1、BRITISH STANDARD BS QC 300501: 1990 IEC384-6-1: 1987 Specification for Harmonized system of quality assessment for electronic components Fixed capacitors for use in electronic equipment Blank detail specification: Fixed metallized polycarbonate film dielectric d.c. capacitors Assessment level EBSQC3
2、00501:1990 This British Standard, having been prepared under the directionof the Electronic Components Standards PolicyCommittee, was publishedunder the authority ofthe Board of BSI and comes intoeffect on 31 May1990 BSI08-1999 The following BSI references relate to the work on this standard: Commit
3、tee reference ECL/4 Draft for comment82/31655DC ISBN 0 580 16986 3 Committees responsible for this British Standard The preparation of this British Standard was entrusted by the Electronic Components Standards Policy Committee (ECL/-) to Technical Committee ECL/4, upon which the following bodies wer
4、e represented: British Telecommunications plc Electronic Components Industry Federation Electronic Engineering Association Ministry of Defence National Supervising Inspectorate Society of British Aerospace Companies Ltd. Telecommunication Engineering and Manufacturing Association Amendments issued s
5、ince publication Amd. No. Date of issue CommentsBSQC300501:1990 BSI 08-1999 i Contents Page Committees responsible Inside front cover National foreword ii Foreword iii Introduction 1 Section 1. General data 1 General data 2 Section 2. Inspection requirements 2 Inspection requirements 3 Table I 2 Tab
6、le II Values of capacitance and of voltage related to case sizes 2 Table III Other characteristics 3 Table IV 4 Publications referred to Inside back coverBSQC300501:1990 ii BSI 08-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standard
7、s Policy Committee. It is identical with IEC Publication384-6-1(QC300501) “Fixed capacitors for use in electronic equipment Part6: Blank detail specification: Fixed metallized polycarbonate film dielectric d.c. capacitors. Assessment level E” published in1987 by the International Electrotechnical Co
8、mmission (IEC). The UK has played an active part in the development of the IEC Publication. This standard is a harmonized specification within the IECQ system of quality assessment for electronic components. Cross-references. The British Standard which implements IEC Publications QC001001:1986 and Q
9、C001002:1986 is BS9000: “General requirements for a system for electronic components of assessed quality” Part3:1987 “Specification for national implementation of IECQ basic rules and rules of precedure”. A British Standard does not purport to include all the necessary provisions of a contract. User
10、s of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standard Corresponding British Standard IEC384-1:1982 BSQC300000:1983: Specification for harmonized system of quality asse
11、ssment for electronic components. Fixed capacitors for use in electronic equipment a Generic specification (Identical) IEC384-6:1987 (QC300500) BSQC300500:1988: Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sect
12、ional specification: Fixed metallized polycarbonate film dielectric d.c. capacitors (Identical) IEC410:1973 BS6001: Sampling procedures for inspection by attributes: Part1:1972: Specification for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection (Technically equivale
13、nt) a Formerly BS9930-0:1983. Summary of pages This document comprises a front cover, an inside front cover, pagesi toiv, pages1to8, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amen
14、dment table on the inside front cover.BSQC300501:1990 BSI 08-1999 iii Foreword 1) The formal decisions or agreements of the IEC on technical matters, prepared by Technical Committees on which all the National Committees having a special interest therein are represented, express, as nearly as possibl
15、e, an international consensus of opinion on the subjects dealt with. 2) They have the form of recommendations for international use and they are accepted by the National Committees in that sense. 3) In order to promote international unification, the IEC expresses the wish that all National Committee
16、s should adopt the text of the IEC recommendation for their national rules in so far as national conditions will permit. Any divergence between the IEC recommendation and the corresponding national rules should, as far as possible, be clearly indicated in the latter. Preface This standard has been p
17、repared by IEC Technical Committee No.40: Capacitors and Resistors for Electronic Equipment. The text of this standard is based upon the following documents: Further information can be found in the relevant Reports on Voting indicated in the table above. The QC number that appears on the front cover
18、 of this publication is the specification number in the IEC Quality Assessment System for Electronic Components (IECQ). Other IEC publications quoted in this standard: Six Months Rule Reports on Voting 40(CO)589 40(CO)598 40(CO)599 40(CO)634 40(CO)646 40(CO)647 Publications Nos. 384-1:1982, Fixed Ca
19、pacitors for Use in Electronic Equipment Part1: Generic Specification. Amendment No.1(1985) and No.2(1986). 384-6:1987, Part6: Sectional Specification: Fixed Metallized Polycarbonate Film Dielectric D.C. Capacitors. 410:1973, Sampling Plans and Procedures for Inspection by Attributes.iv blankBSQC300
20、501:1990 BSI 08-1999 1 Introduction Blank detail specification A blank detail specification is a supplementary document to the Sectional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requireme
21、nts may not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of Sub-clause1.4 of the sectional specification shall be taken into account. The numbers between brackets on the first page correspond to t
22、he following information which shall be inserted in the position indicated: Identification of the detail specification 1 The “International Electrotechnical Commission” or the National Standards Organization under whose authority the detail specification is drafted. 2 The IEC or National Standards n
23、umber of the detail specification, date of issue and any further information required by the national system. 3 The number and issue number of the IEC or national Generic Specification. 4 The IEC number of the blank detail specification. Identification of the capacitor 5 A short description of the t
24、ype of capacitor. 6 Information on typical construction (when applicable). NOTEWhen the capacitor is not designed for use in printed board applications, this shall be clearly stated in the detail specification in this position. 7 Outline drawing with main dimensions which are of importance for inter
25、changeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 8 Application or group of applications covered and/or assessment level. NOTEThe assessment level(s) to be used in a detail spec
26、ification shall be selected from the sectional specification, Sub-clause3.5.4. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping of the tests does not change. 9 Reference data on the most important properties, to allow c
27、omparison between the various capacitor types. 1 IEC384-6-1-XXX QC300501-XXX 2 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC384-6-1 QC300501 4 3 FIXED METALLIZED POLYCARBONATE FILM DIELECTRIC D.C. CAPACITORS 5 Outline drawing: (seeTable I) (.angle projection) 7 6 (Other shapes ar
28、e permitted within the dimensions given) Assessment level(s): E Performance grade: 8 Information on the availability of components qualified to this detail specification is given in the Qualified Products List. 9BSQC300501:1990 2 BSI 08-1999 Section 1. General data 1 General data 1.1 Recommended met
29、hod(s) of mounting (to be inserted) (SeeSub-clause1.4.2 of IEC Publication384-6) 1.2 Dimensions Table I 1.3 Ratings and characteristics Capacitance range (seeTable II) Tolerance on rated capacitance Rated voltage (seeTable II) Category voltage (if applicable) (seeTable II) Climatic category Rated te
30、mperature Maximum a.c. voltage (if applicable) Maximum pulse load Tangent of loss angle Insulation resistance Table II Values of capacitance and of voltage related to case sizes 1.4 Related documents 1.5 Marking The marking of the capacitor and the package shall be in accordance with the requirement
31、s of IEC Publication384-6, Sub-clause1.6. NOTEThe details of the marking of the component and package shall be given in full in the detail specification. Case size reference Dimensions (in millimetres or inches and millimetres) ? L H d . . . . . . . . NOTE 1When there is no case size reference, Tabl
32、e I may be omitted and the dimensions shall be given in Table II, which then becomes Table I. NOTE 2The dimensions shall be given as maximum dimensions or as nominal dimensions with a tolerance. Rated voltage Category voltage a Case size Case size Case size Case size Rated capacitance (in nF and/or
33、4F) a If different from the rated voltage. Generic specification: IEC Publication384-1:1982: Fixed Capacitors for Use in Electronic Equipment. Part1: Generic Specification. Amendment No.1(1985) and No.2(1986). Sectional specification: IEC Publication384-6:1987: Part6: Sectional Specification: Fixed
34、Metallized Polycarbonate Film Dielectric D.C. Capacitors.BSQC300501:1990 BSI 08-1999 3 1.6 Ordering information Orders for capacitors covered by this specification shall contain, in clear or in coded form, the following minimum information: a) Rated capacitance. b) Tolerance on rated capacitance. c)
35、 Rated d.c. voltage. d) Number and issue reference of the detail specification and style reference. 1.7 Certified records of released lots Required/not required. 1.8 Additional information (not for inspection purposes) 1.9 Additional or increased severities or requirements to those specified in the
36、generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. Table III Other characteristics Section 2. Inspection requirements 2 Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval, the procedures shall be in accordance
37、with the Sectional Specification, IEC Publication384-6, Sub-clause3.4. 2.1.2 For Quality Conformance Inspection, the test schedule (Table IV) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause3.5.1 of the Sectional Specification. Th
38、is table is to be used for defining characteristics which are additional to or more severe than those given in the sectional specification.BSQC300501:1990 4 BSI 08-1999 Table IV NOTE 1Sub-clause numbers of tests and performance requirements refer to the Sectional Specification, IEC Publication384-6
39、and Section 1 of this specification. NOTE 2Inspection Levels and AQLs are selected from IEC Publication410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p =periodicity (in months) n =sample size c =acceptance criterion (permitted number of defectives) D =destructi
40、ve ND =non-destructive IL =inspection level IEC Publication 410 AQL =acceptable quality level Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) I L A Q L Performance requirements (seeNote1) (seeNote2) Group A Inspection (lot-by-lot) Sub-group A1 ND S-4 2.5% 4.1 4.1 Visual e
41、xamination Dimensions (gauging) As in4.1 Legible marking and as specified in1.5 of this specification As specified in Table I of this specification Sub-group A2 ND II 1.0% 4.2.2 4.2.3 4.2.1 4.2.4 Capacitance Tangent of loss angle Voltage proof (TestA) Insulation resistance (TestA) Method: . Method:
42、. Within specified tolerance As in4.2.3.2 No breakdown or flashover As in4.2.4.2 GroupB inspection (lot-by-lot) Sub-groupB1 ND S-3 2.5% 4.5 4.15 Solderability Solvent resistance of the marking (ifapplicable) Without ageing Method: . Solvent: . Solvent temperature: . Method1 Rubbing material: . Recov
43、ery time: . Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within.s, as applicable Legible marking BSQC300501:1990 BSI 08-1999 5Table IV Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) Sample size and criterio
44、n of acceptability (seeNote3) Performance requirements (seeNote1) p n c GroupC inspection (periodic) Sub-groupC1A Part of sample of Sub-groupC1 D 6 9 1 4.1 4.3.1 4.3 4.4 4.14 4.4.2 Dimensions (detail) Initial measurements Robustness of terminations Resistance to soldering heat Component solvent resi
45、stance (ifapplicable) Final measurements Capacitance Tangent of loss angle: For C R 14F: at1kHz C R u 14F: at10kHz Visual examination Method: . Solvent: . Solvent temperature: . Method2 Recovery time: . Visual examination Capacitance Tangent of loss angle Seedetail specification No visible damage Se
46、edetail specification No visible damage Legible marking u1% for Grade1 u2% for Grade2 of the value measured initially Increase of tan: u 0.003Cu 14F Grade1 u 0.002C 14F Grade1 u 0.005Cu 14F Grade2 u 0.003C14F Grade2 compared to values measured in4.3.1 Sub-group C1B Other part of sample of Sub-group
47、C1 D 6 18 1 4.6.1 4.6 Initial measurements Rapid change of temperature Capacitance Tangent of loss angle: For C R 14F: at1kHz C R u 14F: at10kHz A=Lower category temperature B=Upper category temperature Five cycles Duration t 1=30min Visual examination No visible damage %C C -BSQC300501:1990 6 BSI 0
48、8-1999Table IV Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) Sample size and criterion of acceptability (seeNote3) Performance requirements (seeNote1) p n c 4.7 4.7.2 4.8 4.9 4.8.3 or 4.9.3 Vibration Final inspection Bump (or shock, see4.9) Shock (or bump, see4.8) Final
49、 measurements Method of mounting see1.1 of this specification ProcedureB4 Frequency range: .Hz to.Hz Amplitude0.75mm or acceleration98m/s 2(whichever is the less severe) Total duration:6h Visual examination Method of mounting: see1.1 of this specification Number of bumps: . Acceleration: .m/s 2 Duration of pulse: .ms Method of mounting: see1.1 of this specification Acceleration: .m/s 2 Duration of pulse: .ms Visual examination Capacitance Tangent of loss angle Insulation resistance No visible damage No vi
