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    BS CECC 41102-1978 Specification for harmonized system of quality assessment for electronic components - Blank detail specification preset potentiometers (assessment level M)《电子元器件.pdf

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    BS CECC 41102-1978 Specification for harmonized system of quality assessment for electronic components - Blank detail specification preset potentiometers (assessment level M)《电子元器件.pdf

    1、BRITISH STANDARD BS CECC 41102:1978 Specification for Harmonized system of quality assessment for electronic components Blankdetail specification Preset potentiometers (Assessmentlevel M)BSCECC 41102:1978 BSI10-1999 ISBN 0 580 35556 X Amendments issued since publication Amd. No. Date CommentsBSCECC

    2、41102:1978 BSI 10-1999 i Contents Page National foreword ii Foreword ii 1 Ratings and characteristics 1 2 Marking 1 3 Related documents 2 4 Ordering information 2 5 Certified test records 2 6 Delayed delivery 2 7 Additional information (Not for inspection purposes) 2 8 Inspection requirements 2 Tabl

    3、e 1 1 Table 2 3BSCECC 41102:1978 ii BSI 10-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC)41102 “Blank detail specification: Preset potentiometers

    4、(assessment level M)”. This standard is a harmonized specification within the CECC system. Terminology and conventions The text of the CECC specification has been approved as suitable for publication, without deviation, as a British Standard. Some terminology and certain conventions are not identica

    5、l with those used in British Standards. Attention is especially drawn to the following. The comma has been used throughout as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross references The British Standard harmonized with

    6、 CECC00100 is BSE9000 “General requirements for electronic components of assessed quality harmonized with the CENELEC Electronic Component Committee System” Part1 “Basic rules”. The following International Standards are referred to in the text and for each there is a corresponding British Standard;

    7、these are as listed below: Scope This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC41100. Detail specification layout In the event of conflict between the requirements of this specification and the

    8、 provisions of BSE9000 the latter shall take precedence except the front page layout will be in accordance with BS9000Circular Letter No.15 dated August 1977. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for the

    9、ir correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standard Corresponding British Standard CECC41000:1976 BS CECC41000:1977 Harmonized system of quality assessment for electronic components: Generic specification for po

    10、tentiometers (Identical) CECC41100:1976 BS CECC41100:1978 Harmonized system of quality assessment for electronic components: Lead screw actuated and rotary preset potentiometers (Identical) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, theCECC title p

    11、age, pageii, pages1 to 10and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.BSCECC 41102:1978 ii BSI 10-1999 Foreword The CENELEC Electronic Components Committee (CECC

    12、) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the speci

    13、fications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This document has been formally

    14、 approved by the CECC, and has been prepared for those member countries taking part in the System who wish to issue national harmonized specifications for PRESET POTENTIOMETERS (Assessment level M). It should be read in conjunction with document CECC00100: Basic Rules (1974). At the date of printing

    15、 of this document the member countries of the CECC are Belgium, Denmark, Germany, France, Ireland, Italy, the Netherlands, Norway, Sweden, Switzerland, theUnitedKingdom, and copies of it can be obtained from the National Committees of the CENELEC in these countries. Preface This blank detail specifi

    16、cation was prepared by CECC Working Group4: “Resistors”. In accordance with the requirements of document CECC00100 it is based, wherever possible, on the Recommendations of the International Electrotechnical Commission and in particular on IEC Publication393-1: Potentiometers. Part1: Terms and metho

    17、ds of test. The text of this blank detail specification was circulated to the CECC for voting in the documents listed below and was ratified by the CECC for printing as a CECC Specification. Key for page1 The numbers between square brackets on page3 correspond to the following indications which shou

    18、ld be given: Document Voting Date CECC (Secretariat)433 27 December 1975 CECC (Secretariat)436 27 February 1976 CECC (Secretariat)561 10 January 1977 Identification of the harmonized detail specification 1 The name of National Standards Organization under whose authority the detail specification is

    19、drafted 2 The CECC Symbol and the number allotted to the national detail specification by the CECC General Secretariat 3 The number and issue number of the national generic and sectional specifications 4 The national number of the detail specification, date of issue and further information required

    20、by the national system, together with any amendment numbers, if issued. Identification of the potentiometer 5 A short description of the type of potentiometer 6 Information on typical construction (where applicable) for example: non-wirewound, leadscrew actuated. 7 Outline drawing with main dimensio

    21、ns which are of importance for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 8 Application or group of applications covered, or, preferably, the level of quality assess

    22、ment covered by the blank detail specification. 9 Reference data on the most important properties, to allow comparison between the various resistor types.BSCECC41102:1978 BSI 10-1999 1 1.1 Derating Potentiometers covered by this specification are derated according to - - - - - - 2 Marking 2.1 The fo

    23、llowing marking information, in the order of importance given below, is required: 1) Rated resistance 2) Tolerance on rated resistance 1 page of 2 ELECTRONIC COMPONENT OF ASSESSED QUALITY IN ACCORDANCE WITH 3 4 DETAIL SPECIFICATION for Typical Construction: 5 6 7 3 All dimensions in millimetres. Tab

    24、le 1 Rated dissipation at70 C (W) Limiting element voltage V d.c. or a.c. Isolation voltage V d.c. or a.c. peak 9 Normal air pressure Low air pressure 1 Ratings and characteristics a Resistance range Standard selection Standard selection tolerances Temperature characteristic of resistance(20to70 C)

    25、Climatic category The range of values in each style is given in the Qualified Products List - - - - - - - % % R:k (- - %R) (% R/R%T:k- - - ppm/ C) -/-/- a The preferred values are those of the E - - - series of IEC63. Where the use of intermediate values is essential, they should, wherever possible,

    26、 be chosen from a series in that document. See the relevant Qualified Products List for availability of components made to this specification Vibration severity Limits of resistance change (a to c) (after1000h electrical endurance test) Starting torque Total mechanical travel Limiting slider current

    27、 - - - Hz to - - - Hz:0,75mm or98m/s 2(whicheveristheless severe) (- - - %R+- - - 7) - - - mNm to - - - mNm - - - - - - turns or - - - . - - - mABSCECC 41102:1978 2 BSI 10-1999 3) Resistance law (if other than linear) 4) Detail specification and style 5) Date of acceptance. A nationally approved cod

    28、e may be used. 6) Manufacturers name and trade mark 2.2 The potentiometers itself shall be clearly marked with1) and2) above using, where practicable, one of the coding methods specified in IEC62, and with as many of the remaining items as is practicable. 2.3 The package containing the potentiometer

    29、 shall be clearly marked with1) to6). 2.4 Any additional marking shall be so applied that no confusion can arise. 3 Related documents (National Authorized Institutions will complete this section, making reference to any documents recommendations or specifications directly referred to in their nation

    30、al equivalent of this document). 4 Ordering information Orders for potentiometers covered by this specification shall contain the following information: Resistance value and tolerance Resistance law (if other than linear) Number of the detail specification and style reference 5 Certified test record

    31、s National Authorized Institutions shall indicate whether certified test records shall be prepared in accordance with3.5 of CECC41000. 6 Delayed delivery The provisions of3.6 of CECC41000 shall apply except that the Inspection Level shall be reduced to S-2 and (except for carbon composition types th

    32、e period shall be extended to two years. The period for carbon composition types shall remain at one year. 7 Additional information (Not for inspection purposes) The detail specification may include information (which is not required to be verified by the inspection procedure) such as circuit diagra

    33、ms, curves, drawings, notes needed for the clarification of the detail specification. The resolution shall also be given for wirewound types only. 8 Inspection requirements 8.1 When drying is called for, procedure I of4.2 of CECC41000 shall be used. 8.2 When it is desired to obtain qualification app

    34、roval by adopting the fixed sample size procedure, use shall be made of the test schedule given for that purpose in CECC41100. The conditions of test and the performance requirements shall be identical to those prescribed for quality conformance inspection in the detail specification. 8.3 In the qua

    35、lity conformance inspection the values representative of the whole approved range shall be tested within one year (Groups A, B and C only).BSCECC41102:1978 BSI 10-1999 3 Table 2 Test (See Note1) D or ND Conditions of Test IL AQL Performance Requirements (See Note1) (See Note2) Group A Inspection To

    36、be conducted on a sampling basis, lot-by-lot Sub-Group A1 ND S-3 4,0% 4.3.1 Visual inspection As in4.3.1 Sub-Group A2 ND S-3 1,5 % 4.3.2 4.5 Marking Element resistance As in4.3.2 As in4.5.1 Sub-Group A3 ND S-3 2,5 % 4.4 Continuity As in4.4 Group B Inspection To be conducted on a sampling basis, lot-

    37、by-lot Sub-Group B1 D S-2 1,5 % 4.12 Voltage proof Insulated styles only Normal air pressure See D1.1 As in4.12.5 4.23.1 Soldering Solderability Solder bath method: The terminations shall be examined for good tinning as evidence by free flowing of the solder with wetting of the terminations Temperat

    38、ure: Duration: 230 10 C 2 0,5 s Notes on page 10BSCECC 41102:1978 4 BSI 10-1999Table 2 Test (See Note1) D or ND Conditions of Test Sample size & criterion of acceptability (See Note3) Performance Requirements (See Note1) P n c Group C Inspection To be conducted on a sampling basis, at the periodicit

    39、y given in column “P”. Sub-Group C1 ND 3 5 1 4.3.3 Dimensions (gauging) As specified in the detail specification 4.8 Mechanical and electrical travel SeeC1.1 and C1.2 Lead screw styles. Effective operating turns Rotary styles 70% of total mechanical travel As specified in the detail specification Su

    40、b-Group C2 D 3 5 1 4.21 Robustness of terminations The tests appropriate to the type of termination Visual examination Element resistance As in4.21.8 (1) %R: k (- - %R+ - - 7) 4.15 Rotational noise Method B k - - - 7 Sub-Group C3 D 6 8 1 4.32.2 Electrical endurance at70 C SeeD1.2 Duration:1000h Load

    41、ed between a and c. Examination at168,500 and1000h. Visual examination Element resistance a to c Loaded between a and b Examination at168,500 and1000h. Visual examination Resistance a to b As in4.32.2.6 (1) %R: k (- - %R+ - - 7) As in4.32.2.6 (1) %R: k (- - %R+ - - 7) Notes on page 10BSCECC41102:197

    42、8 BSI 10-1999 5Table 2 Test (See Note1) D or ND Conditions of Test Sample size & criterion of acceptability (See Note3) Performance Requirements (See Note1) P n c All specimens Examination at 1 000 h Insulation resistance See D1.1 Rotational noise Method B U 1C7 k - - - 7 Group D Inspection To be co

    43、nducted on a sampling basis, at the periodicity given in column “P” Sub-Group D1 D 12 5 1 4.29 Damp heat, steady state Where potentiometers are designed to be mounted directly on to a metal chassis4.29.2.1 shall apply. The first group shall contain one specimen and the second and third groups two sp

    44、ecimens in each. For all other potentiometers4.29.2.2 shall apply. The first group shall contain two specimens and the second group three specimens. DC load (See Note4) Isolation voltage (See Note4 andD1.1) As in4.29.4 Final measurements Visual examination Element resistance Insulation resistance (i

    45、nsulated styles only) SeeD1.1. Continuity Starting torque Voltage proof (insulated styles only) SeeD1.1 As in4.29.6.1 %R: k (- - %R+ - - 7) U 100M7 As in4.4.1 - - -mNm to - - - mNm As in4.29.6.8 Notes on page 10BSCECC 41102:1978 6 BSI 10-1999Table 2 Test (See Note1) D or ND Conditions of Test Sample

    46、 size & criterion of acceptability (See Note3) Performance Requirements (See Note1) P n c Sub-Group D2 D 12 8 1 4.30 Mechanical endurance (potentiometer) Number of cycles:200 Rate:4 1 cycles per minute SeeC1.4 Visual examination Element resistance Starting torque Rotational noise Method B As in4.30.

    47、6 %R: k (- - %R+ - - 7) - - - mNm to - - -mNm k - - - 7 Sub-Group D3 ND 12 5 1 4.16 Starting torque SeeC1.3 As specified in the detail specification 4.18 End-stop torque For rotary types or others fitted with end stops. As in4.18.1 For types fitted with slipping clutches (SeeC1.3) As in4.18.2 Not le

    48、ss than five times the upper limit of the starting torque. (Unless otherwise stated in the detail specification) As in4.18.2 4.19 Locking torque (where applicable) Visual examination : k - - - % As in4.19.3 4.6 Terminal resistance Resistance a to b Resistance b to c k - - -7 k - - -7 4.20 Thrust and

    49、 pull on spindle Only the thrust shall be applied during these tests. The pull is not applicable. Two specimens As specified in4.20.2 Continuity As in4.20.2 Notes on page 10 % Vab Vac -BSCECC41102:1978 BSI 10-1999 7Table 2 Test (See Note1) D or ND Conditions of Test Sample size & criterion of acceptability (See Note3) Performance Requirements (See Note1) P n c Remaining specimens As specified in4.20.3 : k - - - % Sub-Group D4 D See Note8 24 8 1 2 (1) 4 Specimens 4.23


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