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    BS PD IEC TR 62660-4-2017 Secondary lithium-ion cells for the propulsion of electric road vehicles Candidate alternative test methods for the internal short circuit test of IEC 626.pdf

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    BS PD IEC TR 62660-4-2017 Secondary lithium-ion cells for the propulsion of electric road vehicles Candidate alternative test methods for the internal short circuit test of IEC 626.pdf

    1、Secondary lithium-ion cells for the propulsion of electric road vehiclesPart 4: Candidate alternative test methods for the internal short circuit test of IEC 62660-3PD IEC/TR 62660-4:2017BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06National forewordThis Published

    2、Document is the UK implementation of IEC/TR 62660-4:2017.The UK participation in its preparation was entrusted to TechnicalCommittee PEL/21, Secondary cells and batteries.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purpor

    3、t to include all the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2017.Published by BSI Standards Limited 2017ISBN 978 0 580 95495 5ICS 29.220.20Compliance with a British Standard cannot confer immunity fromlegal obligations.

    4、This Published Document was published under the authority of the Standards Policy and Strategy Committee on 31 March 2017.Amendments/corrigenda issued since publicationDate Text affectedPUBLISHED DOCUMENTPD IEC/TR 62660-4:2017IEC TR 62660-4 Edition 1.0 2017-02 TECHNICAL REPORT Secondary lithium-ion

    5、cells for the propulsion of electric road vehicles Part 4: Candidate alternative test methods for the internal short circuit test of IEC 62660-3 INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 29.220.20 ISBN 978-2-8322-3715-1 Registered trademark of the International Electrotechnical Commission Warnin

    6、g! Make sure that you obtained this publication from an authorized distributor. colourinsidePD IEC/TR 62660-4:2017 2 IEC TR 62660-4:2017 IEC 2017 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope 7 2 Normative references 7 3 Terms and definitions 7 4 General provisions for alternative test . 7 5 Altern

    7、ative test method 8 5.1 Alternative test method description . 8 5.1.1 General . 8 5.1.2 Test preparation and test set-up 8 5.1.3 Test execution . 10 5.1.4 Acceptance criteria 11 Annex A (informative) Test data . 12 A.1 General . 12 A.2 Test data 12 A.2.1 Test results . 12 A.2.2 Data of each test . 1

    8、8 Figure 1 Example of test setup 1 9 Figure 2 Example of test setup 2 9 Figure 3 Example of ceramic nail with Ni tip . 10 Figure 4 Example of ceramic nail with Ni tip test 10 Figure A.1 Voltage and temperature of test 1-1 18 Figure A.2 Voltage and temperature of test 1-2 18 Figure A.3 Voltage and te

    9、mperature of test 1-3 19 Figure A.4 Voltage and temperature of test 2-1 19 Figure A.5 Voltage and temperature of test 2-2 20 Figure A.6 Voltage and temperature of test 2-3 20 Figure A.7 Voltage and temperature of test 3-1 21 Figure A.8 Voltage and temperature of test 3-2 21 Figure A.9 null3 mm ceram

    10、ic nail with Ni tip 22 Figure A.10 Voltage and temperature of test 4 . 22 Figure A.11 Voltage and temperature of test 5-1 23 Figure A.12 Voltage and temperature of test 5-2 23 Figure A.13 Voltage data of tests 6 24 Figure A.14 Voltage data of tests 7 24 Figure A.15 Voltage data of tests 8 25 Figure

    11、A.16 Voltage data of tests 9 25 Figure A.17 Voltage data of tests 10-1 . 26 Figure A.18 Voltage data of tests 10-2 . 26 Figure A.19 Voltage data of test 11-1 . 27 Figure A.20 Voltage data of test 11-2 . 27 PD IEC/TR 62660-4:2017IEC TR 62660-4:2017 IEC 2017 3 Figure A.21 Voltage data of test 12-1 . 2

    12、8 Figure A.22 Voltage data of test 12-2 . 28 Figure A.23 Voltage data of test 12-3 . 28 Figure A.24 Voltage data of test 12-4 . 29 Figure A.25 Voltage data of test 12-5 . 29 Figure A.26 Voltage data of test 12-6 . 29 Figure A.27 Voltage data of test 12-7 . 30 Figure A.28 Voltage data of test 13 30 F

    13、igure A.29 Voltage data of test 14-1 . 31 Figure A.30 Voltage data of test 14-2 . 31 Figure A.31 Voltage data of test 14-3 . 31 Figure A.32 Voltage data of test 14-4 . 32 Figure A.33 Voltage data of test 14-5 . 32 Figure A.34 Voltage data of tests 15 33 Figure A.35 Voltage data of tests 16 34 Table

    14、1 Recommended test specifications . 8 Table A.1 Internal short circuit test results . 13 PD IEC/TR 62660-4:2017 4 IEC TR 62660-4:2017 IEC 2017 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ SECONDARY LITHIUM-ION CELLS FOR THE PROPULSION OF ELECTRIC ROAD VEHICLES Part 4: Candidate alternative test metho

    15、ds for the internal short circuit test of IEC 62660-3 FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operat

    16、ion on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “

    17、IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this prepar

    18、ation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consen

    19、sus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts ar

    20、e made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications tr

    21、ansparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independen

    22、t certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liabil

    23、ity shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (includ

    24、ing legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of t

    25、his publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. The main task of IEC technical committees is to prepare International Stan

    26、dards. However, a technical committee may propose the publication of a Technical Report when it has collected data of a different kind from that which is normally published as an International Standard, for example “state of the art“. IEC TR 62660-4, which is a Technical Report, has been prepared by

    27、 IEC technical committee 21: Secondary cells and batteries. PD IEC/TR 62660-4:2017IEC TR 62660-4:2017 IEC 2017 5 The text of this Technical Report is based on the following documents: Enquiry draft Report on voting 21/891/DTR 21/899/RVC Full information on the voting for the approval of this Technic

    28、al Report can be found in the report on voting indicated in the above table. This document has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 62660 series, published under the general title Secondary lithium-ion cells for the propulsion of electric roa

    29、d vehicles, can be found on the IEC website. The committee has decided that the contents of this document will remain unchanged until the stability date indicated on the IEC website under “http:/webstore.iec.ch“ in the data related to the specific document. At this date, the document will be reconfi

    30、rmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a later date. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding

    31、 of its contents. Users should therefore print this document using a colour printer. PD IEC/TR 62660-4:2017 6 IEC TR 62660-4:2017 IEC 2017 INTRODUCTION IEC 62660-3 provides the test procedures and acceptance criteria for safety performance of secondary lithium-ion cells and cell blocks used for prop

    32、ulsion of electric vehicles (EV) including battery electric vehicles (BEV) and hybrid electric vehicles (HEV). IEC 62660-3 specifies the internal short circuit test to simulate an internal short circuit of a cell caused by the contamination of conductive particle, based on IEC 62619. Because the tes

    33、t method based on IEC 62619 requires opening of the cell and care to be taken, the industry needs alternative test methods that could also be applied under certain conditions. This document provides candidates of alternative test procedures. NOTE This test is to be conducted in a facility suitable t

    34、o contain the potential for hazardous reactions up to and including an explosion and with staff trained to manage the risks. PD IEC/TR 62660-4:2017IEC TR 62660-4:2017 IEC 2017 7 SECONDARY LITHIUM-ION CELLS FOR THE PROPULSION OF ELECTRIC ROAD VEHICLES Part 4: Candidate alternative test methods for th

    35、e internal short circuit test of IEC 62660-3 1 Scope This Part of IEC 62660 provides the test data on the candidate alternative test methods for the internal short circuit test according to 6.4.4.2.2 of IEC 62660-3:2016. The internal short circuit test in this document is intended to simulate an int

    36、ernal short circuit of a cell caused by the contamination of conductive particle, and to verify the safety performance of the cell under such conditions. This document is applicable to the secondary lithium-ion cells and cell blocks used for propulsion of electric vehicles (EV) including battery ele

    37、ctric vehicles (BEV) and hybrid electric vehicles (HEV). NOTE This document does not cover cylindrical cells. 2 Normative references The following documents are referred to in the text in such a way that some or all of their content constitutes requirements of this document. For dated references, on

    38、ly the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 62619:2017, Secondary cells and batteries containing alkaline or other non-acid electrolytes Safety requirements for secondary lithium cells and batteries, for

    39、use in industrial applications IEC 62660-3:2016, Secondary lithium-ion cells for the propulsion of electric road vehicles Part 3: Safety requirements 3 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 62660-3 apply. ISO and IEC maintain terminological d

    40、atabases for use in standardization at the following addresses: IEC Electropedia: available at http:/www.electropedia.org/ ISO Online browsing platform: available at http:/www.iso.org/obp. 4 General provisions for alternative test The internal short circuit test is specified in 6.4.4.2.1 of IEC 6266

    41、0-3:2016. The other test methods to simulate the internal short circuit of cell caused by the contamination of conductive particle may be selected if the following criteria are satisfied, and agreed between the customer and the supplier: PD IEC/TR 62660-4:2017 8 IEC TR 62660-4:2017 IEC 2017 a) The c

    42、ase deformation shall not affect the short circuit event of cell thermally or electrically. The energy shall not be dispersed by any short circuit other than the interelectrode short circuit. b) One layer internal short circuit between positive and negative electrode shall be simulated (target). c)

    43、Approximately the same short circuited area as that of 7.3.2 b) of IEC 62619:2017 shall be simulated. d) The short circuited locations in the cell shall be the same as described in 6.4.4.2.1 of IEC 62660-3:2016. e) The test shall be repeatable (see Table 1 of IEC 62619:2017). The detailed test condi

    44、tions and parameters of an alternative test shall be adjusted before the test according to the agreement between the customer and the cell manufacturer, so that the above criteria can be satisfied. The test result shall be evaluated by the disassembly of the cell, X-ray observation, etc. If the test

    45、 result shows more than one layer internal short circuit, or larger short circuited area, the test may be deemed as valid alternative test, provided that the acceptance criteria in 6.4.4.3 of IEC 62660-3:2016 are satisfied. The failure in an alternative test does not mean the failure in the test acc

    46、ording to 6.4.4.2.1 of IEC 62660-3:2016, because the test condition of the alternative test may be more severe than the prescribed criteria. NOTE In case the internal short circuit cannot be simulated, the test is invalid and the test data are reported. 5 Alternative test method 5.1 Alternative test

    47、 method description 5.1.1 General This subclause describes the test method of the indentation induced internal short circuit test as a candidate of alternative test methods in Clause 4. Table 1 provides the recommended test specifications of the test. Table 1 Recommended test specifications Item Rec

    48、ommendation Test temperature (temperature of the test bench and cell) 25 C 5 C State of charge (SOC) of the cell Maximum SOC specified by the cell manufacturer Press speed 0,1 mm/s or less Press speed accuracy 0,01 mm/s Position stability after pressurizing 0,02 mm Maximum pressurizing capability 1

    49、000 N or more Pressure measuring method Directly measured with a load cell Pressure measuring period 5 ms or less Temperature measuring period 1 s or less Voltage measuring period 5 ms or less Time to stop the indenter after voltage drop is detected 100 ms or less 5.1.2 Test preparation and test set-up 5.1.2.1 Cell preparation For flat or pouch cell, no preparation is needed. PD IEC/TR 62660-4:2017IEC TR 62660


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