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    CISPR 16-4-2-2011 Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-2 Uncertainties statistics and limit modelling - Measurement instrumenta.pdf

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    CISPR 16-4-2-2011 Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-2 Uncertainties statistics and limit modelling - Measurement instrumenta.pdf

    1、 CISPR 16-4-2 Edition 2.0 2011-06 INTERNATIONAL STANDARD NORME INTERNATIONALESpecification for radio disturbance and immunity measuring apparatus and methods Part 4-2: Uncertainties, statistics and limit modelling Measurement instrumentation uncertainty Spcifications des mthodes et des appareils de

    2、mesure des perturbations radiolectriques et de limmunit aux perturbations radiolectriques Partie 4-2: Incertitudes, statistiques et modlisation des limites Incertitudes de mesure de linstrumentation CISPR 16-4-2:2011INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE COMIT INTERNATIONAL SPCIAL DES

    3、 PERTURBATIONS RADIOLECTRIQUES BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM colourinsideTHIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or b

    4、y any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this pub

    5、lication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectroniqu

    6、e ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs

    7、ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes I

    8、nternational Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalo

    9、gue of IEC publications: www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/online_news/justpub Stay u

    10、p to date on all new IEC publications. Just Published details twice a month all new publications released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions

    11、 in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Custo

    12、mer Service Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectro

    13、nique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/s

    14、earchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous permet deffectuer des recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online_news/j

    15、ustpub Restez inform sur les nouvelles publications de la CEI. Just Published dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il co

    16、ntient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des

    17、 commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 CISPR 16-4-2 Edition 2.0 2011-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Specification for radio disturbance and im

    18、munity measuring apparatus and methods Part 4-2: Uncertainties, statistics and limit modelling Measurement instrumentation uncertainty Spcifications des mthodes et des appareils de mesure des perturbations radiolectriques et de limmunit aux perturbations radiolectriques Partie 4-2: Incertitudes, sta

    19、tistiques et modlisation des limites Incertitudes de mesure de linstrumentation INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XA ICS 33.100.10; 33.100.20 PRICE CODE CODE PRIX ISBN 978-2-88912-525-8 INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE COMIT INT

    20、ERNATIONAL SPCIAL DES PERTURBATIONS RADIOLECTRIQUES BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale colourinside 2 CISPR 16-4-2 IEC:2011 CONTENTS FOREWORD . 4 INT

    21、RODUCTION . 6 1 Scope . 7 2 Normative references . 7 3 Terms, definitions, symbols and abbreviations 8 3.1 Terms and definitions 8 3.2 Symbols 9 3.3 Abbreviations 10 4 Compliance criterion for the MIU 10 4.1 General . 10 4.2 Compliance assessment 11 5 Conducted disturbance measurements . 12 5.1 Cond

    22、ucted disturbance measurements at a mains port using an AMN (see also B.1) 12 5.2 Conducted disturbance measurements at a mains port using a VP (see also B.2) . 12 5.3 Conducted disturbance measurements at a telecommunication port using an AAN (Y-network) (see also B.3) . 13 5.4 Conducted disturbanc

    23、e measurements at a telecommunication port using a CVP (see also B.4) 14 5.5 Conducted disturbance measurements at a telecommunication port using a CP (see also B.5) 15 6 Disturbance power measurements (see also C.1) . 15 6.1 Measurand for disturbance power measurements 15 6.2 Symbols of input quant

    24、ities specific for disturbance power measurements . 15 6.3 Input quantities to be considered for disturbance power measurements . 16 7 Radiated disturbance measurements in the frequency range 30 MHz to 1 000 MHz . 16 7.1 Radiated disturbance measurements at an OATS or in a SAC (see also D.1) 16 7.2

    25、Radiated disturbance measurements in a FAR (see also D.2) 17 8 Radiated disturbance measurements in the frequency range 1 GHz to 18 GHz (see also E.1) . 18 8.1 Measurand for radiated disturbance measurements in a FAR (FSOATS) . 18 8.2 Symbols of input quantities specific for radiated disturbance mea

    26、surements . 18 8.3 Input quantities to be considered for radiated disturbance measurements in a FAR . 18 Annex A (informative) Basis for Ucisprvalues in Table 1, general information and rationale for input quantities common to all measurement methods . 20 Annex B (informative) Basis for Ucisprvalues

    27、 in Table 1, uncertainty budgets and rationale for conducted disturbance measurements . 28 Annex C (informative) Basis for Ucisprvalues in Table 1 Disturbance power measurements 37 Annex D (informative) Basis for Ucisprvalues in Table 1 Radiated disturbance measurements from 30 MHz to 1 000 MHz 39 A

    28、nnex E (informative) Basis for Ucisprvalues in Table 1 Radiated disturbance measurements from 1 GHz to 18 GHz . 52 Bibliography 56 CISPR 16-4-2 IEC:2011 3 Figure A.1 Deviation of the QP detector level indication from the signal level at receiver input for two cases, a sine-wave signal and an impulsi

    29、ve signal (PRF 100 Hz) 23 Figure A.2 Deviation of the peak detector level indication from the signal level at receiver input for two cases, a sine-wave signal and an impulsive signal (PRF 100 Hz) 24 Figure A.3 Illustration of system noise figure 25 Figure D.1 Effect of antenna directivity without ti

    30、lting . 47 Figure D.2 Effect of antenna directivity with optimum tilting 47 Table 1 Values of Ucispr11 Table B.1 Conducted disturbance measurements from 9 kHz to 150 kHz using a 50 /50 H + 5 AMN 28 Table B.2 Conducted disturbance measurements from 150 kHz to 30 MHz using a 50 /50 H AMN . 29 Table B.

    31、3 Conducted disturbance measurements from 9 kHz to 30 MHz using a VP . 30 Table B.4 Conducted disturbance measurements from 150 kHz to 30 MHz using an AAN 31 Table B.5 Conducted disturbance measurements from 150 kHz to 30 MHz using a capacitive voltage probe (CVP) . 32 Table B.6 Conducted disturbanc

    32、e measurements from 9 kHz to 30 MHz using a CP . 33 Table C.1 Disturbance power from 30 MHz to 300 MHz 37 Table D.1 Horizontally polarized radiated disturbances from 30 MHz to 200 MHz using a biconical antenna at a distance of 3 m, 10 m, or 30 m. 40 Table D.2 Vertically polarized radiated disturbanc

    33、es from 30 MHz to 200 MHz using a biconical antenna at a distance of 3 m, 10 m, or 30 m . 41 Table D.3 Horizontally polarized radiated disturbances from 200 MHz to 1 GHz using an LPDA antenna at a distance of 3 m, 10 m, or 30 m . 42 Table D.4 Vertically polarized radiated disturbances from 200 MHz t

    34、o 1 GHz using an LPDA antenna at a distance of 3 m, 10 m, or 30 m . 43 Table D.5 Radiated disturbance measurements from 30 MHz to 200 MHz using a biconical antenna in a FAR at a distance of 3 m 44 Table D.6 Radiated disturbance measurements from 200 MHz to 1 000 MHz using an LPDA antenna in a FAR at

    35、 a distance of 3 m 45 Table E.1 Radiated disturbance measurements from 1 GHz to 6 GHz in a FAR (FSOATS) at a distance of 3 m . 52 Table E.2 Radiated disturbance measurements from 6 GHz to 18 GHz in a FAR (FSOATS) at a distance of 3 m . 53 4 CISPR 16-4-2 IEC:2011 INTERNATIONAL ELECTROTECHNICAL COMMIS

    36、SION _ SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS Part 4-2: Uncertainties, statistics and limit modelling Measurement instrumentation uncertainty FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comp

    37、rising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Stan

    38、dards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this prep

    39、aratory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organi

    40、zations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form o

    41、f recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretatio

    42、n by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regio

    43、nal publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out b

    44、y independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees f

    45、or any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the No

    46、rmative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held res

    47、ponsible for identifying any or all such patent rights. International Standard CISPR 16-4-2 has been prepared by CISPR subcommittee A: Radio-interference measurements and statistical methods. This second edition cancels and replaces the first edition published in 2003. It constitutes a technical rev

    48、ision. This edition includes the following significant technical additions with respect to the previous edition: Methods of conducted disturbance measurements on the mains port using a voltage probe, on the telecommunication port using an AAN (ISN), CISPR 16-4-2 IEC:2011 5 on the telecommunication p

    49、ort using a CVP, and on the telecommunication port using a current probe. Methods of radiated disturbance measurements in the frequency range 30 MHz to 1 000 MHz using a FAR, and in the frequency range 1 GHz to 18 GHz using a FAR. This publication has the status of a basic EMC standard in accordance with IEC Guide 107:2009, Electromagnetic compatibility Guide


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