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    ASTM E2119-2000 Standard Practice for Quality Systems for Conducting In Situ Measurements of Lead Content in Paint or Other Coatings Using Field-Portable X-Ray Fluorescence (XRF) D.pdf

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    ASTM E2119-2000 Standard Practice for Quality Systems for Conducting In Situ Measurements of Lead Content in Paint or Other Coatings Using Field-Portable X-Ray Fluorescence (XRF) D.pdf

    1、Designation: E 2119 00Standard Practice forQuality Systems for Conducting In Situ Measurements ofLead Content in Paint or Other Coatings Using Field-Portable X-Ray Fluorescence (XRF) Devices1This standard is issued under the fixed designation E 2119; the number immediately following the designation

    2、indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This practice covers the collection a

    3、nd documentation ofquality control (QC) measurements for determining acceptablelevels of instrumental performance when using field-portableenergy-dispersive x-ray fluorescence spectrometry devices(XRFs) for the purposes of generating lead classificationresults from measurements on paint and other co

    4、ating filmswithin buildings and related structures.1.2 QC procedures covered in this provisional practiceinclude the performance of calibration checks, substrate biaschecks, and specific instructions for documenting the collecteddata for later use in reporting the results.1.3 No detailed operating i

    5、nstructions are provided becauseof differences among the various makes and models of suitableinstruments. Instead, the analyst is to follow the instructionsprovided by the manufacturer of the particular XRF device orother relevant sources of information on XRF operation.1.4 This practice contains no

    6、tes which are explanatory andare not part of the mandatory requirements of this provisionalpractice.1.5 The values stated in SI units are to be regarded as thestandard.1.6 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of

    7、 the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:E 1583 Practice for Evaluating Laboratories Engaged in theDetermination of Lead in Paint, Dust, Airborne

    8、Particu-lates, and Soil inAround Buildings and Related Structures2E 1605 Terminology Relating to Abatement of Hazardsfrom Lead-Based Paint in Buildings and Related Struc-tures3E 1613 Test Method for Analysis of Digested Samples forLead by Inductively Coupled Plasm Atomic EmissionsSpectrometry (ICP-A

    9、ES), Flame Atomic Absorption(FAAS), or Graphite Furnace Atomic Absorption (GFAAS) Techniques3E 1645 Practice for Preparation of Dried Paint Samples forSubsequent Lead Analysis by Atomic Spectrometry3E 1729 Practice for Field Collection of Dried Paint Samplesfor Lead Determination by Atomic Spectrome

    10、try Tech-niques32.2 Other Document:Guidelines for the Evaluation and Control of Lead-BasedPaint Hazards in Housing43. Terminology3.1 DefinitionsFor definition of terms not presented be-low, refer to Terminology E 1605.3.2 Definitions of Terms Specific to This Standard:3.2.1 building component, npart

    11、 or element of a buildingthat is made of an industry product that is manufactured as anindependent unit and is capable of being joined with otherelements. Examples include doors, walls, baseboard and exte-rior siding.3.2.2 calibration check, na procedure that generates a QCmeasurement using a calibr

    12、ation test sample with one type ofcontrol block (usually wood).3.2.3 calibration mode, na selected operating mode thatpermits adjustment of an instruments calibration.3.2.4 calibration test sample, na test film sample of aknown lead level in mg/cm2, which must have a reporteduncertainty of the lead

    13、level. Calibration test samples may beseparate from a substrate or adhered to a substrate. All1This practice is under the jurisdiction ofASTM Committee E-6 on Performanceof Buildings and is the direct responsibility of Subcommittee E06.23 on Abatementof Hazards from Lead in Buildings and Related Str

    14、uctures.Current edition approved Nov. 10, 2000. Published March 2001. Originallypublished as PS 95 98. Last previous edition PS 95 98.2Discontinued 1998. See 1997 Annual Book of ASTM Standards, Vol 04.11.3Annual Book of ASTM Standards, Vol 04.11.4Available from the U.S. Department of Housing and Urb

    15、an Development,Washington, DC 20410, www.hud.gov/lea.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.calibration test samples shall be traceable to the NationalInstitute of Standards and Technology (NIST) standard refer-ence material

    16、s and have a known specified uncertainty in theknown lead level.3.2.5 continuing calibration check, na calibration checkperformed during the testing day after the initial calibrationcheck. A continuing calibration check also can serve as a finalcalibration check.3.2.6 control block, na small block o

    17、f material of anidentifiable substrate type used to simulate a building materialduring QC measurements.3.2.7 display unit, nan electronic device that presents theresults of an XRF measurement to the user. Other parameterssuch as total measurement time also may be presented.3.2.8 final calibration ch

    18、eck, nthe last calibration checkperformed in a testing period.3.2.9 inconclusive lead classification result, na lead clas-sification result that reliably cannot be expressed, for example,reported, as either containing lead (positive) or not containinglead (negative) at or above an appropriate local,

    19、 state, orfederal action level for lead in coatings. Such results com-monly are referred to and reported as “inconclusive” results,for example, the XRF measurement that cannot determinewhether lead is or is not present at or above an appropriatelocal, state, or federal action level for lead in coati

    20、ngs.3.2.10 initial calibration check, nthe first calibrationcheck of the testing period performed after the XRF instrumenthas been turned on and allowed to warm up.3.2.11 lead classification result, nan XRF measurementexpressed, for example, as either positive-for-lead, or negative-for-lead, at or a

    21、bove and appropriate local, state, or federalaction level for lead in coatings.Anegative-for-lead result doesnot mean there is no lead present. For some makes and modelsof XRF instruments, lead measurement values obtained near anappropriate local, state or federal action level for lead incoatings ma

    22、y generate inconclusive lead classification results.3.2.12 nominal read time, na read time that results whenthe radioactive source normally provided by the manufacturerfor that XRF instrument is at its original source strength.3.2.13 operating mode, none or more settings that definethe operating par

    23、ameters of an XRF instrument. Some XRFinstruments have multiple settings for use under differenttesting situations, for example, substrates, time or testingobjectives.3.2.14 power-down, nan event where the power to theXRF instrument is turned off. The XRF instrument can notcollect and display any XR

    24、F measurements after a power-down.3.2.15 power-on, nan event where the power to the XRFinstrument from the battery is turned on. The XRF instrumentcan collect and display any XRF measurements after a power-on.3.2.16 probe, na hand-held device containing a radioac-tive source, x-ray detector and asso

    25、ciated mechanical andelectronic components that is placed against a test location orcalibration test sample to obtain an XRF measurement.3.2.17 radioactive source, na radioactive material (forexample,57Co or109Cd) that emits X rays or gamma rays thatcause ionization of atoms in the sample, and subse

    26、quently acascade of higher energy electrons into the vacated lowerenergy shells. As these electrons fall into the lower energyorbitals, X rays characteristic of the atomic species, such aslead, are emitted from the test location.3.2.18 read timea period of X ray data collection time. Itmay be contro

    27、lled manually or automatically depending on theXRF instrument model. It begins with the opening of the XRFinstrument shutter to expose the paint film surface to sourcegamma rays and X rays and ends when the source shutter isclosed and the XRF reading is complete.3.2.19 sampling sitea local geographi

    28、cal area that con-tains at least one unit being tested. A sampling site generally islimited to an area that is easily covered by walking.3.2.20 substrate, nthe building material that lies under thecoating.3.2.21 substrate bias check (SBC), na procedure thatgenerates a QC measurement using a calibrat

    29、ion test sampleand a control block to determine the effect of that substrate onthe XRF measurement.3.2.22 substrate-corrected XRF measurementsa proce-dure that corrects an XRF measurement for substrate effects(see the HUD Guidelines for more information on substratecorrections).3.2.23 substrate type

    30、, nthe type of building material thatlies under the coating. Examples include wood, plaster, gyp-sum wallboard, metal, brick, and concrete.3.2.24 test location, nan area on a building componentwhere a lead measurement value is obtained.3.2.25 testing period, na block of time that defines thecontinuo

    31、us power-on operation of an XRF instrument. Anypower-down of an XRF instrument terminates the testingperiod.3.2.26 unit, nall or a portion of a structure or facility thatis the target of an investigation. Test locations are considered tobe within a unit. An example of a unit is a single familydwelli

    32、ng including a detached garage that is part of theproperty.3.2.27 x-ray detector, na device that results in an elec-tronic signal as a result of the interception of an x-ray.Examples include gas proportional counters, for example, Xe,solid scintillation counters, for example, CsI, and semiconduc-tor

    33、 devices of elemental composition, for example, Si or Ge, orcompound composition, for example, HgI2, CdTe, or CdZnTe.3.2.28 XRF instrument, na field-portable XRF device oranalyzer with associated equipment designed and manufac-tured for use in measuring lead in paint or other coating films.XRF instr

    34、uments, at minimum, include an excitation source,such as a radioactive source, x-ray detector, probe, and adisplay unit.3.2.29 XRF measurement, na procedure used to determinethe lead content of a coating at a test location using an XRFinstrument, or a lead result, expressed as mg of lead per cm2ofsu

    35、rface, that is, mg/cm2, obtained from a coating at a testlocation using an XRF instrument. An XRF measurement maybe one reading or the average of one or more XRF readings.E21190023.2.30 XRF reading, na response, expressed as mg oflead/cm2of surface, that is, mg/cm2, of an XRF instrument forone read

    36、time.4. Summary of Practice4.1 This practice covers the quality assurance (QA), qualitycontrol (QC) and recording procedures to follow when usingfield-portable energy-dispersive x-ray fluorescence spectrom-etry devices (XRFs) to collect measurements of lead in paint orlead in other coating films for

    37、 the purposes of generating leadclassification results. This practice includes start-up proce-dures, beginning-of-day calibration check QC procedures,during-the-test-day QC check procedures, and end-of-day QCcheck procedures designed to complement standard operatingprocedures written by manufacturer

    38、s for specific models offield-portable XRF instruments.5. Significance and Use5.1 This practice provides procedures to generate and docu-ment QC data for ensuring that an XRF is operating withinacceptable tolerances throughout the testing period when beingused to collect lead results during a lead-b

    39、ased pain (LBP)inspection for the purposes of generating lead classificationresults.5.2 This practice is intended to supplement XRF instrumentmanufacturer protocols and Performance Characteristic Sheets(PCSs)4through the use of QA and QC procedures to provideuniform lead testing practices among the

    40、wide variety ofavailable field-portable XRF instruments.5.3 While the QC results collected using this practice canprovide assurances that an XRF instrument is operating withinacceptable tolerances, this practice does not determine anactual level of confidence for a classification result obtainedfrom

    41、 an XRF measurement.5.4 This practice does not address selection of test locationsor representative sampling for leaded paint. Additional infor-mation on conducting measurements of lead in leaded paint orother coatings may be found in the HUD Guidelines, Chapter7.45.5 This practice involves the use

    42、of field-portable XRFinstruments that may contain radioactive materials that emit Xrays and gamma rays. These instruments are intended for useonly by qualified, trained personnel.5.6 The use of field-portable XRF instruments for measure-ment of lead may not accurately reveal low but still potentiall

    43、yhazardous levels of lead.6. Materials and Equipment6.1 (Field-Portable) XRF InstrumentOne of a variety ofthe commercially available field-portable XRF instrumentsdesigned for use in measuring lead in paint and other coatings.6.2 Calibration Check SamplesCalibration test samplesthat are used to veri

    44、fy XRF instrument calibration.6.3 Control BlocksA set of substrate materials for use inmaking QC measurements as defined in Table 1.6.4 Substrate SupportA support material used to holdcalibration check samples and control blocks away from anyadditional underlying material in a manner that will notin

    45、terfere with the lead measurements on calibration checksamples. The support material shall not itself have potentiallyinterfering leaded paint or other material within or on it andshall be one of the following:6.4.1 A polystyrene foam block with minimum thickness of25 cm,6.4.2 Atable constructed fro

    46、m an empty cardboard box withminimum height of 25 cm, or6.4.3 Any physical arrangement that holds the calibrationcheck sample so that at least 25 cm of free air space or foammaterial exists between the XRF instrument-sample-substratearrangement and any nearby physical objects.7. Procedure7.1 Conduct

    47、 XRF measurements on test locations in accor-dance with manufacturer protocols (see Note 1). In addition,XRF measurements shall adhere to the items presented in7.2-7.4.3.NOTE 1Exercise care to avoid performing XRF measurements onsurfaces, which may generate inaccurate results even under conditionswh

    48、ere all measurements are performed within the QC and QA specifica-tions described in this practice. Surfaces that may generate inaccurateresults include:(1) Extremely rough, curved or highly ornate surfaces. In general,field-portable XRF instruments are designed to perform XRF measure-ments on flat

    49、surfaces.Any surface condition that does not permit the XRFprobe to come into complete contact with the surface may generateinaccurate results.(2) Substrates that have leaded coatings on the side opposite from thesurface being measured. The extent of the effect on an XRF measurementdepends on the instrument model, the substrate type and thickness, and thelead content of the film on the opposite side. An example would be arecessed portion of a thin panel door where one side contains a leadedcoating while the other side does not. In this example, mea


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