1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R030-92. 91-11-22 Monica L. Poelking B Changes in accordance with NOR 5962-R126-93. 93-04-12 Monica L. Poelking C Redrawn with changes. Update drawing to current requirements. Editorial changes throughout. - ga
2、p 07-04-20 Robert M. Heber The original first sheet of this drawing has been replaced. REV SHET REV SHET REV STATUS REV C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY David W. Queenan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED B
3、Y D. A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, ECL, FLIP-FLOP, AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-02-02 MONOLITHIC SILICON AMSC N/A REVISION LEVEL
4、 C SIZE A CAGE CODE 67268 5962-87505 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E169-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87505 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LE
5、VEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example:
6、 5962-87505 01 E X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 10H535 Dual J-K mastrer slave flip-flop 1.2.2 Case outline(s). The
7、 case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat pack 2 CQCC1-N20 20 leadless square chip carrier 1.2.3 Lead finish. The lead finish is as specifi
8、ed in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range -8.0 V dc to 0.0 V dc Input voltage range . 0.0 V dc to -5.2 V dc Storage temperature range . -65C to +165C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +165C Maximum power dissipation (PD
9、) 434 mW Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage (VEE) -5.46 V dc minimum to -4.94 V dc maximum Ambient operating temperature range (TA) . -55C to +125C Minimum high level input voltage (VIH): TA= +25C -0.780 V dc TA= +125C -0.6
10、50 V dc TA= -55C . -0.840 V dc Maximum low level input voltage (VIL) . -1.950 V dc Minimum setup time (ts) 1.50 ns Minimum hold time (th) 1.00 ns Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87505 DEFENSE
11、SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless oth
12、erwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-ST
13、D-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/ass
14、ist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in
15、 this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein.
16、Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan
17、and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PI
18、N as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A
19、and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be a
20、s specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and s
21、hall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking p
22、ermitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87505 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the
23、PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A complian
24、ce indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance
25、. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product
26、meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification
27、of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available ons
28、hore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to q
29、uality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or
30、acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in t
31、able II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87505 DEFENSE SUPPLY CENTER COLUM
32、BUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E, F, and 2 Quiescent tests 1/ VIHVIL-0.780 -1.950 1 -1.010 -0.780
33、 -0.650 -1.950 2 -0.860 -0.650 High level output voltage VOH-0.840 -1.950 3 -1.060 -0.840 V -0.780 -1.950 1 -1.950 -1.580 -0.650 -1.950 2 -1.950 -1.565 Low level output voltage VOL-0.840 -1.950 3 -1.950 -1.610 V -1.110 -1.480 1 -1.010 -0.780 -0.960 -1.465 2 -0.860 -0.650 High level threshold output
34、voltage VOHA-1.160 -1.510 3 -1.060 -0.840 V -1.110 -1.480 1 -1.950 -1.580 -0.960 -1.465 2 -1.950 -1.565 Low level threshold output voltage VOLAOutputs terminated through 100 to -2.0 V, VCC= 0.0 V, VEE= -5.2 V 2/ -1.160 -1.510 3 -1.950 -1.610 V 1 -68 Power supply drain current IEE4/ 2, 3 -75 mA 1 285
35、 IIH1J and K inputs 2, 3 460 A 1 420 IIH2Clock input 2, 3 675 A 1 500 High level input current IIH3VEE= -5.46 V, VCC= 0.0 V, VIH= -0.780 V at +25C -0.650 V at +125C -0.840 V at -55C R and S inputs 2, 3 800 A 1, 3 0.5 Low level input current IILVEE= -4.94 V, VIL= -1.950 V, VCC= 0.0 V 2 0.3 A See foot
36、notes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87505 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical perform
37、ance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E and F Rapid tests 3/ VIHVIL-0.798 -1.950 1 -1.027 -0.798 -0.670 -1.950 2 -0.878 -0.670 High level output voltage VOH-0.860 -1.950 3 -1.078 -0.860 V -0.798 -
38、1.950 1 -1.950 -1.586 -0.670 -1.950 2 -1.950 -1.571 Low level output voltage VOL-0.860 -1.950 3 -1.950 -1.616 V -1.127 -1.486 1 -1.027 -0.798 -0.978 -1.471 2 -0.878 -0.670 High level threshold output voltage VOHA-1.178 -1.516 3 -1.078 -0.860 V -1.127 -1.486 1 -1.950 -1.586 -0.978 -1.471 2 -1.950 -1.
39、571 Low level threshold output voltage VOLAOutputs terminated through 100 to -2.0 V, VCC= 0.0 V, VEE= -5.2 V 2/ -1.178 -1.516 3 -1.950 -1.616 V 1 -67 Power supply drain current IEE4/ 2, 3 -74 mA 1 270 IIH1J and K inputs 2, 3 445 A 1 405 IIH2Clock input 2, 3 660 A 1 485 High level input current IIH3V
40、EE= -5.46 V, VCC= 0.0 V, VIH= -0.798 V at +25C -0.670 V at +125C -0.860 V at -55C R and S inputs 2, 3 785 A 1, 3 0.5 Low level input current IILVEE= -4.94 V, VIL= -1.950, VCC= 0.0 V 2 0.3 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without li
41、cense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87505 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C unless otherwise specifi
42、ed Group A subgroups Min Max Unit Case 2 Rapid tests 3/ VIHVIL-0.807 -1.950 1 -1.035 -0.807 -0.679 -1.950 2 -0.887 -0.679 High level output voltage VOH-0.869 -1.950 3 -1.087 -0.869 V -0.807 -1.950 1 -1.950 -1.588 -0.679 -1.950 2 -1.950 -1.574 Low level output voltage VOL-0.869 -1.950 3 -1.950 -1.619
43、 V -1.135 -1.488 1 -1.035 -0.807 -0.987 -1.474 2 -0.887 -0.679 High level threshold output voltage VOHA-1.187 -1.519 3 -1.087 -0.869 V -1.135 -1.488 1 -1.950 -1.588 -0.987 -1.474 2 -1.950 -1.574 Low level threshold output voltage VOLAOutputs terminated through 100 to -2.0 V, VCC= 0.0 V, VEE= -5.2 V
44、2/ -1.187 -1.519 3 -1.950 -1.619 V 1 -67 Power supply drain current IEE4/ 2, 3 -74 mA 1 270 IIH1J and K inputs 2, 3 445 A 1 405 IIH2Clock input 2, 3 660 A 1 485 High level input current IIH3VEE= -5.46 V, VCC= 0.0 V, VIH= -0.807 V at +25C -0.679 V at +125C -0.869 V at -55C R and S inputs 2, 3 785 A 1
45、, 3 0.5 Low level input current IILVEE= -4.94 V, VCB= -1.950 V, VCC= 0.0 V 2 0.3 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87505 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS,
46、 OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E, F, and 2 AC tests 9 0.50 2.00 10 0.70 2.40 Transition time tTLH,
47、 tTHL11 0.50 2.00 ns 9 0.70 2.30 10 0.70 2.60 Propagation delay time, set, reset, or clock to output tPHH, tPLL, tPLH, tPHL11 0.50 2.30 ns 9 250 10 250 Toggle frequency fMAXVEE= -2.94 V, VCC= 2.0 V, CL 5 pF, RL= 100 See figure 4 11 250 MHz 1/ The quiescent limits are determined after a device has re
48、ached thermal equilibrium. This is defined as the reading taken with the device in a socket with 500 LFPM of +25C, +125C or -55C (as applicable) air blowing on the unit in a transverse direction with power applied for at least 4 minutes before the reading is taken. This method was used for theoretical limit establishment only. All devices shall be tested to the delta V (rapid test) conditions specified herein. The rapid test method is an equivalent method of testing quiescent conditions. 2/ The high and low level outp
