1、Licensed Copy: Wang Bin, ISO/Exchange China Standards Information Centre, 26 June 2003, Uncontrolled Copy, (c) BSIBRITISH STANDARD BS EN 60122-1:2002 Quartz crystal units of assessed quality Part 1: Generic specification The European Standard EN 60122-1:2002 has the status of a British Standard ICS
2、31.140 Licensed Copy: Wang Bin, ISO/Exchange China Standards Information Centre, 26 June 2003, Uncontrolled Copy, (c) BSIBS EN 60122-1:2002 This British Standard was published under the authority of the Standards Policy and Strategy Committee on 5 February 2003 BSI 5 February 2003 ISBN 0 580 41183 4
3、 National foreword This British Standard is the official English language version of EN 60122-1:2002. It is identical with IEC 60122-1:2002. It supersedes BS EN 168000:1996 which is withdrawn. The UK participation in its preparation was entrusted to Technical Committee EPL/49, Piezoelectric devices
4、for frequency control and selection, which has the responsibility to: A list of organizations represented on this committee can be obtained on request to its secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be f
5、ound in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are re
6、sponsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and kee
7、p the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 42, an inside back cover and a back cover. The BSI copyright date displayed
8、 in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date Comments Licensed Copy: Wang Bin, ISO/Exchange China Standards Information Centre, 26 June 2003, Uncontrolled Copy, (c) BSIEUROPEAN STANDARD EN 60122-1 NORME EUROPENNE EUROPISCHE NORM Dec
9、ember 2002 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2002 CENELEC - All rights of exploitation in any form and by any mean
10、s reserved worldwide for CENELEC members. Ref. No. EN 60122-1:2002 E ICS 31.140 Supersedes EN 168000:1993 + A2:1998 English version Quartz crystal units of assessed quality Part 1: Generic specification (IEC 60122-1:2002) Rsonateurs quartz sous assurance de la qualit Partie 1: Spcification gnrique (
11、CEI 60122-1:2002) Schwingquarze mit bewerteter Qualitt Teil 1: Fachgrundspezifikation (IEC 60122-1:2002) This European Standard was approved by CENELEC on 2002-10-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
12、 Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English
13、, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Bel
14、gium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom. Licensed Copy: Wang Bin, ISO/Exchange China Standards Information Centre, 26 June 2003, Uncont
15、rolled Copy, (c) BSIEN 62102-:10022 - 2 Foreword The text of document 49/551/FDIS, future edition 3 of IEC 60122-1, prepared by IEC TC 49, Piezoelectric and dielectric devices for frequency control and selection, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60122-
16、1 on 2002-10-01. This European Standard supersedes EN 168000:1993 + A2:1998. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2003-07-01 latest date by which the national stand
17、ards conflicting with the EN have to be withdrawn (dow) 2005-10-01 Annexes designated “normative“ are part of the body of the standard. In this standard, annex ZA is normative. Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60122-1:2002 was approv
18、ed by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60068-2-58 NOTE Harmonized as EN 60068-2-58:1999 (not modified). IEC 60068-2-64 NOTE Harmonized as EN 60068-2-64:1994 (not m
19、odified). _ Page2 EN601221:2002Licensed Copy: Wang Bin, ISO/Exchange China Standards Information Centre, 26 June 2003, Uncontrolled Copy, (c) BSICONTENTS 1 General 6 1.1 Scope6 1.2 Normative references 6 1.3 Order of precedence8 2 Terminology and general requirements.8 2.1 General .8 2.2 Terms, defi
20、nitions and classification of phenomena.8 2.3 Preferred ratings and characteristics .23 2.3.1 Temperature ranges in degrees Celsius ( o C) suitable for ambient operation23 2.3.2 Elevated temperature ranges in degrees Celsius ( o C) suitable for oven control .23 2.3.3 Frequency tolerance (110 6 )23 2
21、.3.4 Circuit conditions.23 2.3.5 Levels of drive.23 2.3.6 Drive level dependency .24 2.3.7 Climatic category.24 2.3.8 Bump severity24 2.3.9 Vibration severity.25 2.3.10 Shock severity.25 2.3.11 Leak rate .25 2.4 Marking .25 3 Quality assessment procedures26 3.1 Primary stage of manufacture26 3.2 Str
22、ucturally similar components.26 3.3 Subcontracting 26 3.4 Manufacturers approval26 3.5 Approval procedures .26 3.5.1 General .26 3.5.2 Capability approval26 3.5.3 Qualification approval27 3.6 Procedures for capability approval.27 3.6.1 General .27 3.6.2 Eligibility for capability approval.27 3.6.3 A
23、pplication for capability approval .27 3.6.4 Granting of capability approval 27 3.6.5 Capability manual27 3.7 Procedures for qualification approval.27 3.7.1 General .27 3.7.2 Eligibility for qualification approval.27 3.7.3 Application for qualification approval .28 3.7.4 Granting of qualification ap
24、proval 28 3.7.5 Quality conformance inspection.28 3.8 Test procedures 28 3.9 Screening requirements.28 Page3 EN601221:2002Licensed Copy: Wang Bin, ISO/Exchange China Standards Information Centre, 26 June 2003, Uncontrolled Copy, (c) BSI061-221 EI:C0022 4 3.10 Rework and repair work.28 3.10.1 Rework2
25、8 3.10.2 Repair work .28 3.11 Certified records of released lots.28 3.12 Validity of release28 3.13 Release for delivery.29 3.14 Unchecked parameters29 4 Test and measurement procedures.29 4.1 General .29 4.2 Alternative test methods29 4.3 Precision of measurement .29 4.4 Standard conditions for tes
26、ting 29 4.5 Visual inspection .30 4.5.1 Visual test A 30 4.5.2 Visual test B 30 4.5.3 Visual test C30 4.6 Dimensioning and gauging procedures30 4.6.1 Dimensions, test A.30 4.6.2 Dimensions, test B.30 4.7 Electrical test procedures 30 4.7.1 Frequency and resonance resistance 30 4.7.2 Drive level depe
27、ndency .30 4.7.3 Frequency and resonance resistance as a function of temperature31 4.7.4 Unwanted responses .31 4.7.5 Shunt capacitance.31 4.7.6 Load resonance frequency and resistance.32 4.7.7 Frequency pulling range (f L1 , f L2 ).32 4.7.8 Motional parameters32 4.7.9 Insulation resistance32 4.8 Me
28、chanical and environmental test procedures .32 4.8.1 Robustness of terminations (destructive) .32 4.8.2 Sealing tests (non-destructive) 33 4.8.3 Soldering (solderability and resistance to soldering heat) (destructive)35 4.8.4 Rapid change of temperature, two-fluid bath method (non-destructive)35 4.8
29、.5 Rapid change of temperature with prescribed time of transition (non-destructive) .35 4.8.6 Bump (destructive) 35 4.8.7 Vibration (destructive) .36 4.8.8 Shock (destructive)36 4.8.9 Free fall (destructive).36 4.8.10 Acceleration, steady state (non-destructive) 36 4.8.11 Dry heat (non-destructive)
30、.36 4.8.12 Damp heat, cyclic (destructive)36 4.8.13 Cold (non-destructive) .36 4.8.14 Climatic sequence (destructive).37 4.8.15 Damp heat, steady state (destructive)37 4.8.16 Immersion in cleaning solvents (non-destructive).37 Page4 EN601221:2002Licensed Copy: Wang Bin, ISO/Exchange China Standards
31、Information Centre, 26 June 2003, Uncontrolled Copy, (c) BSI4.9 Endurance test procedure .37 4.9.1 Ageing (non-destructive)37 4.9.2 Extended ageing (non-destructive) 38 Annex ZA (normative) Normative references to international publications with their corresponding European publications .39 Bibliogr
32、aphy42 Figure 1 Symbol and equivalent electrical circuit of a piezoelectric resonator.10 Figure 2 Impedance |Z|, resistance R e , reactance X e , series arm reactance X 1of a piezoelectric resonator as a function of frequency13 Figure 3 Impedance and admittance diagram of a piezoelectric resonator14
33、 Figure 4 Resonance, anti-resonance and load resonance frequencies .15 Figure 5 Equivalent circuit of a piezoelectric resonator with a series (load) capacitance C L .22 Figure 6 Terminal bend test tool.34 Table 1 List of symbols used for the equivalent electric circuit of a piezoelectric resonator.1
34、8 Table 2 Solutions for the various characteristic frequencies .20 Table 3 Minimum values for the ratio r Q 2to be expected for various types of piezoelectric resonators20 Table 4 Approximate relations between the characteristic frequencies and the series resonance frequency f sof a piezoelectric re
35、sonator21 Page5 EN601221:2002Licensed Copy: Wang Bin, ISO/Exchange China Standards Information Centre, 26 June 2003, Uncontrolled Copy, (c) BSI061-221 EI:C0022 6 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY Part 1: Generic specification 1 General 1.1 Scope This part of IEC 60122 specifies the methods of
36、 test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures. 1.2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the editio
37、n cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60027(all parts), Letter symbols to be used in electrical technology IEC 60050(561):1991, International Electrotechnical Vocabulary (IEV) Chapter 561: Piezoelectric devices
38、for frequency control and selection IEC 60068-1:1988, Environmental testing Part 1: General and guidance IEC 60068-2-1:1990, Environmental testing Part 2: Tests Tests A: Cold IEC 60068-2-2:1974, Environmental testing Part 2: Tests Tests B: Dry heat IEC 60068-2-3:1969, Environmental testing Part 2: T
39、ests Test Ca: Damp heat, steady state IEC 60068-2-6:1995, Environmental testing Part 2: Tests Test Fc: Vibration (sinusoidal) IEC 60068-2-7:1983, Environmental testing Part 2: Tests Test Ga: Acceleration, steady state IEC 60068-2-13:1983, Environmental testing Part 2: Tests Test M: Low air pressure
40、IEC 60068-2-14:1984, Environmental testing Part 2: Tests Test N: Change of temperature IEC 60068-2-17:1994, Basic environmental testing procedures Part 2: Tests Test Q: Sealing IEC 60068-2-20:1979, Environmental testing Part 2: Tests Test T: Soldering IEC 60068-2-21:1999, Environmental testing Part
41、2-21: Tests Test U: Robustness of terminations and integral mounting devices Page6 EN601221:2002Licensed Copy: Wang Bin, ISO/Exchange China Standards Information Centre, 26 June 2003, Uncontrolled Copy, (c) BSI061-221 EI:C0022 7 IEC 60068-2-27:1987, Environmental testing Part 2: Tests Test Ea and gu
42、idance: Shock IEC 60068-2-29:1987, Environmental testing Part 2: Tests Test Eb and guidance: Bump IEC 60068-2-30:1980, Environmental testing Part 2: Tests Test Db and guidance: Damp heat, cyclic (12 + 12-hour cycle) IEC 60068-2-32:1975, Environmental testing Part 2: Tests Test Ed: Free fall (Procedu
43、re 1) IEC 60068-2-45:1980, Environmental testing Part 2: Tests Test XA and guidance: Immersion in cleaning solvents IEC 60122-3:2001, Quartz crystal units of assessed quality Part 3: Standard outlines and lead connections IEC 60444-1:1986, Measurement of quartz crystal unit parameters by zero phase
44、technique in a -network Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase techniques in a -network IEC 60444-2:1980, Measurement of quartz crystal unit parameters by zero phase technique in a -network Part 2: Phase offset m
45、ethod for the measurement of motional capacitance of quartz crystal units IEC 60444-4:1988, Measurement of quartz crystal unit parameters by zero phase technique in a -network Part 4: Method for the measurement of the load resonance frequency f L , load resonance resistance R Land the calculation of
46、 other derived values of quartz crystal units, up to 30 MHz IEC 60444-5:1995, Measurement of quartz crystal unit parameters Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error corrections IEC 60444-6:1995, Measurement of qua
47、rtz crystal unit parameters Part 6: Measurement of drive level dependence (DLD) IEC 60617 (all parts), Graphical symbols for diagrams IEC 61178-2:1993, Quartz crystal units A specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 2: Sectional specification Capabilit
48、y approval IEC 61178-3:1993, Quartz crystal units A specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 3: Sectional specification Qualification approval IEC QC 001001:2000, IEC Quality Assessment System for Electronic Components (IECQ) Basic Rules IEC QC 001002-
49、2:1998, ICQ Quality Assessment System for Electronic Components (IECQ) Rules of Procedure Part 2: Documentation IEC QC 001002-3:1998, IEC Quality Assessment System for Electronic Components (IECQ) Rules of Procedure Part 3: Approval Procedures Page7 EN601221:2002Licensed Copy: Wang Bin, ISO/Exchange China Standar
