1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with N.O.R. 5962-R249-92. 92-08-04 M. A. FRYE B Changes in accordance with N.O.R. 5962-R219-93. 93-09-02 M. A. FRYE C Drawing updated to reflect current requirements. - ro 02-07-03 R. MONNIN D Update standard SMD paragraphs.
2、 -rrp 09-03-18 R. HEBER THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY CHARLES E. BESORE DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESOR
3、E COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, VIDEO OPERATIONAL AMPLIFIER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 91-03-22 AMSC N/A REVISION LEVEL D
4、 SIZE A CAGE CODE 67268 5962-89502 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E655-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89502 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVE
5、L D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5
6、962-89502 01 G X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 HA-2544 Video operational amplifier 1.2.2 Case outline(s). The case
7、outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix
8、A. 1.3 Absolute maximum ratings. Voltage between +V and -V terminals . 33 V dc Differential input voltage 6.0 V dc Voltage at either input terminal +V to -V Peak output current . 40 mA Storage temperature range . -65C to +150C Junction temperature (TJ) . +175C Maximum power dissipation (PD) 1/ Case
9、G 860 mW Case P . 780 mW Case 2 . 1.1 W Lead temperature (soldering, 10 seconds) +275C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case G 116C/W Case P . 129C/W Case 2 . 92C/W _ 1/ Derate linearly above TA= +75C as follows: case G = 8.6
10、mW/C, case P = 7.8 mW/C, case 2 = 11 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89502 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.4 Rec
11、ommended operating conditions. Positive supply voltagerange (+V) . +12 V dc to +15 V dc Negative supply voltage range (-V) . -12 V dc to -15 V dc Common mode input voltage (VCM) (+V - -V) / 2 Load resistance (RL) . 1.0 k Ambient temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Gove
12、rnment specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICA
13、TION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard
14、Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In
15、the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The
16、 individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been
17、granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to
18、the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Desig
19、n, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as s
20、pecified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking pe
21、rmitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89502 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II
22、. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire S
23、MD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance in
24、dicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply i
25、n MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certific
26、ate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs a
27、gent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall b
28、e in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883.
29、(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as appl
30、icable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufactur
31、er. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. Provided by IHSNot for ResaleNo reproduction or networking permitted without licen
32、se from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89502 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA+125C +V = +15 V, -V = -15 V, CL 10 pF Group A sub
33、groups Device type Limits Unit unless otherwise specified Min Max Input offset voltage VIOVCM= 0 V 1 01 15 mV 2,3 20 Input bias current +IBVCM= 0 V, +RS= 1.0 k, 1 01 15 A -RS= 10 2,3 20 -IBVCM= 0 V, +RS= 10 , 1 15 -RS= 1.0 k 2,3 20 Input offset current IIOVCM= 0 V, +RS= 1.0 k, 1 01 2.0 A -RS= 1.0 k
34、2,3 3.0 Common mode voltage range +VCM+V = +5.0 V, -V = -25 V 1,2,3 01 10 V -VCM+V = +25 V, -V = -5.0 V -10 Large signal voltage gain +AVOLVOUT= 0 V and +8 V, 4 01 3.5 kV/V RL= 1 k 5,6 2.5 -AVOLVOUT= 0 V and -8 V, 4 3.5 RL= 1 k 5,6 2.5 Common mode rejection ratio +CMRR VCM= +10 V, +V = +5.0 V, -V =
35、-25 V, VOUT= -10 V 1,2,3 01 75 dB -CMRR VCM= -10 V, +V = +25 V, -V = -5.0 V, VOUT= +10 V 75 Output current +IOUTVOUT= +9 V, TA= +25C 4 01 25 mA -IOUTVOUT= -9 V, TA= +25C -25 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,
36、-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89502 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA+125C +V = +15 V, -V = -15 V, CL 10 pF Group A subgro
37、ups Device type Limits Unit unless otherwise specified Min Max Output voltage swing +VOUTRL= 1 k 4,5,6 01 +10.0 V -VOUT-10.0 Quiescent power supply current +ICCVOUT= 0 V, IOUT= 0 mA 1,2,3 01 12 mA -ICC-12 Power supply rejection ratio +PSRR +V = +10 V and +20 V, -V = -15 V 1,2,3 01 70 dB -PSRR -V = -
38、10 V and -20 V, +V = +15 V 70 Offset voltage adjustment +VIO(ADJ) TA= +25C 2/ 1 01 VIO1.0 mV +VIO(ADJ) VIO+1.0 Slew rate +SR VOUT= -3.0 V to +3.0 V, RS= 100 , RL= 1 k, 7 01 100 V/s AV= 1 V/V 8 70 -SR VOUT= +3.0 V to -3.0 V, RS= 100 , RL= 1 k, 7 100 AV= 1 V/V 8 70 Differential gain 3/ dAVRS= 50 , RL=
39、 1.0 k, fO= 3.58 MHz and 4.43 MHz, TA= +25C 4 01 .04 dB Differential phase 3/ d RS= 50 , RL= 1.0 k, fO= 3.58 MHz and 4.43 MHz, TA= +25C 4 01 .11 degree Unity gain bandwidth UGBW VOUT= 200 mV, TA= +25C, f at 3.0 dB 4 01 45 MHz See footnotes at end of table. Provided by IHSNot for ResaleNo reproductio
40、n or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89502 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA+
41、125C +V = +15 V, -V = -15 V, CL 10 pF Group A subgroups Device type Limits Unit unless otherwise specified Min Max Gain tolerance 3/ AVfO= 5.0 MHz, TA= +25C 4 01 .15 dB fO= 10 MHz, TA= +25C .35 Full power bandwidth 4/ FPBW VPK= 1.0 V, RL= 1 k, TA= +25C 4 01 15.9 MHz VPK= 5.0 V, RL= 1 k, TA= +25C 3.2
42、 Closed loop stable 5/ Gain CLSG RL= 1 k, CL 1.0 pF 4,5,6 01 +1.0 V/V Rise time 6/ trVOUT= 0 V to +200 mV 9 01 15 ns 10,11 5/ 15 Fall time 6/ tfVOUT= 0 V to -200 mV 9 01 15 ns 10,11 5/ 15 Overshoot +OS VOUT= 0 V to +200 mV 9 01 20 % 10,11 5/ 30 -OS VOUT= 0 V to -200 mV 9 20 10,11 5/ 30 Output resist
43、ance 5/ ROUTTA= +25C 4 01 40 Quiescent power 7/ consumption PC VOUT= 0 V, IOUT= 0 mA 1,2,3 01 360 mW 1/ For DC tests (subgroups 1, 2, and 3): RS= 10 , RL= 500 k, VOUT= 0V unless otherwise specified. For AC tests (subgroups 4, 5, 6, 7, 8, 9, 10, 11): AV= +1.0 V/V, RL= 1 k, unless otherwise specified.
44、 2/ Offset adjustment range is VIO(measured) 1.0 mV minimum referred to output. This test is for functionality only to assure adjustment through 0 V. 3/ Test initially and after any design changes that affects the parameters. 4/ Full power bandwidth = SR / (2 x x VPK). 5/ If not tested, shall be gua
45、ranteed to the limits specified in table I herein. 6/ Rise and fall times measured between 10 percent and 90 percent point. 7/ Quiescent power consumption based on quiescent supply current test maximum (no load on outputs). Provided by IHSNot for ResaleNo reproduction or networking permitted without
46、 license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89502 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outlines G and P 2 Terminal number Terminal symbol 1 BALANCE NC 2 -INPUT BALANCE 3 +INPUT NC 4 -V NC 5 BAL
47、ANCE -INPUT 6 OUTPUT NC 7 +V +INPUT 8 NC NC 9 - NC 10 - -V 11 - NC 12 - BALANCE 13 - NC 14 - NC 15 - OUTPUT 16 - NC 17 - +V 18 - NC 19 - NC 20 - NC NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STA
48、NDARD MICROCIRCUIT DRAWING SIZE A 5962-89502 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - Final electrical test parameters (method 5004) 1*,2,3,
