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    BS EN 62059-31-1-2008 Electricity metering equipment - Dependability - Accelerated reliability testing - Elevated temperature and humidity《电计量设备 可靠性 增加可靠性测试 提高温度和湿度》.pdf

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    BS EN 62059-31-1-2008 Electricity metering equipment - Dependability - Accelerated reliability testing - Elevated temperature and humidity《电计量设备 可靠性 增加可靠性测试 提高温度和湿度》.pdf

    1、Electricity metering equipment Dependability Part 31-1: Accelerated reliability testing Elevatedtemperature and humidityBS EN 62059-31-1:2008raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI British StandardsLicensed Copy: Wang Bin, ISO/EXCHANGE CHI

    2、NA STANDARDS, 07/07/2009 08:26, Uncontrolled Copy, (c) BSINational forewordThis British Standard is the UK implementation of EN 62059-31-1:2008. It isidentical to IEC 62059-31-1:2008.The UK participation in its preparation was entrusted to Technical CommitteePEL/13, Electricity meters.A list of orga

    3、nizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions of acontract. Users are responsible for its correct application. BSI 2008ISBN 978 0 580 53559 8ICS 91.140.50BRITISH STANDARDBS EN 62059-31-1:20

    4、08Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of the StandardsPolicy and Strategy Committee on 31 March 2009 Amendments issued since publicationAmd. No. Date Text affectedLicensed Copy: Wang Bin, ISO/EXCHANGE

    5、 CHINA STANDARDS, 07/07/2009 08:26, Uncontrolled Copy, (c) BSIEUROPEAN STANDARD EN 62059-31-1 NORME EUROPENNE EUROPISCHE NORM November 2008 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung

    6、 Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 62059-31-1:2008 E ICS 29.240; 91.140.50 English version Electricity metering equipment - Dependability - Part 31-1: A

    7、ccelerated reliability testing - Elevated temperature and humidity (IEC 62059-31-1:2008) Equipements de comptage de llectricit -Sret de fonctionnement - Partie 31-1: Essais de fiabilit acclrs - Temprature et humidit lves (CEI 62059-31-1:2008) Elektrizittszhler -Zuverlssigkeit - Teil 31-1: Zeitraffen

    8、de Zuverlssigkeitsprfung - Temperatur und Luftfeuchte erhht (IEC 62059-31-1:2008) This European Standard was approved by CENELEC on 2008-11-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of

    9、 a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A ve

    10、rsion in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus,

    11、 the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. BS EN 62059-31-1:2008Licensed Co

    12、py: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 07/07/2009 08:26, Uncontrolled Copy, (c) BSIEN 62059-31-1:2008 - 2 - Foreword The text of document 13/1437A/FDIS, future edition 1 of IEC 62059-31-1, prepared by IEC TC 13, Electrical energy measurement, tariff- and load control, was submitted to the IEC-C

    13、ENELEC parallel vote and was approved by CENELEC as EN 62059-31-1 on 2008-11-01. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2009-08-01 latest date by which the national s

    14、tandards conflicting with the EN have to be withdrawn (dow) 2011-11-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 62059-31-1:2008 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliograph

    15、y, the following notes have to be added for the standards indicated: IEC 61124 NOTE Harmonized as EN 61124:2006 (not modified). IEC 61163-1 NOTE Harmonized as EN 61163-1:2006 (not modified). IEC 61164 NOTE Harmonized as EN 61164:2004 (not modified). IEC 61709 NOTE Harmonized as EN 61709:1998 (not mo

    16、dified). _ BS EN 62059-31-1:2008Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 07/07/2009 08:26, Uncontrolled Copy, (c) BSI- 3 - EN 62059-31-1:2008 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced

    17、documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modific

    18、ations, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60050-191 1990 International Electrotechnical Vocabulary (IEV) - Chapter 191: Dependability and quality of service - - IEC 60300-3-5 2001 Dependability management - Part 3-5: Application guide - Reliability

    19、 test conditions and statistical test principles - - IEC 61649 2008 Weibull analysis EN 61649 2008 IEC 61703 2001 Mathematical expressions for reliability, availability, maintainability and maintenance support terms EN 61703 2002 IEC/TR 62059-11 2002 Electricity metering equipment - Dependability -

    20、Part 11: General concepts - - IEC/TR 62059-21 2002 Electricity metering equipment - Dependability - Part 21: Collection of meter dependability data from the field - - IEC 62059-41 2006 Electricity metering equipment - Dependability - Part 41: Reliability prediction EN 62059-41 2006 IEC 62308 2006 Eq

    21、uipment reliability - Reliability assessment methods EN 62308 2006 BS EN 62059-31-1:2008Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 07/07/2009 08:26, Uncontrolled Copy, (c) BSI 2 62059-31-1 IEC:2008 CONTENTS INTRODUCTION.7 1 Scope.8 2 Normative references .8 3 Terms and definitions .9 4 S

    22、ymbols, acronyms and abbreviations14 5 Description of quantitative accelerated life tests .15 5.1 Introduction .15 5.2 The life distribution15 5.3 The life-stress model.15 6 The Weibull distribution 16 6.1 Introduction .16 6.2 Graphical representation .16 6.3 Calculation of the distribution paramete

    23、rs19 6.3.1 Input data to be used.19 6.3.2 Ranking of the time to failure.19 6.3.3 Reliability / unreliability estimates20 6.3.4 Calculation of the parameters 21 7 The life-stress model 25 7.1 General .25 7.2 Linear equation of the acceleration factor26 7.3 Calculation of parameters n and Ea.27 8 The

    24、 quantitative accelerated life testing method .28 8.1 Selection of samples .28 8.2 The steps to check product life characteristics 28 8.3 Procedure for terminating the maximum stress level test .29 8.4 Procedure to collect time to failure data and to repair meters 29 9 Definition of normal use condi

    25、tions .29 9.1 Introduction .29 9.2 Temperature and humidity conditions 30 9.2.1 Equipment for outdoor installation .30 9.2.2 Equipment for indoor installation .31 9.3 Temperature correction due to variation of voltage and current .31 9.3.1 Definition of the normal use profile of voltage and current

    26、.32 9.3.2 Measurement of the meter internal temperature at each current and voltage 32 9.3.3 Calculation of the meter average internal temperature.32 9.4 Other conditions 34 10 Classification and root cause of failures .34 11 Presentation of the results34 11.1 Information to be given34 11.2 Example

    27、35 12 Special cases .35 12.1 Cases of simplification 35 12.1.1 Minor evolution of product design 35 BS EN 62059-31-1:2008Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 07/07/2009 08:26, Uncontrolled Copy, (c) BSI62059-31-1 IEC:2008 3 12.1.2 Verification of production batches35 12.2 Cases whe

    28、n additional information is needed 35 12.2.1 The parameter changes significantly from maximum stress level to medium or low stress level 35 12.2.2 Fault mode different between stress levels 35 Annex A (informative) Basic statistical background 36 Annex B (informative) The characteristics of the Weib

    29、ull distribution38 Annex C (informative, see also draft IEC 62308) Life-stress models 42 Annex D (normative) Rank tables.44 Annex E (normative) Values of the Gamma function (n) .47 Annex F (normative) Calculation of the minimum duration of the maximum stress level test .48 Annex G (informative) Exam

    30、ple54 Bibliography84 INDEX 85 Figure 1 Weibull unreliability representation example with = 3 000, = 1,1, = 10 000.19 Figure 2 Example of graphical representation of F(t) in the case of Weibull distribution25 Figure 3 Example of regional climatic conditions30 Figure 4 Calculation of average year use

    31、conditions 31 Figure A.1 The probability density function 36 Figure A.2 The reliability and unreliability functions .37 Figure B.1 Effect of the parameter on the Weibull probability density function )(tf 39 Figure B.2 Effect of the parameter on the Weibull probability density function )(tf 40 Figure

    32、 F.1 Unreliability at normal use conditions49 Figure F.2 Unreliability at maximum stress level 50 Figure G.1 Graphical representation of display failures for each stress level63 Figure G.2 Graphical representation of Q2 failures for each stress level 64 Figure G.3 Graphical representation of U1 fail

    33、ures for each stress level 65 Figure G.4 Example of climate data .67 Figure G.5 Graphical representation of all failures at normal use conditions 76 Figure G.6 Final cumulative distribution with confidence intervals 81 Figure G.7 Reliability function extrapolated to normal use conditions .82 Figure

    34、G.8 Reliability function extrapolated to normal use conditions (First portion magnified).83 Table 1 Construction of ordinate (Y) 17 Table 2 Construction of abscissa (t-) 17 Table 3 Equations format entered into a spreadsheet 18 Table 4 Example with = 3 000, = 1,1, = 10 000 18 Table 5 Example of rank

    35、ing process of times to failure.20 Table 6 Unreliability estimates by median rank 21 Table 7 Example of unreliability estimation for Weibull distribution.24 BS EN 62059-31-1:2008Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 07/07/2009 08:26, Uncontrolled Copy, (c) BSI 4 62059-31-1 IEC:2008

    36、Table 8 Example of 90 % confidence bounds calculation for Weibull distribution24 Table 9 Values of the linear equation.27 Table 10 Example of procedure for temperature correction 33 Table G.1 Failures logged at 85 C with RH = 95 % .57 Table G.2 Failures logged at 85 C with RH = 85 % .59 Table G.3 Fa

    37、ilures logged at 85 C with RH = 75 % .60 Table G.4 Failures logged at 75 C with RH = 95 % .61 Table G.5 Failures logged at 65 C with RH = 95 % .62 Table G.6 Best fit Weibull distributions for display failures .63 Table G.7 Best fit Weibull distributions for Q2 failures64 Table G.8 Best fit Weibull d

    38、istributions for U1 failures65 Table G.9 Values of the linear equation for display failures66 Table G.10 Values of the linear equation for Q2 failures 66 Table G.11 Values of the linear equation for other failures.66 Table G.12 Normal use profile of voltage and current.67 Table G.13 Measurement of t

    39、he internal temperature.69 Table G.14 Arrhenius acceleration factors compared to temperature measured at Unand 0,1 Imax, for display failures .70 Table G.15 Arrhenius acceleration factors compared to temperature measured at Unand 0,1 Imax, for Q2 failures71 Table G.16 Arrhenius acceleration factors

    40、compared to temperature measured at Unand 0,1 Imax, for U1 failures 72 Table G.17 Display failures extrapolated to normal use conditions.74 Table G.18 Q2 failures extrapolated to normal use conditions75 Table G.19 U1 failures extrapolated to normal use conditions 76 Table G.20 Best fit Weibull distr

    41、ibutions at normal use conditions77 Table G.21 Display failures 90 % confidence bounds calculation .78 Table G.22 Q2 failures 90 % confidence bounds calculation 79 Table G.23 U1 failures 90 % confidence bounds calculation 80 BS EN 62059-31-1:2008Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS,

    42、 07/07/2009 08:26, Uncontrolled Copy, (c) BSI62059-31-1 IEC:2008 7 INTRODUCTION Electricity metering equipment are products designed for high reliability and long life under normal operating conditions, operating continuously without supervision. To manage metering assets effectively, it is importan

    43、t to have tools for predicting and estimating life characteristics of various types. IEC 62059-41 provides methods for predicting the failure rate assumed to be constant of metering equipment based on the parts stress method. IEC 62059-31-1 provides a method for estimating life characteristics using

    44、 temperature and humidity accelerated testing. It is practically impossible to obtain data about life characteristics by testing under normal operating conditions. Therefore, accelerated reliability test methods have to be used. During accelerated reliability testing, samples taken from a defined po

    45、pulation are operated beyond their normal operating conditions, applying stresses to shorten the time to failure, but without introducing new failure mechanisms. The estimation is performed by recording and analysing failures during such accelerated testing, establishing the failure distribution und

    46、er the test conditions and, using life stress models, extrapolating failure distribution under accelerated conditions of use to normal conditions of use. The method provides quantitative results with their confidence limits and may be used to compare life characteristics of products coming from diff

    47、erent suppliers or different batches from the same supplier. BS EN 62059-31-1:2008Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 07/07/2009 08:26, Uncontrolled Copy, (c) BSI 8 62059-31-1 IEC:2008 ELECTRICITY METERING EQUIPMENT DEPENDABILITY Part 31-1: Accelerated reliability testing Elevated

    48、 temperature and humidity 1 Scope This part of IEC 62059 provides one of several possible methods for estimating product life characteristics by accelerated reliability testing. Acceleration can be achieved in a number of different ways. In this particular standard, elevated, constant temperature an

    49、d humidity is applied to achieve acceleration. The method also takes into account the effect of voltage and current variation. Of course, failures not (or not sufficiently) accelerated by temperature and humidity will not be detected by the application of the test method specified in this standard. Other factors, like temperature variation, vibration, dus


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