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    DLA SMD-5962-87682 REV F-2008 MICROCIRCUIT MEMORY DIGITAL BIPOLAR 18 X 42 X 10 FIELD PROGRAMMABLE LOGIC ARRAY (FPLA) MONOLITHIC SILICON.pdf

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    DLA SMD-5962-87682 REV F-2008 MICROCIRCUIT MEMORY DIGITAL BIPOLAR 18 X 42 X 10 FIELD PROGRAMMABLE LOGIC ARRAY (FPLA) MONOLITHIC SILICON.pdf

    1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make changes to table I, table II, 1.2.2, 3.9.1, 4.2a, 4.3.1, and 4.3.2. 88-06-28 M. A. Frye B Add burn-in test conditions A and B to 4.2 and 4.3.2. Editorial changes throughout. 89-10-30 M. A. Frye C Convert to one part, one part number document

    2、 format. 92-05-30 M. A. Frye D Changes in accordance with NOR 5962-R223-92. 92-06-16 M. A. Frye E Update drawing to current requirements. Editorial changes throughout. - gap 02-01-14 Raymond Monnin F Boilerplate update, part of 5 year review. ksr 08-04-25 Robert M. Heber THE ORIGINAL FIRST PAGE OF T

    3、HIS DRAWING HAS BEEN REPLACED. REV SHET REV F SHET 15 REV STATUS REV F F F F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY K. Rice DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dsc

    4、c.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. Hauck AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 87-07-30 MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR 18 x 42 x 10 FIELD PROGRAMMABLE LOGIC ARRAY (FPLA), MONOLITHIC SILICON AMSC N/A REVISION LEVEL F SIZE

    5、 A CAGE CODE 67268 5962-87682 SHEET 1 OF 15 DSCC FORM 2233 APR 97 5962-E346-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87682 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F S

    6、HEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identi

    7、fying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 87682 01 M X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCas

    8、e outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appen

    9、dix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 82S153A 18 x 42 x 10 field programmable logic array

    10、1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordanc

    11、e with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 20 dual in-line package S GDFP2-F20 20 flat

    12、package 2 CQCC1-N20 20 square chip carrier package 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) . 7.0 V dc Input voltage range (VI) 10 V dc S

    13、torage temperature range -65C to +150C Maximum power dissipation 2/ 900 mW Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC): Cases R, S, and 2 See MIL-STD-1835 Junction temperature (TJ) . +200C Output sink current . 100 Ma Provided by IHSNot for ResaleNo rep

    14、roduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87682 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Supply voltage range (VCC) . 4.5 V dc to 5.5 V

    15、dc Case operating temperature range (TC) -55C to +125C Minimum high level input voltage (VIH) 2.0 V dc Maximum low level input voltage (VIL) 0.8 V dc 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of t

    16、his drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MI

    17、L-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online

    18、at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil from the Standardization Document Order Desk, 700 Robins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the

    19、 text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-

    20、38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appen

    21、dix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class

    22、M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Logic diagram. The block or logic diagram shall be as specified on figure 2. 3.3 Electrical performance characteristics an

    23、d postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test req

    24、uirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/

    25、 Must withstand the added PD due to short-circuit test; e.g., IOS. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87682 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC

    26、FORM 2234 APR 97 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-

    27、“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certi

    28、fication mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from

    29、 a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate

    30、of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and he

    31、rein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For

    32、 device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the

    33、 option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit gro

    34、up number 14 (see MIL-PRF-38535, appendix A). 3.11 Processing options. Since the device is capable of being programmed by either the manufacturer or the user to result in a wide variety of configurations; two processing options are provided for selection in the contract, using an altered item drawin

    35、g. 3.11.1 Unprogrammed device delivered to the user. All testing shall be verified through group A testing as defined in 4.4.1c and table II. It is recommended that users perform subgroups 7 and 9 after programming to verify the specific program configuration. 3.11.2 Manufacturer-programmed device d

    36、elivered to the user. All testing requirements and quality assurance provisions herein, including the requirements of the altered item drawing, shall be satisfied by the manufacturer prior to delivery. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-

    37、STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87682 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TC +125C GND = 0 V 4.5 V VCC 5.5 V Group A subgroups Device type Lim

    38、its Unit unless otherwise specified Min Max Input clamp voltage VICVCC= 4.5 V, IIN= -18 mA 1, 2, 3 01 -1.2 V 2/ (3022) High level output VOHVCC= 4.5 V, IOH= -2.0 mA 1, 2, 3 01 2.4 V voltage VIL= 0.8 V, VIH= 2.0 V (3006) 3/ Low level output VOLVCC= 4.5 V, IOL= 12 mA 1, 2, 3 01 0.5 V voltage VIL= 0.8

    39、V, VIH= 2.0 V (3007) 4/ High level input IIH1VCC= 5.5 V, VIN= 5.5 V 1, 2, 3 01 50 A current for pin being tested, all other (3010) (except I/O pins) pins not being tested at 0.0 V. Low level input IIL1VCC= 5.5 V, VIN= 0.45 V 1, 2, 3 01 -150 A current for pin being tested, all other (3010) (except I/

    40、O pins) pins not being tested at 0.0 V. High level input IIH2VCC= 5.5 V, VIN= 5.5 V 1, 2, 3 01 110 A current for pin being tested, all other (3010) (I/O pins only) pins not being tested at 0.0 V. Low level input IIL2VCC= 5.5 V, VIN= 0.45 V 1, 2, 3 01 210 A current for pin being tested, all other (30

    41、10) (I/O pins only) pins not being tested at 0.0 V. Output short-circuit IOSVCC= 4.5 V and 5.5 V, 1, 2, 3 01 -15 -85 mA current VO= 0.0 V 2/ 5/ (3007) Supply current ICCVCC= 5.5 V 6/ 1, 2, 3 01 165 mA (3010) Three-state output IOZVCC= 5.5 VO= 5.5 V 1, 2, 3 01 110 A current (3007) (I/O pins only) VO=

    42、 .45 V 210 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87682 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I.

    43、 Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TC +125C GND = 0 V 4.5 V VCC 5.5 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Functional tests See 4.4.1d 7, 8 01 (3014) Propagation delay tPDCL= 30 pF 7/ 8/ 9, 10, 11 01 45 ns time

    44、R1= 470 (3010) 2= 1 k Output disable tODCL= 5 pF 7/ 8/ 9/ 9, 10, 11 01 40 ns time R1= 470 (3010) 2= 1 k Output enable tOECL= 30 pF 7/ 8/ 9, 10, 11 01 40 ns time R1= 470 (3010) 2= 1 k 1/ All voltage values are with respect to ground. 2/ Test one output pin at a time. 3/ Measured with +10 V applied to

    45、 I0-7. Output sink current is supplied through a resistor to VCC. 4/ Measured with +10 V applied to I7. 5/ Duration of short-circuit condition should not exceed 1 second. 6/ ICCis measured with I0-1grounded, I2-7and IB0-9at 4.5 V. 7/ Tested initially and after any design or process changes which may

    46、 affect this parameter and therefore shall be guaranteed to the limits specified in table I. 8/ See figure 3. 9/ Measured at VT= VOL+ 0.5 V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87682 DEFENSE SUPPL

    47、Y CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outlines R, S, and 2Terminal number Symbol 1 I02 I13 I24 I35 I46 I57 I68 I79 B010 GND 11 B112 B213 B314 B415 B516 B617 B718 B819 B920 VCCFIGURE 1. Terminal connections. Provided by IHSNot f

    48、or ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87682 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 8 DSCC FORM 2234 APR 97 FIGURE 2. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87682 DEFENSE SUPPLY CENTER COLUM


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