1、BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06Test methods for electrical materials, printed board and other interconnection structures and assembliesPart 5-503: General test method for materials and assemblies Conductive anodic filaments (CAF) testing of circuit b
2、oards (IEC 61189-5-503:2017)BS EN IEC 61189-5-503:2017EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 61189-5-503 August 2017 ICS 31.180 English Version Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for
3、 materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards (IEC 61189-5-503:2017) Mthodes dessai pour les matriaux lectriques, les cartes imprimes et autres structures dinterconnexion et ensembles - Partie 5-503 : Mthodes dessai gnrales pour les matriaux et les assemblag
4、es - Essais des filaments anodiques conducteurs (CAF) des cartes circuit imprim (IEC 61189-5-503:2017) Prfverfahren fr Elektromaterialien, Leiterplatten und andere Verbindungsstrukturen und Baugruppen - Teil 5-503: Allgemeine Prfverfahren fr Materialien und Baugruppen - Leitfhige anodische Fasern (C
5、AF), Prfung fr Leiterplatten (IEC 61189-5-503:2017) This European Standard was approved by CENELEC on 2017-06-26. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without a
6、ny alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other l
7、anguage made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
8、the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey an
9、d the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2017 CENELEC All rights of exploitation in any form and by a
10、ny means reserved worldwide for CENELEC Members. Ref. No. EN 61189-5-503:2017 E National forewordThis British Standard is the UK implementation of EN 61189-5-503:2017. It is identical to IEC 61189-5-503:2017.The UK participation in its preparation was entrusted to Technical Committee EPL/501, Electr
11、onic Assembly Technology.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 201
12、8 Published by BSI Standards Limited 2018ISBN 978 0 580 91991 6ICS 31.180Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 30 April 2018.Amendments/corrigenda issu
13、ed since publicationDate Text affectedBRITISH STANDARDBS EN IEC 61189-5-503:2017EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 61189-5-503 August 2017 ICS 31.180 English Version Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-50
14、3: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards (IEC 61189-5-503:2017) Mthodes dessai pour les matriaux lectriques, les cartes imprimes et autres structures dinterconnexion et ensembles - Partie 5-503 : Mthodes dessai gnrales pour les
15、 matriaux et les assemblages - Essais des filaments anodiques conducteurs (CAF) des cartes circuit imprim (IEC 61189-5-503:2017) Prfverfahren fr Elektromaterialien, Leiterplatten und andere Verbindungsstrukturen und Baugruppen - Teil 5-503: Allgemeine Prfverfahren fr Materialien und Baugruppen - Lei
16、tfhige anodische Fasern (CAF), Prfung fr Leiterplatten (IEC 61189-5-503:2017) This European Standard was approved by CENELEC on 2017-06-26. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a n
17、ational standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German)
18、. A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, B
19、ulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Swed
20、en, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2017 CENELEC All rights of exploit
21、ation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 61189-5-503:2017 E BS EN IEC 61189-5-503:2017EN 61189-5-503:2017 European foreword The text of document 91/1433/FDIS, future edition 1 of IEC 61189-5-503, prepared by IEC/TC 91 “Electronics assembly technology“ wa
22、s submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61189-5-503:2017. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2018-03-26 latest date by whi
23、ch the national standards conflicting with the document have to be withdrawn (dow) 2020-06-26 Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights. End
24、orsement notice The text of the International Standard IEC 61189-5-503:2017 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60068-3-4 NOTE Harmonized as EN 60068-
25、3-4. IEC 60068-3-5 NOTE Harmonized as EN 60068-3-5. IEC 60721-1 NOTE Harmonized as EN 60721-1. IEC 60721-2-1 NOTE Harmonized as EN 60721-2-1. IEC 60721-3-0 NOTE Harmonized as EN 60721-3-0. BS EN IEC 61189-5-503:2017EN 61189-5-503:2017 3 Annex ZA (normative) Normative references to international publ
26、ications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referen
27、ced document (including any amendments) applies. NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
28、www.cenelec.eu. Publication Year Title EN/HD Year IEC 60068-1 2013 Environmental testing - Part 1: General and guidance EN 60068-1 2014 IEC 60068-2-30 - Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) EN 60068-2-30 - IEC 60068-2-38 - Environmental testing -
29、Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test EN 60068-2-38 - IEC 60068-2-66 - Environmental testing - Part 2-66: Test methods - Test Cx: Damp heat, steady state (unsaturated pressurized vapour) EN 60068-2-66 - IEC 60068-2-67 - Environmental testing - Part 2: Tests - Test
30、Cy: Damp heat, steady state, accelerated test primarily intended for components EN 60068-2-67 - IEC 60068-2-78 - Environmental testing - Part 2-78: Tests - Test Cab: Damp heat, steady state EN 60068-2-78 - IEC 60194 - Printed board design, manufacture and assembly - Terms and definitions - - IPC-TM-
31、650 No 2.6.14.1 - Electrochemical Migration Resistance Test - - IPC-TM-650 No 2.6.25 - Conductive Anodic Filament (CAF) Resistance Test: X-Y Axis - - BS EN IEC 61189-5-503:2017This page deliberately left blank 2 IEC 61189-5-503:2017 IEC 2017 CONTENTS FOREWORD . 4 1 Scope 6 2 Normative references 6 3
32、 Terms and definitions 6 4 Testing condition . 7 4.1 Standard condition 7 4.2 Judgment state . 8 5 Specimen 8 5.1 Outline of CAF test vehicle design 8 5.1.1 Evaluation design for the glass cloth direction . 8 5.1.2 Design between plated through hole (PTH) 9 5.2 CAF test board 10 5.2.1 Example A . 10
33、 5.2.2 Example B . 11 5.3 Number of specimens . 13 6 Equipment/Apparatus or material . 13 6.1 Environmental test chamber 13 6.2 Measuring equipment 13 6.3 Power supply 13 6.4 Current limiting resistors . 14 6.5 Connecting wire 14 6.6 Other dedicated fixtures 14 7 Resistance measurement method 14 7.1
34、 Manual insulation resistance measurement method 14 7.2 Automatic insulation resistance measurement method 15 8 Test method 16 8.1 Test method selection . 16 8.2 Steady-state temperature and humidity test 16 8.2.1 Object 16 8.2.2 Test condition 16 8.3 Temperature and humidity (12 h + 12 h) cycle tes
35、t 16 8.3.1 Object 16 8.3.2 Test condition 17 8.3.3 Number of cycles of the test 17 8.4 Temperature and humidity cyclic test with and without low temperature exposure . 17 8.4.1 Object 17 8.4.2 Test condition 17 8.5 Steady-state high temperature and high humidity (unsaturated pressurized vapour) test
36、 17 8.5.1 Object 17 8.5.2 Test condition 18 9 Procedure 18 9.1 Test specimen preparation 18 9.1.1 General . 18 9.1.2 Sample identification . 18 2 IEC 61189-5-503:2017 IEC 2017 CONTENTS FOREWORD . 4 1 Scope 6 2 Normative references 6 3 Terms and definitions 6 4 Testing condition . 7 4.1 Standard cond
37、ition 7 4.2 Judgment state . 8 5 Specimen 8 5.1 Outline of CAF test vehicle design 8 5.1.1 Evaluation design for the glass cloth direction . 8 5.1.2 Design between plated through hole (PTH) 9 5.2 CAF test board 10 5.2.1 Example A . 10 5.2.2 Example B . 11 5.3 Number of specimens . 13 6 Equipment/App
38、aratus or material . 13 6.1 Environmental test chamber 13 6.2 Measuring equipment 13 6.3 Power supply 13 6.4 Current limiting resistors . 14 6.5 Connecting wire 14 6.6 Other dedicated fixtures 14 7 Resistance measurement method 14 7.1 Manual insulation resistance measurement method 14 7.2 Automatic
39、insulation resistance measurement method 15 8 Test method 16 8.1 Test method selection . 16 8.2 Steady-state temperature and humidity test 16 8.2.1 Object 16 8.2.2 Test condition 16 8.3 Temperature and humidity (12 h + 12 h) cycle test 16 8.3.1 Object 16 8.3.2 Test condition 17 8.3.3 Number of cycle
40、s of the test 17 8.4 Temperature and humidity cyclic test with and without low temperature exposure . 17 8.4.1 Object 17 8.4.2 Test condition 17 8.5 Steady-state high temperature and high humidity (unsaturated pressurized vapour) test 17 8.5.1 Object 17 8.5.2 Test condition 18 9 Procedure 18 9.1 Tes
41、t specimen preparation 18 9.1.1 General . 18 9.1.2 Sample identification . 18 BS EN IEC 61189-5-503:2017IEC 61189-5-503:2017 IEC 2017 3 9.1.3 Prescreen for opens and shorts . 18 9.1.4 Cleaning 19 9.1.5 Connecting wire . 19 9.1.6 Cleaning after attachment 19 9.1.7 Dry 19 9.2 Precondition 19 9.3 Test
42、procedure 19 9.3.1 Setting of the specimen . 19 9.3.2 Test voltage and measuring voltage 19 9.3.3 Temperature and humidity condition at the start time of the test 20 9.3.4 Measurement . 20 9.3.5 Procedure in test interruption . 21 9.3.6 End of test . 21 9.4 Visual inspection . 21 9.4.1 General . 21
43、9.4.2 Shape of electrochemical migration . 21 Annex A (informative) Forms of electrochemical migration . 22 A.1 Example of dendrite-shaped migration 22 A.2 CAF (Example of migration along the glass fibre) 22 Bibliography 23 Figure 1 Schematic of in-line test comb, with possible failure site 8 Figure
44、 2 Schematic of staggered test comb, with possible failure site 9 Figure 3 Manhattan distance 9 Figure 4 Schematic section of via pair with bias . 10 Figure 5 Example of inner layer via pads and layer patterns 10 Figure 6 Example of no inner layer via pads and layer patterns 10 Figure 7 Insulation e
45、valuation pattern for through-holes and via holes . 11 Figure 8 Layouts of the two versions of the CAF test boards 12 Figure 9 Measurement with insulation resistance meter . 15 Figure 10 Temperature and humidity in a test 20 Figure A.1 Example which is generated on the board surface 22 Figure A.2 Ex
46、ample of CAF 22 Table 1 Dimension of insulation evaluation pattern for through-holes . 11 Table 2 Test structures A1 through A4 design rules . 12 Table 3 Test structures B1 through B4 design rules . 13 Table 4 Test condition 16 Table 5 Number of cycles of the test 17 Table 6 Test condition 17 Table
47、7 Test condition (IEC 60068-2-66) 18 BS EN IEC 61189-5-503:2017 4 IEC 61189-5-503:2017 IEC 2017 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARD AND OTHER INTERCONNECTION STRUCTURES AND ASSEMBLIES Part 5-503: General test method for materials and assem
48、blies Conductive anodic filaments (CAF) testing of circuit boards FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote internation
49、al co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)“). Their preparation is entrusted to technical committees; any IEC National Committee interested in t
