1、 Reference number ISO 14490-1:2005(E) ISO 2005INTERNATIONAL STANDARD ISO 14490-1 First edition 2005-10-15 Optics and optical instruments Test methods for telescopic systems Part 1: Test methods for basic characteristics Optique et instruments doptique Mthodes dessai pour systmes tlescopiques Partie
2、1: Mthodes dessai des caractristiques fondamentales ISO 14490-1:2005(E) PDF disclaimer This PDF file may contain embedded typefaces. In accordance with Adobes licensing policy, this file may be printed or viewed but shall not be edited unless the typefaces which are embedded are licensed to and inst
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5、please inform the Central Secretariat at the address given below. ISO 2005 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in wri
6、ting from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO 2005 All rights reservedISO 14490
7、-1:2005(E) ISO 2005 All rights reserved iii Contents Page Foreword. v 1 Scope 1 2 Normative references 1 3 Terms and definitions .1 4 Method of measurement of the angular magnification2 4.1 General2 4.2 Test arrangement.2 4.3 Procedure .3 4.4 Determination of results .3 4.5 Test report 3 5 Method of
8、 measurement of the entrance pupil diameter.3 5.1 General3 5.2 Test arrangement.3 5.3 Procedure .4 5.4 Determination of results .4 5.5 Test report 4 6 Method of measurement of the exit pupil diameter and eye relief .4 6.1 General4 6.2 Test arrangement.5 6.3 Procedure .5 6.4 Determination of results
9、.5 6.5 Test report 6 7 Method of measurement of the angular field of view in the object space.6 7.1 General6 7.2 Test arrangement.6 7.3 Procedure .6 7.4 Determination of results .7 7.5 Test report 7 8 Method of measurement of the angular field of view in the image space .7 8.1 General7 8.2 Test arra
10、ngement.7 8.3 Procedure .8 8.4 Determination of results .9 8.5 Test report 9 9 Method of measurement of the angular field of view in the object space for spectacle wearers .9 9.1 General9 9.2 Test arrangement.9 9.3 Procedure .9 9.4 Determination of results .11 9.5 Test report 11 10 Method of measure
11、ment of the collimation of rays emergent from the eyepiece 11 10.1 General11 10.2 Test arrangement.11 10.3 Procedure .12 10.4 Determination of results .12 10.5 Test report 12 ISO 14490-1:2005(E) iv ISO 2005 All rights reserved11 Method of measurement of the image rotation 12 11.1 General . 12 11.2 T
12、est arrangement 12 11.3 Procedure. 13 11.4 Determination of results. 13 11.5 Test report 13 12 Method of determination of the closest distance of observation 14 12.1 General . 14 12.2 Test arrangement 14 12.3 Procedure. 14 12.4 Determination of results. 14 12.5 Test report 14 13 General test report
13、14 ISO 14490-1:2005(E) ISO 2005 All rights reserved v Foreword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees.
14、Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the Internat
15、ional Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of technical committees is to prepare International Standards. Draft International Stand
16、ards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subjec
17、t of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. ISO 14490-1 was prepared by Technical Committee ISO/TC 172, Optics and photonics, Subcommittee SC 4, Telescopic systems. ISO 14490 consists of the following parts, under the general title Optics and
18、optical instruments Test methods for telescopic systems: Part 1: Test methods for basic characteristics Part 2: Test methods for binocular systems Part 3: Test methods for telescopic sights Part 4: Test methods for astronomical telescopes Part 5: Test methods for transmittance Part 6: Test methods f
19、or veiling glare index Part 7: Test methods for limit of resolution The following part is under preparation: Part 8: Test methods for night-vision devices INTERNATIONAL STANDARD ISO 14490-1:2005(E) ISO 2005 All rights reserved 1 Optics and optical instruments Test methods for telescopic systems Part
20、 1: Test methods for basic characteristics 1 Scope This part of ISO 14490 specifies the test methods for the determination of the following basic characteristics of telescopic systems and observational telescopic instruments: angular magnification (see Clause 4); entrance pupil diameter (see Clause
21、5); exit pupil diameter and eye relief (see Clause 6); angular field of view in the object space (see Clause 7); angular field of view in the image space (see Clause 8); angular field of view in the object space for spectacle wearers (see Clause 9); collimation of the bundle of rays emergent from th
22、e eyepiece (see Clause 10); image rotation (see Clause 11); closest distance of observation (see Clause 12). 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references,
23、 the latest edition of the referenced document (including any amendments) applies. ISO 14132-1:2002, Optics and optical instruments Vocabulary for telescopic systems Part 1: General terms and alphabetical indexes of terms in ISO 14132 3 Terms and definitions For the purposes of this document, the te
24、rms and definitions given in ISO 14132-1 apply. ISO 14490-1:2005(E) 2 ISO 2005 All rights reserved4 Method of measurement of the angular magnification 4.1 General In accordance with ISO 14132-1, the angular magnification of a telescopic system is defined by the following equation: tan tan ww ww = (1
25、) where w and w are angles that the axes of conjugate beams make with the optical axis in the object space and image space, respectively. The method of measurement of the angular magnification is based on the measurement of the angular size of an object placed in the field of view of a test specimen
26、 and that of its image. 4.2 Test arrangement Measurement of the magnification shall be carried out with the angular test arrangement shown in Figure 1. For systems for which the magnification is to be measured under a focus setting other than infinity, the collimator scale shall be adjusted in order
27、 to form the image of the scale at the specified distance from the test specimen. The test arrangement shall be provided with a green optical filter to avoid any chromatism of the image. The maximum transmittance of the filter shall be at a wavelength of about 0,55 m. As an optical angular measuring
28、 device, one of the following shall be used: a telescope with a scale having divisions of known angular size; a telescope with a micrometer eyepiece; any other angle-measuring device which assures the required measurement precision. The same method should be used for Galilean telescopes. Key 1 light
29、 source 2 condenser 3 filter 4 diffusing plate 5 scale 6 collimator lens 7 test specimen 8 optical angle measuring telescope Figure 1 Test arrangement for measurement of the angular magnification ISO 14490-1:2005(E) ISO 2005 All rights reserved 3 4.3 Procedure Before starting the measurements, adjus
30、t the eyepiece of the test specimen to 0 m 1and focus the test specimen onto an infinitely remote object. Determine the number of telescope (8 in Figure 1) scale divisions covered by an integral number of collimator scale (5 in Figure 1) image divisions produced by the test specimen. If a telescope
31、with a micrometer eyepiece is used, measure the angular size of the image of a part of the collimator scale (5 in Figure 1) produced by the test specimen. 4.4 Determination of results The magnification that is to be found is defined as the ratio of the size of the image of the collimator scale (5 in
32、 Figure 1) produced by the telescope to the size of the corresponding part of the collimator scale. For the case in which a telescope with a micrometer eyepiece is used 1 2 na ma = (2) where n is the number of divisions of the telescope (8 in Figure 1) scale that corresponds to the number of divisio
33、ns m of the collimator scale (5 in Figure 1) image; a 1is the scale division value of the measuring telescope scale; a 2is the scale division value of the collimator scale. The uncertainty of magnification shall be less than one third of the maximum deviation from the nominal value specified in the
34、relevant specification standard. For calculation of the magnification difference between the telescopes of a binocular having a magnification of 6 or more, this tolerance shall be reduced by half. 4.5 Test report A test report shall be presented and shall include the general information specified in
35、 Clause 13 and the result of the test as specified in 4.4. 5 Method of measurement of the entrance pupil diameter 5.1 General The method of measurement of the entrance pupil diameter D is based on viewing a reticle which is placed near the entrance pupil through the test specimen and reading off the
36、 linear size of the entrance pupil diameter. 5.2 Test arrangement For a schematic representation of the test arrangement see Figure 2. The test arrangement shall be provided with a green optical filter to avoid any chromatism of the image. The maximum transmittance of the filter should be at a wavel
37、ength of about 0,55 m. The same method shall be used for Galilean telescopes. ISO 14490-1:2005(E) 4 ISO 2005 All rights reservedKey 1 light source 2 condenser 3 filter 4 pinhole 5 collimator lens 6 reticle 7 test specimen 8 intermediate image 9 exit pupil; reticle optional 10 magnifier or microscope
38、 11 scale Figure 2 Test arrangement for the measurement of the entrance pupil diameter 5.3 Procedure To measure the entrance pupil diameter, set a reticle with a fixed scale (or two adjustable knife edges) immediately in front of the test specimens objective lens. Illuminate the reticle marks (or kn
39、ife edges) with a collimator. Position a field stop, whose apparent size may not exceed three arc minutes, in the focal plane of the collimator. Use a microscope or a magnifier behind the eyepiece of the test specimen. Determine which two reticle marks are coincident with the edges of the entrance p
40、upil (or adjust the knife edges to be coincident with the edges of the entrance pupil). The distance between the reticle marks (or knife edges) coincident with the edges of the entrance pupil is equal to the entrance pupil diameter. 5.4 Determination of results The result is determined by reading of
41、f the distance (in mm) between the reticle marks (or knife edges). The distance between the reticle marks (or knife edges) in front of the lens can easily be determined with a precision of 0,1 mm. In order to make sure the uncertainty is less than 1 %, a microscope or magnifier of sufficient magnifi
42、cation shall be chosen appropriately for the specimen being tested. 5.5 Test report A test report shall be presented and shall include the general information specified in Clause 13 and the result of the test as specified in 5.4. 6 Method of measurement of the exit pupil diameter and eye relief 6.1
43、General The exit pupil diameter D is defined to be the size of the image of the entrance pupil produced by the test specimen. ISO 14490-1:2005(E) ISO 2005 All rights reserved 5 The eye relief l is defined as the distance of the exit pupil from the vertex of the last optical surface of the eyepiece.
44、6.2 Test arrangement The exit pupil diameter of the test specimen and the eye relief shall be measured with the test arrangement shown in Figure 3. The test arrangement shall be provided with a green optical filter to avoid any chromatism of the image. The maximum transmittance of the filter shall b
45、e at a wavelength of about 0,55 m. Key 1 light source 2 condenser 3 filter 4 pinhole 5 collimator lens 6 entrance pupil 7 test specimen 8 exit pupil; reticle optional 9 measuring microscope Figure 3 Test arrangement for the measurement of the exit pupil diameter and eye relief 6.3 Procedure Before s
46、tarting the measurements, adjust the eyepiece of the test specimen to 0 m 1and focus the test specimen onto an infinitely remote object. To measure the diameter of the exit pupil, focus the measuring microscope onto the exit pupil. Bring the image of the pupil into coincidence with the microscope re
47、ticle scale and count the number of scale divisions covering the diameter of the exit pupil image. To measure the eye relief, focus the measuring microscope first onto the exit pupil, then onto the vertex of the last refracting surface of the test specimen. 6.4 Determination of results Calculate the
48、 exit pupil diameter D (in mm) in accordance with the equation D nK = (3) where n is the number of scale divisions covering the exit pupil diameter of the test specimen; K is the linear scale division value, in millimetres, of the measuring microscope. ISO 14490-1:2005(E) 6 ISO 2005 All rights reser
49、vedDetermine the eye relief l (in mm) as the difference of readouts from the external scale of the measuring microscope during its axial travel: 121 () laaK = (4) where a 1and a 2are the readouts from the external scale of the measuring microscope when it is focused on the exit pupil and on the last refracting surface of the eyepiece of the test specimen; K 1is the scale value of the external scale of the measuring microscope, in mm, p
