1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add vendor CAGE 27014 to case outline 2. 87-03-24 N. A. Hauck B Add vendor CAGE code 01295 to case outlines E and 2. Editorial changes on pages 2 and 3. 87-10-05 R. P. Evans C Add test circuit and notes in figure 4. Update boilerplate to MIL-PRF-
2、38535 requirements. Editorial changes throughout. LTG04-06-18 Thomas M. Hess D Correct the condition IOfor the output voltage tests in table I. Update boilerplate to MIL-PRF-38535 requirements. jak10-11-10 Thomas M. Hess CURRENT CAGE CODE 67268 REV SHET REV SHET REV STATUS REV D D D D D D D D D D D
3、D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Jeffery Tunstall DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. Hauck MICROCIRCUIT,
4、DIGITAL, HIGH SPEED CMOS, BCD-TO-DECIMAL DECODER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 86-10-01 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 14933 5962-86821 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E014-10 Provided by IHSNot for ResaleNo reproduction or n
5、etworking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86821 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class leve
6、l B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-86821 01 E A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s)
7、 identify the circuit function as follows: Device type Generic number Circuit function 01 54HC42 BCD-to-decimal decoder 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16
8、16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat pack 2 CQCC1-N20 20 Square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to VCC+
9、0.5 V dc DC output voltage range (VOUT) . -0.5 V dc to VCC+ 0.5 V dc Clamp diode current 20 mA DC output current (per pin) 25 mA DC VCCor GND current (per pin) . 50 mA Storage temperature range (TSTG) . -65C to +150C Maximum power dissipation (PD) 2/ . 500 mW Lead temperature (soldering 10 seconds)
10、. 260C Thermal resistance, junction-to-case (JC): Cases E, F, and 2 See MIL-STD-1835 Junction temperature (TJ) 175C 1.4 Recommended operating conditions. Supply voltage range (VCC) +2.0 V dc to +6.0 V dc Case operating temperature range (TC) . -55C to +125C Input rise or fall time (tr, tf): VCC= 2.0
11、 V . 0 to 1000 ns VCC= 4.5 V . 0 to 500 ns VCC= 6.0 V . 0 to 400 ns 1/ Unless otherwise specified, all voltages are referenced to ground. 2/ For TC= +100C to +125C, derate linearly at 12 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD
12、MICROCIRCUIT DRAWING SIZE A 5962-86821 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to t
13、he extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test
14、 Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist
15、.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence.
16、Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specifie
17、d herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved pro
18、gram plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not aff
19、ect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, a
20、ppendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram
21、shall be as specified on figure 3. 3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 4. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86821
22、 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperatu
23、re range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PI
24、N listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance
25、 indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance.
26、A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA land and maritime -VA prior to listing as an approved source of supply shall affirm that the manufa
27、cturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of chang
28、e. Notification of change to DLA land and maritime-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA land and maritime, DLA land and maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable requir
29、ed documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86821 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 RE
30、VISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TC+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max High level output voltage VOHVIN= VIHor VILIOH= -20 A VCC= 2.0 V 1, 2, 3 All 1.9 V VCC= 4.
31、5 V 4.4 VCC= 6.0 V 5.9 VIN= VIHor VILIOH= -4.0 mA VCC= 4.5 V 3.7 VIN= VIHor VILIOH= -5.2 mA VCC= 6.0 V 5.2 Low level output voltage VOLVIN= VIHor VILIOL= +20 A VCC= 2.0 V 1, 2, 3 All 0.1 V VCC= 4.5 V 0.1 VCC= 6.0 V 0.1 VIN= VIHor VILIOL= +4.0 mA VCC= 4.5 V 0.4 VIN= VIHor VILIOL= +5.2 mA VCC= 6.0 V 0
32、.4 High level input voltage 2/ VIHVCC= 2.0 V 1, 2, 3 All 1.5 V VCC= 4.5 V 3.15 VCC= 6.0 V 4.2 Low level input voltage 2/ VILVCC= 2.0 V 1, 2, 3 All 0.3 V VCC= 4.5 V 0.9 VCC= 6.0 V 1.2 Quiescent supply current ICCVCC= 6.0 V, VIN= VCCor GND 1, 2, 3 All 160 A Input leakage current IINVCC= 6.0 V, VIN= VC
33、Cor GND 1, 2, 3 All 1.0 A Input capacitance CINVIN= 0.0 V, TC= 25C See 4.3.1c 4 All 10.0 pF Functional tests See 4.3.1d 7 All L H Propagation delay time, input A to output Y 3/ tPHL, tPLHTC= 25C CL= 50 pF 10% See figure 4 VCC= 2.0 V 9 All 150 ns VCC= 4.5 V 30 VCC= 6.0 V 26 TC= -55C, +125C CL= 50 pF
34、10% See figure 4 VCC= 2.0 V 10, 11 All 225 ns VCC= 4.5 V 45 VCC= 6.0 V 38 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86821 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 R
35、EVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TC+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Transition time 4/ tTHL, tTLHTC= 25C CL= 50 pF 10% See figure 4 VCC= 2.0 V 9 Al
36、l 75 ns VCC= 4.5 V 15 VCC= 6.0 V 13 TC= -55C, +125C CL= 50 pF 10% See figure 4 VCC= 2.0 V 10, 11 All 110 ns VCC= 4.5 V 22 VCC= 6.0 V 19 1/ For a power supply of 5.0 V 10%, the worst case output voltages (VOHand VOL) occur for HC at 4.5 V. Thus, the 4.5 V values should be used when designing with thi
37、s supply. Worst case VIHand VILoccur at VCC= 5.5 V and 4.5 V, respectively. (The VIHvalue at 5.5 V is 3.85 V). The worst case leakage currents (IINand ICC) occur for CMOS at the higher voltage and so the 6.0 V values should be used. Power dissipation capacitance (CPD), typically 40 pF, determines th
38、e no load dynamic power consumption, PD= CPDVCC2f + ICCVCC, and the no load dynamic current consumption, IS= CPDVCCf + ICC. 2/ Tests not required if applied as a forcing function for VOHand VOL. 3/ AC testing at VCC= 2.0 V and VCC= 6.0 V shall be guaranteed, if not tested, to the specified limits. 4
39、/ Transition times, if not tested, shall be guaranteed to the specified limits. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86821 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 D
40、SCC FORM 2234 APR 97 Device type 01 Case outlines E and F 2 Terminal number Terminal symbol Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 Y0 Y1 Y2 Y3 Y4 Y5 Y6 GND Y7 Y8 Y9 A3 A2 A1 A0 VCC- - - - NC Y0 Y1 Y2 Y3 NC Y4 Y5 Y6 GND NC Y7 Y8 Y9 A3 NC A2 A1 A0 VCCNC = No internal connec
41、tion FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86821 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Inputs Outputs A3 A2 A
42、1 A0 Y0 Y1 Y2 Y3 Y4 Y5 Y6 Y7 Y8 Y9 L L L L L H H H H H H H H H L L L H H L H H H H H H H H L L H L H H L H H H H H H H L L H H H H H L H H H H H H L H L L H H H H L H H H H H L H L H H H H H H L H H H H L H H L H H H H H H L H H H L H H H H H H H H H H L H H H L L L H H H H H H H H L H H L L H H H H
43、 H H H H H H L H L H L H H H H H H H H H H H L H H H H H H H H H H H H H H L L H H H H H H H H H H H H L H H H H H H H H H H H H H H L H H H H H H H H H H H H H H H H H H H H H H H H H = High voltage level L = Low voltage level FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or n
44、etworking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86821 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without licens
45、e from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86821 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 10 DSCC FORM 2234 APR 97 NOTES: 1. CLincludes test jig and probe capacitance. 2. Input signal from pulse generator: PRR 1 MHz; ZO= 50; tr= 6.0 ns; tf= 6.0 ns; trand t
46、fshall be measured from 0.1 VCCto 0.9 VCCand from 0.9 VCCto 0.1 VCC, respectively; duty cycle = 50 percent. 3. The outputs are measured one at a time with one transition per measurement. FIGURE 4. Switching waveforms and test circuit. Provided by IHSNot for ResaleNo reproduction or networking permit
47、ted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86821 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 11 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
48、appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under
