1、m 9999996 0323049 97b 7-5)- I3 LT R DE8CRIPTlON DATE APPROVED Prepared in accordance with MIL-STD-100 Selected item drawing -1 6-IZ-m e. ru D 4k-e 12.E9A 8IZf C-ODE IDENI * NO. A 14933 Original date of drawing I3 June 1979 MICROCIRCUITS, DIGITAL, CMOS 1 of 8 DECODER, MONOLITHIC SIL1 CON OW “O* 79019
2、 BffEWSE ELECTRlCt SUIL1 CfTEl - IAYTBI, W“ , TITLE REV PA I OF IO I 5962-El95 OESC FOU 144 MAR 7b Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-, UtFENSE tlEGINICS SIIIlV CEMIEIL IATlH, 9110 1. SCOPE 1.1 Scope. This drawing describes the requireme
3、nts for monolithic silicon, CMOS, 1 of 8 ecoder microcircuits. This drawing provides for a level of microcircuit quality and reliab ssurance for procurement of microcircuits in accordance with MIL-M-38510. 1.2 Part number. The complete part number shall be as shown in the following exaniple: SIZE CO
4、DE IOENT. NO. OW0 NO. A 18933 79019 REV PAE 2 - rir XLLL ing num er (1.2.1) (1.2.2) (3.3) 7901 9 I Case outline Lead finish (1.2.1) (1.2.2) (3.3) T f i 1.2.1 Device type. The device type shall identify the circuit function as follows: Device type Generic number Circuit o1 i a530 1 of 8 decoder 1.2.2
5、 Case outline. The case outline shall be as designated in MIL-M-38510, append :o1 1 ows : OutTinP letter Cose outliz I_ -.-. E D-2 (16-pin, 1/4“ x 7/8“ dual-in-line) 1.3 1.4 Absolute maximum ratings. Supply voltage range- - - - - - - - - - - - - - - - - Input voltage range - - - - - - - - - - - - -
6、- - - - Storage temperature range - - - - - - - - - - - - - - Maximum power dissipation, P 1/- - - - - - - - - - - Lead temperature (soldering 10 seconds) - - - - - - - Thermal resistance, junction to case - - - - - - - - Junction temperature- - - - - - - - - - - - - - - - - Recommended operating co
7、nditions. D- Supply voltage- - - - - - - - - - - - - - - - - Ambient operating temperature range - - - - - - - - - - 1/ Must withstand the added PD due - 2/ For TA = +lo0 to +125OC, derate -0.5 Vdc to +15 Vdc -0.5 to VDD +0.5 Vdc -65OC to +150C 500 mWdc g/ +3OO0C QJc = O.OB0C/mW for dua TJ = +175OC
8、+3.0 Vdc to +15 Vdc -55OC to +125OC o short circuit test (e.g. Ias). inearly at 12 mW/OC to 200 mu. lity x C and as -in-1 ine Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-2. APPLICABLE DOCLMENTS 2.1 Issues of docunents. The following docunents, of
9、 the issue in effect on date of invitation for bids or request for proposal, form a part of this drawing to the extent specified herein. SPEC IF ICATION MILITARY MIL-M-38510 - Microcircuits, General Specification for. STANDARD MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics.
10、(Copies of specifications, standards, drawings, and publications required by suppliers in connec- tion with specific procurement functions should be obtained from the procuring activity or as directed by the contracting officer.) 3. REQUIREMENTS DEFENSE ELECTRONICS SU?PLY CENTER BATOll, OHIO 3.1 Ite
11、m requirements. The individual item requirements shall be in accordance with MIL-M-38510, and as specified herein. A 11933 79019 I I REV IPAOE 3 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-M-38510 and herein. 3.2.1
12、 Design docunentation. The design docunentation shall be in accordance with MIL-M-38510 and, unless otherwise specified in the contract or purchase order, shall be retained by the manu- facturer but be available for review by the procuring activity or sontractor upon request. 3.2.2 Terminal connecti
13、ons. The terminal connections shall be as specified on figure 1. 3.2.3. Truth table. The truth table shall be as specified on figure 2. 3.2.4 Case outlines. The case outlines shall be in accordance with 1.2.2. 3.3 Lead material and finish. Lead material and finish shall be in accordance with MIL-M-3
14、8510. 3.4 Electrical performance characteristics. The electrlcal performance characteristics are as specified in table I and apply over the full recmended ambient operating temperature range, un- less otherwise specified. 3.5 Marking. Marking shall be in accordance with MIL-M-38510 except the part n
15、unber shall be in accordance with 1.2 herein. The M385lO/XXX part nunber, and the “JAN“ or “J“ mark shall not be used. subjected to, and passed all the requirements, tests, and inspections detailed herein incl ding screening, and quality conformance inspection requirements. 3.6 Product assurance req
16、uirements. Microcircuits furnished under this drawing shall have been I SIZE I CODE IDENT. NO. DWB NO. I I I DESC FORM 144A YAR 16 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-m 9999996 0323052 4b0 m SIZE A CODE IOENT. NO. DWO NO. 11933 6 TABLE I.
17、 Electrical characteristics. Group A bubgroups Limits 3ymbol Test hits V V - mA High- 1 evel out put vol tage “OH - %L DOPsV VIN = O or VDD DD - 15 v s 2, 3 DD5 VIN - VDD or O DD = 15 v s 2, 3 Low-1 evel output vol tage IDN Vo = 0.4 V Vtn = VDD or O 2, 3 Output drive current N channel (sink) DD = 10
18、 v Vo - 0.5 V Vin = VDo or O 2.65 oo=5v Vo = 4.6 V Vin = VDD or O 2, 3 -1.2 - -2.6E Output drive current P channel (source) IDP IIL IIH mA IDD = 10 v v0 = 9.5 v VIN - VDo or O IDD - 15 V * 2, 3 s 2, 3 Input 1 eakage current Qui escent current IDD IDO - 10 v VIN = o, 10 v 79019 DESC FORM 144A MAR 74
19、Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-= 9999996 0123053 3T7 = I TABLE I. Electrical characteristics - Continued. - Units ns - - ns Symbol Limits Conditions Test Propagation delay time, low to high level, clock enable to output Min tPLH DD5“
20、 = 50 pF 210% = 200 kn TA = 25OC 9 300 - 450 TA -55OC, 125OC 10, 11 Propagation delay time, high to low level, clock enable to output t 9 275 413 - - 300 ns ns - - ns ns - ns ns 7 - ns ns - - ns TA = 25OC TA = -55OC. 125OC 10, 11 Propagation delay time, low to high level, N to output t 9 TA = 25C TA
21、 4 50 10, 11 z Propagation del ay time, high to low level, N to output TA 25OC 9 400 600 - - 330 495 - PHL 10, 11 Propagation delay time, clock A to output t t TA = 25OC 9 10, 11- TA = -55OC. 125OC T, = 25Y 9 31 5 Propagation delay time, clock B to output 10, 11 4 73 - SIZE I CODE IDENT. NO. DWO NO.
22、 DfftWSE ELECTRONICS SUPPLY CENTER DAYTON, ewio A I 14933 I 1 79019 I REV I PAGE 5 I I DESC FORM 144A MAR 76 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-9999996 0323054 233 -_. BtfENtE ELECTRONICS SUIPLI CtWTEP BAYTOW, OYII 8 4 9 6 f O OUT t OUT
23、n SIZE CODE IDLNT. NO. OW8 NO. A 14933 79019 . REV PAQE 6 NE CE OUT II OUT OUT o OUT FIGURE 1. Terminal connections (top view TRUTH TABLE I I l O0 O I 0000 L O 01 I I 0100 I ,ololo lo I Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-3.6.1 1.3 herein
24、do percent final electrical screening for off the shelf devices shall consist of the normal 100 percent DC tests at 25OC with 10 percent PDA, high and low temperature DC tests, and 15OC AC tests followed by normal sampling and LTPDs at group A lot acceptance. Screenin . Screening shall be in accorda
25、nce with method 5004, class B, of MIL-STD-883 and 3.6.2 Qualification. Qualification inspection shall not be required. ty conformance inspection. Quality conformance inspection shall be in accordance O and 4.4 herein. 3.7 Manufacturer eligibility. To be eligible to supply microcircuits to this drawi
26、ng, a manu- facturer must have manufacturer certification in accordance with MIL-M-38510 for at least one line and have PART I listing on Qualified Products List QPL-38510 for at least one device type (not necessarily the one for which the procurement of this drawing is to apply). 4. PRODUCT ASSURAN
27、CE PROVISIONS 4.1 4.2 Qualification inspection. Qualification inspection to this device type shall not be required 4.3 Screenin . Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-M-38510 and method 5005 of MIL-STD-883, except as modified herein. Screening s
28、hall be in accordance with method 5004 of MIL-STO-883, and shall be conducteddevices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test (method 1015 of MIL-STD-883). (1) Test condition A, D or E, each circuit must be driven with an appropriate sig
29、nal to simulate circuit applications and each circuit shall have maximum load applied. (2) TA = 125C minimum. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test prior to burn-in is optional at the discretion of the manufacturer.
30、Percent defective allowable (PDA) - The PDA is specified as 10 percent based on failures from group A, subgroup 1, test after cooldown as final electrical test in accordance with method 5004 of MIL-STD-883, and with no intervening electrical measurements. If interim electrical parameter tests are pe
31、rformed prior to burn-in, failures resulting from pre burn-in screening may be excluded from the PDA. If interim electrical param- eter tests prior to burn-in are anitted, then all screening failures shall be included in the PDA. the total number of devices submitted for burn-in in that lot shall be
32、 used to determine the percent defective for the lot. MIL-M-38510. Groups A and B inspections shall be performed on each lot. Quality assurance shall keep lot records for 3 years (minimum), monitor for compliance to the prescribed procedures, and observe that satisfactory manufacturing conditions an
33、d records on lots are maintained for these devices. The records, including as a minimum an attributes sunary of all screening and quality conformance inspections conducted on each lot, shall be available for review by the customer at all times. 4.4.1 values shown in table I of method 5005 of MIL-STD
34、-883 (class B) and as follows: b. c. The verified failcres of group k, sbgroiip 1, after burn-in divided by 4.4 Quality conformance inspection. Quality conformance inspection shall be in accordance with Group A inspection. a. Tests shall be as specified in table II. b. c. Group A inspection shall co
35、nsist of the test subgroups and LTPD Subgroups 4, 5, 6, and 8 of table I of method 5005 of MIL-STD-883 shall be omitted. Subgroup 7 tests sufficient to verify the truth table. DEfEWSE ELECTROWICS SUPPLY CEWTER BAYTON, onie SIZE CODE IDENT- NO. OW0 NO. A 14933 79019 REV I PAOE 7 I I I DEIC CORM 1b(A
36、MAR 7b Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 4.4.2 Group B inspect. 4.4.3 Group C and group D inspection. In group B inspection, each inspection lot shall be subjected to the Group C and group D inspections shall be as specified in est sub
37、groups and LTPD values shown in table IIb of method 5005 of MIL-STD-883, class B. ethod 5005 of MIL-STD-883, class B. ance with MIL-M-38510. nd group D inspection. The frequency of testing and the sample size shall be in accor- Generic test data 16.5) may be used to satisfy the requirements for grou
38、p C a. b. End point electrical parameters shall be as specified in table li. Operating life test (method 1005 of MIL-STD-883) conditions: (1) (2) TA = 125C. minimum. (3) Test duration: 1,000 hours. Subgroups 3 and 4 shall be added to the group C inspection requirements and shall Test condition D or
39、E, each circuit must be driven with an appropriate signal to simulate circuit applications and each circuit shall have maximum load applied. c. consist of the tests, conditions, and limits specified for subgroups 10 and 11 be in Interim electrical parameters Final electrical test parameters Group A
40、test requirements Groups C and D end point (pre burn-in) (method 5004, 3.1.9) (method 5004, 3.1.15) - (method 5005) el ect r i cal parameters (met hod 5005) groups for group C periodic inspections Additional electrical sub- of group A. 1 - 1*, 2, 3, 9 1, 2, 3, 7, 9 1, 2, 3 10, 11 4.5 3. Inspection o
41、f preparation for delivery shal ccordance with MIL-M-38510 , except that the rough handling test shall not apply. 9lZE CODE IOENT. NO. DEENSf fLICT0NlCS SWLY CENTER A 11933 TABLE II. Electrical test requirements. OW8 NO. 79019 IL-STD-883 test requirements I Subgroups lJ PDA applies to subgroup 1 (se
42、e 4.3). - 1/ Subgroups per method 5005, Table I. 5. PACKAGING 5.1 Packaqing requirements. The requirements for packaging shall be in accordance with 1 I L-M-3851 O 6. NOTES 6.1 Notes. Only 6.4 of the notes specified in MIL-M-38510 shall apply to this drawing. Provided by IHSNot for ResaleNo reproduc
43、tion or networking permitted without license from IHS-,-,-b 0323057 T42 DEFENSE riECTRONiCS SlP?LY CENTER QAYTOII, owie 6.2 Intended use. Microcircuits conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the requi
44、red function are not available for OEM application. eration of unnecessary duplicate specifications, drawings and stock catalog listings. military specification exists and the product covered by this drawing has been qualified for listing on PL-38510 this drawing becanes obsolete and will not be use
45、d for new design. lhe QPL-38510 projuct shali be the preferred item for all applications. This drawing is intended exclusively to prevent the prolif- When a SIZE CODE IOENT- NO. DW6 NO- A 14933 79019 REV PIO 9 6.3 Ordering data. The contract or order should specify the following: a. b. c. Requireiii
46、cnt for certificate of compliance, if applicable. ci. e. f. Requirements for carrier, special lead lengths or lead forming, if applicable. These Complete part number (see 1.2). Requirements for delivery of one copy of the quality conformance inspection data pertinent to the device inspection lot to
47、be supplied with each shipment by the device manufacturer, if applicable. Hequireiiients for notification of change of product or process to procuring activity, if applicable. Requirements for packaging and packing. requirements shall not affect the part nwnber. requirements will not apply to direct
48、 shipment to the Government. Unless otherwise specified, these 6.4 Replaceability. Replaceability is determined as follows: a. b. Microcircuits covered by this drawing will replace the sanie generic device covered When Military Specification MIL-M-38510/474 is issued, the part numbered devices by co
49、ntractor prepared specification or drawing. specified in this drawing will be replaced by the microcircuit identified as part number M38510/47401B-. 6.5 Generic test data. Generic test data may be used to satisfy the requirements of 4.4.3. Generic test data is defined as test data from devices manufactured during the same time period, by means of the same productio
