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    IEEE C57 130-2015 en Guide for the Use of Dissolved Gas Analysis Applied to Factory Temperature Rise Tests for the Evaluation of Mineral Oil-Immersed Transforme.pdf

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    IEEE C57 130-2015 en Guide for the Use of Dissolved Gas Analysis Applied to Factory Temperature Rise Tests for the Evaluation of Mineral Oil-Immersed Transforme.pdf

    1、IEEE Guide for the Use of Dissolved Gas Analysis Applied to Factory Temperature Rise Tests for the Evaluation of Mineral Oil-Immersed Transformers and ReactorsIEEE Std C57.130-2015IEEE Power and Energy SocietySponsored by the Transformers CommitteeIEEE3 Park AvenueNew York, NY 10016-5997USAIEEE Std

    2、C57.130-2015IEEE Guide for the Use of Dissolved Gas Analysis Applied to Factory Temperature Rise Tests for the Evaluation of Mineral Oil-Immersed Transformers and ReactorsSponsorTransformers Committeeof theIEEE Power and Energy SocietyApproved 26 October 2015IEEE-SA Standards BoardAbstract: Applicat

    3、ion of dissolved gas analysis (DGA) techniques on oil-immersed transformers and reactors applied during factory temperature rise tests is addressed in this guide. It contains recommended procedures for sampling, recommended actions based on interpretation of results, and a bibliography of related li

    4、terature.Keywords: dissolved gas analysis, factory temperature rise tests, IEEE C57.130The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2016 by The Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 19

    5、February 2016. Printed in the United States of America.IEEE is a registered trademark in the U.S. Patent fi tness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: r

    6、esults; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.”Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and servi

    7、ces related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard.In publishing and making its standards av

    8、ailable, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing any IEEE Standards document, should rely upon his or her own independ

    9、ent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriateness of a given IEEE standard.IN NO EVENT SHALL IEEE BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQU

    10、ENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OU

    11、T OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE.TranslationsThe IEEE consensus development process involves the review of documents in English only. In the event that an IEEE standard

    12、 is translated, only the English version published by IEEE should be considered the approved IEEE standard.Offi cial statementsA statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manual shall not be considered or inferred to be the offi cial

    13、position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall make it clear that his or her views should be considered

    14、 the personal views of that individual rather than the formal position of IEEE.Comments on standardsComments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affi liation with IEEE. However, IEEE does not provide consulting information or advic

    15、e pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Since IEEE standards represent a consensus of concerned interests, it is important that any responses to comments and ques

    16、tions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to comments or questions except in those cases where the matter has previously been addressed. For th

    17、e same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group.Comments on standards should be submitted to the following address:Secretary, IEEE-SA Standards Board445 Hoes

    18、LanePiscataway, NJ 08854 USALaws and regulationsUsers of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are re

    19、sponsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so.CopyrightsIEEE draft and approved standards a

    20、re copyrighted by IEEE under US and international copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion

    21、of engineering practices and methods. By making these documents available for use and adoption by public authorities and private users, IEEE does not waive any rights in copyright to the documents.PhotocopiesSubject to payment of the appropriate fee, IEEE will grant users a limited, non-exclusive li

    22、cense to photocopy portions of any individual standard for company or organizational internal use or individual, non-commercial use only. To arrange for payment of licensing fees, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400.

    23、 Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clear-ance Center.Updating of IEEE Standards documentsUsers of IEEE Standards documents should be aware that these documents may be superseded at any time by the issu

    24、ance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An offi cial IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect.Every IEEE standard i

    25、s subjected to review at least every 10 years. When a document is more than 10 years old and has not undergone a revision process, it is reasonable to conclude that its contents, although still of some value, do not wholly refl ect the present state of the art. Users are cautioned to check to determ

    26、ine that they have the latest edition of any IEEE standard.In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.org/xpl/standards.jsp or cont

    27、act IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org.ErrataErrata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ie

    28、ee.org/fi ndstds/errata/index.html. Users are encouraged to check this URL for errata periodically.PatentsAttention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by t

    29、he IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has fi led a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/p

    30、atcom/patents.html. Letters of Assurance may in-dicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensa-tion or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desir

    31、ing to obtain such licenses.Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inqui-ries into the legal validity or scope of Patents Claims,

    32、or determining whether any licensing terms or condi-tions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights

    33、, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association.6Copyright 2016 IEEE. All rights reserved.ParticipantsAt the time this IEEE guide was completed, the Insulating Fluids-DGA During Thermal Test

    34、Working Group had the following membership:James A. Thompson, ChairTom Prevost, Vice ChairJuan Castellanos, SecretaryScott DigbyWilliam DarovnyVijayan KrishnamurphyMark McNallySue McNellyDon PlattsSubhas SarkarJin SimRyan ThompsonMel WrightThe following members of the individual balloting committee

    35、voted on this guide. Balloters may have voted for approval, disapproval, or abstention.Stephen AntoszJavier ArteagaRoberto AsanoPeter BalmaThomas BarnesChristopher BaumgartnerBarry BeasterW.J. (Bill) BergmanWallace BinderThomas BlackburnDaniel BlaydonW. BoettgerChris BrooksPaul BuchananPaul Cardinal

    36、Juan CastellanosDonald CherryC. Clair ClaiborneJohn CrouseWillaim DarovnyAlan DarwinDieter DohnalGary DonnerDonald DunnFred ElliottJorge Fernandez DaherJoseph FoldiBruce ForsythGeorge FrimpongDoaa GalalRobert GanserFrank GerleveAli GhafourianEdwin GoodwinJames GrahamWilliam GriesackerRandall GrovesB

    37、al GuptaJohn HarleyRoger HayesJoshua HerzPhilip HopkinsonRowland JamesJohn JohnLaszlo KadarJohn KayGael KennedySheldon KennedyJames KinneyNeil KranichJim KulchiskySaumen KunduJohn LackeyChung-Yiu LamJeffrey LaMarcaThomas La RoseThomas LundquistRichard MarekJ. Dennis MarlowLee MatthewsJames MciverMar

    38、k McnallySusan McnellyCharles Mc ShaneJoseph MelansonDaleep MohlaDaniel MulkeyJerry MurphyR. MusilArthur NeubauerJoe NimsLorraine PaddenBansi PatelPaulette Payne PowellBrian PennyChristopher PetrolaAlvaro PortilloBertrand PoulinTom PrevostTimothy Charles RaymondJean-Christophe RiboudJohn RoachMichae

    39、l RobertsOleg RoizmanJohn RossettiBartien SayogoStephen SchroederEwald SchweigerHyeong SimCharles SimmonsJerry SmithSteve SnyderBrian SparlingDavid StankesMalcolm ThadenJames ThompsonRobert ThompsonMel GeorgeJohn VergisLoren WagenaarDavid WallaceDavid WallachKenneth WhiteJennifer Yu7Copyright 2016 I

    40、EEE. All rights reserved.When the IEEE-SA Standards Board approved this guide on 26 October 2015, it had the following membership:John D. Kulick, ChairJon Walter Rosdahl, Vice ChairRichard H. Hulett, Past ChairKonstantinos Karachalios, SecretaryMasayuki AriyoshiTed BurseStephen DukesJean-Philippe Fa

    41、ureJ. Travis Griffi thGary HoffmanMichael JanezicJoseph L. Koepfi nger*David J. LawHung LingAndrew MylesT. W. OlsenGlenn ParsonsRonald C. PetersenAnnette D. ReillyStephen J. ShellhammerAdrian P. StephensYatin TrivediPhillip WinstonDon WrightYu YuanDaidi Zhong*Member Emeritus8Copyright 2016 IEEE. All

    42、 rights reserved.IntroductionThis introduction is not part of IEEE Std C57.130-2015, IEEE Guide for the Use of Dissolved Gas Analysis Applied to Factory Temperature Rise Tests for the Evaluation of Mineral Oil-Immersed Transformers and Reactors.The evaluation of gases generated in oil-immersed trans

    43、formers and reactors during factory temperature rise tests is a useful method of detecting thermal problems. These thermal problems may be due to abnormal leakage fl ux heating in the windings and leads, the magnetic circuit, or in structural elements. They may also be caused by inadequate heat diss

    44、ipation or poor oil circulation within the core or windings, imperfect connections or contacts, excessive paper insulation, or clogged or inadequate cooling ducts.This guide was written with the understanding that, as additional experience is gained; periodic reviews will be made to ensure that reco

    45、mmendations in this guide continue to be based on the most up-to- date information. The factory temperature rise test (formerly known as the heat run test) is performed in accor-dance with IEEE Std C57.12.90 to determine whether the temperature rises of the windings, oil, and other components meet d

    46、esign values. When testing power transformers, it is normally performed by the short circuit method; therefore, the losses and corresponding heating produced by core fl ux are minimal and the superposition of core and leakage fl ux during actual loading are not accurately represented by this test. O

    47、n the other hand, during much of this test, a transformer is operated at higher-than-rated current to simulate core losses. During factory temperature rise tests, only the more serious design or manufacturing defects become apparent and less severe conditions, which could lead to future problems in

    48、service, can escape detection.This document is, in general, an advisory document that provides guidance on the subject of DGA as it applies to the factory temperature rise test. The ultimate decision on the evaluation of acceptable levels of gas generated during the temperature rise test should be m

    49、ade by the user and manufacturer at the time of contract negotiation. This could include for instance reports of the factory DGA test data to be provided to the user upon request.9Copyright 2016 IEEE. All rights reserved.Contents1. Overview . 101.1 Scope 101.2 Purpose . 102. Normative references 113. Procedures for obtaining samples of oil from the transformer or reactor for laboratory analysis 114. Laboratory methods for analyzing the gas extracted from the oil 115. Description 126. Temperature rise test interval and oil sampling . 136.1 Oil sampling before temperature ris


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