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    DLA SMD-5962-88563 REV A-2008 MICROCIRCUITS LINEAR 16 BIT D A CONVERTER MONOLITHIC SILICON《单片硅16位直 交流转换器线性微电路》.pdf

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    DLA SMD-5962-88563 REV A-2008 MICROCIRCUITS LINEAR 16 BIT D A CONVERTER MONOLITHIC SILICON《单片硅16位直 交流转换器线性微电路》.pdf

    1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Redraw. Update drawing to current requirements. - drw 08-08-06 Robert M. Heber THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY Josep

    2、h A. Kerby CHECKED BY William J. Johnson DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY Michael A. Frye STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-1

    3、0-17 MICROCIRCUIT, LINEAR, 16 BIT D/A CONVERTER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-88563 SHEET 1 OF 8 DSCC FORM 2233 APR 97 5962-E478-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAW

    4、ING SIZE A 5962-88563 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.

    5、2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-88563 01 J A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type identifies the circuit function as follows: Device type Generic number

    6、Circuit function 01 DAC703 16-bit D/A converter 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package style J GDIP1-T24 or CDIP2-T24 24 Dual-in-line 3 CQCC1-N28 28 Square leadless chip carrier 1.2.3 Lead finish. T

    7、he lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage: +VCCto common +18 V dc -VCCto common . -18 V dc Supply voltage, VDDto common. 0 V to +18 V dc Digital data input voltage to common. -1 V to +7 V dc Power dissipation (PD) . 1.0 W Short circuit

    8、duration: VREFoutput to common Continuous VOUTto common. Continuous External voltage applied to D/A output. -5 V dc to +5 V dc Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +175C Thermal resistance, junction-to-case (JC). See MIL-STD-1835 Thermal resistance, junction-to-am

    9、bient (JA): Case J 50C/W Case 3 120C/W 1.4 Recommended operating conditions. Supply voltage (VCC) 15 V dc Supply voltage (VDD) 5 V dc Ambient operating temperature range (TA) -55C to +125C Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICR

    10、OCIRCUIT DRAWING SIZE A 5962-88563 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing

    11、 to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 -

    12、 Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/as

    13、sist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes preceden

    14、ce. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as spec

    15、ified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved

    16、 program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not

    17、 affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-3853

    18、5, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance

    19、 characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Markin

    20、g. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has

    21、the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accor

    22、dance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88563 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 D

    23、SCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C +VCC= +15 V, -VCC= -15 V, VDD= 5 V Group A subgroupsDevice type Limits Unit unless otherwise specified Min Max Resolution 1, 2, 3 All 16 Bits High input voltage VIHHex input code = FFFF, TA= +2

    24、5C 1 All +2.4 +VCCV Low input voltage VILHex input code = 0000, TA= +25C 1 All -1.0 +0.8 V High input current IIHVIN= +2.7 V, TA= +25C 1 All +40 A Low input current IILVIN= +0.4 V, TA= +25C 1 All -0.5 mA Linearity error NLE 1 All 0.003 % of FSR 2, 3 0.006 1/ Differential linearity DLE 1 All 0.006 %

    25、of FSR 2, 3 -0.006 +0.009 1/ Gain error AE Hex input code = 0000, FFFF TA= +25C 1 All 0.1 % of FSR 1/ Gain error drift dAE/ dT Hex input code = 0000, FFFF TA= -55C and +125C 2, 3 All 20 ppm of FSR/C Zero error ZE Hex input code = 7FFF, TA= +25C 1 All 0.1 % of FSR 2/ Zero error drift dZE/ dt Hex inpu

    26、t code = 7FFF, TA= -55C and +125C 2, 3 All 15 ppm/C Monotinicity 1, 2, 3 All 14 Bits See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88563 DEFENSE SUPPLY CENTER COLUMBUS COLUMBU

    27、S, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions -55C TA +125C +VCC= +15 V, -VCC= -15 V, VDD= 5 V Group A subgroupsDevice type Limits Unit unless otherwise specified Min Max Settling time tSTo 0.003%

    28、 of FSR, RL= 2 k TA= +25C 9 All 8 s Slew rate SR RL= 2 k, TA= +25C 7 All 10 V/s Output current IOTA= +25C 1 All 5 mA Reference voltage VREFHex input code = 0000 1, 2, 3 All +6.0 +6.6 V Reference tempco dVREF/ dT Hex input code = 0000 TA= -55C and +125C 2, 3 All 15 ppm/C Power supply current +ICCVOUT

    29、= 0 V, TA= +25C 1 All +30 mA -ICC-30 +IDD+8 Power supply sensitivity PSS1it +VCC= 1 V, TA= +25C 1 All 4 mV/V PSS2 -VCC= 1 V, TA= +25C 4 PSS3 +VDD= 1 V, TA= +25C 4 1/ VOinherently 10 V. 2/ FSR means full scale range and is 20 V for the 10 V range. Provided by IHSNot for ResaleNo reproduction or netwo

    30、rking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88563 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 Device type 01 Case outlines J 3 Terminal number Terminal symbol 1 Bit 1 (MSB) NC 2 Bit 2 Bit 1 (MSB) 3

    31、 Bit 3 Bit 2 4 Bit 4 Bit 3 5 Bit 5 Bit 4 6 Bit 6 Bit 5 7 Bit 7 Bit 6 8 Bit 8 NC 9 Bit 9 Bit 7 10 Bit 10 Bit 8 11 Bit 11 Bit 9 12 Bit 12 Bit 10 13 Bit 13 Bit 11 14 Bit 14 Bit 12 15 Bit 15 NC 16 Bit 16 (LSB) Bit 13 17 VOUTBit 14 18 VDDBit 15 19 -VCCBit 16 (LSB) 20 Common VOUT21 Summing Junction VDD22

    32、Gain Adjust NC 23 +VCC-VCC24 +6.3 VREFOutput Common 25 - - - Summing Junction 26 - - - Gain Adjust 27 - - - +VCC28 - - - +6.3 VREFOutput FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZ

    33、E A 5962-88563 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herei

    34、n). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as require

    35、d in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activ

    36、ity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-

    37、38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, o

    38、r D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with th

    39、e intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test

    40、 requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*, 2, 3 Group A test requirements (method 5005) 1, 2, 3, 7, 9 Groups C and D end-point electrica

    41、l parameters (method 5005) 1 * PDA applies to subgroup 1. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88563 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234

    42、 APR 97 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b

    43、. Subgroups 4, 5, 6, 8, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or

    44、D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the

    45、intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Inten

    46、ded use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-pr

    47、epared specification or drawing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military a

    48、nd industrial users shall inform Defense Supply Center Columbus (DSCC) when a system application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544. 6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or te


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