1、INCH-POUND MIL-DTL-11134G 17 November 2008 SUPERSEDING MIL-H-11134F (CR) 18 September 1990 DETAIL SPECIFICATION HANDSET H-33 ( )/PT Inactive for new design after 30 March 1999. This specification is approved for use by all Departments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. Th
2、is specification covers one type of handset having a carbon microphone; designated as Handset H-33 ( )/PT (see 6.1 and 6.4). 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents c
3、ited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of th
4、is specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents ar
5、e those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-C-10544 - Connectors, Plug and group C as specified in table III. After completion of group C environmental tests, conforming units shall be re-inspected and shall pass all group A inspection. 4.2.3 Failures. One
6、 or more failures shall be cause for refusal to grant first article approval. 4.3 Inspections covered by subsidiary documents. The following shall be inspected under the applicable subsidiary documents as part of the inspection required by this specification, and the inspection requirement specified
7、 in the contract or purchase order: ITEM WHERE REQUIREDConstruction 3.2Finish 3.3Marking 3.4Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-11134G 74.4 Conformance inspection. The contractor shall perform the inspection specified in 4.3, 4.4.
8、1 through 4.4.4. This does not relieve the contractor of his responsibility for performing any additional inspection, which is necessary to control the quality of the product and to assure compliance with all specification requirements. 4.4.1 Group A inspection. Units presented for acceptance shall
9、be inspected for conformance with the criteria specified in table I. Lots shall be formed and subjected to the sampling plan as indicated. 4.4.1.1 Order of inspection with group A. Group A inspection shall be performed in an order satisfactory to the government, except that the operational inspectio
10、n shall be last. TABLE I. Group A inspection. Inspection Requirement Paragraph Inspection Paragraph Sampling plan Table Visual & Mechanical (Major) Visual & Mechanical (Minor) Electrical Insulation Resistance Operation Microphone Response Impedance Earphone Response Impedance 3.83.83.5.13.5.23.5.4.1
11、3.5.4.23.5.4.13.5.4.24.54.54.6.2.14.6.2.24.6.2.3.14.6.2.3.24.6.2.4.14.6.2.4.3IV V IV IV IV IV IV IV 4.4.2 Group B inspection. Group B inspection shall be performed on inspection lots that have passed group A inspection and on samples selected from units that have been subjected to and met the group
12、A inspection. This inspection shall conform to requirements in table II. 4.4.2.1 Group B sampling plans. The group B sampling plans shall be as specified in table II. 4.4.2.2 Order of inspection within group B. Group B inspection shall be performed in an order satisfactory to the government. TABLE I
13、I. Group B inspection. Inspection Requirement Paragraph Inspection Paragraph Sampling plan Table Make-break sequence Interchangeability Microphone Unagitated circuit Earphone Overload 3.5.5.13.73.5.3.43.5.4.24.6.2.5.14.84.6.2.3.34.6.2.4.2V VI V V Provided by IHSNot for ResaleNo reproduction or netwo
14、rking permitted without license from IHS-,-,-MIL-DTL-11134G 84.4.3 Group C inspection. Group C inspection shall be performed on units that have passed group A and group B inspection. The inspection shall consist of the inspection specified in table III. 4.4.3.1 Sampling for group C inspection. For s
15、ubgroup I, two samples each of the handset shall be selected at random from each 500 units or fraction thereof produced. Each sample shall be tested to all tests of the subgroup. For subgroup II, five samples shall be selected at random from each 1,000 units or fraction thereof produced. One sample
16、shall be tested against each test. For subgroup III, two samples shall be selected at random from each 2,000 units or fraction thereof produced. One sample shall be tested against each test. The first samples of each test subgroup shall be selected from the first production lot. 4.4.3.2 Group C fail
17、ures. Actions required relative to group C failures shall be as specified in the contract or purchase order. 4.4.4 Reinspection of conforming group C sample units. Unless otherwise specified, sample units which have been subjected to and passed group C inspection may be accepted on contract provided
18、 all damage is repaired and the sample units are re-subjected to and pass group A and group B inspection. TABLE III. Group C inspection. Inspection Requirement paragraph Inspection paragraph Subgroup I Carbon noise Leakage (Immersion) Subgroup II Temperature Humidity Altitude (Elevation) Vibration A
19、ging Subgroup III Endurance Blast 3.5.3.53.6.43.6.13.6.23.6.33.6.63.5.3.63.5.5.23.6.54.6.2.3.44.7.44.7.14.7.24.7.34.7.64.6.2.3.54.6.2.5.24.7.54.4.5 Rejection and retest. When one or more items fail to meet the specification, acceptance of all items will be withheld until the extent and cause of fail
20、ure are determined. After corrections have been made, all necessary tests shall be repeated. 4.4.5.1 Sampling plan. Accept on zero, for general inspection as specified in table IV, table V or table VI. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
21、MIL-DTL-11134G 9TABLE IV. Sampling plan for group A inspection. 1/ Lots Size Sample Size 2 to 12 13 to 150 151 to 290 291 to 500 501 to 1,200 1,201 to 3,200 3,201 to 10,000 10,001 to 35,000 35,001 to 150,000 150,001 to 500,000 500,001 and over * 13 20 29 34 42 50 60 74 90 102 * Indicates entire lot
22、must be inspected. 1/ Acceptance number in all cases is zero. TABLE V. Sampling plan for group A and B inspections. 1/ Lot Size Sample Size 2 to 3 4 to 25 26 to 50 51 to 90 91 to 150 151 to 290 291 to 500 501 to 1,200 1,201 to 3,200 3201 to 10,000 10,001 and above 100% 3 5 6 7 10 11 15 18 22 29 1/ A
23、cceptance number in all cases is zero. TABLE VI. Sampling plan for group B inspection. 1/ Lot Size Sample Size 2 to 15 16 to 25 26 to 90 91 to 150 151 to 290 291 to 500 501 to 1,200 1,201 to 3,200 3,201 and above 2 3 5 6 7 9 11 13 15 1/ Acceptance number in all cases is zero. 4.5 Visual and mechanic
24、al. The equipment shall be examined for compliance with 3.8. 4.6 Performance requirements. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-11134G 104.6.1 Test equipment and procedures. Except as otherwise specified herein, test equipment and
25、procedures shall conform to IEEE 258 and ANSI S3.7. a. The secondary sound pressure reference standard shall be Type L (not N or H) pressure microphone conforming to ANSI S1.12 and calibrated in accordance with ANSI S1.10. b. The distance from the face of the microphone to the plane of the opening o
26、f the artificial voice shall be 0.25 inch. The voltage across the voice coil of the artificial voice shall be calibrated to provide a sound pressure level of 2.8 Pascals in the frequency range of 300 to 4,000 Hz. c. In the test circuit on figure 2 of IEEE 258, RLis 40 ohms non-inductive, C is 100 mi
27、crofarad, Ebb is 24 volts dc and the variable resistor is 250 ohms. d. The sound pressure level of 2.8 Pa (103 dB) shall be used in place of the 94 dB specified in IEEE 258. e. Microphone and earphone tests 4.6.2.3 and 4.6.2.4 shall be performed on the elements only. All other tests shall be perform
28、ed with the elements installed in the handset. Measurements shall be made at the connector U-161/U terminals. f. Continuous trace response data are required for the microphone element. 4.6.2 Methods of inspection. 4.6.2.1 Insulation resistance. The assembly shall be tested in accordance with method
29、302, test condition B, of MIL-STD-202 to meet the requirements of 3.5.1. There shall be no evidence of arcing or insulation breakdown during the test. 4.6.2.2 Operation. Establish a test circuit by providing a battery bias supply between connector pins E and C, connect pin C to pin B through a 100 m
30、f capacitor, and connect pin D to pin F and pin H to pin A. Speak into the microphone. Side-tone shall be heard in the earphone only when the push-to-talk switch is depressed (see 3.5.2). 4.6.2.3 Microphone. 4.6.2.3.1 Response. (see 3.5.3.2) a. Perform the power response test of the microphone in th
31、e vertical position with a bias current of 85 ma dc and determine compliance with 3.5.3.2 a. b. Perform the power response test of the microphone as specified in 4.6.2.3.l a above, with the microphone rotated in a vertical plane +90, -90, +45 and -45 degrees and determine compliance with 3.5.3.2 b.
32、c. Perform the power response test of the microphone as specified in 4.6.2.3.l a above, with the bias supply of the battery and variable resistor replaced with a bias battery of 1.5 volts dc and determine compliance with 3.5.3.2 c. 4.6.2.3.2 Impedance. Using the test circuit of 4.6.2.3.l a, 1,000 Hz
33、, measure the voltage (dc) across the microphone and the direct current flowing through it and determine that their ratio complies with 3.5.3.3. 4.6.2.3.3 Unagitated current. The microphone under test shall not be preconditioned (agitated) prior to this test. Use the test circuit as in 4.6.2.3.l a,
34、except that the bias voltage and variable resistor combination shall be replaced with a bias battery of 6 volts dc and the load resistor reduced to 30 ohms. During a 10 minute period, measure the peak current flowing through the microphone for compliance with 3.5.3.4. 4.6.2.3.4 Carbon noise. Using t
35、he test circuit as in 4.6.2.3.l a, except that the bias current shall be adjusted to 170 milliampere dc and the sound pressure level shall be 7.0 Pa, perform the test in accordance with the IEEE 258 and determine compliance with 3.5.3.5. Provided by IHSNot for ResaleNo reproduction or networking per
36、mitted without license from IHS-,-,-MIL-DTL-11134G 114.6.2.3.5 Aging. Perform the measurements of frequency response, impedance and carbon noise, before and after the vibration sweep specified in IEEE 258 to determine compliance with 3.5.3.6. 4.6.2.4 Earphone. 4.6.2.4.1 Response. Constant-available-
37、power (2 mW) frequency response measurements shall be made at 300, 500, 1,000, 2,000, 3,000 and 4,000 Hz. Response measurements shall be made in accordance with ANSI S3.7 in a type-1 earphone coupler except that the coupling weight shall be one kilogram. Determine compliance with 3.5.4.2. 4.6.2.4.2
38、Overload. Operate the earphone at 10 volts, 400 Hz, for a period of 10 hours. Repeat the response tests at the 2 milliwatt level for compliance with 3.5.4.3. 4.6.2.4.3 Impedance. Using the procedures described an ANSI S3.7, measure the impedance at 1,000 Hz for compliance with 3.5.4.4. 4.6.2.5 Push-
39、to-talk switch. 4.6.2.5.1 Make-break sequence. Connect suitable low current lamp indicating circuits to pins F and H of the connector (control circuit) to pins E and D of the connector (microphone circuit). Slowly operate and release the push-to-talk switch and determine compliance with 3.5.5.1. 4.6
40、.2.5.2 Endurance. Connect a variable resistive load in series with 24 volts dc between connector pins F and H (control circuit) and adjust the load to one ampere. Operate the switch to full travel and off at a rate of 25 to 60 cycles per minute for a total of 500,000 cycles. At the conclusion of the
41、 test, determine compliance with 3.5.5.1, and 3.5.5.2. 4.7 Environmental conditions. 4.7.1 Temperature. 4.7.1.1 Low. The equipment shall be tested in accordance with method 502, procedure I of MIL-STD-810. The storage temperature shall be -55 C, maintained for 4 hours, and the operating temperature
42、shall be -40 C. Prior to, during and following the test, the equipment shall meet the requirements of 3.6.1.1. 4.7.1.2 High. The equipment shall be tested in accordance with method 501, procedure I of MIL-STD-810. The storage temperature shall be 70 C, maintained for 2 hours and the operating temper
43、ature shall be 65 C. Prior to, during and following the test, the equipment shall meet the requirements of 3.6.1.2. 4.7.2 Humidity. The equipment shall be tested in accordance with method 507, procedure I of MIL-STD-810, with measurements made during the last 5 hour period of each cycle. Prior to, d
44、uring and following the test, the equipment shall meet the requirements of 3.6.2. 4.7.3 Altitude. The equipment shall be tested in accordance with method 500, procedure I of MIL-STD-810. Prior to, during and following the test, the equipment shall meet the requirements of 3.6.3. 4.7.4 Leakage (immer
45、sion). The equipment shall be tested in accordance with method 512, procedure 1 of MIL-STD-810 and meet the requirements of 3.6.4 prior to and following the test. 4.7.5 Blast. Mount the handset under test on the carriage of the Simulated Gun Blast Producing Equipment in accordance with SK-N-864 with
46、 the front edge of the earphone element in the test plane and with its axis coincident with that of the explosion chamber. Subject the handset to 30 rounds of blast at peak pressure of 9.5 psi. Determine compliance with 3.6.5. 4.7.6 Vibration. The equipment shall be tested in accordance with method
47、201 of MIL-STD-202. Determine compliance with 3.6.6. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-11134G 124.8 Interchangeability and dimensional inspection. The dimensions listed in the drawings referenced shall be gauged to determine con
48、formance to the physical interchangeability requirements of 3.7 to the following, microphone element (see 3.5.3.1), earphone receiver element (see 3.5.4.1), handle assembly (see 3.5.6), and connector U-161/U (see 3.5.7). When a dimension is not within specified or design limits, it shall be consider
49、ed a major defect. 5. PACKAGING 5.1 Packaging. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements. Packaging requirements are maintained by the Inventory Control Poin
