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    ARMY MIL-PRF-49137 D-2009 CAPACITORS FIXED ELECTROLYTIC (SOLID ELECTROLYTE) TANTALUM MOLDED CONFORMAL COATED AND METAL CASED WITH PLASTIC END-FILL NONHERMETICALLY SEALED GENERAL SP.pdf

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    ARMY MIL-PRF-49137 D-2009 CAPACITORS FIXED ELECTROLYTIC (SOLID ELECTROLYTE) TANTALUM MOLDED CONFORMAL COATED AND METAL CASED WITH PLASTIC END-FILL NONHERMETICALLY SEALED GENERAL SP.pdf

    1、INCH POUND MIL-PRF-49137D 19 February 2009 SUPERSEDING MIL-PRF-49137C 22 April 2004 PERFORMANCE SPECIFICATION CAPACITORS, FIXED, ELECTROLYTIC (SOLID ELECTROLYTE), TANTALUM, MOLDED, CONFORMAL COATED AND METAL CASED WITH PLASTIC END-FILL, NONHERMETICALLY SEALED, GENERAL SPECIFICATION FOR This specific

    2、ation is approved for use by all Depart- ments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. This specification covers the general requirements for fixed, electrolytic (solid electrolyte), tantalum, molded, conformal coated and metal cased with plastic end-fill nonhermetically seale

    3、d capacitors, primarily intended for filter, bypass, coupling, and other applications where the alternating current (ac) component is small compared to the direct current (dc) rated voltage. These capacitors are intended to be used only where supplemental moisture protection is provided or for noncr

    4、itical applications where hermetic moisture protection is not required. 1.2 Classification. Capacitors covered by this specification are classified by the style, as specified (see 3.1). 1.2.1 Part or Identifying Number (PIN). The PIN will be in the following form and as specified (see 3.1 and 6.2).

    5、CX01 D 225 K Style Voltage Capacitance Capacitance (see 1.2.1.1) (see 1.2.1.2) (see 1.2.1.3) tolerance (see 1.2.1.4) Comments, suggestions, or questions on this document should be addressed to: US Army Communications-Electronics RDEC, ATTN: AMSRD-CER-PR-D, Fort Monmouth, NJ 07703-5023, or emailed to

    6、 robert.francisus.army.mil . Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at http:/assist.daps.dla.mil AMSC N/A FSC 5910 Copyright Communications - Electronics Command Provided by IHS under license with CRAINot

    7、 for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-49137D 2 1.2.1.1 Style. The style is identified by the two-letter symbol CX, followed by a two-digit number; the letters identify fixed, electrolytic (solid electrolyte) tantalum, molded, conformal coated and met

    8、al cased with plastic end-fill, nonhermetically sealed capacitors, and the number identifies the design of the capacitor. 1.2.1.1 Voltage. The voltage (rated and surge) is identified by a single letter as shown in table I. TABLE I. Voltage. Symbol Rated (85C) Volts, dc Surge (85C) Volts, dc A B C D

    9、F H J K M N 2 3 4 6 10 15 20 25 35 50 2.6 4.0 5.0 8.0 13.0 20.0 26.0 32.0 46.0 65.0 1.2.1.3 Capacitance. The nominal capacitance value, expressed in picofarads (pF) is identified by a three-digit number; the first two digits represent significant figures and the last digit specifies the number of ze

    10、ros to follow. 1.2.1.4 Capacitance tolerance. The capacitance tolerance is identified by a single letter as shown in table II. TABLE II. Capacitance tolerance. Symbol Capacitance tolerance K M Percent () 10 20 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in

    11、 sections 3 and 4 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they mu

    12、st meet all specified requirements documents cited in sections 3 and 4 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent sp

    13、ecified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract (see 6.2). Copyright Communications - Electronics Command Provided by IHS under license with CRAINot for ResaleNo reproduction or networking permitted without license from IHS-,-

    14、,-MIL-PRF-49137D 3 DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-49137/1 - Capacitors, Fixed, Electrolytic (Solid Electrolyte), Tantalum, Polar, Molded, Nonhermetically Sealed, Style CX01. MIL-PRF-49137/2 - Capacitors, Fixed, Electrolytic (Solid Electrolyte), Tantalum, Polar, Conformal Coated, Nonher

    15、metically Sealed, Styles CX02 and CX12. MIL-PRF-49137/5 - Capacitors, Fixed, Electrolytic (Solid Electrolyte), Tantalum, Polar, Molded, Nonhermetically Sealed, Style CX05. MIL-PRF-49137/6 - Capacitors, Fixed, Electrolytic (Solid Electrolyte), Tantalum, Polar, Nonhermetically Sealed, Styles CX06 and

    16、CX16. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-202 - Test Methods Standards Electronics and Electrical Component Parts. MIL-STD-1285 - Marking of Electrical and Electronic Parts. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or

    17、from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Non-Government publications. The following documents form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited

    18、 in the solicitation or contract. AMERICAN NATIONAL STANDARDS INSTITUTE (ANSI) J-STD-006 - Requirements for Electronic Grade Solder Alloys and Fluxed and Non-Fluxed Solid Solders for Electronic Soldering Applications. (Copies of this document can be ordered online at www.ipc.org or from the Institut

    19、e for Interconnecting and Packaging Electronic Circuits (IPC, INC.), 2215 Sanders Road, Suite 200 south, Northbrook, IL 60062.) ANSI/NCSL Z540.3 - Requirements for Calibration of Measuring and Test Equipment. (Copies of this document can be ordered online at www.ncsli.org or from NCSL International,

    20、 2995 Wilderness Place, Suite 107, Boulder, CO 80301-5404) INTERNATIONAL ORGANIZATION FOR STANDARDS (ISO) ISO 10012 - Measuring Management Systems Requirements for Measurement Processes and Measuring Equipment. (Copies of this document may be ordered online at http:/webstore.ansi.org/ or from the Am

    21、erican National Standards Institute, 11 West 42ndStreet, New York, NY 10036-0350.) 2.4 Order of precedence. In the event of a conflict between the text of this document and the references cited herein (except for related associated specifications, specification sheets, or MS standards), the text of

    22、this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. Copyright Communications - Electronics Command Provided by IHS under license with CRAINot for ResaleNo reproduction or networking permitted wit

    23、hout license from IHS-,-,-MIL-PRF-49137D 4 3. REQUIREMENTS 3.1 Specification sheets. The individual item requirements shall be as specified herein and in accordance with the applicable specification sheet. In the event of any conflict between the requirements of this specification and the specificat

    24、ion sheet, the latter shall govern (see 6.2). 3.2 Qualification. Capacitors furnished under this specification shall be products that are qualified for listing on the applicable Qualified Products List (QPL) before contract award (see 4.4 and 6.4). 3.3 Materials. Materials shall be as specified here

    25、in. However, when a definite material is not specified, a material shall be used which will enable the capacitors to meet the performance requirements of this specification. Acceptance or approval of any constituent material shall not be construed as a guaranty of the acceptance of the finished prod

    26、uct. The use of paper products is not acceptable. 3.3 1 Solder and soldering flux. Solder and soldering flux shall be of such quality as to enable the capacitors to meet all of the requirements of this specification. 3.4 Interface and physical dimension requirements. Capacitors shall meet the interf

    27、ace requirements and physical dimensions specified (see 3.1). 3.4.1 Body structure. The body structure shall be of encapsulated form (see 3.1). 3.4.2 Terminals. Terminals shall be of a solid conductor, of the dimensions specified (see 3.1), and shall be suitably treated to facilitate soldering. 3.4.

    28、2.1 Solder dip (retinning). Only the manufacturer may solder dip/retin the lead of the capacitors supplied to this specification, provided the solder dip process has been approved by the qualifying activity. 3.4.2.1.1 Qualifying activity approval. Approval of the solder dip process shall be based on

    29、 one of the following options: a. When the original lead finish qualified was hot solder dip lead finish 52 in accordance with MIL-STD-1276 (NOTE: The 200 microinch maximum thickness is not applicable). The manufacturer shall use the same solder dip process for retinning as was used in the original

    30、manufacture of the capacitor. b. When the lead originally qualified was not solder dip lead finish 52 of MIL-STD-1276 as prescribed in 3.4.2.1.1a, approval for the process to be used for solder dip shall be based on the following procedure: (1) Thirty samples of any capacitance value for each style

    31、and lead finish shall be subjected to the manufacturers solder dip process. The capacitors shall be subjected to all prescreen electrical tests, with no defects allowed. (2) Ten of the 30 samples shall be subjected to the solderability test, with no defects allowed. (3) The remaining 20 samples shal

    32、l be subjected to the resistance to soldering heat test, followed by the moisture resistance test, with no defects allowed. 3.4.2.1.2 Solder dip/retinning options. The capacitor manufacturer may solder dip/retin after the prescreen tests or as a corrective action. After solder dip/retinning, the fol

    33、lowing inspection and tests shall be performed on 100 percent of the lot: DC leakage: Shall not exceed the requirement specified in 3.7. Capacitance: Shall be within the tolerance specified (see 3.1). Dissipation factor: Shall not exceed the requirement specified in 3.9. Copyright Communications - E

    34、lectronics Command Provided by IHS under license with CRAINot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-49137D 5 3.4.2.2 Pure tin. The use of pure tin, as an underplate or final finish, is prohibited both internally and externally. Tin content of capacito

    35、r components and solder shall not exceed 97 percent, by mass. Tin shall be alloyed with a minimum of 3 percent lead, by mass (see 6.3). 3.5 Voltage aging. When tested as specified in 4.8.2, capacitors shall withstand the application of voltage at high temperature without visible mechanical damage. 3

    36、.6 Construction analysis (metal cased units only). When capacitors are inspected as specified in 4.8.3, construction analysis shall disclose no evidence of voids of the plastic end-fill exceeding 20 percent of the total case volume. 3.7 DC leakage. When measured as specified in 4.8.4, the dc leakage

    37、 shall not exceed the applicable value specified (see 3.1). 3.8 Capacitance. When measured as specified in 4.8.5, the capacitance shall be within the applicable tolerance specified (see 3.1). 3.9 Dissipation factor. When measured as specified in 4.8.6, the dissipation factor shall not exceed the val

    38、ue specified (see 3.1). 3.10 Shock (specified pulse). When capacitors are tested as specified in 4.8.7, there shall be no intermittent contacts of 0.5 millisecond (ms) or greater duration, or arcing or other indication of breakdown, nor shall there be any open-circuiting or short-circuiting or evide

    39、nce of mechanical damage. 3.11 Vibration, high frequency. When capacitors are tested as specified in 4.8.8, there shall be no intermittent contacts of 0.5 ms or greater duration, or arcing or other indication of breakdown, nor shall there be any open-circuiting or short-circuiting or evidence of mec

    40、hanical damage. 3.12 Thermal shock. When tested as specified in 4.8.9, capacitors shall meet the following requirements: DC leakage: Shall not exceed the requirement specified in 3.7. Capacitance: Shall not change more than 10 percent from the initial measured value (see 3.8). Dissipation factor: Sh

    41、all not exceed the requirement specified in 3.9. Visual examination: There shall be no evidence of harmful corrosion, mechanical damage, and obliteration of marking wherever applicable. 3.13 Resistance to soldering heat. When capacitors are tested as specified in 4.8.10, there shall be no evidence o

    42、f mechanical damage. 3.14 Terminal strength. When capacitors are tested as specified in 4.8.11, there shall be no loosening of the terminals or permanent damage to the terminals. 3.15 Moisture resistance. When tested as specified in 4.8.12, capacitors shall meet the following requirements: DC leakag

    43、e: Shall not exceed 300 percent of the requirement specified in 3.7. Capacitance: Shall not change more than 15 percent from the initial measured value (see 3.1 and 3.8). Dissipation factor: Shall not exceed 150 percent of the requirement specified in 3.9. Visual examination: There shall be no evide

    44、nce of harmful corrosion, mechanical damage, or obliteration of marking wherever applicable. Copyright Communications - Electronics Command Provided by IHS under license with CRAINot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-49137D 6 3.16 Stability at low

    45、 and high temperatures. When tested as specified in 4.8.13, capacitors shall meet the following requirements: Step 1 (+25C): DC leakage: Shall not exceed the applicable value specified (see 3.1). Capacitance: Shall be within tolerance of the nominal value specified (see 3.1). Dissipation factor: Sha

    46、ll not exceed the applicable value specified (see 3.1). Step 2 (-55C): Capacitance: Shall not change more than the applicable value specified (see 3.1) from the step 1 measured value. Dissipation factor: Shall not exceed the applicable value specified (see 3.1). Step 3 (+25C): DC leakage: Shall not

    47、exceed the applicable value specified (see 3.1). Capacitance: Shall not change more than 10 percent from the step 1 measured value. Dissipation factor: Shall not exceed the requirement specified in 3.9. Step 4 (+85C): DC leakage: Shall not exceed the applicable value specified (see 3.1) Capacitance:

    48、 Shall not change more than the applicable value specified (see 3.1) from the step 1 measured value. Dissipation factor: Shall not exceed the requirement specified in 3.9. Step 5 (+25C): DC leakage: Shall not exceed the applicable value specified (see 3.1). Capacitance: Shall not change more than th

    49、e applicable value specified (see 3.1) from the step 1 measured value. Dissipation factor: Shall not exceed the applicable value specified (see 3.1). Copyright Communications - Electronics Command Provided by IHS under license with CRAINot for ResaleNo reproduction or networking permitted without license from IHS-,-,-


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