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    IEEE C95 6-2002 en Standard for Safety Levels with Respect to Human Exposure to Electromagnetic Fields 0 C3 kHz《关于人类暴露于0~3kHz电磁场的安全等级》.pdf

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    IEEE C95 6-2002 en Standard for Safety Levels with Respect to Human Exposure to Electromagnetic Fields 0 C3 kHz《关于人类暴露于0~3kHz电磁场的安全等级》.pdf

    1、IEEE Std C95.6-2002IEEE StandardsC95.6TMIEEE Standard for Safety Levels withRespect to Human Exposure toElectromagnetic Fields, 03 kHzPublished by The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USA23 October 2002IEEE Standards Coordinating Committe

    2、e 28IEEE International Committee onElectromagnetic Safety on Non-Ionizing RadiationIEEE StandardsPrint: SH95034PDF: SS95034The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2002 by the Institute of Electrical and Electronics Engineers, In

    3、c.All rights reserved. Published 23 October 2002. Printed in the United States of America.National Electrical Safety Codeand NESCare registered trademarks and service marks in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educationalclassroom use ca

    4、n also be obtained through the Copyright Clearance Center.Note: Attention is called to the possibility that implementation of this standard may require use of subject mat-ter covered by patent rights. By publication of this standard, no position is taken with respect to the existence orvalidity of a

    5、ny patent rights in connection therewith. The IEEE shall not be responsible for identifying patentsfor which a license may be required by an IEEE standard or for conducting inquiries into the legal validity orscope of those patents that are brought to its attention.Copyright 2002 IEEE. All rights re

    6、served.iiiIntroduction(This introduction is not part of IEEE Std C95.6-2002, IEEE Standard for Safety Levels with Respect to Human Expo-sure to Electromagnetic Fields, 03 kHz.)In 1960, the American Standards Association approved the initiation of the Radiation Hazards Standardsproject under the co-s

    7、ponsorship of the Department of the Navy and the Institute of Electrical and Electron-ics Engineers.Prior to 1988, C95 standards were developed by accredited standards committee C95 and submitted to theAmerican National Standards Institute (ANSI) for approval and issuance as ANSI C95 standards. Betw

    8、een1988 and 1990, the committee was converted to Standards Coordinating Committee 28 under sponsorship ofthe IEEE Standards Board, and in 2001, became also known as the International Committee on Electromag-netic Safety (ICES). In accordance with policies of the IEEE, C95 standards will be issued an

    9、d developed asIEEE standards, as well as being submitted to ANSI for recognition.The present scope of ICES is:“Development of standards for the safe use of electromagnetic energy in the range of 0 Hz300 GHz relativeto the potential hazards due to exposure of such energy to man, volatile materials, a

    10、nd explosive devices. Thecommittee will coordinate with other committees whose scopes are contiguous with ICES.”ICES is responsible for this standard. There are ve subcommittees concerned with:I Techniques, Procedures, Instrumentation, and Computation,II Terminology, Units of Measurements, and Hazar

    11、d Communication,III Safety Levels with Respect to Human Exposure, 03 kHz,IV Safety Levels with Respect to Human Exposure, 3 kHz300 GHz,V Safety Levels with Respect to Electro-Explosive Devices.Two standards, two guides, and three recommended practices have been issued. Current versions are:IEEE Std

    12、C95.1-1999 Edition, IEEE Standard for Safety Levels with Respect to Human Exposure toRadio Frequency Electromagnetic Fields, 3 kHz300 GHz (Replaces IEEE Std C95.1-1991).IEEE Std C95.2-1999, IEEE Standard for Radio Frequency Energy and Current Flow Symbols (ReplacesANSI C95.2).IEEE Std C95.3-1991 (Re

    13、aff 1997), IEEE Recommended Practice for the Measurement of PotentiallyHazardous Electromagnetic FieldsRF and Microwave (Replaces ANSI C95.3-1973 and ANSI C95.1-1981).ANSI C95.5-1981, American National Standard Recommended Practice for the Measurement of HazardousElectromagnetic FieldsRF and Microwa

    14、ve.IEEE Std 1460-1996, IEEE Guide for the Measurement of Quasi-Static Magnetic and Electric Fields.ANSI C95.4-1978, American National Standard Safety Guide for the Prevention of Radio-Frequency Radia-tion Hazards in the Use of Electric Blasting Caps.This standard was developed by an ICES Subcommitte

    15、e 3 (SC 3) formed in 1991 to address the frequencyrange from 03 kHz (SC 3). In the early years, the subcommittee discussed the science relating to both long-ivCopyright 2002 IEEE. All rights reserved.term and short-term exposures and concluded that the effects of long-term (chronic) exposure were no

    16、tconvincingly established as were effects of short-term exposures. DisclaimerThis IEEE standard was developed through the collaborative effort of an international group of volunteerswith expertise in many disciplines ranging from medicine to engineering. While this standard represents aconsensus amo

    17、ng this volunteer group, it is not the only view on the safety issues addressed herein. As withany guidance, use of this standard, does not provide proof of or guarantee of absolute safety. Use and com-pliance with this IEEE standard is wholly voluntary.ParticipantsAt the time this standard was comp

    18、leted, SCC 28 Subcommittee 3 had the following membership:Kent Jaffa,ChairJames Daly, SecretaryEleanor AdairFranz AdlkoferJ. Robert AshleyWilliam BaileyDavid BaronJohn BavinJohn BergeronDavid BlackRalf BodemannCharles BoeggermanAviva BrecherRobert CarberryPhilip ChadwickIan CrabtreeRobert CurtisStei

    19、nar DaleThann DovanJohn DeFrankRuth Douglas-MillerLinda ErdreichWilliam FeeroPeter GajsekOm GandhiKenneth GettmanKelly GibneyGregory GorsuchStan GrayDonald Haes, Jr.Wayne HammerMartin HernandezMichael HerzLouis HeynickDanny HicksPhilip HopkinsonMichel IsraelVeronica IvansJoseph L. KoepngerJohn Leono

    20、wichW. Gregory LotzPatrick MasonRobert McCourtTom McManusMartin MeltzAmitabha MukhopadhyayJohn OsepchukRussell OwenWilliam PaulRonald PetersenJ. Patrick ReillyBrad RobertsErvin RootDave SawdonAsher SheppardJon SirugoCarl SuttonMays SwicordRichard TellArt ThansandoteEric van RongenArthur VaranelliCle

    21、veland WatkinsLouis Williams, Jr.Richard WoodsEdward YandekDonald W. ZipseMarvin ZiskinCopyright 2002 IEEE. All rights reserved.vThe following members of the balloting committee voted on this standard. Balloters may have voted forapproval, disapproval, or abstention. When the IEEE-SA Standards Board

    22、 approved this standard on 12 September 2002, it had the followingmembership:James T. Carlo,ChairJames H. Gurney,Vice ChairJudith Gorman,Secretary*Member EmeritusAlso included is the following nonvoting IEEE-SA Standards Board liaison:Alan Cookson, NIST RepresentativeSatish K. Aggarwal, NRC Represen

    23、tativeNoelle D. HumenickIEEE Standards Project EditorGrateful appreciation is expressed to J. Patrick Reilly for his major contributions to this standard throughtechnical development, his chairmanship of the Working Group responsible for its development, his draftingof this standard, and his graciou

    24、s permission to adapt the material in this standard from his own numerouspublications on this subject.The Committee also recognizes the contributions to this standard by the previous Subcommittee co-chairs,John A. Bergeron and William E. Feero.In memoriam, we wish to recognize Matthew Mingoia, who s

    25、erved as Secretary of Subcommittee 3 from itsformation in 1991 until his death in 2000, for his total dedication and support of the activities of the Sub-committee and his contributions to the development of this standard.Eleanor AdairJ. Robert AshleyWilliam BaileyDavid BaronJohn BergeronPrabhakar B

    26、hatCharles BoeggermanAviva BrecherJerrold BushbergChung-Kwang ChouJules CohenJames DalyWilliam FeeroDavid FichtenbergKenneth R. FosterCarl FredericksDavid GeorgeKenneth GettmanGregory GorsuchKonstantinos HalkiotisLouis HeynickJames HillKent JaffaSheila JohnstonShaeila KandelJoseph L. KoepngerRussell

    27、 KurtzJames LinJohn LeonowichArthur LightRobert McCourtMehrdad MehdizadehDaleep MohlaAbdul MousaMichael MurphyMichael NewmanJohn OsepchukRussell OwenRonald PetersenSteve PittmanVikram PunjJ. Patrick ReillyEric Von RongenErvin RootVeli SantomaaWilliam ScanlonJon SirugoJan StolwijkMays SwicordRichard

    28、TellArthur VaranelliLouis Williams, Jr.Donald W. ZipseMarvin ZiskinSid BennettH. Stephen BergerClyde R. CampRichard DeBlasioHarold E. EpsteinJulian Forster*Howard M. FrazierToshio FukudaArnold M. GreenspanRaymond HapemanDonald M. HeirmanRichard H. HulettLowell G. JohnsonJoseph L. Koepnger*Peter H. L

    29、ipsNader MehravariDaleep C. MohlaWillaim J. MoylanMalcolm V. ThadenGeoffrey O. ThompsonHoward L. WolfmanDon WrightviCopyright 2002 IEEE. All rights reserved.Contents1. Overview 11.1 Scope 11.2 Purpose. 22. References 23. Definitions, acronyms, and symbols 23.1 Definitions 23.2 Acronyms and abbreviat

    30、ions 73.3 Symbols . 84. Protected population and mechanisms of interaction 94.1 Protected population 94.2 Mechanisms of biophysical reactions 94.3 Adverse biological effects 105. Exposure limits 105.1 Basic restrictions 105.2 Maximum permissible exposure (MPE) values: Magnetic flux density 115.3 Max

    31、imum permissible exposure values: environmental electric fields. 145.4 Contact and induced current maximum permissible exposure limits 156. Rationale 166.1 Excitation thresholds: strength-duration and strength-frequency laws 166.2 Adverse reaction criteria 216.3 Threshold limits for magnetic field e

    32、xposure 216.4 Static or quasi-static magnetic field exposure . 246.5 Nonsinusoidal or pulsed fields. 256.6 Exposure to environmental electric fields 256.7 Static or quasi-static electric fields 276.8 Statistical variations in thresholds of reaction . 286.9 Acceptance criteria. 306.10 Partial or nonu

    33、niform exposure . 326.11 Induced and contact current. 336.12 Medical devices and metallic implants 34Annex A (informative) Bibliography. 35Annex B (normative) Magnetic induction model 42Copyright 2002 IEEE. All rights reserved.1IEEE Standard for Safety Levels with Respect to Human Exposure to Electr

    34、omagnetic Fields, 03 kHz1. OverviewThis standard is divided into six clauses. Clause 1 denes the scope and purpose of the standard. Clause 2lists references to other standards that are useful in applying this standard. Clause 3 provides denitions thatare either not found in other standards or have b

    35、een modied for use with this standard. Clause 4 denes theprotected population and the mechanisms of interaction. Clause 5 denes the exposure limits. Clause 6details the rationale used in developing this standard.1.1 ScopeThis standard denes exposure levels to protect against adverse effects in human

    36、s from exposure to electricand magnetic elds at frequencies from 03 kHz. This standard was developed with respect to establishedmechanisms of biological effects in humans from electric and magnetic eld exposures. It does not apply toexposures encountered during medical procedures. The dened exposure

    37、 limits do not necessarily protectagainst interference of medical devices or problems involving metallic implants (see 6.12).Established human mechanisms fall within the category of short-term effects. Such effects are understood interms of recognized interaction mechanisms. Exposure limits dened in

    38、 this standard are not based on thepotential effects of long-term exposure because: a) There is not sufcient, reliable evidence to conclude that long-term exposures to electric and mag-netic elds at levels found in communities or occupational environments are adverse to humanhealth or cause a diseas

    39、e, including cancer. b) There is no conrmed mechanism that would provide a rm basis to predict adverse effects fromlow-level, long-term exposure.The Subcommittee is aware of reported epidemiological associations between long-term exposure tomagnetic elds and disease, including childhood leukemia in

    40、residential environments and chroniclymphocytic leukemia in occupational environments. The interpretation of these associations is unclear,especially since exposure to magnetic elds does not appear to initiate or advance the development ofleukemia or other forms of cancers and other diseases in anim

    41、als exposed over much of their lifetime. This isIEEEStd C95.6-2002 IEEE STANDARD FOR SAFETY LEVELS WITH RESPECT TO 2Copyright 2002 IEEE. All rights reserved.consistent with the ndings of interdisciplinary panels of scientists that have evaluated the literature on long-term exposures for scientic and

    42、 governmental organizations. The most recent of these major reviewsinclude the Advisory Group on Non-Ionizing Radiation of the UK National Radiological Protection Board(AGNIR B31), the Health Council of the Netherlands (Netherlands B63), the U.S. National Institute ofEnvironmental Health Sciences (N

    43、IEHS B64; Olden B68), the Institution of Electrical Engineers (IEEB45), the International Agency for Research on Cancer (IARC B42), the International Commission onNon-Ionizing Radiation Protection (ICNIRP) B43, and the U. S. National Research Council (NRC B65).Because none of the above reviews concl

    44、uded that any hazard from long-term exposure has been conrmed,this standard does not propose limits on exposures that are lower than those necessary to protect againstadverse short-term effects. The Subcommittee will continue to evaluate new research and will revise thisstandard should the resolutio

    45、n of present uncertainties in the research literature identify a need to limit long-term exposures to values lower than the limits of this standard. The Subcommittee will also continue toevaluate new research on short-term effects and modeling. As stated below, this standard makes reasonableassumpti

    46、ons based upon available data. As new data becomes available, the committee will revisit theseassumptions for future revisions.1.2 PurposeThe IEEE has previously dened safety standards for human exposure to electromagnetic elds in thefrequency regime from 3 kHz300 GHz (IEEE B46). The purpose of this

    47、 standard is to dene exposurestandards for the frequency regime 03 kHz. For pulsed or nonsinusoidal elds, it may be necessary toevaluate an acceptance criterion at frequencies outside this frequency regime as explained in 5.2.4.2.2. ReferencesThis standard shall be used in conjunction with the follo

    48、wing publications:2Accredited Standards Committee C2-1997, National Electrical Safety Code(NESC).3IEEE Std 644-1994, IEEE Standard Procedures for Measurement of Power Frequency Electric and Mag-netic Fields from AC Power Lines.4IEEE Std 1460-1996, IEEE Guide for the Measurement of Quasi-Static Magne

    49、tic and Electric Fields.3. Denitions, acronyms, and symbols3.1 DenitionsFor the purposes of this standard, the following terms and denitions apply. The Authoritative Dictionary ofIEEE Standards Terms, Seventh EditionB47, shall be referenced for terms not dened in this clause.3.1.1 action potential:A response of a nerve cell to a stimulus involving a propagating rapid depolarizationof the potential across the cell membrane.1The numbers in brackets correspond to those of the bibliography in Annex A.2The IEEE


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