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    DLA SMD-5962-00527 REV D-2008 MICROCIRCUIT HYBRID LINEAR 12-VOLT SINGLE CHANNEL DC-DC CONVERTER.pdf

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    DLA SMD-5962-00527 REV D-2008 MICROCIRCUIT HYBRID LINEAR 12-VOLT SINGLE CHANNEL DC-DC CONVERTER.pdf

    1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Correct paragraph 1.3, power dissipation. Table I, add note 5 to TTLINEand correct note 2. Correct paragraph 4.3.5.a. 01-02-07 Raymond Monnin B Update drawing. 05-12-01 Raymond Monnin C Add paragraph 1.5 and note 2. Table I, add note for enhanced

    2、 low dose rate effects. Paragraph 4.3.5.a, correct paragraph to add component tested dose rate. -sld 06-11-21 Raymond Monnin D Table I; Correct conditions for Output voltage (VOUT) from IOUT= 125 mA to IOUT= 63 mA. gc 08-10-14 Robert M. Heber REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D D

    3、D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Raymond Monnin MICROC

    4、IRCUIT, HYBRID, LINEAR, 12-VOLT, SINGLE CHANNEL, DC-DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 00-05-12 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-00527 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E009-09Provided by IHSNot for ResaleNo reproduction or networ

    5、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00527 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3

    6、and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 -

    7、00527 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-3853

    8、4 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 SLH2812S DC-DC converter, 1.5 W, +12 V output 1.2.3

    9、 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product

    10、assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices

    11、 are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conforman

    12、ce inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be revi

    13、ewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction

    14、 or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00527 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: O

    15、utline letter Descriptive designator Terminals Package style X See figure 1 7 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range -0.5 V dc to +50 V dc Power dissipation (PD): Device type 01 (non-RHA) 1.2 W Devi

    16、ce type 01 (RHA levels L and R) . 1.5 W Output power . 1.56 W Lead soldering temperature (10 seconds) +300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Input voltage range +16 V dc to +40 V dc Case operating temperature range (TC). -55C to +125C 1.5 Radiation featur

    17、es. Maximum total dose available (dose rate = 9 rad(Si)/s): Device type 01 (RHA levels L and R). 100 krad (Si) 2/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified

    18、herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MI

    19、L-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or h

    20、ttp:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affec

    21、t reliability. 2/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition C, tested at 9 rad(Si)/s.

    22、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00527 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a confli

    23、ct between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item perf

    24、ormance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device clas

    25、s. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the devic

    26、e for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal

    27、connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Elec

    28、trical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN li

    29、sted in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial qualit

    30、y conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made

    31、 available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers pro

    32、duct meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspect

    33、ion procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted with

    34、out license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00527 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28V dc 0.5V, CL= 0 Group A

    35、 subgroups Device type Limits Unit unless otherwise specified Min Max 1 11.88 12.12 Output voltage VOUT IOUT= 63 mA 2,3 01 11.52 12.48 V dc L, R 1,2,3 01 11.30 12.70 Output current IOUT VIN= 16 V dc to 40V dc 1,2,3 01 125 mA L, R 1,2,3 01 125 1 200 VOUTripple voltage VRIPIOUT= 125 mA, BW = 10 kHz to

    36、 2 MHz 2,3 01 300 mVp-p L, R 1,2,3 01 300 1 200 VOUTline regulation VRLINEIOUT= 125 mA, VIN =16V dc to 40V dc 2,3 01 400 mV L, R 1,2,3 01 500 VOUTload regulation VRLOADIOUT= 13 mA to 125 mA 1,2,3 01 700 mV L, R 1,2,3 01 900 Input current IINIOUT= 0 A Inhibit (pin 7) = 0 1,2,3 01 5 mA L, R 1,2,3 01 1

    37、7 1 14 IOUT= 0 A Inhibit (pin 7) = open 2,3 01 17 mA L, R 1,2,3 01 20 1 250 IINripple current IRIPIOUT= 125 mA, LIN = 6 H BW = 10 kHz to 10 MHz 2,3 01 300 mAp-p L,R 1,2,3 01 400 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from I

    38、HS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00527 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28V dc 0.5V, CL= 0 Group A subgr

    39、oups Device type Limits Unit unless otherwise specified Min Max Efficiency Eff IOUT= 125 mA 1 01 80 % 2,3 01 69 L, R 1,2,3 01 67 Isolation ISO Input to output or input to case or output to case. 500 V dc, TC= +25C 1 01 100 M L, R 1 01 100 Short circuit internal power dissipation PDPIN POUT 1,2,3 01

    40、1.2 W L, R 1,2,3 01 1.5 Switching frequency FSIOUT= 125 mA 4,5,6 01 220 320 kHz L, R 4,5,6 01 220 350 VOUTstep load transient 3/ VTLOAD50% load to/from 100% load 4,5,6 01 -700 +700 mV pk L, R 4,5,6 01 -700 +700 VOUTstep load transient recovery 3/ 4/ 5/ TTLOAD50% load to/from 100% load 4,5,6 01 400 s

    41、 L, R 4,5,6 01 600 VOUTstep line transient 4/ 6/ VTLINEInput step 16 V dc to/from 40 V dc, IOUT= 125 mA 4,5,6 01 -600 +600 mV pk L, R 4,5,6 01 -700 +700 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRC

    42、UIT DRAWING SIZE A 5962-00527 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28V dc 0.5V, CL= 0 Group A subgroups Device type Limits U

    43、nit unless otherwise specified Min Max VOUTstep line transient recovery 4/ 5/ 6/ TTLINEInput step 16 V dc to/from 40 V dc, IOUT= 125 mA 4,5,6 01 500 s L, R 4,5,6 01 800 Start up overshoot 4/ VtonOSIOUT= 125 mA 4,5,6 01 500 mV pk L, R 4,5,6 01 800 Start up delay 7/ TonDIOUT= 125 mA 4,5,6 01 20 ms L,

    44、R 4,5,6 01 30 Load fault recovery 4/ TrLF4,5,6 01 30 ms L,R 4,5,6 01 40 Capacitive load 4/ 8/ CL No effect on dc performance, TC= +25C 4 01 100 F L, R 4 01 100 1/ Post irradiation testing shall be in accordance with 4.3.5 herein. 2/ These parts may be dose rate sensitive in a space environment and m

    45、ay demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition C, tested at 9 rads(Si)/s. 3/ Load step transition time greater than 10 microseconds. 4/ Parameter shall be te

    46、sted as part of device characterization and after design and process changes. Thereafter, parameters shall be guaranteed to the limits specified in table I. 5/ Recovery time is measured from the initiation of the transient until VOUThas returned to within 1 percent of VOUT final value. 6/ Input step

    47、 transition time greater than 10 microseconds. 7/ Start up delay time measurement is either for a step application of power at the input or the removal of a ground signal from the inhibit pin (pin 7) while power is applied to the input. 8/ Capacitive load may be any value from 0 to the maximum limit

    48、 without compromising dc performance. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00527 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Case outline X. Millimeters Inches Symbol Min Max Min Max A 6.86 .270 b 0.41 0.51 .016 .020 b1 1.37 1.47 .054


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