1、BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06Electronic components Long-term storage of electronic semiconductor devicesPart 4: Storage (IEC 62435-4:2018)BS EN IEC 62435-4:2018EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN IEC 62435-4 August 2018 ICS 31.020
2、English Version Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage (IEC 62435-4:2018) Composants lectroniques - Stockage de longue dure des dispositifs lectroniques semiconducteurs - Part 4: Stockage (IEC 62435-4:2018) Elektronische Bauteile - Langzeitlag
3、erung elektronischer Halbleiterbauelemente - Teil 4: Lagerung (IEC 62435-4:2018) This European Standard was approved by CENELEC on 2018-07-10. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of
4、a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, Germ
5、an). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium
6、, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, S
7、weden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels 2018 CENELEC All rights of
8、exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN IEC 62435-4:2018 E National forewordThis British Standard is the UK implementation of EN IEC 624354:2018. It is identical to IEC 624354:2018.The UK participation in its preparation was entrusted to Technica
9、l Committee EPL/47, Semiconductors.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Insti
10、tution 2018 Published by BSI Standards Limited 2018ISBN 978 0 580 96027 7ICS 31.020Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 August 2018.Amendments/corr
11、igenda issued since publicationDate Text affectedBRITISH STANDARDBS EN IEC 624354:2018EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN IEC 62435-4 August 2018 ICS 31.020 English Version Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage (IEC 62435-4:2
12、018) Composants lectroniques - Stockage de longue dure des dispositifs lectroniques semiconducteurs - Part 4: Stockage (IEC 62435-4:2018) Elektronische Bauteile - Langzeitlagerung elektronischer Halbleiterbauelemente - Teil 4: Lagerung (IEC 62435-4:2018) This European Standard was approved by CENELE
13、C on 2018-07-10. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards
14、 may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language an
15、d notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Ger
16、many, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de No
17、rmalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels 2018 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN IEC 62435-4:2018 E BS EN IEC 624
18、354:2018EN IEC 62435-4:2018 (E) 2 European foreword The text of document 47/2469/FDIS, future edition 1 of IEC 62435-4, prepared by IEC/TC 47 “Semiconductor devices“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN IEC 62435-4:2018. The following dates are fixed: latest d
19、ate by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2019-04-10 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2021-07-10 Attention is drawn to the possibility
20、that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62435-4:2018 was approved by CENELEC as a European Standard wi
21、thout any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60068-2-17 NOTE Harmonized as EN 60068-2-17 IEC 60721-3-1 NOTE Harmonized as EN IEC 60721-3-1 IEC 60749-30 NOTE Harmonized as EN 60749-30 IEC 61340-5-1 NOTE Harmon
22、ized as EN 61340-5-1 IEC 61340-5-3 NOTE Harmonized as EN 61340-5-3 IEC 61760-2 NOTE Harmonized as EN 61760-2 IEC 62258 series NOTE Harmonized as EN 62258 series IEC 62435 series NOTE Harmonized as EN 62435 series IEC 62435-2 NOTE Harmonized as EN 62435-2 BS EN IEC 624354:2018EN IEC 62435-4:2018 (E)
23、3 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following documents are referred to in the text in such a way that some or all of their content constitutes requirements of this document. For dated references, only the editi
24、on cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date information on the latest
25、versions of the European Standards listed in this annex is available here: www.cenelec.eu. Publication Year Title EN/HD Year IEC 60749-20-1 - Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the
26、combined effect of moisture and soldering heat EN 60749-20-1 - IEC/TR 61340-5-2 - Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide CLC/TR 61340-5-2 - IEC/TR 62258-3 - Semiconductor die products - Part 3: Recommendations for good practice in handli
27、ng, packing and storage - - JEDEC J-STD-033 - Standard for handling, packing, shipping, and use of moisture/reflow sensitive surface mount devices MIL-PRF-27401 - Propellant pressurizing agent nitrogen MIL-PRF-81705 - ESD Materials, Bags and Performance Specification BS EN IEC 624354:2018This page d
28、eliberately left blank 2 IEC 62435-4:2018 IEC 2018 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope 8 2 Normative references 8 3 Terms and definitions 8 4 Purpose of storage (facility) . 10 4.1 General . 10 4.2 Cost of ownership . 10 4.3 Security 10 4.4 Location and ambient environment 10 4.5 Incorrec
29、t control of reliability during storage 10 5 Storage . 10 5.1 General . 10 5.2 Type of environment . 11 5.3 Storage identification traceability . 11 5.4 Initial packaging 11 5.5 Storage conditions 12 5.5.1 General . 12 5.5.2 Storage area 12 5.6 Maintaining storage conditions 13 6 Periodic check of t
30、he components . 13 6.1 Objectives . 13 6.2 Periodicity . 13 6.3 Tests during periodic check 14 7 Removal from storage . 14 7.1 Precautions . 14 7.2 Electrostatic discharges 14 8 Materials used in storage regimes . 14 8.1 General . 14 8.2 Moisture barrier bags (MBB) . 14 8.3 Desiccant 15 8.4 Humidity
31、 indicator card (HIC) 15 8.5 Dry nitrogen atmosphere . 15 8.6 High purity dry air atmosphere 15 8.7 Storage containers 16 8.8 Foams, packing material and protective cushioning 16 9 General storage environment . 16 10 LTS methods . 16 10.1 General . 16 10.2 Dry cabinet storage . 17 10.2.1 General . 1
32、7 10.2.2 Humidity controlled storage . 17 10.2.3 Oxygen (O2)-controlled storage . 17 10.2.4 Outgassing-controlled storage . 17 10.3 MBB storage . 17 10.3.1 General . 17 2 IEC 62435-4:2018 IEC 2018 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope 8 2 Normative references 8 3 Terms and definitions 8 4 P
33、urpose of storage (facility) . 10 4.1 General . 10 4.2 Cost of ownership . 10 4.3 Security 10 4.4 Location and ambient environment 10 4.5 Incorrect control of reliability during storage 10 5 Storage . 10 5.1 General . 10 5.2 Type of environment . 11 5.3 Storage identification traceability . 11 5.4 I
34、nitial packaging 11 5.5 Storage conditions 12 5.5.1 General . 12 5.5.2 Storage area 12 5.6 Maintaining storage conditions 13 6 Periodic check of the components . 13 6.1 Objectives . 13 6.2 Periodicity . 13 6.3 Tests during periodic check 14 7 Removal from storage . 14 7.1 Precautions . 14 7.2 Electr
35、ostatic discharges 14 8 Materials used in storage regimes . 14 8.1 General . 14 8.2 Moisture barrier bags (MBB) . 14 8.3 Desiccant 15 8.4 Humidity indicator card (HIC) 15 8.5 Dry nitrogen atmosphere . 15 8.6 High purity dry air atmosphere 15 8.7 Storage containers 16 8.8 Foams, packing material and
36、protective cushioning 16 9 General storage environment . 16 10 LTS methods . 16 10.1 General . 16 10.2 Dry cabinet storage . 17 10.2.1 General . 17 10.2.2 Humidity controlled storage . 17 10.2.3 Oxygen (O2)-controlled storage . 17 10.2.4 Outgassing-controlled storage . 17 10.3 MBB storage . 17 10.3.
37、1 General . 17 BS EN IEC 624354:2018IEC 62435-4:2018 IEC 2018 3 10.3.2 Humidity-controlled storage . 17 10.3.3 Oxygen (O2)-voided storage 17 10.3.4 Outgassing controlled storage . 18 10.3.5 Nitrogen (N2) positive-pressure MBB storage 18 11 LTS double containment redundancy . 18 Annex A (normative) E
38、xample checklist for long-term storage facilities 19 Bibliography 20 Table A.1 Example checklist for storage facilities . 19 BS EN IEC 624354:2018 4 IEC 62435-4:2018 IEC 2018 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTRONIC COMPONENTS LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES Part
39、4: Storage FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardiza
40、tion in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is
41、entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the In
42、ternational Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects sin
43、ce each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content
44、 of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible
45、in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity a
46、ssessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, e
47、mployees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of
48、 the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to t
49、he possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62435-4 has been prepared by IEC technical committee 47: Semiconductor devices. The text of this International Standard is based on the following documents: FDIS Report on voting 47/2469/FDIS 47/2486/RVD Full information on the voting for the approval of this International Standard can b
