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    ASTM C1303 C1303M-2014 Standard Test Method for Predicting Long-Term Thermal Resistance of Closed-Cell Foam Insulation《预测闭孔泡沫绝缘的场地热耐性的标准试验方法》.pdf

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    ASTM C1303 C1303M-2014 Standard Test Method for Predicting Long-Term Thermal Resistance of Closed-Cell Foam Insulation《预测闭孔泡沫绝缘的场地热耐性的标准试验方法》.pdf

    1、Designation: C1303/C1303M 12C1303/C1303M 14Standard Test Method forPredicting Long-Term Thermal Resistance of Closed-CellFoam Insulation1This standard is issued under the fixed designation C1303/C1303M; the number immediately following the designation indicates theyear of original adoption or, in th

    2、e case of revision, the year of last revision. A number in parentheses indicates the year of lastreapproval. A superscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method covers a procedure for predicting the long-term thermal resistance (L

    3、TTR) of unfaced or permeably facedrigid gas-filled closed-cell foam insulations by reducing the specimen thickness to accelerate aging under controlled laboratoryconditions (1-5).2NOTE 1See Terminology, 3.2.1, for the meaning of the word aging within this standard.1.2 Rigid gas-filled closed-cell fo

    4、am insulation includes all cellular plastic insulations manufactured with the intent to retain ablowing agent other than air.1.3 This test method is limited to unfaced or permeably faced, homogeneous materials. This method is applied to a wide rangeof rigid closed-cell foam insulation types, includi

    5、ng but not limited to: extruded polystyrene, polyurethane, polyisocyanurate, andphenolic. This test method does not apply to impermeably faced rigid closed-cell foams or to rigid closed-cell bun stock foams.NOTE 2See Note 8 for more details regarding the applicability of this test method to rigid cl

    6、osed-cell bun stock foams.1.4 This test method utilizes referenced standard test procedures for measuring thermal resistance. Periodic measurements areperformed on specimens to observe the effects of aging. Specimens of reduced thickness (that is, thin slices) are used to shortenthe time required fo

    7、r these observations. The results of these measurements are used to predict the long-term thermal resistanceof the material.1.5 The test method is given in two parts. The Prescriptive Method in Part A provides long-term thermal resistance values ona consistent basis that can be used for a variety of

    8、 purposes, including product evaluation, specifications, or product comparisons.The Research Method in part B provides a general relationship between thermal conductivity, age, and product thickness.1.5.1 To use the Prescriptive Method, the date of manufacture must be known, which usually involves t

    9、he cooperation of themanufacturer.1.6 The values stated in either SI units or inch-pound units are to be regarded separately as standard. The values stated in eachsystem may not be exact equivalents; therefore, each system shall be used independently of the other. Combining values from thetwo system

    10、s may result in non-conformance with the standard.1.7 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibilityof the user of this standard to establish appropriate safety and health practices and determine the applicability of re

    11、gulatorylimitations prior to use.1.8 Table of Contents:SectionScope 1Reference Documents 2Terminology 3Summary of Test Method 4Significance and Use 5Part A: The Prescriptive Method 6Applicability 6.1Qualification Requirements 6.1.1Facing Permeability 6.1.2Apparatus 6.21 This test method is under the

    12、 jurisdiction of ASTM Committee C16 on Thermal Insulation and is the direct responsibility of Subcommittee C16.30 on ThermalMeasurement.Current edition approved March 1, 2012April 15, 2014. Published May 2012September 2014. Originally approved in 1995. Last previous edition approved in 20112012as C1

    13、303 11C1303 12.A. DOI: 10.1520/C1303_C1303M-12.10.1520/C1303_C1303M-14.2 The boldface numbers in parentheses refer to the list of references at the end of this standard.This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes ha

    14、ve been made to the previous version. Becauseit may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current versionof the standard as published by ASTM is to be considered the official do

    15、cument.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States1Sampling 6.3Schedule 6.3.1Representative Replicate Product Sheets 6.3.2Replicate Test Specimen Sets 6.3.3Specimen Preparation 6.4Goal 6.4.1Schedule 6.4.2Specimen Extraction 6.4.3S

    16、lice Flatness 6.4.4Slice Thickness 6.4.5Stack Composition 6.4.6Storage Conditioning 6.5Test Procedure 6.6Thermal Resistance Measurement Schedule 6.6.1Thermal Resistance Measurements 6.6.2Product Density 6.6.3Calculations 6.7Part B: The Research Method 7Background 7.1TDSL Apparatus 7.2Sampling Schedu

    17、le 7.3Specimen Preparation 7.4Storage Conditioning 7.5Test Procedure 7.6Calculations 7.7Reporting 8Reporting for Part A, the Prescriptive Method 8.1Reporting for Part B, the Research Method 8.2Precision and Bias 9Keywords 10Mandatory Information Qualification AnnexA1Specimen Preparation A1.1Homogene

    18、ity Qualification A1.2Aging Equivalence Test Procedure A1.3Thermal Conductivity Equivalence Test Procedure A1.3Alternate Product Thickness Qualification A1.4Example Calculations A1.5Mandatory Information-Preparation of Test Specimens forSpray-Foam ProductsAnnexA2Effect Of TDSL AppendixX1History of t

    19、he Standard AppendixX2Theory of Foam Aging AppendixX3References2. Referenced Documents2.1 ASTM Standards:3C168 Terminology Relating to Thermal InsulationC177 Test Method for Steady-State Heat Flux Measurements and Thermal Transmission Properties by Means of theGuarded-Hot-Plate ApparatusC518 Test Me

    20、thod for Steady-State Thermal Transmission Properties by Means of the Heat Flow Meter ApparatusC578 Specification for Rigid, Cellular Polystyrene Thermal InsulationC591 Specification for Unfaced Preformed Rigid Cellular Polyisocyanurate Thermal InsulationC1029 Specification for Spray-Applied Rigid C

    21、ellular Polyurethane Thermal InsulationC1045 Practice for Calculating Thermal Transmission Properties Under Steady-State ConditionsC1126 Specification for Faced or Unfaced Rigid Cellular Phenolic Thermal InsulationC1289 Specification for Faced Rigid Cellular Polyisocyanurate Thermal Insulation Board

    22、D1622 Test Method for Apparent Density of Rigid Cellular PlasticsD6226 Test Method for Open Cell Content of Rigid Cellular PlasticsE122 Practice for Calculating Sample Size to Estimate, With Specified Precision, the Average for a Characteristic of a Lot orProcess3 For referencedASTM standards, visit

    23、 theASTM website, www.astm.org, or contactASTM Customer Service at serviceastm.org. For Annual Book of ASTM Standardsvolume information, refer to the standards Document Summary page on the ASTM website.C1303/C1303M 1422.2 Other Standards:CAN/ULC S770 Standard Test Method for Determination of Long-Te

    24、rm Thermal Resistance of Closed-Cell Thermal InsulationFoams42.3 ASTM Adjuncts:Test Method for Predicting Long-Term Thermal Resistance of Closed-Cell Foam Insulation53. Terminology3.1 DefinitionsFor definitions of terms and symbols used in this test method, refer to Terminology C168.3.2 Definitions

    25、of Terms Specific to This Standard:3.2.1 aging, vthe change in thermophysical properties of rigid closedcell plastic foam with time, primarily due to changesin the composition of the gas contained within the closed cells.3.2.2 bias, na generic concept related to a consistent or systematic difference

    26、 between a set of test results from the process(that is, the predicted thermal conductivity at 5 years) and an accepted reference value of the property being measured (that is, theactual thermal resistance after 5 years of full-thickness products taken from the same lot as the source of the thin sli

    27、ces).3.2.3 core slice, na thin-slice foam specimen that was taken at least 5 mm 0.2 in. or 25 % of the product thickness,whichever is greater, away from the surface of the full-thickness product.3.2.4 effective diffusion thickness, none-half of the geometric thickness minus the total thickness of da

    28、maged surface layer(s)(TDSL).3.2.5 facing, na material adhered to the surface of foam insulation, including any foam product that has been suffused intothe facing material, but not inclusive of any skin formed by the foam insulation itself.3.2.6 homogeneous material, nsufficiently uniform in structu

    29、re and composition to meet the requirements of this test method(see A1.2).3.2.7 long-term, adjfor the purposes of the Prescriptive Method, long term refers to five years.3.2.8 normalized service life, nproduct service life divided by the square of the full product thickness, units of time/length2.3.

    30、2.9 scaled time, ntime divided by the square of the specimen thickness.3.2.10 scaled service life, ntime necessary for a thin specimen to reach the same thermal conductivity that a full thicknessspecimen would reach at the end of its service life, equals the product service life multiplied by the sq

    31、uare of the ratio of theaverage slice thickness to the full product thickness, value has units of time.3.2.11 service life, nthe anticipated period of time that the material is expected to maintain claimed thermophysical properties,may be dependent on the specific end-use application.3.2.12 surface

    32、slice, na thin-slice foam specimen that was originally adjacent to the surface of the full-thickness product andthat includes any facing that was adhered to the surface of the original full-thickness product.3.2.13 thickness of damaged surface layer (TDSL), nthe average thickness of surface cells, o

    33、n one surface, that are eitherdestroyed (ruptured or opened) during the preparation of test specimens or were originally open due to the manufacturing process.3.3 Symbols:i = counter used in a summationk = thermal conductivity, W/(mK)n = counter used in a summationN = number of cut planar surfacesnS

    34、L = counter in a time series that corresponds to the service life.R = thermal resistance, (m2K)/WTDSL = average thickness of damaged surface layer, mXeff = effective diffusion thickness of thermal resistance specimen, m3.3 Symbols:Fsurface = fraction of the product thickness represented by surface s

    35、licei = counter used in a summationk = thermal conductivity, W/(mK)L = thickness, mn = counter used in a summationN = number of cut planar surfaces4 Underwriters Laboratory of Canada, 333 Pfingsten Road, Northbrook, IL 60062-2096 USA,www.ulc.ca5 Available from ASTM International Headquarters. Order

    36、Adjunct No. ADJC1303.C1303/C1303M 143nSL = counter in a time series that corresponds to the service life.R = thermal resistance, (m2K)/WTDSL = average thickness of damaged surface layer, mX = insulation thickness, mXeff = effective diffusion thickness of thermal resistance specimen, m=4. Summary of

    37、Test Method4.1 Rigid gas-filled closed-cell foam insulation is thin-sliced to reduce the gas diffusion path length which accelerates the agingprocess. The resulting temporal acceleration is proportional to the square of the ratio of the product use thickness to the slicethickness.4.2 Careful and pre

    38、cise slice preparation is necessary and the process is described in detail in 6.4.4.3 In PartA, the Prescriptive Method, specific test dates are calculated and the thermal resistance of the thin slices is measuredon those dates.4.3.1 Qualification tests are included to determine whether this method

    39、is applicable to a given material.4.4 In Part B, the Research Method, thermal conductivity is measured for a series of time periods and extensive data analysisis possible.5. Significance and Use5.1 Rigid gas-filled closed-cell foam insulations include all cellular plastic insulations which rely on a

    40、 blowing agent (or gas),other than air, for thermal resistance values. At the time of manufacture, the cells of the foam usually contain their highestpercentage of blowing agent and the lowest percentage of atmospheric gases. As time passes, the relative concentrations of thesegases change due prima

    41、rily to diffusion. This results in a general reduction of the thermal resistance of the foam due to an increasein the thermal conductivity of the resultant cell gas mixture. These phenomena are typically referred to as foam aging.5.1.1 For some rigid gas-filled closed-cell foam insulation products p

    42、roduced using blowing agent gases that diffuse very rapidlyout of the full-thickness foam product, such as expanded polystyrene, there is no need to accelerate the aging process.5.1.2 Physical gas diffusion phenomena occur in three dimensions. The one-dimensional form of the diffusion equations used

    43、in the development of this practice are valid only for planar geometries, that is, for specimens that have parallel faces and wherethe thickness is much smaller than the width and much smaller than the length.NOTE 3Please see Appendix X3 for a discussion of the theory of accelerated aging via thin s

    44、licing.NOTE 4Theoretical and experimental evaluations of the aging of insulation in radial forms, such as pipe insulation, have been made. (6) However,these practices have not evolved to the point of inclusion in the test standard.5.2 The change in thermal resistance due to the phenomena described i

    45、n 5.1 usually occurs over an extended period of time.Information regarding changes in the thermal resistance of these materials as a function of time is required in a shorter period oftime so that decisions regarding formulations, production, and comparisons with other materials can be made.5.3 Spec

    46、ifications C578, C591, C1029, C1126 and C1289 on rigid closed-cell foams measure thermal resistance afterconditioning at 23 6 1C 73 6 2F for 180 6 5 days from the time of manufacture or at 60 6 1C 140 6 2F for 90 days.This conditioning can be used for comparative purposes, but is not sufficient to d

    47、escribe long-term thermal resistance. Thisrequirement demonstrates the importance of the aging phenomena within this class of products.5.4 The Prescriptive Method in Part A provides long-term thermal resistance values on a consistent basis for a variety ofpurposes, including product evaluation, spec

    48、ifications, or product comparisons. The consistent basis for these purposes is providedby a series of specific procedural constraints, which are not required in the Research Method described in Part B. The valuesproduced by the Prescriptive Method correspond to the thermal resistance at an age of fi

    49、ve years, which corresponds closely tothe average thermal resistance over a 15-year service life (7, 8).5.4.1 It is recommended that any material standard that refers to C1303 to provide a product rating for long-term thermalresistance specify the Part A Test Method of C1303.5.5 The Research Method in Part B provides a relationship between thermal conductivity, age, and product thickness. Thecalculation methods given in Part B can be used to predict the resistance at any specific point in time as well as the averageresistance over a specif


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