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    IEEE C37 302-2015 en Guide for Fault Current Limiter (FCL) Testing of FCLs Rated above 1000 V AC.pdf

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    IEEE C37 302-2015 en Guide for Fault Current Limiter (FCL) Testing of FCLs Rated above 1000 V AC.pdf

    1、 IEEE Guide for Fault Current Limiter (FCL) Testing of FCLs Rated above 1000 V AC Sponsored by the Switchgear Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std C37.302-2015 IEEE Std C37.302-2015 IEEE Guide for Fault Current Limiter (FCL) Testing of FCLs

    2、Rated above 1000 V AC Sponsor Switchgear Committee of the IEEE Power and Energy Society Approved 5 December 2015 IEEE-SA Standards Board Abstract: The testing of fault current limiters (FCLs) operating on condition-based impedance increase for AC systems 1000 V and above is described in this guide.

    3、Constant impedance series reactors and single fuses are not included in this guide. Keywords: asymmetrical short-circuit current, continuous current, electromagnetic compatibility, FCL testing, IEEE C37.302, insertion impedance, insulation resistance, inter-turns insulation, lightning impulse/BIL, l

    4、ightning impulse voltage, loss measurement, partial discharge, peak withstand current, power frequency voltage withstand, recovery, short-circuit current limitation, short-time withstand current, temperature rise. The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, N

    5、Y 10016-5997, USA Copyright 2016 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 18 May 2016. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accu

    6、racy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE stan

    7、dard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through d

    8、evelopments in the state of the art and comments received from users of the standard. In publishing and making its standards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by an

    9、y other person or entity to another. Any person utilizing any IEEE Standards document, should rely upon his or her own independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriateness

    10、 of a given IEEE standard. IN NO EVENT SHALL IEEE BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON A

    11、NY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Transl

    12、ations The IEEE consensus development process involves the review of documents in English only. In the event that an IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE standard. iii Official statements A statement, written or oral, that is

    13、not processed in accordance with the IEEE-SA Standards Board Operations Manual shall not be considered or inferred to be the official position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educ

    14、ational courses, an individual presenting information on IEEE standards shall make it clear that his or her views should be considered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome fr

    15、om any interested party, regardless of membership affiliation with IEEE. However, IEEE does not provide consulting information or advice pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporti

    16、ng comments. Since IEEE standards represent a consensus of concerned interests, it is important that any responses to comments and questions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not ab

    17、le to provide an instant response to comments or questions except in those cases where the matter has previously been addressed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the rel

    18、evant IEEE working group. Comments on standards should be submitted to the following address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provi

    19、sions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that

    20、is not in compliance with applicable laws, and these documents may not be construed as doing so Copyrights IEEE draft and approved standards are copyrighted by IEEE under U.S. and international copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and priv

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    23、ayment of licensing fees, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv

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    27、 been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.org/Xplore/guesthome.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Webs

    28、ite at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibil

    29、ity that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has fi

    30、led a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights with

    31、out compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsibl

    32、e for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any lice

    33、nsing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards

    34、Association Participants At the time this IEEE guide was completed, the AdsCom - FCL Testing Working Group had the following membership: Michael Steurer, Chair Frank Lambert, Vice Chair Ram Adapa Michael Andrus Simon Bird Curtis Birnbach Joachim Bock Andreas Brandt Landi Carfi Gilbert Carmona Tim Ch

    35、iocchio Mark DAgostino Francisco DeLaRosa Prafulla Deo Patrick DiLillo Jerry Earl Ken Edwards Jim Houston Joanne Hu Swarn Kalsi John Kappenman Dvir Landwer Paul Leufkens Tim MacDonald Franco Moriconi Frank Muench Frank Mumford Raj Nayar Harsha Ravindra Isidor Sauers Christian Schacherer Gerald Schoo

    36、nenberg Judith Schramm Mario Sciulli Tushar Shah David Syracuse Passinam Tatcho Alexander Usoskin Yoram Valent James van de Ligt Paul Williams Jan Zawadzki The Editorial Board of the AdsCom - FCL Testing Working Group had the following membership: Ram Adapa Michael Andrus Joachim Bock Andreas Brandt

    37、 Gilbert Carmona Tim Chiocchio Francisco DeLaRosa Jerry Earl Frank Lambert Paul Leufkens Franco Moriconi Harsha Ravindra Christian Schacherer Judith Schramm Mario Sciulli Michael Steurer Passinam Tatcho James van de LigtThe following members of the individual balloting committee voted on this guide.

    38、 Balloters may have voted for approval, disapproval, or abstention. Katrin Baeuml Robert Behl Andreas Brandt Ted Burse Eldridge Byron Thomas Callsen Paul Cardinal Suresh Channarasappa J. Arturo DelRio Carlo Donati Gary Donner Randall Dotson Edgar Dullni Jerry Earl Marcel Fortin Fredric Friend Frank

    39、Gerleve Mietek Glinkowski Robert Goodin Edwin Goodwin Randall Groves Ajit Gwal David Harris Jeffrey Helzer Lee Herron Gary Heuston Werner Hoelzl John Kay Yuri Khersonsky Joseph L. Koepfinger Jim Kulchisky Marc Lacroix Chung-Yiu Lam Frank Lambert Michael Lauxman Roger Lawrence John Leach Albert Livsh

    40、itz Homer Alan Mantooth Daleep Mohla Georges Montillet Arun Narang Michael Newman David Nichols T. W. Olsen Mirko Palazzo Christopher Petrola Michael Roberts Oleg Roizman Vincent Saporita Bartien Sayogo Thomas Schossig Devki Sharma Jerry Smith Michael Steurer Michael Swearingen Passinam Tatcho Eric

    41、Udren James van de Ligt John Vergis Jane Verner Mark Waldron John Webb Larry Yonce vi Copyright 2016 IEEE. All rights reserved. vii Copyright 2016 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this guide on 5 December 2015, it had the following membership: John D. Kulick, Chai

    42、r Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Ted Burse Stephen Dukes Jean-Philippe Faure J. Travis Griffith Gary Hoffman Michael Janezic Joseph L. Koepfinger* David J. Law Hung Ling Andrew Myles T. W. Olsen Glenn Parsons Ronald

    43、C. Petersen Annette D. Reilly Stephen J. Shellhammer Adrian P. Stephens Yatin Trivedi Philip Winston Don Wright Yu Yuan Daidi Zhong *Member Emeritus Introduction This introduction is not part of IEEE Std C37.302-2015, IEEE Guide for Fault Current Limiter (FCL) Testing of FCLs Rated above 1000 V AC.

    44、Significant developments in the area of fault current limiters (FCLs) operating on the principle of condition-based impedance increase have resulted in products emerging on the market in the last decade. There are, however, no guidelines on how to test these new FCL technologies. Therefore, in June

    45、2010 the IEEE Switchgear Committee established WG PC37.302 to develop such a guide. This Working Group was co-sponsored by the IEEE Power and Energy Society/Substations (PE/SUB) and the IEEE Power Electronics Society/Standards Committee (PEL/SC). This guide takes a technology-independent black-box a

    46、pproach and intentionally avoids stating any performance criteria. It provides, however, a newly developed set of parameters (not values) to fully describe the behavior of any FCL for testing purposes. Overall, this guide has been written to inform the stakeholder community about all the aspects of

    47、testing FCLs. viii Copyright 2016 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 2. Normative references 2 3. Definitions, acronyms, and abbreviations 3 3.1 General FCL definitions 3 3.2 Definitions related to voltages observed during fault current limitation . 4 3.3 D

    48、efinitions related to prospective short-circuit currents 5 3.4 Definitions related to initiation of CCL transition . 5 3.5 Definitions related to currents without limitation by an FCL 6 3.6 Fault currents or over-currents with limitation by an FCL 6 3.7 FCL recovery processes and associated times .

    49、7 4. FCL technical principles . 9 4.1 Type A FCLs 10 4.2 Type B FCLs 13 5. Sample specification parameters .16 5.1 Electrical performance 16 5.2 Rated fault current limitation voltage .18 5.3 Rated maximum prospective short-circuit current 18 5.4 Rated minimum prospective short-circuit current 18 5.5 Withstand current ratings in C mode 19 5.6 CCL Initiation criteria.19 5.7 Current ratings with FCL limitation .20 5.8 Insertion impedance 20 5.9 Physical and operational .21 5.10 Environmental 21 5.11 Safety 22 6. Design tests 22 6.1 Aspects of FCL behavior 22 6.2 Power frequency


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