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    ASTM F326-1996(2006) Standard Test Method for Electronic Measurement for Hydrogen Embrittlement From Cadmium-Electroplating Processes《电镀镉工艺氢度化电子测量的标准试验方法》.pdf

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    ASTM F326-1996(2006) Standard Test Method for Electronic Measurement for Hydrogen Embrittlement From Cadmium-Electroplating Processes《电镀镉工艺氢度化电子测量的标准试验方法》.pdf

    1、Designation: F 326 96 (Reapproved 2006)Standard Test Method forElectronic Measurement for Hydrogen Embrittlement FromCadmium-Electroplating Processes1This standard is issued under the fixed designation F 326; the number immediately following the designation indicates the year oforiginal adoption or,

    2、 in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method covers an electronic hydrogen detec-tion instrument procedure

    3、for measurement of plating perme-ability to hydrogen. This method measures a variable related tohydrogen absorbed by steel during plating and to the hydrogenpermeability of the plate during post plate baking. A specificapplication of this method is controlling cadmium-platingprocesses in which the p

    4、late porosity relative to hydrogen iscritical, such as cadmium on high-strength steel.1.2 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices a

    5、nd determine the applica-bility of regulatory limitations prior to use. For specific hazardstatement, see Section 8.1.3 The values stated in SI units are to be regarded as thestandard. The values given in parentheses are for informationonly.2. Referenced Documents2.1 ASTM Standards:2D 1193 Specifica

    6、tion for Reagent WaterF 519 Test Method for Mechanical Hydrogen Embrittle-ment Evaluation of Plating/Coating Processes and ServiceEnvironments3. Terminology3.1 Definitions of Terms Specific to This Standard:3.1.1 hydrogen pressure peakthe maximum hydrogenpressure value (see IH) obtained when the pro

    7、be is heatedfollowing calibration, plating, or fluid testing.3.2 Symbols:3.2.1 HP = calibration hydrogen pressure peak.3.2.2 HPp= plating hydrogen pressure peak.3.2.3 IE= probe cathode emission current.3.2.4 IH= probe hydrogen pressure.3.2.5 Ig= integral of IHcurve from probe on to HP.3.2.6 lambda =

    8、 time in seconds for hydrogen pressurepeak to drop to half its value.3.2.7 l = lambda obtained from a calibration run.3.2.8 lp= lambda obtained from a plating run.3.2.9 lpc= normalized test lambda, obtained as follows:lpc5lp40/l! (1)3.2.10 lpc= arithmetic average of normalized lambdas fora set of te

    9、sts.3.2.11 range = difference between maximum lpcand mini-mum lpcfor a given set of tests.3.2.12 run = calibration or plating of a probe.3.2.13 test = single evaluation of a plating solution forhydrogen embrittlement determination; run using a previouslycalibrated probe.3.2.14 set of testsall consec

    10、utive tests on a plating solu-tion for a given operator-instrument-day evaluation.3.2.15 windowtest surface of a probe described in Fig.1(A).4. Summary of Test Method4.1 This method uses a metal-shelled vacuum probe as anion gage to evaluate electrodeposited cadmium characteristicsrelative to hydrog

    11、en permeation. After calibration, a section ofthe probe shell is electroplated at the lowest current densityencountered in the cadmium electroplating process. During thesubsequent baking of the probe at a closely controlled tem-perature, the probe ion current, proportional to hydrogenpressure, is re

    12、corded as a function of time. From these data andthe calibration data of the probe, a number related to theporosity of the electroplated metal relative to hydrogen isobtained.4.2 During the initial part of the bakeout, hydrogen contin-ues to diffuse through the metal shell of the probe and the ioncu

    13、rrent increases. Within a short time, however, a maximumcurrent is observed and then falls off as hydrogen is driven outof the system.1This test method is under the jurisdiction of ASTM Committee F07 onAerospace and Aircraft and is the direct responsibility of Subcommitteee F07.04 onHydrogen Embritt

    14、lement.Current edition approved Nov. 1, 2006. Published January 2007. Originallyapproved in 1978. Last previous edition approved in 2001 as F 326 96 (2001)e2.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of A

    15、STMStandards volume information, refer to the standards Document Summary page onthe ASTM website.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.4.3 Observations of the ion current-time curve indicate thatthe slope of the curve has a

    16、n empirical relationship with failuredata on stress rupture specimens such as those in Test MethodF 519. For this method, Igand l variables (see Section 3) mustbe empirically correlated with results from the stress rupturespecimens. This gives a quick means of measuring ease ofbaking hydrogen out of

    17、 cadmium-electroplated parts.4.4 Before an electroplating test, calibration is accom-plished by electrolyzing the probe in a standard solution andbaking it to determine Igand l of the unplated steel shell of theprobe.5. Significance and Use5.1 Hydrogen is evolved during metal electrodeposition inaqu

    18、eous baths. Some of this hydrogen enters parts duringplating. If the absorbed hydrogen is at a level presentingembrittlement hazards to high-strength steel, it is removed bybaking parts after plating to expel this hydrogen. However, thelack of plate porosity itself may block hydrogen egress. Thus,it

    19、 becomes important to know both the relative amount ofhydrogen absorbed and the plate porosity.5.2 This test provides a quantitative control number forcadmium plate porosity that can be used to control a cadmiumplating process and the status of cadmium-plated hardware. Itcan also be used for plating

    20、 process troubleshooting andresearch and development to determine the effects on plateporosity by process variables, contaminants, and materials.When used to control a critical process, control numbers forplate porosity must be determined by correlation with stressrupture specimens or other acceptab

    21、le standards.5.3 There is no prime standard for plate porosity. For thisreason, two ovens must be used, with tests alternated betweenovens. Data from the ovens are compared to ensure noequipment change has occurred.6. Apparatus6.1 Hydrogen Detection InstrumentA system consistingof a control unit, tw

    22、o special ovens, auxiliary heater, recorder,test probes, and associated equipment.6.2 OvenThe oven warms the probe to increase thehydrogen diffusion rate into the probe. Oven parameters areselected by apparatus manufacturer to provide a standardreading for all hydrogen detection instruments.6.3 Oven

    23、 StopperStopper covering the oven opening.Remove 10 s before inserting the probe.6.4 WindowThe window is the unpainted, bare steelportion of the probe, 0.63 6 0.03 in. in height, that is plated inthe solution under test. The window is shown in Fig. 1.6.5 Abrasive BlastAbrasive blast window area in t

    24、hesame way, using the same media, as used for the parts. Probeshould be rotated while being blasted to provide uniformsurface.6.6 Electronic Bakeout UnitThis heats the probe electri-cally to remove hydrogen absorbed into the probe after testing.May be part of hydrogen detection instrument.7. Reagent

    25、s and Materials7.1 Reagents:7.1.1 Purity of ReagentsReagent grade chemicals shall beused in all tests. Unless otherwise indicated, it is intended thatall reagents conform to the specifications of the Committee onAnalytical Reagents of the American Chemical Society wheresuch specifications are availa

    26、ble.3Other grades may be used,provided it is first ascertained that the reagent is of sufficienthigh purity to permit its use without lessening the accuracy ofthe determination.7.1.2 Acetone (C3H6O), technical.7.1.3 Anode Cleaning SolutionConcentrated nitric acid(HNO3), reagent grade.7.1.4 Cadmium S

    27、tripping SolutionAmmonium Nitrate(125 g/L)Dissolve 125 g of ammonium nitrate (NH4NO3,technical) in water and dilute to 1 L. Use at room temperature.7.1.5 Calibration SolutionSodium Cyanide (50 g/L) PlusSodium Hydroxide (50 g/L)Dissolve 50 g of sodium hydrox-ide (NaOH) in water.Add 50 g of sodium cya

    28、nide (NaCN) anddissolve. Dilute to 1 L. Use at 18 to 27C (65 to 80F).7.1.6 Water, Distilled or Deionized, minimum electricalresistivity 50 000 Vcm (for example, Specification D 1193).7.2 Materials:3Reagent Chemicals, American Chemical Society Specifications , AmericanChemical Society, Washington, DC

    29、. For suggestions on the testing of reagents notlisted by the American Chemical Society, see Analar Standards for LaboratoryChemicals, BDH Ltd., Poole, Dorset, U.K., and the United States Pharmacopeiaand National Formulary, U.S. Pharmacopeial Convention, Inc. (USPC), Rockville,MD.FIG. 1 Probe Config

    30、urationF 326 96 (2006)27.2.1 Anodes (Calibration), solid-carbon arc rods, 5.1- to12.7-mm (0.20- to 0.50-in.) diameter.7.2.2 Anodes (Plating), cadmium rods, A-A-51126 6.4 to12.7 mm (0.25 to 0.50 in.) thick, round or square.7.2.3 Polytetrafluoroethylene (PTFE) TapeThe tapeshould be appropriate for use

    31、 in solution, width about 12 to 19mm, thickness small enough to seal.7.2.4 Glass 1-L Beaker.8. Hazards8.1 Sodium cyanide, cyanide, cadmium, nitric acid, andacetone can be health hazards. Use adequate face, hands, andrespiratory protection commensurate with standards estab-lished by American Conferen

    32、ce of Government and IndustrialHygiene for these chemicals.9. Sampling9.1 Stir plating bath to ensure homogeneity. The platingbath sample must be representative of the bath. Obtain thesample from beneath the surface of the bath, not by skimmingthe surface. Chemical constituents must be within normal

    33、operating range.10. Preparation of Apparatus10.1 Plug in instrument and allow sufficient time for war-mup.10.2 Turn on the oven and allow 4 h for warmup.10.3 Leave the instrument on continuously.10.4 Clean contaminated anodes in cleaning solution,(7.1.3) until heavy gassing is observed. (WarningSee

    34、Sec-tion 8.)11. Calibration of Apparatus11.1 Calibration Position, 1.08 6 0.2 A/dm2(10 6 2A/ft2)Use nominal dimensions of Fig. 1(A) for currentcalculations.11.2 Plating Position, 62 % of CurrentSet plating cur-rent density at the minimum value allowed by the platingspecification.11.3 Probe Current,

    35、Ie,66 0.2 mA.11.4 Electronic Probe Bakeout, 100 6 10 mA.11.5 Probe IH: 1 IHunit = 107ALinearity, 62 % full scale within eachrange, 1 to 10 00011.6 OvensOvens are calibrated by the manufacturersagainst standard ovens that in turn were calibrated withnotched tension specimen data. Oven stability is ch

    36、ecked bycomparing ovens against each other in duplicate tests.11.7 Correlation of OvensTo correlate ovens, determinelpcfor all tests of a set (except tests discarded in accordancewith 13.4.4). From lpcand the number of tests, determine Dfrom Fig. 2. Separate data and compute lpcfor each oven. Letlpc

    37、(A) be the higher value and lpc(B) the lower value. Wherelpc(A) lpc(B) is less than D, the ovens are comparable.Where lpc(A) lpc(B) is greater than D, the ovens are notcomparable.12. Procedure12.1 Bakeout of Probe:12.1.1 Strip cadmium-plated probes in stripping solution(7.1.4) and rinse in 50C (122F

    38、) water for 2 min beforebakeout.12.1.2 Insert a probe into the socket of an electronic bakeoutunit.12.1.3 Within 30 s, the heater should stabilize or be adjustedto 86.5 6 16.5 mA. If the heater does not register current, theprobe is defective and must be discarded.12.1.4 Bake out the probe for the t

    39、ime required to meet thelimits in 12.2. Do not continuously bake out probes for longerthan2htopreclude damaging paint.12.2 Probe CheckoutProbes that are new, or have beencalibrated or plated and stripped, need to be baked out to meetcheckout requirements as follows:12.2.1 Hot Probe:12.2.1.1 Set the

    40、range to 10.NOTE 1Here and throughout the specification, range settings are forfull-scale reading.12.2.1.2 Remove the probe from the electronic bakeout unit;plug into the socket assembly and 15 6 1 s after removal fromthe bakeout unit, turn the probe on.12.2.1.3 Observe the peak value of IH. If less

    41、 than 1,proceed with surface activation. If it is greater than 1.0, screwon the cap and insert probe into the oven.12.2.1.4 If IHis 0.5 or less within 5 min of inserting theprobe into the oven, proceed to surface preparation. If theprobe does not drop to IH= 0.5 or less with 5 min, bake outagain. If

    42、 three successive bakeouts do not reduce IHto 0.5 orless within 5 min of insertion into the oven, discard the probe.12.2.1.5 Set the instrument to read IE. Probe IEshould read6.0 6 0.2 mA. If IEdoes not read or cannot be adjusted to this,the probe or the instrument is defective. Check the instrument

    43、with other probes to determine which is defective. Discarddefective probes.12.2.2 Cold Probe:12.2.2.1 Set the range to 1.0.12.2.2.2 Plug the probe into socket assembly and turn on.12.2.2.3 Observe the peak value of IH. If less than 0.2,proceed to surface preparation. If greater than 0.2, insert into

    44、the oven.12.2.2.4 Proceed as in 12.2.1, 12.2.1.4, and 12.2.1.5.12.3 Surface PreparationBefore the probe window prepa-ration, check to ensure the window width and height above theprobe base meet the requirements of Fig. 1(A). The probeshaving windows out of limits must be cleaned and repainted inacco

    45、rdance with the suppliers instructions or discarded.12.3.1 Mask the probe to meet the requirement of Fig. 1(B)using conforming masks, supplied with instruments or PTFEadhesive tape. Edges of masks must coincide with edges ofwindow with no paint being visible. Protect the base of theprobe. Remove abr

    46、asive dust from the rubber masks to avoidpaint damage.12.3.2 For processes using current densities under 4.32A/dm2(40A/ft2), use production equipment to blast productionparts. For processes with higher current densities, use labora-tory blast equipment. Dry abrasive blast the window area of theF 326

    47、 96 (2006)3probe. Use material, size, air pressures, and distances repre-sentative of production blasting. Dry abrasive blast beforecalibration may be in a laboratory cabinet.NOTE 2Some production facilities may not be adaptable to blasting ofprobes. Special procedures will need to be approved by th

    48、e procuringagency.12.3.3 Remove conformal blasting masks, ensuring that thewindow area is not touched. Remove loose abrasive byblowing off with filtered compressed air or by using a tissuepaper, taking care not to scratch the paint. Fingerprints orvisible contamination on the window invalidate the r

    49、un.12.3.4 Visually inspect the window area for cleanliness anduniformly textured surface representative of production parts.Repeat Steps 12.3.1-12.3.3 as required to provide acceptablecleanliness and texture.12.3.5 Proceed to the calibration run or plating run asapplicable; immerse the probe within 10 min after sandblast-ing.12.4 Probe Calibration:12.4.1 Pour 850 6 50 mL (28.6 6 0.17 fl oz) of calibrationsolution (7.1.5) into a clean, dry 1-L beaker and insert fourcarbon anodes, (7.2.1) equally spaced and rigidly mounted tofit snugly ins


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