89623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-385

    5、35, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89623 01 G A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device types. The device types identify the circuit function as follows: Device ty

    6、pe Generic number Circuit function 01 EL2003 Video line driver 02 EL2033 Video line driver 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can P GDIP1-T8 and CDIP2-T8 8 Dual-in-line 2 CQCC

    7、1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VS) 18 V dc or 36 V dc Input voltage (VIN) 1/ 15 V dc or VSInput current (IIN) 1/ 50 mA Power dissipation (PD) . 2/ Output short circui

    8、t duration 3/. Continuous Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC). See MIL-STD-1835 Case G. 190C/W Case P . 123C/W Case 2 100C/W Junction temperature (TJ) +175C 1.4 Recommended operating conditions. Supply volta

    9、ge (VS) 15 V dc Ambient operating temperature . -55C to +125C _ 1/ If the input exceeds the ratings shown (or the supplies) or if the input to output voltage exceeds 7.5 V, then the input current must be limited to 50 mA. 2/ The maximum power dissipation depends on package type, ambient temperature,

    10、 and heat sinking. 3/ A heat sink is required to keep the junction temperature below the absolute maximum when the output is short circuited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89623 DEFENSE SUPP

    11、LY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwi

    12、se specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-18

    13、35 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.

    14、daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in thi

    15、s document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Prod

    16、uct built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and

    17、qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as

    18、 described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and

    19、herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics a

    20、re as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall b

    21、e in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not

    22、marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF

    23、-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR

    24、97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C 1/ unless otherwise specified Group A subgroups Device type Limits Unit Min MaxInput offset voltage VIOVIN= 0V 1 All -40 +40 mV 2, 3 -50 +50 Input bias current IBVIN= 0 V 1, 2 All -25 +25 A 3 -50 +50 Input resis

    25、tance RINVIN= 12 V, Load = 100 1, 2 All 1 M 3 0.1 Voltage gain AV1VIN= 12 V, Load = 1 k 4 All 0.98 V/V 5, 6 0.97 AV2VIN= 6 V, Load = 50 4 0.83 5, 6 0.80 AV3VS= 5 V, VIN= 3 V, Load = 50 4 0.82 5, 6 0.79 Output voltage swing VO1VIN= 14 V, Load = 1 k 4 All 13 V 5, 6 12.5 VO2VIN= 12 V, Load = 100 4 10.5

    26、 5, 6 10 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. E

    27、lectrical performance characteristics - continued. Test Symbol Conditions -55C TA +125C 1/ unless otherwise specified Group A subgroups Device type Limits Unit Min MaxOutput resistance ROUTVIN= 2 V, Load = 50 4 All 10 5, 6 12 Output current 2/ IOUTVIN= 12 V 4 All 105 mA 5, 6 100 Supply current ISVIN

    28、= 0 V 1, 2 All 15 mA 3 20 Power supply rejection ratio PSRR VS= 4.5 V to 18 V, VIN= 0 V 1 All 60 dB 2, 3 50 Slew rate SR1 VIN= 10 V, Load = 1 k 3/ 7 All 600 V/s 8 5/ 430 SR2 VIN= 5 V, Load = 50 4/ 7 200 8 5/ 130 Distortion at 1 kHz THD VIN= 4 V, Load = 50, TA= +25C 7 1 % 1/ VS= 15 V, RS= 50, RL= . 2

    29、/ Maximum current output at 10 V output. 3/ Slew rate is measured between VOUT= +5 V and -5 V. 4/ Slew rate is measured between VOUT= +2.5 V and -2.5 V. 5/ Guaranteed if not tested to the limits specified. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-

    30、,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 Device type 01 02 Case outlines G P 2 P Terminal number Terminal symbol 1 V1+ V1+, V2+ NC V1+, V2+ 2 V2+ VINV1+, V2+ NC 3 NC NC NC NC 4 VOUTV1-,

    31、 V2- NC VIN5 NC NC NC V1-, V2- 6 V2- NC NC NC 7 V1- VOUTNC NC 8 VINNC NC VOUT9 - - - - - - NC - - - 10 - - - - - - VIN- - - 11 - - - - - - NC - - - 12 - - - - - - V1-, V2- - - - 13 - - - - - - NC - - - 14 - - - - - - NC - - - 15 - - - - - - NC - - - 16 - - - - - - NC - - - 17 - - - - - - NC - - - 18

    32、 - - - - - - NC - - - 19 - - - - - - NC - - - 20 - - - - - - VOUT- - - FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218

    33、-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to li

    34、sting as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of

    35、microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and app

    36、licable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance

    37、 with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer unde

    38、r document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, m

    39、inimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accorda

    40、nce with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 4, 5, 6, 7 Group A test requirements (method 5005) 1, 2, 3, 4, 5, 6, 7, 8* Groups C and D end-point electrical parameters (method 5005) 1 * PDA appli

    41、es to subgroup 1. * Subgroup 8, if not tested, shall be guaranteed to the limits specified in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218

    42、-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Test

    43、s shall be as specified in table II herein. b. Subgroups 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-

    44、883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as

    45、 applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-3

    46、8535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same gener

    47、ic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Propo

    48、sal. 6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544. 6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio


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