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    DLA SMD-5962-77048 REV G-2011 MICROCIRCUIT DIGITAL CMOS DUAL BINARY TO 1-OF-4 DECODER DEMULTIPLEXER MONOLITHIC SILICON.pdf

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    DLA SMD-5962-77048 REV G-2011 MICROCIRCUIT DIGITAL CMOS DUAL BINARY TO 1-OF-4 DECODER DEMULTIPLEXER MONOLITHIC SILICON.pdf

    1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED D Convert to military drawing format. Change drawing CAGE to 67268. Add vendor CAGE 34371. Delete vendor CAGE 31019. Technical and editorial changes throughout. mbk 91-04-12 Michael A. Frye E Update boilerplate to MIL-PRF-38535 requirements. - jak

    2、01-06-25 Thomas M. Hess F Made change to paragraph 3.5. Update boilerplate to MIL-PRF-38535 requirements. - LTG 05-02-09 Thomas M. Hess G Correct output current condition IOfor tests VOHand VOLin table I. Change boilerplate to current MIL-PRF-38535 requirements jak. 11-07-21 Thomas M. Hess CURRENT C

    3、AGE CODE 67268 REV SHEET REV SHEET REV STATUS REV G G G G G G G G G G G OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY A. J. Foley DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 https:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY C. R. Jackson THIS DRAWING IS

    4、AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Nelson A. Hauck MICROCIRCUIT, DIGITAL, CMOS, DUAL BINARY TO 1-OF-4 DECODER/ DEMULTIPLEXER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 77-10-18 AMSC N/A REVISION LEVEL G SIZE A CAGE CODE 14933 77048 SHEET 1 OF 11

    5、 DSCC FORM 2233 APR 97 5962-E447-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 77048 REVISION LEVEL G SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This dra

    6、wing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 77048 01 E A Drawing number Device type (see 1.2.1) Case outlin

    7、e(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 4556B Dual binary to 1-to-4 decoder/demultiplexer 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as f

    8、ollows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat pack 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range (VDD) -0.5 V dc to

    9、+20.0 V dc 1/ Input voltage range -0.5 V dc to VDD+ 0.5 V dc DC input current (any one input) 10 mA Storage temperature range (TSTG) . -65C to +150C Maximum power dissipation (PD) 500 mW 2/ Lead temperature (soldering, 10 seconds) +265C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Ju

    10、nction temperature (TJ) . +175C 1.4 Recommended operating conditions. Supply voltage range (VDD) +3.0 V dc to +18.0 V dc Case operating temperature range (TC) . -55C to +125C 1/ Supply voltages are referenced to VSSterminal. 2/ For TC= +100C to +125C, derate linearly at 12 mW/C to 200 mW. Provided b

    11、y IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 77048 REVISION LEVEL G SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handb

    12、ooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits,

    13、Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Stan

    14、dard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text

    15、of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in

    16、 accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL

    17、-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modificati

    18、ons shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions.

    19、 The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table

    20、. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 4. Provided by IHSNot for ResaleNo reproduction or netwo

    21、rking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 77048 REVISION LEVEL G SHEET 4 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteris

    22、tics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shal

    23、l be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-

    24、JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be requi

    25、red from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 and QML-38535 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-

    26、PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Mari

    27、time-VA shall be required in accordance with MIL-PRF-38535, appendix A. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation s

    28、hall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 77048 REVISION LEVEL G SHEET 5 DSCC FORM 2234 APR 97 TA

    29、BLE I. Electrical performance characteristics. Test Symbol Test conditions -55C TC +125C unless otherwise specified Group A subgroups Limits Unit Min Max Quiescent supply Current IDDVDD= 5.0 V 1/ VIN= 0.0 V or VDD1, 3 5.0 A 2 150.0 VDD= 10.0 V 1/ VIN= 0.0 V or VDD1, 3 10.0 2 300.0 VDD= 15.0 V 1/ VIN

    30、= 0.0 V or VDD1, 3 20.0 2 600.0 VDD= 20.0 V 2/ VIN= 0.0 V or VDD1, 3 100.0 2 3.0 mA Low-level output VOLVIN= 0.0 V or VDDIOL= +1.0 A VDD= 5.0 V 1/ 1, 2, 3 0.05 V Voltage VDD= 10.0 V 1/ 1, 2, 3 0.05 VDD= 15.0 V 1, 2, 3 0.05 High-level output VOHVIN= 0.0 V or VDDIOH= -1.0 A VDD= 5.0 V 1/ 1, 2, 3 4.95

    31、V Voltage VDD= 10.0 V 1/ 1, 2, 3 9.95 DD= 15.0 V 1, 2, 3 14.95 Low-level input Voltage VILVDD= 5.0 V VO= 0.5 V or 4.5 V 1, 2, 3 1.5 V VDD= 10.0 V VO= 1.0 V or 9.0 V 1/ 1, 2, 3 3.0 VDD= 15.0 V VO= 1.5 V or 13.5 V 1, 2, 3 4.0 High-level input Voltage VIHVDD= 5.0 V VO= 0.5 V or 4.5 V 1, 2, 3 3.5 V VDD=

    32、 10.0 V VO= 1.0 V or 9.0 V 1/ 1, 2, 3 7.0 VDD= 15.0 V VO= 1.5 V or 13.5 V 1, 2, 3 11.0 Low-level output Current IOLVDD= 5.0 V 3/ VO= 0.4 V VIN= 0.0 V or VDD1 0.51 mA 2 0.36 3 0.64 VDD= 10.0 V 1/ VO= 0.5 V VIN= 0.0 V or VDD1 1.3 2 0.9 3 1.6 VDD= 15.0 V 1/ VO= 1.5 V VIN= 0.0 V or VDD1 3.4 2 2.4 3 4.2

    33、See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 77048 REVISION LEVEL G SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance c

    34、haracteristics - Continued. Test Symbol Test conditions -55C TC +125C unless otherwise specified Group A subgroups Limits Unit Min Max High-level output Current IOHVDD= 5.0 V 3/ VO= 4.6 V VIN= 0.0 V or VDD1 -0.51 mA 2 -0.36 3 -0.64 VDD= 5.0 V 3/ VO= 2.5 V VIN= 0.0 V or VDD1 -1.6 2 -1.15 3 -2.0 VDD=

    35、10.0 V 1/ VO= 9.5 V VIN= 0.0 V or VDD1 -1.3 2 -0.9 3 -1.60 VDD= 15.0 V 1/ VO= 13.5 V VIN= 0.0 V or VDD1 -3.4 2 -2.4 3 -4.2 Input current IINVDD= 18.0 V 2/ VIN= 0.0 V or VDD1, 3 0.1 A 2 1.0 Input capacitance CINVIN= 0.0 V , See 4.3.1c 4 7.5 pF Functional test See 4.3.1d 7, 8 Transition time tTHL, tTL

    36、HRL= 200 k CL= 50 pF tr= tf= 20 ns See figure 4 VDD= 5.0 V 9 1.5 200 ns 10, 11 1.5 300 VDD= 10.0 V 1/ 9 1.5 100 10, 11 1.5 150 VDD= 15.0 V 1/ 9 1.5 80 10, 11 1.5 120 Propagation delay time, An to Qmnnullnullnullnullnullnull, Bn to QmnnullnullnullnullnullnulltPHL1, tPLH1RL= 200 k CL= 50 pF tr= tf= 20

    37、 ns See figure 4 VDD= 5.0 V 9 1.5 440 ns 10, 11 1.5 660 VDD= 10.0 V 1/ 9 1.5 190 10, 11 1.5 285 VDD= 15.0 V 1/ 9 1.5 140 10, 11 1.5 210 Propagation delay time, Ennullnullnullnullto QmnnullnullnullnullnullnulltPHL2, tPLH2RL= 200 k CL= 50 pF tr= tf= 20 ns See figure 4 VDD= 5.0 V 9 1.5 400 ns 10, 11 1.

    38、5 600 VDD= 10.0 V 1/ 9 1.5 170 10, 11 1.5 255 VDD= 15.0 V 1/ 9 1.5 130 10, 11 1.5 195 1/ This parameter is guaranteed, if not tested, to the limits specified in table I. 2/ This test is performed with VDD= 18 V at TC= -55C. 3/ The IOLand IOHtests are tested 100 percent at TC= +25C, and are guarantee

    39、d, if not tested, for TC= -55C and TC= +125C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 77048 REVISION LEVEL G SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Cas

    40、e outlines E and F Terminal number Terminal symbol 1 EAnullnullnullnull2 AA 3 BA 4 Q0Anullnullnullnullnullnull5 Q1Anullnullnullnullnullnull6 Q2Anullnullnullnullnullnull7 Q3Anullnullnullnullnullnull8 VSS9 Q3Bnullnullnullnullnullnull10 Q2Bnullnullnullnullnullnull11 Q1Bnullnullnullnullnullnull12 Q0Bnul

    41、lnullnullnullnullnull13 BB14 AB15 EBnullnullnullnull16 VDDPin descriptions Ennullnullnullnull(n = A or B) Enable inputs (active low) An (n = A or B) Data inputs Bn (n = A or B) Data inputs Qmnnullnullnullnullnullnull(m = 0 to 3) (n = A or B) Data outputs (inverted outputs) FIGURE 1. Terminal connect

    42、ions. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 77048 REVISION LEVEL G SHEET 8 DSCC FORM 2234 APR 97 Inputs Outputs EnnullnullnullnullSelects Bn An Q3nnullnull

    43、nullnullnullnullQ2nnullnullnullnullnullnullQ1nnullnullnullnullnullnullQ0nnullnullnullnullnullnullL L L H H H L L L H H H L H L H L H L H H L H H L H H H H X X H H H H H = High voltage level L = Low voltage level X = Irrelevant FIGURE 2. Truth table. NOTE: All inputs are protected by a CMOS protectio

    44、n network as shown above. FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 77048 REVISION LEVEL G SHEET 9 DSCC FORM 2234 APR 97 NOTES: 1. CL=

    45、 50 pF 5% (including wiring and probe capacitance) 2. RL= 200 k 5% 3. tr, tf= 20 ns. FIGURE 4. Switching waveforms and test circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43

    46、218-3990 SIZE A 77048 REVISION LEVEL G SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be c

    47、onducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be m

    48、ade available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be


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