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    BS PD IEC TS 62607-4-4-2016 Nanomanufacturing Key control characteristics Nano-enabled electrical energy storage Thermal characterization of nanomaterials nail penetration method《纳.pdf

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    BS PD IEC TS 62607-4-4-2016 Nanomanufacturing Key control characteristics Nano-enabled electrical energy storage Thermal characterization of nanomaterials nail penetration method《纳.pdf

    1、Nanomanufacturing Key control characteristicsPart 4-4: Nano-enabled electrical energy storage Thermal characterization of nanomaterials, nail penetration method PD IEC/TS 62607-4-4:2016BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06National forewordThis Published Do

    2、cument is the UK implementation of IEC/TS 62607-4-4:2016.The UK participation in its preparation was entrusted to TechnicalCommittee NTI/1, Nanotechnologies.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include a

    3、ll the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2016.Published by BSI Standards Limited 2016ISBN 978 0 580 91370 9ICS 07.120Compliance with a British Standard cannot confer immunity fromlegal obligations.This Published Do

    4、cument was published under the authority of theStandards Policy and Strategy Committee on 30 November 2016.Amendments/corrigenda issued since publicationDate Text affectedPUBLISHED DOCUMENTPD IEC/TS 62607-4-4:2016IEC TS 62607-4-4 Edition 1.0 2016-10 TECHNICAL SPECIFICATION Nanomanufacturing Key cont

    5、rol characteristics Part 4-4: Nano-enabled electrical energy storage Thermal characterization of nanomaterials, nail penetration method INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 07.120 ISBN 978-2-8322-3712-0 Registered trademark of the International Electrotechnical Commission Warning! Make sure

    6、 that you obtained this publication from an authorized distributor. colourinsidePD IEC/TS 62607-4-4:2016 2 IEC TS 62607-4-4:2016 IEC 2016 CONTENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope 6 2 Normative references 6 3 Terms and definitions 6 4 Sample preparation . 8 4.1 General sample requirements . 8 4

    7、.2 Pre-treatment 8 4.3 Puncture nail construction . 9 4.4 Puncture nail temperature and isolation verification 9 5 Measurement of electric properties 10 5.1 Equipment and testing site requirements. 10 5.2 Measurement system requirements . 10 5.3 Sample setup 11 5.4 Puncture method . 11 5.5 Design of

    8、 testing method 12 6 Data analysis / interpretation of result 13 6.1 Samples classification from the results . 13 6.1.1 Reference sample (without nanomaterials) 13 6.1.2 Test sample (with nanomaterials) 13 6.2 Data analysis 13 Annex A (informative) Data report example 15 Bibliography 17 Figure 1 Sch

    9、ematic view of puncture nail . 9 Figure 2 Schemetic view of puncture nail and the heated metal block 10 Figure 3 The puncture through depth of cell . 11 Figure 4 Flow chart of reference sample test procedures . 12 Figure 5 Voltage and temperatures versus time plot . 13 Figure 6 Repeatability plot of

    10、 voltage and temperature versus time 14 Figure 7 Performance comparison plot of voltage and temperature versus time . 14 Table 1 Hazard level description 12 Table A.1 Anode specifications 15 Table A.2 Cathode specifications . 15 Table A.3 Electrolyte specifications 15 Table A.4 Separator specificati

    11、ons . 15 Table A.5 Cell specification 15 Table A.6 Sample analysis . 16 PD IEC/TS 62607-4-4:2016IEC TS 62607-4-4:2016 IEC 2016 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ NANOMANUFACTURING KEY CONTROL CHARACTERISTICS Part 4-4: Nano-enabled electrical energy storage Thermal characterization of nano

    12、materials, nail penetration method FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all question

    13、s concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”

    14、). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collabor

    15、ates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on t

    16、he relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure th

    17、at the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the

    18、maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bod

    19、ies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to

    20、 IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and

    21、 expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9)

    22、 Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. The main task of IEC technical committees is to prepare International Standards. In exception

    23、al circumstances, a technical committee may propose the publication of a Technical Specification when the required support cannot be obtained for the publication of an International Standard, despite repeated efforts, or the subject is still under technical development or where, for any other reason

    24、, there is the future but no immediate possibility of an agreement on an International Standard. Technical Specifications are subject to review within three years of publication to decide whether they can be transformed into International Standards. IEC TS 62607-4-4, which is a Technical Specificati

    25、on, has been prepared by IEC technical committee 113: Nanotechnology for electrotechnical products and systems. PD IEC/TS 62607-4-4:2016 4 IEC TS 62607-4-4:2016 IEC 2016 The text of this Technical Specification is based on the following documents: Enquiry draft Report on voting 113/306/DTS 113/329/R

    26、VC Full information on the voting for the approval of this Technical Specification can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 62607 series, published under the

    27、general title Nanomanufacturing Key control characteristics, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC website under “http:/webstore.iec.ch“ in the data related to the specific

    28、publication. At this date, the publication will be transformed into an International Standard, reconfirmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a later date. IMPORTANT The colour inside logo on the cover page of this publicat

    29、ion indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. PD IEC/TS 62607-4-4:2016IEC TS 62607-4-4:2016 IEC 2016 5 INTRODUCTION Energy storage devices are becoming increas

    30、ingly important for many applications such as consumer devices, electric vehicles and aircrafts. Energy storage devices with high performance and reliability are the key factors to earn the confidence of customers. Also, in smart grid and renewable energy applications, where energy efficiency and re

    31、liable power supplies are critical, an energy storage system is an essential device. There are many types of energy storage devices for various applications. Lithium-ion batteries are the most popular and promising energy storage devices for portable electronics, consumer electronics, military, elec

    32、tric vehicle and aerospace applications. It is a good test carrier for performance and reliability characteristics. One of the characteristics that draws the attention of users is the thermal runaway behaviour when a short circuit occurs inside the energy storage devices due to a manufacturing proce

    33、ss defect, improper operation or external shocks. The poor control of manufacturing process may cause the energy storage devices internal defects, such as particle impurity, defects of separator, burr of electrodes or a prominence of conductive arms. Energy storage devices operated under abnormal co

    34、nditions, such as quick charging or piercing by external objects, may cause an internal short circuit. Large current generated short circuit will generate an abnormal exothermic reaction and a local temperature rise, but the temperature of the short circuit spot drops due to heat transfer. These eff

    35、ects cause the energy storage devices temperature to continue to rise rapidly. If it reaches thermal runaway temperature, it usually leads to fire and explosion of the energy storage devices. The event can result in damage to personnel and equipment. In the worst case scenario, this may hamper the d

    36、evelopment of such type of energy storage devices. In order to prevent such a scenario, nanomaterial additives have been used to prevent thermal runaway to ensure the reliability and safety of energy storage devices. The nanomaterial additives may mix with active materials of electrodes, electrolyte

    37、, coated on the surface of electrodes or separator. This document specifies general testing procedures and requirements for the assessment of thermal runaway performance and risk associated with the nano-enabled energy storage devices prepared by employing nanomaterial additives, and serves as the b

    38、asis for further developing particular product specific standards. This method covers only large temperature rises in cell temperature caused by shorting of the anode and cathode. This method does not generally cover thermal runaway due to other causes such as high external temperature and is not a

    39、general method to prevent thermal runaway. PD IEC/TS 62607-4-4:2016 6 IEC TS 62607-4-4:2016 IEC 2016 NANOMANUFACTURING KEY CONTROL CHARACTERISTICS Part 4-4: Nano-enabled electrical energy storage Thermal characterization of nanomaterials, nail penetration method 1 Scope This part of IEC 62607, which

    40、 is a Technical Specification, provides a measurement method for thermal runaway quality level test for nano-enabled energy storage devices. This method uses comparative measurement to enable a manufacturer to decide whether or not the nanomaterial additives used in energy storage devices are resili

    41、ent against the thermal runaway caused by a faulty or accidental low resistance connection between two or several internal points depending on the number of stacking electrode layers of the test sample. The nanomaterial additives may mix with the materials of positive and negative electrodes, electr

    42、olyte, coated on electrodes or separator. This document includes definitions of terminology, test sample, puncture nail requirements, test procedures, data analysis and methods of interpretation of results and a case study. This document does not apply directly to the safety testing for energy stora

    43、ge device products due to complex safety design schemes embedded in these products. 2 Normative references The following documents are referred to in the text in such a way that some or all of their content constitutes requirements of this document. For dated references, only the edition cited appli

    44、es. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO 9001:2015, Quality management systems Requirements ISO 14001:2015, Environmental management systems Requirements with guidance for use ISO 26000:2010, Guidance on social responsibility I

    45、SO/TS 80004-1:2015, Nanotechnologies Vocabulary Part 1: Core terms ISO/TS 80004-2:2015, Nanotechnologies Vocabulary Part 2: Nano-objects ISO/TS 80004-4:2011, Nanotechnologies Vocabulary Part 4: Nanostructured materials IEC TS 80004-9:2016, Nanotechnologies Vocabulary Part 9: Nano-enabled electro-tec

    46、hnical products and systems 3 Terms and definitions For the purposes of this document, the terms and definitions given in ISO 9001, ISO 14001, ISO 26000, the core terms of ISO/TS 80004-1, ISO/TS 80004-2, ISO/TS 80004-4, IEC TS 80004-9 and the following apply. ISO and IEC maintain terminological data

    47、bases for use in standardization at the following addresses: PD IEC/TS 62607-4-4:2016IEC TS 62607-4-4:2016 IEC 2016 7 IEC Electropedia: available at http:/http:/www.electropedia.org/ ISO Online browsing platform: available at http:/www.iso.org/obp 3.1 nanoscale length range approximately from 1 nm t

    48、o 100 nm SOURCE: ISO/TS 80004-1:2015, 2.1 3.2 nanomaterial material with any external dimension in the nanoscale or having internal structure or surface structure in the nanoscale SOURCE: ISO/TS 80004-1:2015, 2.4 3.3 nano-object discrete piece of material with one, two or three external dimensions i

    49、n the nanoscale SOURCE: ISO/TS 80004-1:2015, 2.5 3.4 nanomaterial additive nanomaterial, added in small quantities to a part of a device, to improve or otherwise modify one or more properties 3.5 nano composite material multiphase material where one of the phases has one, two or three dimensions of less than nanoscale 3.6 nano-enabled exhibiting function or performance only possible with nanotechnology SOURCE: ISO/TS 80004-1:201


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