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    CECC 16 101- 007 ISSUE 3-1982 CNR CEI CECC 16 101-007 Two Pole Changeover Contact Arrangement (2 Form C) Light Duty with Low Level Switching Capability Solderable Straight or Hooke.pdf

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    CECC 16 101- 007 ISSUE 3-1982 CNR CEI CECC 16 101-007 Two Pole Changeover Contact Arrangement (2 Form C) Light Duty with Low Level Switching Capability Solderable Straight or Hooke.pdf

    1、3 - I- .i .- INSULII-IHG , PA0 OPIIONAl O OIMIHSIOHS ARI IH MM IOlIRAHCI 0.25 1“LISS OIIILRWISL CIA110 I 1 I . - + - - . - . . ._r I . . - . . . .- Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without l

    2、icense from IHS-,-,-CECC*Lb*LOL- 007*ISSUE*3 82 3974499 0037453 53T F1;. 2 ?! i“: I inrula?ion rtsiitance of coi): i000 Hegohis at SOO V d,c, Dielectric Strenqtht 500 V rie.%. Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or ne

    3、tworking permitted without license from IHS-,-,-F4;* : :f 2: CECC*Lb*LOL- 007*ISSUE*3 82 1974499 O017452 476 flininoa cantict voltage flrrircr contact current hinirur ccntact current hxirua cantact current averload insu1 at ion resistance Dielectric strenqth Contact circuit resistance reasured at 3a

    4、i fror gim seal) Cant c t bounce ti re Operate tise Release time Hiniiui operations . at 20 V d.c, 2 resistive 10 t A i A, 100 operations IOQO Weqahrs iin, at 5r!O Y d,c. 500 V r.1.5. -0 50 silliohas BX before lifo 203 ailliobos LJX alter life. 2.5 DS ouinus 4.0 3s iaxiaca .i,O as aaxiaur 10 5 11) P

    5、elarr subjected to high lev1 iaads ahall nat subsequently be used for loar level Sibr st ion buep if cnc t i onal I 992 als? (10 GI b as pulre duration (Perforodnce lor relay rcunting varidnt ref, Ob returaly nountede Deritinq ray Occur OR other aountinq variants1 1,3, Physical ._._.)I Herieticall y

    6、 sealed by welding Yeiqht Finish IS 9 raxirua Bright tin-lead plated terminals and chse Mhen ordering relays to this specilication, the following inlorcation shall be given: . 1, lhe CECC 2nd $sus nuiber of this detail specification 2, Code nuaber in the order as folloust two digits for ln0 digit5 .

    7、lor latter *P if t oqu; r tQ Two digits for coil variant (see Tibis 1) rounting virint (ser Aspendi; II ter ai nati un var i ont (see Appendix 2) nsuatinq pad 1s (see Appendix 3) *- . B J - Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo repr

    8、oduction or networking permitted without license from IHS-,-,-a 3.4, HkRKIti Of PACKAGE - Detail specification reference 8 - lmlacturers ndie or trade.aark - Relay type code a - Hanufacturers balch identification L (by purchase orde;) - Quantity I 4,08 RElA6ED DOCUflEHTS .-.-.-1-1*1-.- This specific

    9、ation shall be read in conunction with: . CHR-CEI-CECC-16000 - Generic spec f icdt ion, for electr orechanica all or nothing relays CHR-CEI-CECC-lb190 - Sectional apecification, for ali or nothing relays CHR-GEI-CECC-16191 - Blank detail specifiction, all or nothing relaya lec tronechani a1 or elsct

    10、roiechanical CWR-CE1-CECC-09007 9 Saiplinq proredure and tdblei far inspoction by it tr ibutes CWR-CEI-CECC-00107 - Rua1 i ty asseisrrnt proceduru IEC-68 - Basic envirofinental tertinq procedures CICC40200 - Ouiiiiied product list Copyright CENELEC Electronic Components Committee Provided by IHS und

    11、er license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-.Ill lith the exception of subgroup AO, ahere a subqroup contains em than one test, order of tccts is iendrtory,. 6.1.2 Perforoance characteristics, Cptact Bwnce and Contact Titing shall be ieaslir

    12、ed with contacts loaded with 5 V d.c. daxinua, IO 84 raxiiua. .1,3 Rated coil voltage as specified in Table 1 shall be used for all tests untess otherwise stated, 6.1.4 Ribient terperature to be I5 C ta 50 C unies5 otherwise stated. 6.1.5 Sarples subjected to destructive tests sarked O shall not be

    13、accepted for release, 6,1,6 Vibration, Chock, Burp test rethod. Relays shalt be riqidly securod, either by their DY brattets, or by neans ol adhesivo applied the top of the relay and the rountinq plate, Lon9 terrinais shail be claaped at rpproxiiately 10 ni fro* the body, Csnnections to the relay s

    14、hall bc nrde by rjoldsriny stranded flexible wire to the terrinais, Yhcn energized, the applied voltqe shill be BI rated, Foi purposa of iicnitwing, ccatictr shlt be laadcd rr4h 3 Y, JO ail aaxinua. y- . Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for

    15、 ResaleNo reproduction or networking permitted without license from IHS-,-,-R.O. fF.XAlIBH CF IHCPECliC4 1Olf -“-“.-.-.- inspection lots shall be 4o:rcld by the agqrcpaticrn at 5errdl lots which are produced ow a poricd not xceeding one reat, for Qualification Approval Praceiiure see Table 3, For mo

    16、unting variants see Appendix I, For teraination variants szc Appendix 2, For insulating pad inforration see Appendix 3, - 10.9, NOTES - 10,i. Conditicns of tests are prescribed once only, Later on they are referred to a5 lest HO, 10.2. Reference nusbers of tests and perforrance requireaents refer to

    17、 CEE-16000 IK to 16100 if applicable, i :- . Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- CECC*lb*LOL- 007*ISSUE*T2 3974499 0037457 T5 . 30, 30,4. - Enerqirrtion at rated v

    18、altaqe - Huaher of operations: 5000 . - Specd: 72001)lhaur ut 501 duty cyclo - All contact closures to be tested - Oynaric contact circuit resistance failure level: 50 Oh-fis - Open circuit voltage: 30 aV - Resistive load current: IO ai Lcad fio! switched 5.6 - Correctness of iarting and tersinal id

    19、enli ticition - Visual conditions ol housing, plating, finish -Cariecl be .$In1 5.12 Steady state neasutetont , Ail irtinq contact5 it i Upen circutt voltago 30 B Y lax i CurrPnt 10 I II au I 5.3, I, Reference terperAtura 25 C (referenco Table II arkinqs present end legible External conditions to bP

    20、 5 at i sf AC I or y L i Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Od+ ai 25 CECC*Lb*101- 007*ISSUE*3 82 m 1974499 0017458 994 W I i t I ! lining lests Dielectric test 5.

    21、11,2,1,2,3 ParJgriph lo1 . Haunting indifferent - - Energiiition at rated ueltaqe (sec par. 6.1.2) RI1 iating contacts _-_-_-_-“-*-“ 5.9 lest voltage 550 Vr.a.s. it sec. duration energizrd and deenergized - Between case, fraie and contacts i- Between tase, fraae and coil :- Between contacts of d set

    22、 i I I5 Insulation . +5.11 Ireiistance .Test voltaqe 500 V d,c, ail terrinals to case duratian up to 10 6 i Sealing . Hethod 1 -Test Oc of IEC-2-17 (iethod 21 1 Cub-6roup 81 Il 1 For 311 tests in this subqreup !m. 1,o .I- - -. If- I I #o breakdown i t #a ildshover 1000 ilohas m, Copyright CENELEC El

    23、ectronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC*Lb*LOL- 007*ISSUE*3 2 m 1974499 0017459 20 m Il s3 AR1 1.0 n this group I Dettructive tests are Barked by (DI Copyright CENELEC Electronic Comp

    24、onents Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC*Lb*LOL- 007*ISSUE*3 82 3974499 0037460 542 I tcbustnerr ol t eroina tions (b) - vitual inspection qcner al I D.C coil cesi stance b insulation resistance Co

    25、ntact circuit resi st ance GROUP C .-.I 1 est No, 1 est No, 3 est Ho. i5 est No, 2 . Hofie, but final wasur erentr apply Sub-Group CZ for the test in this qroup -I*-.-“. Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networki

    26、ng permitted without license from IHS-,-,-. 331. !t e( 22 CECC*Lb*LOL- 007*ISSUE*3 82 m 1974499 00174bL 489 m F reawerents ;Contact i jcircui t r tsittanet I Inrulit ion .resist inte - -Pl.-*e“-+l i 1 I - Speed: 7?000 operationr pef hour at - Contact circuit resistancc! failure : - Resistive -load c

    27、urrent: !O rl ! l a duty cycle of 501 - Open circuit voltage: 30 rV t i i I Lohd not snitched I I I !5.30,3 i Fiiture: - iuober 01 operations: i0 I across contxts I - All contacts loaded higher than 51 of - Open Circuit voltaqe: 28 V d.c. i of open circuit . - Resistive load current: 2 R I voltqe. -

    28、 Speed: 20 operations per ninute i 5 failures 1 dlloned per ! - leeperature: 125% Icntect oatinp - fuse rating: 100 rl - Energintion at rated voltage I 1 tethod 1. Continuous checkinq i voltage drop : ! at a duty cycle of SO2 i I r I Test #o, 1 I i , 100 Begacha an, . I ! Copyright CENELEC Electroni

    29、c Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-5.22.1 Test Ka of IEC 68-2-11 Test Ho, 1 and Test #o, 14 J. 26 lest a of IEC 68-2-27 Nethod 1, functianel - Acceleration: 490 3/52 (506) - Energization at

    30、rated voltage half sine wave, 11 8s See Paru 4,l.b i.21 lest Eb af IEC O-2-29 ethod I, functional * kcelerrtian; 392.4 r/r2i10Gi Huabrr of bumps: 4000 total 8 Enerqtzition jt rated voltage halt rist Saiple size: b 4 1 lectricrl and aechanical ndurance 5,30 iJ4,iS .I 35 42 c3 C4 On B One Copyright CE

    31、NELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC*Lb*LOL- 007*ISSUE*3 82 m 3974499 00374bb TbO m tan diotnsianr shown In ref, 01 apply to ali variants Ali toraination viriailts are aiio

    32、wabs IIIV -* 20, G MAX - TERM I NAT i ON VAR I AM T 1 I I 1 I 323 MAX L Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC*Lb*LOL- 007*ISSUE*3 82 L974499 0017467 9T7 I I I I

    33、0 I I I 7 I 1 I 1 -4 05 08 Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Pd-js IQ f :J CECC*Lb*101= 007*ISSUE*3 82 m 19?74499 0017468 833 m I i? I I I $ i 9, Q 0% 09 / 4-40 U

    34、NC II 4-40 UNC k Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-, o CECC*IIb*IIOII- 007*ISSUE*3 82 II974499 00174b9 77T Pig. 3 Bi 23 I I5 Copyright CENELEC Electronic Componen

    35、ts Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-7 I I I I -J 13 I? , ,i- I Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permi

    36、tted without license from IHS-,-,-CECC*Lb*LOL- 007*ISSUE*3 82 1774499 0017471 328 -7 :;ir- 7 QQ O1 o2 03 64 Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I f I SPHER R TYP Yhan prd is mounted the useable lenqht 04 terriaationr will result shcrtenod by tho me arount 15 the thickness ol pdd, I- - Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-


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