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    IEC 60512-16-9-2008 Connectors for electronic equipment - Tests and measurements - Part.16-9 Mechanical tests on contacts and terminations - Test 16i Grounding .pdf

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    IEC 60512-16-9-2008 Connectors for electronic equipment - Tests and measurements - Part.16-9 Mechanical tests on contacts and terminations - Test 16i Grounding .pdf

    1、 IEC 60512-16-9 Edition 1.0 2008-05 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 16-9: Mechanical tests on contacts and terminations Test 16i: Grounding contact spring holding force Connecteurs pour quipements lectroniques Essais et mesu

    2、res Partie 16-9: Essais mcaniques des contacts et des sorties Essai 16i: Force de maintien du ressort de contact de mise la masse IEC 60512-16-9:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publi

    3、cation may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an

    4、enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous que

    5、lque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires su

    6、r cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the lead

    7、ing global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrige

    8、nda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC

    9、Just Published: www.iec.ch/online_news/justpub Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical te

    10、rms containing more than 20 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publicati

    11、on or need further assistance, please visit the Customer Service Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes interna

    12、tionales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publ

    13、i. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous permet deffectuer des recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou re

    14、mplaces. Just Published CEI: www.iec.ch/online_news/justpub Restez inform sur les nouvelles publications de la CEI. Just Published dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne

    15、 au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custser

    16、v/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-16-9 Edition 1.0 2008-05 INTERNATIONAL STANDARD NORME IN

    17、TERNATIONALE Connectors for electronic equipment Tests and measurements Part 16-9: Mechanical tests on contacts and terminations Test 16i: Grounding contact spring holding force Connecteurs pour quipements lectroniques Essais et mesures Partie 16-9: Essais mcaniques des contacts et des sorties Essai

    18、 16i: Force de maintien du ressort de contact de mise la masse INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE E ICS 31.220.10 PRICE CODE CODE PRIX ISBN 2-8318-9786-6 2 60512-16-9 IEC:2008 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUI

    19、PMENT TESTS AND MEASUREMENTS Part 16-9: Mechanical tests on contacts and terminations Test 16i: Grounding contact spring holding force FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (

    20、IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Report

    21、s, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non

    22、- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements o

    23、f IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are

    24、accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote intern

    25、ational uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in th

    26、e latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or

    27、its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expense

    28、s arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attenti

    29、on is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60512-16-9 has been prepared by subcommittee 48B: Connectors, of IEC techn

    30、ical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces test 16i of IEC 60512-8, issued in 1993. This standard is to be read in conjunction with IEC 60512-1 and IEC 60512-1-100 which explains the structure of the IEC 6051

    31、2 series. 60512-16-9 IEC:2008 3 The text of this standard is based on the following documents: FDIS Report on voting 48B/1872/FDIS 48B/1904/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has bee

    32、n drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60512 series, under the general title Connectors for electronic equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of this publication will remain u

    33、nchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition; or amended. 4 60512-16-9 IEC:2008 CONNECTORS FOR ELECTR

    34、ONIC EQUIPMENT TESTS AND MEASUREMENTS Part 16-9: Mechanical tests on contacts and terminations Test 16i: Grounding contact spring holding force 1 Scope and object This part of IEC 60512, when required by the detail specification, is used for testing electomechanical components within the scope of te

    35、chnical committee 48. This test may also be used for similar devices when specified in a detail specification. The object of this part of IEC 60512 is to detail a standard test method to determine the holding capacity of grounding contact springs by means of gauges. 2 Normative references The follow

    36、ing referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1-1, Connectors for electronic equipment Tests an

    37、d measurements Part 1-1: General examination Test 1a: Visual examination ISO 1302, Geometrical Product Specification (GPS) Indication of surface texture in technical product documentation 3 Preparations 3.1 Preparation of specimen The specimen shall consist of a component with its terminations, and

    38、may be wired if so specified in the component detail specification. If lubricant is specified for use with the contact system, it shall be applied in the manner specified in the component detail specification. Any preconditioning given in the component detail specification shall be applied. 3.2 Equi

    39、pment Set(s) of gauges as specified in the component detail specification, shall be provided. 3.3 Mounting If mounting of the specimen is appropriate, it shall be as specified in the component detail specification. 60512-16-9 IEC:2008 5 4 Test methods 4.1 Method A Single contact gauges 4.1.1 Female

    40、contact springs Each contact to be tested shall have the maximum size gauge specified, engaged and separated three times. After which, the minimum size retention force gauge specified shall be inserted. 4.1.2 Male contact springs Each contact to be tested shall have the minimum size gauge specified,

    41、 engaged and separated three times. After which, the contact shall be inserted into the maximum size retention force gauge specified. 4.2 Method B Multiple contact gauges As Method A, except that contacts shall be tested in specified groups using gauges having multiple contact engaging elements. Aft

    42、er which appropriate individual maximum or minimum gauges shall be used. 4.3 Measurements and requirements 4.3.1 Before testing Visual examination according to IEC 60512-1-1 shall be carried out. There shall be no defects, which would impair the validity of the test. 4.3.2 During testing Contacts sh

    43、all support the weight of the individual contact retention force gauge in a vertically downward direction. 4.3.3 After testing Visual examination according to IEC 60512-1-1 shall be carried out. There shall be no defects that would impair the normal functioning of the component. Special attention sh

    44、all be given to the resilient features of the specimen. 5 Details to be specified When this test is required by a detail specification, the following details shall be specified: a) whether preconditioning is required; b) nature and means of application of any lubricant to be applied; c) whether the

    45、specimen is to be wired, and if so, details of this; d) whether special mounting of the specimen is required; e) details of gauges to be used, including surface roughness, according to ISO 1302; f) number of specimens to be tested; g) any deviation from the standard test method. _ 6 60512-16-9 CEI:2

    46、008 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 16-9: Essais mcaniques des contacts et des sorties Essai 16i: Force de maintien du ressort de contact de mise la masse AVANT-PROPOS 1) La Commission Electrotechnique Internationale (CEI)

    47、 est une organisation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de llectronique. A cet

    48、effet, la CEI entre autres activits publie des Normes internationales, des Spcifications techniques, des Rapports techniques, des Spcifications accessibles au public (PAS) et des Guides (ci-aprs dnomms “Publication(s) de la CEI“). Leur laboration est confie des comits dtudes, aux travaux desquels to

    49、ut Comit national intress par le sujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales, en liaison avec la CEI, participent galement aux travaux. La CEI collabore troitement avec lOrganisation Internationale de Normalisation (ISO), selon des conditions fixes par accord entre le


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