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    IEC 61290-3-2008 Optical amplifiers - Test methods - Part 3 Noise figure parameters《光学放大器 试验方法 第3部分 噪声指数参量》.pdf

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    IEC 61290-3-2008 Optical amplifiers - Test methods - Part 3 Noise figure parameters《光学放大器 试验方法 第3部分 噪声指数参量》.pdf

    1、 IEC 61290-3 Edition 2.0 2008-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Optical amplifiers Test methods Part 3: Noise figure parameters Amplificateurs optiques Mthodes dessais Partie 3: Paramtres du facteur de bruit IEC 61290-3:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Ge

    2、neva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in

    3、 the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication

    4、contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des que

    5、stions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web:

    6、www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under

    7、constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical commi

    8、ttee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/online_news/justpub Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available on-line and also by email. Electropedia: w

    9、ww.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary online. Customer Service Cen

    10、tre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internati

    11、onale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer

    12、 que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous permet deffectuer des recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtu

    13、des,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online_news/justpub Restez inform sur les nouvelles publications de la CEI. Just Published dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne

    14、 et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulai

    15、re Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11

    16、Fax: +41 22 919 03 00 IEC 61290-3 Edition 2.0 2008-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Optical amplifiers Test methods Part 3: Noise figure parameters Amplificateurs optiques Mthodes dessais Partie 3: Paramtres du facteur de bruit INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECT

    17、ROTECHNIQUE INTERNATIONALE L ICS 33.180.30 PRICE CODE CODE PRIX ISBN 2-8318-9952-4 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 61290-3 IEC:2008 CONTENTS FOREWORD.3 INTRODUCTION.5 1 Scope and object6 2 Normative

    18、 references .6 3 Acronyms and abbreviations.6 4 Noise figure generalities.7 5 Noise figure contributions.8 6 Noise figure test methods.9 Bibliography11 Table 1 Parameters measurable with each of the two methods of Clause 510 61290-3 IEC:2008 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ OPTICAL AMPL

    19、IFIERS TEST METHODS Part 3: Noise figure parameters FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operatio

    20、n on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IE

    21、C Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this prepara

    22、tion. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consens

    23、us of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are

    24、 made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications tra

    25、nsparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot

    26、be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and membe

    27、rs of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or

    28、 any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication ma

    29、y be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61290-3 has been prepared by subcommittee 86C: Fibre optic systems and active devices, of IEC technical committee 86: Fibre optics. This second edition cance

    30、ls and replaces the first edition, published in 2000, and constitutes a technical revision. It includes updates to specifically address additional types of optical amplifiers and to highlight that the IEC 61290-3 series pertains to single-channel amplifiers. References have been added to the documen

    31、ts pertaining to multichannel amplifiers. The text of this standard is based on the following documents: FDIS Report on voting 86C/842/FDIS 86C/854/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. 4 61290-3 IEC:20

    32、08 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the speci

    33、fic publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 61290-3 IEC:2008 5 INTRODUCTION This International Standard is devoted to the subject of optical amplifiers. The technology of optical amplifiers is still evolving, hence amendme

    34、nts to and new editions of this standard can be expected. Each abbreviation introduced in this standard is explained in the text at least the first time it appears. However, for an easier understanding of the whole text, a list of all abbreviations used in this standard is given in Clause 3. 6 61290

    35、-3 IEC:2008 OPTICAL AMPLIFIERS TEST METHODS Part 3: Noise figure parameters 1 Scope and object This International Standard applies to all commercially available optical amplifiers (OAs), including OAs using optically pumped fibres (OFAs based on either rare-earth doped fibres or on the Raman effect)

    36、, semiconductor optical amplifiers (SOAs) and planar waveguide optical amplifiers (PWOAs). The object of this standard is to provide the general background for OA noise figure parameters measurements and to indicate those IEC standard test methods for accurate and reliable measurements of the follow

    37、ing OA parameters, as defined in IEC 61291-1: a) noise figure (NF); b) noise factor (F); c) multiple path interference (MPI) figure of merit; d) signal-spontaneous noise figure; e) (equivalent) spontaneous-spontaneous optical bandwidth (B sp-sp ); f) forward amplified spontaneous emission (ASE) powe

    38、r level; g) reverse ASE power level; h) ASE bandwidth. This standard addresses measurement of OAs that are to be used for amplifying single channels, that is signals from a single transmitter. Testing of OAs for multichannel use involves additional considerations, such as: the number, wavelengths an

    39、d relative power of the signals, the ability to measure signals simultaneously and to measure the ASE between channels. NOTE Methods for measurement of OAs for multichannel use are included in the IEC 61290-10 series. 2 Normative references The following referenced documents are indispensable for th

    40、e application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 61290-3-1, Optical amplifiers Test methods Part 3-1: Noise figure parameters Optical spectrum analyzer m

    41、ethod IEC 61290-3-2, Optical amplifiers Part 3-2: Test methods for noise figure parameters Electrical spectrum analyzer method IEC 61291-1, Optical amplifiers Part 1: Generic specification 3 Acronyms and abbreviations ASE amplified spontaneous emission B sp-sp(equivalent) spontaneous-spontaneous opt

    42、ical bandwidth 61290-3 IEC:2008 7 ESA electrical spectrum analyzer F noise factor FWHM full width half maximum MPI multiple path interference NF noise figure OA optical amplifiers OFA optical fibre amplifier OSA optical spectrum analyzer PWOA planar waveguide optical amplifiers SOA semiconductor opt

    43、ical amplifiers SNR signal-to-noise ratio 4 Noise figure generalities The noise figure is one of the most important parameters of an OA. Following the definition in IEC 61291-1, the noise factor, i.e. the linear form of the noise figure, can be expressed by: in 2 noise out 2 noise 2 out 2 signal out

    44、 2 noise in 2 noise in 2 signal output input 1 = = i i G F i i i i SNR SNR F(1) where SNR denotes signal-to-noise ratios; i denotes photocurrents in an ideal photodetector with a quantum efficiency of 1; G denotes the optical signal gain. The input noise current is, by definition, the shot noise cur

    45、rent caused by the optical input signal. This excludes other noise sources on the input side. The output noise current is the sum of five contributions. Each of these contributions can be expressed by a partial noise factor: a) signal shot noise factor, F shot,sig , from shot noise from amplified in

    46、put signal; b) ASE shot noise factor, F shot,ase , from shot noise from amplified spontaneous emission; c) signal-spontaneous noise factor, F sig-sp , from signal beating with ASE; d) spontaneous-spontaneous noise factor, F sp-sp , from ASE beating with itself; e) noise factor from multiple path int

    47、erference (MPI), F mpi . The total noise factor (in linear, not logarithmic units) is: mpi sp sp sp sig ase shot, sig shot, total F F F F F F + + + + = (2) 8 61290-3 IEC:2008 The noise figure can be calculated using: () total log 10 F NF = (3) Equation (2) can be used for optical noise figure measur

    48、ements, as well as for estimating the influence of various parameters in electrical noise figure measurements. It represents a complete noise figure model of an OA. 5 Noise figure contributions The signal shot noise factor is: G F 1 sig shot, =, (4) where G is the gain at the signal wavelength. The

    49、ASE shot noise factor is: in 2 ase ase shot, P G P F = (5) where P aseis the wavelength-integrated ASE power; P inis the optical input signal power. The signal-spontaneous noise factor is: sig p ase, sp sig h 2 G F = (6) where ase,pis the optical power density of spontaneous emission, in the same polarization state as the output signal, at the signal wavelength, in W/Hz; h is Plancks c


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