欢迎来到麦多课文档分享! | 帮助中心 海量文档,免费浏览,给你所需,享你所想!
麦多课文档分享
全部分类
  • 标准规范>
  • 教学课件>
  • 考试资料>
  • 办公文档>
  • 学术论文>
  • 行业资料>
  • 易语言源码>
  • ImageVerifierCode 换一换
    首页 麦多课文档分享 > 资源分类 > PDF文档下载
    分享到微信 分享到微博 分享到QQ空间

    DLA SMD-5962-79024 REV D-2011 MICROCIRCUITS MEMORY DIGITAL 8192 BIT SWITCHABLE SCHOTTKY BIPOLAR PROM WITH TRI-STATE OUTPUT MONOLITHIC SILICON.pdf

    • 资源ID:698638       资源大小:71.69KB        全文页数:11页
    • 资源格式: PDF        下载积分:10000积分
    快捷下载 游客一键下载
    账号登录下载
    微信登录下载
    二维码
    微信扫一扫登录
    下载资源需要10000积分(如需开发票,请勿充值!)
    邮箱/手机:
    温馨提示:
    如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
    如需开发票,请勿充值!如填写123,账号就是123,密码也是123。
    支付方式: 支付宝扫码支付    微信扫码支付   
    验证码:   换一换

    加入VIP,交流精品资源
     
    账号:
    密码:
    验证码:   换一换
      忘记密码?
        
    友情提示
    2、PDF文件下载后,可能会被浏览器默认打开,此种情况可以点击浏览器菜单,保存网页到桌面,就可以正常下载了。
    3、本站不支持迅雷下载,请使用电脑自带的IE浏览器,或者360浏览器、谷歌浏览器下载即可。
    4、本站资源下载后的文档和图纸-无水印,预览文档经过压缩,下载后原文更清晰。
    5、试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。

    DLA SMD-5962-79024 REV D-2011 MICROCIRCUITS MEMORY DIGITAL 8192 BIT SWITCHABLE SCHOTTKY BIPOLAR PROM WITH TRI-STATE OUTPUT MONOLITHIC SILICON.pdf

    1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change to military drawing format. Change from a suggested source drawing to an approved source drawing. Add CAGE 34335 and device type 02. Add case outline letters K, L, X, and 3. Change drawing CAGE to 67268. 88-01-15 M. A. Frye B Updated boile

    2、rplate. Removed programming specifics from drawing. Separated source bulletin from body of drawing. - glg 00-08-01 Raymond Monnin C Correction to marking paragraph 3.5, updated boilerplate paragraphs. ksr 05-03-02 Raymond Monnin D Boilerplate update, part of 5 year review. ksr 11-01-20 Charles F. Sa

    3、ffleTHE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. CURRENT CAGE CODE 67268 REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY A. J. Foley DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIR

    4、CUIT DRAWING CHECKED BY C. R. Jackson THIS DRAWING IS AVAILABLE FOR USE BY All DEPARTMENTS APPROVED BY N. A. Hauck MICROCIRCUITS, MEMORY, DIGITAL, 8192 BIT, SWITCHABLE, SCHOTTKY, BIPOLAR PROM WITH TRI-STATE OUTPUT, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 13

    5、 August 1979 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 1493379024 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E164-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 79024 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-

    6、3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN shall be as shown in

    7、the following example: 79024 01 J A | | | | | | | | | | | | Drawing number Device type Case outline Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows: Device type Generic number Circuit Access time 01 1/ 1K x 8-bit

    8、 power switched bipolar PROM 90 ns 02 1/ 1K x 8-bit power switched bipolar PROM 75 ns 1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835, and as follows: Outline letter Descriptive designator Terminals Package style J GDIP1-T24 or CDIP2-T24 24 dual-in-line package K GD

    9、FP2-F24 or CDFP3-F24 24 flat package L GDIP3-T24 or CDIP4-T24 24 dual-in-line package X CQCC1-N32 32 rectangular chip carrier package 3 CQCC1-N28 28 square leadless chip carrier package 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Sup

    10、ply voltage range . -0.5 V dc to +7.0 V dc Address/enable Input voltages . -0.5 V dc to +5.5 V dc Address/enable Input current -30 mA dc to +5.5 mA dc Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835

    11、 1.4 Recommended operating conditions. Case operating temperature range (TC) . -55C to +125C Supply voltage range (VCC) 4.5 V dc to 5.5 V dc 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards and handbooks form a part of this drawin

    12、g to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. 1/ Generic numbers are listed on the Standard Microcircuit Drawing Source Approval Bulletin at the end of this document and will also be listed in MIL-HDBK-103

    13、. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 79024 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated

    14、 Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK

    15、-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between t

    16、he text of this drawing and the references cited herein, the text of this drawing shall take precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements The individual item requirements

    17、 shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certific

    18、ation to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. Thes

    19、e modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as

    20、specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.2 Unprogrammed devices. Testing to the applicable truth table, or alternate testing as specified in 4.3.1d, shall be used for unprogrammed devices for contra

    21、cts involving no altered item drawing. When testing is required per 4.3 herein, the devices shall be programmed by the manufacturer prior to test in a checkerboard pattern (a minimum of 50 percent of the total number of bits programmed) or to any altered item drawing pattern which includes at least

    22、25 percent of the total number of bits programmed. 3.2.3 Programmed devices. The truth table for programmed devices shall be specified by an altered item drawing. 3.2.4 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless other

    23、wise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each

    24、 subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. Provided by IHSNot for ResaleNo reproduction or networking permitted with

    25、out license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 79024 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test | | Conditions | Group A |Device | Limits | | Symbol | -55C TC +125C |subgroups | t

    26、ype | |Unit | | 4.5 V VCC 5.5 V | | | Min | Max | | | unless otherwise specified | | | | | | | | | | | | High level output voltage |VOH|VIL= 0.8 V, VIH= 2.0 V | 1, 2, 3 | All | 2.4 | | V | |IOH= -2.0 mA, VCC= 4.5 V | | | | | | | | | | | | | | | | | | | Low level output voltage |VOL|VIL= 0.8 V, VIH=

    27、2.0 V | 1, 2, 3 | All | | 0.5 | V | |IOL= 16 mA, VCC= 4.5 V | | | | | | | | | | | | | | | | | | | Low level input voltage |VIL| VCC= 5.5 V | 1, 2, 3 | All | | 0.8 | V | | | | | | Input clamp voltage |VIC|VCC= 4.5 V, IIN= -18 mA, | 1, 2, 3 | All | | 0.8 | V | |Ambient temperature = 25C | | | | | | |

    28、| | | | | Input threshold voltage |VIH| VCC= 4.5 V | 1, 2, 3 | All | 2.0 | | V | | | | | | | | | | | | | Address/enable input |IIH|VIH= 5.5 V | 1, 2, 3 | All | | 40 | A | | | | | | | | | | | | | | Address/enable input |IIL|VIN= 0.45 V | 1, 2, 3 | All |-1.0 | -250 | A | | | | | | Output short-circuit

    29、 | | | | | | | current 1/ 2/ |IOS|VOUT= 0.2 V 1/ | 1, 2, 3 | All |-12 |-100 | mA | | | | | | | | | | | | | | Output disable current |IOHE|VCC= 5.5 V, VOUT= 2.4 V | 1, 2, 3 | All | | 40 | A | | | | | | | | | | | | | | Output disable current |IOLE|VOL= 0.45 V, VOUT= 5.5 V 2/ | 1, 2, 3 | All | | -40 |

    30、A | | | | | | | Supply current |ICC|VCC= 5.5 V Disabled | 1, 2, 3 | All | | 80 | mA | | | | | | | | |All inputs grounded Enabled | | | | 185 | | | | | | | | Input capacitance |CIN|VIN= 2.0 V dc; f = 1 MHz | 4 | All | | 8 | pF |Ambient temperature = 25C | | | | | | | | | | | | Address access time |tA

    31、VQV|See figure 2 and 3 | 9, 10, 11 | 01 | | 90 | ns | | | | 02 | | 75 | | | | | | | | | | | | | | | Chip power-down delay |tGVQZ|See figure 2 and 3 | 9, 10, 11 | All | | 50 | ns to tri-state | | | | | | | | | | | | | | | | | | | | | Chip power-up access |tGVQV|See figure 2 and 3 | 9, 10, 11 | 01 | |

    32、 115 | ns time | | | | 02 | | 225 | | | | | | | | 1/ Not more than one output shall be shorted at a time for a maximum duration of one second. 2/ Device is in the three state. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAW

    33、ING SIZE A 79024 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 3.5.1 Certification/compliance mark. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, Appendix A. 3.6 Certificate of compliance. A certificate of complia

    34、nce shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the

    35、 requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change

    36、 to DLA Land and Maritime-VA shall be required for any change that affects this drawing 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore d

    37、ocumentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shal

    38、l be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test (method 1015 of MIL-STD-883). (1) Test condition C, D or E. The test circuit shall be maintained by the manufacturer under document revision level control and shall b

    39、e made available to the preparing or procuring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test

    40、parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including grou

    41、ps A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (CINmeasurement) shall be measured only for the initi

    42、al test and after process or design changes which may affect input capacitance. d. Unprogrammed devices shall be tested for programmability and ac performance compliance to the requirements of group A, subgroups 9. 10, and 11. Either of two techniques is acceptable: (1) Testing the entire lot using

    43、additional built-in test circuitry which allows the manufacturer to verify programmability and ac performance without programming the user array. If this is done, the resulting test patterns shall be verified on all devices during subgroups 9, 10, and 11, group A testing per the sampling plan specif

    44、ied in MIL-STD-883, method 5005. (2) If such compliance cannot be tested on an unprogrammed device, a sample shall be selected to satisfy programmability requirements prior to performing subgroups 9, 10, and 11. Twelve devices shall be submitted to programming. If more than 2 devices fail to program

    45、, the lot shall be rejected. At the manufacturers option, the sample may be increased to 24 total devices with no more than 4 total device failures allowable. Ten devices from the programmability sample shall be submitted to the requirements of group A, subgroups 9, 10, and 11. If more than 2 total

    46、devices fail, the lot shall be rejected. At the manufacturers option, the sample may be increased to 20 total devices with no more than 4 total device failures allowable. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING S

    47、IZE A 79024 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 Device Types All Case Outlines J, K, L X 3 Terminal Number Terminal Symbol Terminal Symbol Terminal Symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 A7 A6 A5 A4 A3 A2 A1 A0 Q0 Q1 Q2 VSS Q3 Q4 Q5 Q6 Q7 E4 E3 E2 E1 A9 A8 VCC - - - - - - - - - - - - - - - - - - - - - - - - NC NC A7 A6 A5 A4 A3 A2 A1 A0 NC Q0 Q1 Q2 NC VSS Q3 NC Q4 Q5 Q6 Q7 NC E4 E3 E2 NC E1 A9 A8 NC V


    注意事项

    本文(DLA SMD-5962-79024 REV D-2011 MICROCIRCUITS MEMORY DIGITAL 8192 BIT SWITCHABLE SCHOTTKY BIPOLAR PROM WITH TRI-STATE OUTPUT MONOLITHIC SILICON.pdf)为本站会员(registerpick115)主动上传,麦多课文档分享仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文档分享(点击联系客服),我们立即给予删除!




    关于我们 - 网站声明 - 网站地图 - 资源地图 - 友情链接 - 网站客服 - 联系我们

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1 

    收起
    展开