1、 IEEE Guide for Transformer Impulse Tests Sponsored by the Transformers Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 9 March 2012 IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyrig
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14、sk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this IEEE guide was completed, the Dielectric Test Working Group had the following membership: Arthur Molden, Chair Joseph Melans
15、on, Vice Chair Reto Fausch Jim McBride Bertrand Poulin Pierre Riffon Loren Wagenaar The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Satish Aggarwal Carlo Arpino Donald Ayers Peter Balma Paul Barnhart
16、Barry Beaster W. J. Bill Bergman Steven Bezner Wallace Binder Thomas Bishop Thomas Blackburn William Bloethe W. Boettger Steven Brockschink Steven Brown Carl Bush Bill Chiu Craig Colopy Stephen Conrad Jerry Corkran John Crouse Gary Donner Donald Dunn Fred Elliott Gary Engmann James Fairris Joseph Fo
17、ldi Bruce Forsyth Marcel Fortin Eduardo Garcia Saurabh Ghosh Jalal Gohari Edwin Goodwin James Graham William Griesacker Randall Groves Ajit Gwal Michael Haas David Harris Jeffrey Hartenberger Roger Hayes Steven Hensley Gary Hoffman William Hopf Charles Johnson Laszlo Kadar Chad Kennedy Gael Kennedy
18、Sheldon Kennedy James Kinney Joseph L. Koepfinger Jim Kulchisky Saumen Kundu John Lackey Chung-Yiu Lam Aleksandr Levin Hua Liu Thomas Lundquist Greg Luri Richard Marek J. Dennis Marlow John W Matthews Omar Mazzoni James McBride Susan McNelly Nigel McQuin Joseph Melanson Arthur Molden Daniel Mulkey J
19、erry Murphy Ryan Musgrove K. R. M. Nair Michael S. Newman Joe Nims Lorraine Padden Bansi Patel J. Patton Brian Penny Christopher Petrola Paul Pillitteri Alvaro Portillo Bertrand Poulin Lewis Powell Gustav Preininger Iulian Profir Jean-Christophe Riboud Johannes Rickmann Pierre Riffon Michael Roberts
20、 Zoltan Roman John Rossetti Marnie Roussell Thomas Rozek Dinesh Sankarakurup Bartien Sayogo Devki Sharma Gil Shultz Hyeong Sim Charles Simmons James Smith Jerry Smith Steve Snyder Gary Stoedter John Vergis Loren Wagenaar David Wallach Joe Watson Ernesto Jorge Wiedenbrug Alan Wilks James Wilson John
21、Wilson William Wimmervi Copyright 2012 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this guide on 11 December 2011, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past President Judith Gorman, Secretary Masayuki Ariyoshi Will
22、iam Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim Hughes Joseph L. Koepfinger* David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Phil Winston Howard L. Wolfman Don Wright *Me
23、mber Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Francesca Drago IEEE Standards Program Manager, Document Development Erin Spiewak IEEE Standards Pro
24、gram Manager, Document Development vii Copyright 2012 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std C57.98-2011, IEEE Guide for Transformer Impulse Tests. Early in 1955 a Working Group was appointed by the Dielectric Test Subcommittee of the AIEE Transformers Comm
25、ittee to prepare an Impulse Test Guide for oil-immersed transformers. The present content of this guide is a consolidation of all the revisions that have occurred since then, revisions that introduced new developments in testing methods and new developments in impulse recording and fault detecting m
26、ethods. In keeping with the continuing development of this Guide, additional sections are included in this edition on the testing of transformers that include non-linear devices, the use of digital impulse recording systems, and an Annex on the advanced processing of digital records and the applicat
27、ion of the transfer function algorithm. viii Copyright 2012 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Impulse Testing 2 3.1 General 2 3.2 Impulse waveshapes 3 4. Lightning impulse test circuits . 5 4.1 Waveshape control 5 4.2 Chopped-w
28、ave impulse testing of transformers 15 4.3 Non-linear devices. 17 4.4 Arrangement of lightning impulse test circuits 18 4.5 Measurement of lightning impulse voltages 20 4.6 Digital recording instruments 21 4.7 Failure detection 23 4.8 Normal test procedure 26 4.9 Troubleshooting. 26 4.10 Dry type tr
29、ansformers 28 4.11 Voltage and current transformers 29 4.12 Examples of impulse waveforms. 32 4.13 Methods of presenting lightning impulse test results.42 5. Switching impulse testing. 44 5.1 Switching impulse testing techniques 44 5.2 Switching impulse waveshapes . 45 5.3 Switching impulse test cir
30、cuit 46 5.4 Measurement of switching impulse voltage 49 5.5 Switching impulse failure detection 52 5.6 Switching impulse and non-linear devices 53 5.7 Methods of presenting switching impulse test results . 53 6. Grounding practices 55 6.1 General 55 7. Impulse generator size 58 Annex A (informative)
31、 Advanced processing of digital records 62 A.1 Introduction 62 A.2 Transfer function background information. 62 A.3 Transfer function theory . 63 A.4 Application of transfer function 65 A.5 Transfer function of chopped-wave records . 71 A.6 Transfer function of a full wave and chopped wave. 73 A.7 T
32、ransfer function example with test equipment problems 75 A.8 Coherence function. 76 Annex B (informative) Bibliography 78 ix Copyright 2012 IEEE. All rights reserved. IEEE Guide for Transformer Impulse Tests IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or envir
33、onmental protection. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaime
34、rs appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Sc
35、ope To aid in the interpretation and application of the impulse testing requirements of the IEEE Standard Test Codes for Transformers. 1.2 Purpose This guide is written primarily for power transformers, but it is also generally applicable to distribution and instrument transformers. Other IEEE stand
36、ards, plus the purchasers specifications determine the specific requirements for impulse tests. The purpose of this guide is not to change those standards in any way, but to add background information that will aid in the interpretation and application of those standards. The information contained i
37、n this guide is a compendium of technical information provided by engineers and technicians well versed in the art of transformer impulse testing. It is hoped that this guide will provide a basis for a better understanding of impulse test techniques and troubleshooting procedures. 1 Copyright 2012 I
38、EEE. All rights reserved. IEEE Std C57.98-2011 IEEE Guide for Transformer Impulse Tests 2. Normative references The following referenced documents are indispensable for the application of this document (i.e., they must be understood and used, so each referenced document is cited in text and its rela
39、tionship to this document is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. IEEE Std 4TM, IEEE Standard Techniques for High-Voltage Testing.1, 2IEEE Std C57.12.0
40、0TM, IEEE Standard General Requirements for Liquid-Immersed Distribution, Power, and Regulating Transformers. IEEE Std C57.12.01TM, IEEE Standard General Requirements for Dry-Type Distribution and Power Transformers Including Those With Solid Cast and/or Resin-Encapsulated Windings. IEEE Std C57.12.
41、90TM, IEEE Standard Test Code for Liquid-Immersed Distribution, Power, and Regulating Transformers. IEEE Std C57.12.91TM, IEEE Standard Test Code for Dry-Type Distribution and Power Transformers. IEEE Std 1122TM, IEEE Standard for Digital Recorders for Measurements in High-Voltage Impulse Tests. 3.
42、Impulse Testing 3.1 General Insulation is recognized as one of the most important constructional elements of a transformer. Its chief function is to confine the current to useful paths, preventing its flow into harmful channels. Any weakness of insulation may result in failure of the transformer. A
43、measure of the effectiveness with which insulation performs is the dielectric strength. It was once accepted that low-frequency tests alone were adequate to demonstrate the dielectric strength of transformers. As more became known about lightning and switching phenomena, and as impulse testing appar
44、atus was developed, it became apparent that the distribution of impulse-voltage stress through the transformer winding was very different from the low-frequency voltage distribution. Low-frequency voltage distributes itself throughout the winding on a uniform volts-per-turn basis. Impulse voltages a
45、re initially distributed on the basis of winding capacitances. If this initial distribution differs from the final low-frequency inductance distribution, the impulse energy will oscillate between these two distributions until the energy is dissipated and the inductance distribution is reached. In se
46、vere cases, these internal oscillations can produce voltages to ground that approach twice the applied voltage. As circuit voltages became standardized, impulse levels corresponding to the respective voltage classes were also standardized. Impulse levels, now referred to as basic insulation levels (
47、BIL), were established in 1937 by an AIEE-EEI-NEMA Committee on Insulation Coordination. This committee was formed to consider laboratory technique and data, to determine the insulation levels in common use, to establish the insulation strength of all classes of equipment, and to establish insulatio
48、n levels for various voltage classifications. Through the use of these BILs, apparatus can be specified on the basis of demonstrating that the insulation strength of the equipment will be equal to or greater than the selected basic level, and protective equipment can be selected to provide adequate
49、protection. The BILs and other insulation-test voltages are listed in IEEE Std C57.12.00 and C57.12.01. 1The IEEE standards or products referred to in this clause are trademarks of The Institute of Electrical and Electronics Engineers, Inc. 2IEEE publications are available from The Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards.ieee.org/). 2 Copyright 2012 IEEE. All rights reserved. IEEE Std C57.98-2011 IEEE Guide for Transformer Impulse Tests During the 1950s, it became apparent that the lightning impuls
