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    DLA MIL-HDBK-1331A-2003 HANDBOOK FOR PARAMETERS TO BE CONTROLLED FOR THE SPECIFICATION OF MICROCIRCUITS.pdf

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    DLA MIL-HDBK-1331A-2003 HANDBOOK FOR PARAMETERS TO BE CONTROLLED FOR THE SPECIFICATION OF MICROCIRCUITS.pdf

    1、 MIL-HDBK-1331A 22 October 2003_ SUPERSEDING MIL- HDBK -1331 30 October 1995 DEPARTMENT OF DEFENSE HANDBOOK FOR PARAMETERS TO BE CONTROLLED FOR THE SPECIFICATION OF MICROCIRCUITS This handbook is for guidance only. Do not cite this document as a requirement. AMSC N/A FSC 5962 NOT MEASUREMENT SENSITI

    2、VE Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-HDBK-1331A FORWARD 1. This handbook is approved for use by all Departments and Agencies of the Department of Defense. 2. This handbook is for guidance only. This handbook cannot be cited as a req

    3、uirement. If it is, the contractor does not have to comply. 3. Before the publication of this handbook, parameters to be controlled for the specification of microcircuits were identified in MIL-STD-1331. 4. Comments, suggestions, or questions on this document should be addressed to: Commander, Defen

    4、se Supply Center Columbus, ATTN: DSCC-VAS, 3990 East Broad St., Columbus, OH 43216-5000, or emailed to STD1835dscc.dla.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at www.dodssp.daps.mil. ii Provided by IH

    5、SNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-HDBK-1331A CONTENTSPARAGRAPH PAGE 1. SCOPE . 1 1.1 Scope 1 2. APPLICABLE DOCUMENTS 1 2.1 General . 1 2.2 Government documents . 1 2.3 Order of precedence . 1 3. DEFINITIONS . 1 4. GENERAL GUIDANCE 2 4.1 General .

    6、 2 4.2 Requirements for standardized parameters . 2 4.3 General items to be controlled 2 5. ELECTRICAL PARAMETERS TO BE CONTROLLED 2 6. NOTES . 7 6.1 Intended use . 7 6.2 Supersession information . 7 6.3 Subject term (key word) listing 7 TABLES TABLE I Dynamic electrical parameters (digital microcir

    7、cuits) 3 II Static electrical parameters (digital microcircuits) . 4 III Electrical parameters for amplifiers . 5 APPENDIXES APPENDIX A TERMS, LETTER SYMBOLS, ABBREVIATIONS AND DEFINITIONS 8 iii Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-THIS PA

    8、GE INTENTIONALLY BLANK Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-HDBK-1331A 1 1. SCOPE 1.1 Scope. This handbook describes the parameters required as a minimum for the specification of microcircuits. Parameters, rather than circuits, are con

    9、sidered because circuits vary with the manufacturers involved. Further, circuit designs should be subject to change if improvement results as long as the affected designs are compatible and fully interchangeable. The specific objectives of this document are as follows: a. To provide the minimum para

    10、meters that should be specified to ensure adequate evaluation of circuit design and performance. b. To provide maximum commonality of parameters for purpose of test and measurement, within and between major classes of microcircuit types and to allow the recognition of interface problems between type

    11、s of microcircuits. c. To provide standard abbreviations, definitions and symbols pertinent to the specification of microcircuits. d. To promote maximum interchangeability and compatibility between microcircuits types. This handbook is for guidance only and cannot be cited as a requirement. 2. APPLI

    12、CABLE DOCUMENTS 2.1 General. The documents listed below are not necessarily all of the documents referenced herein, but are those needed to understand the information provided by this handbook. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, st

    13、andards and handbooks form a part of this document to the extent specified herein. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits (Copie

    14、s of these documents are available online at http:/assist.daps.dla.mil;quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) Provided by IHSNot for ResaleNo reproduction or networking permitted without lice

    15、nse from IHS-,-,-MIL-HDBK-1331A 2 3. DEFINITIONS 3.1 For the purpose of this handbook, the terms, letter symbols, abbreviations, and definitions of Appendix A should apply. 4. GENERAL GUIDANCE 4.1 General. The applicable acquisition documents prepared for the acquisition of microcircuits should incl

    16、ude, as a minimum, the parameters described herein specified as a function of temperature and any other pertinent conditions as associated with the applicable microcircuit category. The acquisition document should also contain the additional parameters and controls, if any, required for assurance of

    17、 interchangeability in specific applications. The acquisition document should also identify which parameters are to be tested on a 100 percent basis and which allow sampling. Accept/reject limits for parameter values and acceptable quality levels, where applicable, should also be included. The termi

    18、nology and symbols used in the acquisition document should conform to those used herein. The generic term “microcircuit“ used in this handbook includes all categories of construction as defined in MIL-PRF-38535. Where MIL-STD-883 provides test methods for the parameters identified in section 5 or sp

    19、ecified in the applicable acquisition document, the appropriate test method of MIL-STD-883 should be used for the measurement or control of those parameters and such use should be governed by the applicable general requirements of MIL-STD-883. 4.2 Requirements for standardization parameters. In orde

    20、r to best fit the microcircuit users needs for a standardized set of parameters, the following requirements have been established. a. All important circuit parameters should be described. b. The symbology should be descriptive of the measured parameters. c. Test parameters for a given microcircuit t

    21、ype or function should be specified in such a manner as to be independent of the internal microcircuit construction or the application of the microcircuit. For logic circuits: d. Positive current should be defined as conventional current flow into a device terminal. e. The limiting terms “min“ (mini

    22、mum) and “max“ (maximum) should be considered to apply to magnitudes only and the sign should be indicated. f. Vx should be considered to be a positive voltage at terminal x with respect to ground or 0 volts. Vxy should be considered to be a positive voltage at terminal x with respect to terminal y.

    23、 g. Parameter limits should be specified under the least favorable appropriate conditions of temperature, biases, supply voltages, signals, and loading within the applicable range of each test condition. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-

    24、,-MIL-HDBK-1331A 3 4.3 General items to be controlled. The following items should be specified for all microcircuits specified: a. Storage temperatures (minimum and maximum limits). b. Lead or case operating temperature extremes (minimum and maximum limits). c. Mechanical outline and dimensions. d.

    25、Terminal designations. e. Maximum terminal voltage and current (all supplies, inputs, outputs, nodes.) f. Dynamic electrical parameters (see section 5). g. Static electrical parameters (see section 5). h. Mechanical and environmental integrity. i. Quality assurance levels and reliability. j. Packagi

    26、ng and packing. k. Logic diagram, logic equations and truth table (for digital microcircuits). l. Complex input and output impedance characteristics when applicable. m. Maximum thermal resistance for the complete microcircuit to the lead or case. n. Maximum power dissipation per function and for the

    27、 complete microcircuit. 5. ELECTRICAL PARAMETERS TO BE CONTROLLED 5.1 In all specifications or applicable acquisition documents for microcircuits, all applicable electrical parameters of table I, II, and III should be specified together with limits and conditions of measurement, and where indicated,

    28、 the test methods of MIL-STD-883 should apply. Where “X“ appears, the parameter should be specified, but no MIL-STD-883 test methods exists. Where no MIL-STD-883 test methods exist, the manufacturer should use nongovernment standards or commercial documents for guidance. Provided by IHSNot for Resal

    29、eNo reproduction or networking permitted without license from IHS-,-,-MIL-HDBK-1331A 4 TABLE I. Dynamic electrical parameters (digital microcircuits). Specify input test conditions: VIHmin, VIHmax, VILmin, or VILmax Test method, MIL-STD-883 Parameter Symbol Gating Bistable and monostable Remarks Pro

    30、pagation delay time, low to tPLH3003 X high level output Propagation delay time, high tPHL3003 X low level output Transition time, high to low tTHL3004 X level output Transition time, low to high tTLH3004 X level output Power supply current drain vs. X X frequency Output pulse width (monostable only

    31、) Terminal capacitance 3012 Where terminal capacitance is regarded as critical application AC noise margin VN3013 Where noise margin is regarded as critical to the application NOTE: Forcing conditions which should be specified (as applicable) for monostable or bistable digital microcircuits are as f

    32、ollows: Asynchronous input, minimum pulse width; Minimum clock pulse width; Clock levels, high and low; Clock repetition rate; Clock level, transition times; Timing relationships of input signals. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-H

    33、DBK-1331A 5 TABLE II. Static electrical parameters (digital microcircuits). Specify input test conditions: VIHmin, VIHmax, VILmin, or VILmax Parameter Symbol Test method MIL-STD-883 Remarks High level output voltage VOHmax and min 3006 Low level output voltage VOLmax and min 3007 High level input cu

    34、rrent IIHmax and min 3010 Low level input current IILmax and min 3009 High level output current IOHmax and min X Measure in conjunction with VOHLow level output current IOLmax only X Measure in conjunction with VOLOutput short circuit current IOSmax and min 3011 Collector cut-off current ICEXmax onl

    35、y X Noise margin VN3013 Where noise margin is regarded as critical to the application Low level supply current drain ICCL, IDDL, IEEL, etc. 3005 High level supply current drain ICCH, IDDH, IEEH, etc. 3005 Breakdown voltage BV 3008 Where applicable Where node terminals exist: a. High level node curre

    36、nt IINH3010 At specified VINHb. Low level node current IINL3009 At specified VINLProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-HDBK-1331A 6 TABLE III. Electrical parameters for amplifiers. Amplifier types and configurations Differential, video,

    37、 RF, general purpose Operational, wide band, IF, audio frequency Audio frequency, video, IF, RF, wide band, HF, general purpose Parameter Symbol MIL-STD-883 test method AC unbalance voltage VOUX Automatic gain control range AGC4007 4007 4007 Bandwidth (small signal) BW 4004 4004 4004 Common-mode inp

    38、ut voltage range VICR4003 4003 Common-mode output voltage VOC4003 Common-mode rejection ratio CMRR 4003 4003 Common-mode voltage amplification AVC4003 4003 DC power dissipation PD4005 4005 4005 Differential input impedance Zid4004 4004 Differential voltage AVD4003 4003 amplification AvdInput bias cu

    39、rrent IIB4001 4001 Input bias current temperature IIB/T 4001 4001 sensitivity Input offset current IIO4001 4001 Input offset current temperature IIO/T 4001 4001 sensitivity Input offset voltage VIO4001 4001 Input offset voltage temperature VIO/T 4001 4001 sensitivity Maximum output voltage swing VOP

    40、P4004 4004 Single-ended input voltage range VISRX X X Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-HDBK-1331A 7 TABLE III. Electrical parameters for amplifiers - Continued. Amplifier types and configurations Differential, video, RF, general pu

    41、rpose Operational, wide band, IF, audio frequency Audio frequency, video, IF, RF, wide band, HF, general purpose Parameter Symbol MIL-STD-883 test method Noise figure NF 4006 4006 4006 Differential output impedance Zod4005 4005 4005 Single-ended output voltage Zos4005 4005 4005 Output offset voltage

    42、 VOOX X X Phase margin m 4002 4002 Power gain or insertion power gain GPor Gp4006 4006 Power supply rejection ratio PSRR 4003 4003 Quiescent input voltage VIX Quiescent output voltage VOX Single-ended input impedance Zis4004 4004 4004 Single-ended voltage amplification AVSor Avs4004 4004 4004 Slew R

    43、ate SR 4002 Total harmonic distortion THD 4004 4004 4004 Transient response TR X Maximum output swing bandwidth BOMOverload recovery time torProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-HDBK-1331A 8 6. NOTES 6.1 Intended use. Parameters and sy

    44、mbols identified herein are intended for use in detailed specifications and applicable acquisition documents for microelectronic devices. 6.2 Supersession information. This handbook supersedes MIL-STD-1331. Before the publication of this handbook, parameters to be controlled for the specification of

    45、 microcircuits were identified in MIL-STD-1331. 6.3 Subject term (key word) listing. Digital microcircuit Graphic symbols Linear microcircuit Microcircuit parameters Microcircuit symbols 6.4 Changes from previous issue. The margins of this handbook are marked with vertical lines to indicate where ch

    46、anges form the previous issue were made. This was done as a convenience only and the Government assumes no liability whatsoever for any inaccuracies in these notations. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-HDBK-1331A 9 APPENDIX A TERMS

    47、, LETTER SYMBOLS, ABBREVIATIONS, AND DEFINITIONS A.1 SCOPE A.1.1 Scope. This appendix contains terms, letter symbols, abbreviations, and definitions for use with microcircuits. This appendix is not a mandatory part of this handbook. The information contained herein is intended for guidance only. A.2

    48、 GENERAL GUIDELINES FOR LETTER SYMBOLS AND ABBREVIATIONS A.2.1 Letter symbols and abbreviations defined. A2.1.1 Letter symbols. A letter symbol is a character which is used to designate an electrical or physical quantity or parameter, or units of measurement. This use occurs most frequently in mathematical equations, specifications, and commercial data. The following chart will illustrate the primary distinct


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