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    ANSI IEEE C57.19.03 CORR 1-2005 Standard Requirements Terminology and Test Code for Bushings for DC Applications.pdf

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    ANSI IEEE C57.19.03 CORR 1-2005 Standard Requirements Terminology and Test Code for Bushings for DC Applications.pdf

    1、IEEE Std C57.19.03-2005(Corrigendum to IEEE Std C57.19.03-1996)IEEE Standard Requirements,Terminology, and Test Code forBushings for DC ApplicationsCorrigendum 1 I E E E3 Park Avenue New York, NY 10016-5997, USA6 June 2006IEEE Power Engineering SocietySponsored by theTransformers Committee IEEE Std

    2、C57.19.03-1996/Cor 1-2005 (Corrigendum to IEEE Std C57.19.03-1996) IEEE Standard Requirements, Terminology, and Test Code for Bushings for DC Applications Corrigendum 1 Sponsor Transformers Committee of the IEEE Power Engineering Society Approved 7 December 2005 IEEE-SA Standards Board Abstract: Thi

    3、s corrigendum corrects IEEE Std C57.19.03-1996. The standard applies to outdoor and indoor power apparatus dc bushings of condenser type that have basic impulse insulation levels of 110 kV and above for use as components of oil-filled converter transformers and smoothing reactors, as well as air-to-

    4、air dc bushings. This standard defines the special terms used, service conditions, rating, general requirements, electrical insulation characteristics, and test procedure for the bushings for dc application. Keywords: bushings, dc application The Institute of Electrical and Electronics Engineers, In

    5、c. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2006 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 6 June 2006. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy

    6、 portions ofany individual standard for educational classroom use can also be obtained through the Copyright ClearanceCenter.NOTEAttention is called to the possibility that implementation of this standard may require use of subjectmatter covered by patent rights. By publication of this standard, no

    7、position is taken with respect to theexistence or validity of any patent rights in connection therewith. The IEEE shall not be responsible foridentifying patents for which a license may be required by an IEEE standard or for conducting inquiries into thelegal validity or scope of those patents that

    8、are brought to its attention.Introduction This introduction is not part of IEEE Std C57.19.03-1996/Cor 1-2005, IEEE Standard Requirements, Terminology, and Test Code for Bushings for DC Applications. IEEE Std C57.19.03-1996 was approved by the IEEE-SA Standards Board on 20 June 1996 and published 6

    9、January 1997. During the reaffirmation process for this document in 2002, several errors in the document were reported. All known errors are corrected in this corrigendum. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ie

    10、ee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that i

    11、mplementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent

    12、 applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Participants At the time this standard was completed, the IEEE Task Force for C57.19.03 Corrigendum 1 had t

    13、he following membership: Fred E. Elliott, Chair John Graham Lars-Erik Juhlin Pierre Riffon Copyright 2006 IEEE. All rights reserved. iv The following members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Saber Azizi-Ghannad Jame

    14、s D. Huddleston, III Michael S. NewmanWallace B. Binder, Jr. Rowland I. James, Jr. Robert C. Olen Bill Chiu Jose A. Jarque Dhiru S. PatelKeith Chow Wayne E. Johnson J. M. PattonTommy P. Cooper Lars E. Juhlin Carlos A. O. PeixotoAlan W. Darwin Morteza Khodaie Johannes RickmannRonald L. Daubert Young

    15、Han Kim Michael A. Roberts Eric J. Davis Hermann Koch Oleg Roizman Larry J. Davis J. L. Koepfinger Dinesh Pranathy Sankarakurup Randall Dotson John G. Lackey Subhas C. Sarkar Barry L. Easter Gerald E. Lee Sascha M. Schmeling Fred E. Elliott Yeou Song Lee Devkin Sharma Gary R. Engmann Thomas G. Lindq

    16、uist Hyeong J. Sim Christopher Faust William Lumpkins James E. Smith Joseph Foldi G. L. Luri Loren B. Wagenaar Randall C. Groves John W. Matthews Joe D. Watson Peter Heinzig Gary L. Michel James W. Wilson, Jr. Gary A. Heuston Yinghua Min Eric V. Woods Philip J. Hopkinson Kyaw Myint Guochang Zhou Den

    17、nis Horwitz Waldemar Ziomek When the IEEE-SA Standards Board approved this standard on 7 December 2005, it had the following membership: Steve M. Mills, Chair Richard H. Hulett, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Mark D. Bowman William B. Hopf T. W. Olsen Dennis B. Brophy Low

    18、ell G. Johnson Glenn Parsons Joseph Bruder Herman Koch Ronald C. Petersen Richard Cox Joseph L. Koepfinger* Gary S. Robinson Bob Davis David J. Law Frank Stone Julian Forster* Daleep C. Mohla Malcolm V. Thaden Joanna N. Guenin Paul Nikolich Richard L. Townsend Mark S. Halpin Joe D. Watson Raymond Ha

    19、peman Howard L. Wolfman * Member Emeritus Copyright 2006 IEEE. All rights reserved. vIEEE Std C57.19.03-1996/Cor 1-2005 Requirements, Terminology, and Test Code for Bushings for DC ApplicationsCorrigendum 1 CONTENTS 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 1 Changes to IEEE

    20、Std C57.19.03-1996 . 2 5. Rating . 2 5.3 Rated dielectric strength 2 7. Test procedure 3 7.2 Design tests 3 Copyright 2006 IEEE. All rights reserved. viIEEE Std C57.19.03-1996/Cor 1-2005 Requirements, Terminology, and Test Code for Bushings for DC ApplicationsCorrigendum 1 IEEE Standard Requirements

    21、, Terminology, and Test Code for Bushings for DC ApplicationsCorrigendum 1 Copyright 2006 IEEE. All rights reserved. 1. 1.11.22. Overview Scope This corrigendum corrects errors in IEEE Std C57.19.03-1996. Purpose This standard defines the special terms used, service conditions, rating, general requi

    22、rements, electrical insulation characteristics, and test procedure for the bushings for dc applications. This corrigendum corrects errors in the initial publication of this standard. Normative references The following referenced documents are indispensable for the application of this document. For d

    23、ated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. IEEE Std C57.19.03-1996, IEEE Standard Requirements, Terminology, and Test Code for Bushings for DC Applications.11IEEE publication

    24、s are available from the Institute of Electrical and Electronics Engineers, Inc., 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards.ieee.org). 1IEEE Std C57.19.03-1996/Cor 1-2005 Requirements, Terminology, and Test Code for Bushings for DC ApplicationsCorrigendum 1 Changes to IEEE Std C57.19

    25、.03-1996 NOTEThe editing instructions contained in this corrigendum define how to merge the material contained therein into the existing base standard and its amendments to form the comprehensive standard. The editing instructions are shown in bold italic. Four editing instructions are used: change,

    26、 delete, insert, and replace. Change is used to make corrections in existing text or tables. The editing instruction specifies the location of the change and describes what is being changed by using strikethrough (to remove old material) and underscore (to add new material). Delete removes existing

    27、material. Insert adds new material without disturbing the existing material. Insertions may require renumbering. If so, renumbering instructions are given in the editing instruction. Replace is used to make changes in figures or equations by removing the existing figure or equation and replacing it

    28、with a new one. Editorial notes will not be carried over into future editions because the changes will be incorporated into the base standard. 5.5.35.3.3Rating Rated dielectric strength Rated chopped-wave lightning-impulse voltage Change the text in 5.3.3 as shown: The rated chopped-wave lightning-i

    29、mpulse voltage is the crest value of a standard 1.2 50 s impulse voltage, which a new bushing shall be capable of withstanding for a specified time from the start of the wave at virtual time zero until flashover of a rod gap or coordinating gap occurs when tested under the conditions specified in 7.

    30、2.3 7.2.2. 5.3.45.3.4.1Rated switching-impulse voltage Rated wet switching-impulse voltage Change the text in 5.34.1 as shown: The rated wet switching-impulse voltage is the crest value of a 250 2500 s switching-impulse voltage wave, which a new bushing shall be capable of withstanding when tested u

    31、nder the conditions specified in 7.2.4.1 7.2.3. 5.3.4.2 Rated dry switching-impulse voltage Change the text in 5.3.4.2 as shown: The rated dry switching-impulse voltage is the crest value of a 250 2500 s switching-impulse voltage wave, which a new bushing shall be capable of withstanding when tested

    32、 under the conditions specified in 7.2.4.2 7.2.4. Copyright 2006 IEEE. All rights reserved. 2IEEE Std C57.19.03-1996/Cor 1-2005 Requirements, Terminology, and Test Code for Bushings for DC ApplicationsCorrigendum 1 Copyright 2006 IEEE. All rights reserved. 7. 7.27.2.2Test procedure Design tests Full

    33、-wave and chopped-wave lightning-impulse withstand voltage Change the last paragraph of 7.2.2 as shown: The time to chopping shall be 3 s. The chopped-wave peak-voltage level shall be 115% of the full-wave value. Change Table 2 as shown: Table 2 Routine and design tests for dc bushings Clause number

    34、 Tests Routine Design Special 7.2.1 Low-frequency dry X 7.3.3 Low-frequency dry X 7.2.2 Lightning impulse X 7.3.5 Lightning impulse X 7.2.3 Switching-impulse wet X 7.2.4 Switching-impulse dry X 7.3.6 Switching-impulse Xa7.2.5.3 7.2.5.2 DC applied voltage X X 7.2.5.4 7.2.5.3 DC polarity reversal X X

    35、7.2.6 Capacitance 7.2. Power factor X 7.2.7.1 Pressure test X 7.2.7.2 Cantilever strength X 7.2.8 Thermal test 7.3.4 7.3.7 Potential tap withstand X 7.3.9 7.3.8 Mechanical tests X 7.4.1 Contamination test X 7.4.2 Even rain test X 7.4.3 Uneven rain test X aOnly for wall bushings and roof bushings. 3I

    36、EEE Std C57.19.03-1996/Cor 1-2005 Requirements, Terminology, and Test Code for Bushings for DC ApplicationsCorrigendum 1 Replace Table 4 with the following: Copyright 2006 IEEE. All rights reserved. Table 4 Power factor and capacitance limits Power factorcCapacitance Type of construction Limit % Acc

    37、eptable change %aAcceptable change %bResin-impregnated +0.04 +1.0 Paper-insulated 0.85 0.04 1.0 Oil-impregnate +0.02 +1.0Paper-insulated 0.50 0.06 1.0 aThe arithmetic difference in power factors (expressed in percent) measured at 10 kV or at the rated maximum line-to-ground voltage before and after

    38、dielectric withstand voltage test shall be within the specified limit. For example, if the power factor of the oil-impregnated, paper-insulated bushing was 0.30% before the withstand test, the maximum acceptable power factor after the test would be 0.32%. bThe percent change in capacitance after the

    39、 dielectric withstand voltage test based on the initial value shall be within the specified limit. The measurements are to be made at 10 kV or at the rated maximum line-to-ground voltage. If the bushing has more than 100 conductive layers, the accepted percentage change in capacitance will be (1/No. of Layers) 100. cCorrected to 20 C. See 7.1.4 g). 4


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