1、IEEE Std C37.233 -2009IEEE Guide for Power System Protection TestingIEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2009 IEEE. All rights reserved. Introduc
2、tion This introduction is not part of IEEE Std C37.233-2009, IEEE Guide for Power System Protection Testing. This guide focuses on the general approach and specific procedures for testing protective relaying systems that include multiple interacting relay components, auxiliary devices, and power app
3、aratus. In the most critical applications, these system devices may interact over an extended physical or geographic area and use communications systems. The procedures focus separately on design testing, commissioning testing, routine maintenance testing, and ongoing performance assessment with a d
4、iscussion of what each of these test categories aims to accomplish. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. I
5、mplementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights
6、 This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making th
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9、ment is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association Web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IE
10、EE Standards Association or the IEEE standards development process, visit the IEEE-SA Web site at http:/standards.ieee.org. v Copyright 2009 IEEE. All rights reserved. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/
11、updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of thi
12、s guide may require use of subject matter covered by patent rights. By publication of this guide, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may b
13、e required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this
14、 guide are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this guide was submitted to the I
15、EEE-SA Standards Board for approval, the Power System Protection Testing Working Group had the following membership: Vahid Madani, Chair Hyder DoCarmo, Vice Chair Marc Achterkamp Mark Adamiak Mike Agudo Alexander Apostolov James Ariza Miroslav Begovic Robert Beresh Gustavo Brunello Dac-Phouc Bui Sea
16、n Chilcote Guy Colpron Ratan Das Kelly Gardner Daniel Goodrich Anthony Giuliante Gene Henneberg Rich Hunt Bogdan Kasztenny Tim Kern Mladen Kezunovic Gary L. Kobet Peter McLaren Michael Mendik Kalyan Mustaphi Damir Novosel Farnoosh Rahmatian Andr Santos Tony Seegers Jon Sykes Eric Udren Alfredo Vacca
17、ro Benton A. Vandiver Jun Verzosa Ilia Voloh vi Copyright 2009 IEEE. All rights reserved. The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William J. Ackerman Steven Alexanderson Alexander Apostolov St
18、an Arnot Ali Al Awazi Thomas Barnes G. Bartok David Basset Thomas Basso Robert Beresh Martin Best Steven Bezner Wallace Binder Kenneth Birt William Bloethe Chris Brooks Gustavo Brunello Hyder DoCarmo Arvind K. Chaudhary Stephen Conrad Tommy Cooper Jerry Corkran James Cornelison Ratan Das Alla Deronj
19、a Gary L. Donner Ernest Duckworth Donald Dunn Douglas J. Edwards Gearold O. H. Eidhin Gary Engmann Keith Flowers Fredric Friend Jeffrey Gilbert Anthony Giuliante Jalal Gohari Stephen Grier Randall Groves Ajit Gwal Roger Hedding Charles Henville Lee Herron Gary Heuston Scott Hietpas Jerry Hohn Dennis
20、 Holstein David Horvath James Huddleston III James Ingleson Gerald Johnson James Jones Innocent Kamwa Bogdan Kasztenny Gael Kennedy Mladen Kezunovic Tanuj Khandelwal Yuri Khersonsky Chad Kiger James Kinney Gary L. Kobet Joseph L. Koepfinger David W. Krause Jim Kulchisky Saumen Kundu Chung-Yiu Lam Ra
21、luca Lascu Debra Longtin Federico Lopez William Lowe Bruce Mackie Vahid Madani O. Malik Omar Mazzoni Gary Michel Georges Montillet Charles Morse Jerry Murphy Dennis Nietzel Michael S. Newman Joe Nims Gary Nissen Allan St. Peter Craig Preuss Iulian Profir Farnoosh Rahmatian Madan Rana R. Rebbapragada
22、 Michael Roberts Charles Rogers M. Sachdev Miriam Sanders Steven Sano Daniel Sauer Bartien Sayogo Thomas Schossig Sam Sciacca Tony Seegers Douglas Seely Gregory Sessler Devki Sharma Gil Shultz Tarlochan Sidhu David Smith James E. Smith Jerry Smith Kevin Stephan Charles Sufana Richard Taylor John Ten
23、gdin David Tepen Demetrios Tziouvaras Joe Uchiyama Eric Udren Benton A. Vandiver John Vergis Jane Verner Solveig Ward Kenneth WhiteWhen the IEEE-SA Standards Board approved this guide on 11 September 2009, it had the following membership: Robert M. Grow, Chair Thomas Prevost, Vice Chair Steve M. Mil
24、ls, Past Chair Judith Gorman, Secretary John Barr Karen Bartleson Victor Berman Ted Burse Richard DeBlasio Andy Drozd Mark Epstein Alexander Gelman Jim Hughes Richard H. Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Ted Olsen Glenn Parsons Ronald C. Petersen Narayanan Ramachan
25、dran Jon Walter Rosdahl Sam Sciacca *Member Emeritus vii Copyright 2009 IEEE. All rights reserved. Also included are the following nonvoting IEEE-SA Standards Board liaisons: Howard L. Wolfman, TAB Representative Michael Janezic, NIST Representative Satish K. Aggarwal, NRC Representative Lorraine Pa
26、tsco IEEE Standards Program Manager, Document Development Soo Kim IEEE Standards Program Manager, Technical Program Development viii Copyright 2009 IEEE. All rights reserved. Contents 1. Overview .1 1.1 Scope 1 1.2 Purpose .1 1.3 General .2 1.4 Types of applications2 1.5 Types of tests3 1.6 Applicat
27、ions for systems, schemes, and multistation testing5 1.7 Considerations for testing and scheme self-monitoring7 2. Normative references.10 3. Definitions, acronyms, and abbreviations .11 3.1 Definitions 11 3.2 Acronyms and abbreviations 11 4. Types of tests.12 4.1 Certification tests12 4.2 Applicati
28、on tests .13 4.3 Commissioning tests.14 4.4 Maintenance tests .15 4.5 Example of test setup configurations and equipment (end-to-end testing).18 4.6 Methods for generating test modules and cases21 4.7 Analyses and retention of test results .26 5. Benefits and justification for different types of tes
29、ts.30 6. Description of types of relay schemes and testing requirements.31 6.1 Introduction 31 6.2 Line protection32 6.3 Transformer protection .43 6.4 Distribution protection49 6.5 Shunt capacitor protection 56 6.6 Bus protection.58 6.7 Breaker failure protection and control 59 6.8 Reactor protecti
30、on.67 6.9 Generator protection .68 6.10 Trip circuit logic scheme 70 7. Protection system communication testing .74 7.1 Power-line carrier testing74 7.2 Functional testing of IEC 61850-based substation automation systems.77 7.3 Wireless communication 82 ix Copyright 2009 IEEE. All rights reserved. 8
31、. SIPS test requirements.83 8.1 Proof-of-concept testing .86 8.2 Field commissioning tests.87 8.3 System-wide performance testing during maintenance intervals87 8.4 Validation through state estimation 88 8.5 Automatic and manual periodic testing of the entire scheme .88 9. Testing protection and con
32、trol systems with unconventional voltage and current sensing inputs.90 9.1 Testing inputs to relays and microprocessor-based devices with low-level analog inputs per IEEE Std C37.92TM-2005 B17 .90 9.2 Testing inputs to relays with digital interfaces per IEC 61850-9-2-2004 B13 process bus .91 9.3 Tes
33、ting outputs of unconventional sensors.94 9.4 Verification by condition-based maintenance 96 Annex A (informative) Bibliography 97 Annex B (informative) Suggested line current differential scheme testing procedure.100 Annex C (informative) Impact of high-impedance faults to protective relay performa
34、nce and system testing .105 Annex D (informative) Transformer oil and winding temperature computational methods .108 Annex E (informative) Measuring and compensating for time delay after trigger for performing end-to-end testing using different relay test sets110 1 Copyright 2009 IEEE. All rights re
35、served. IEEE Guide for Power System Protection Testing IMPORTANT NOTICE: This guide is not intended to ensure safety, security, health, or environmental protection in all circumstances. Implementers of the guide are responsible for determining appropriate safety, security, environmental, and health
36、practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Dis
37、claimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/ disclaimers.html. 1. Overview 1.1 Scope This guide covers suggested test requirements for power system protection scheme testing, system application tests, the scope and lev
38、el of tests based on the application, and benefits of the overall protective schemes testing. This guide encompasses overall system testing procedures (generators, line, line reactors, transformer, capacitors, special protection schemes, end-to-end testing, distributed application within substation,
39、 etc.) and data collection requirements, as well as the test procedure definitions. This guide describes the methods, extent, and types of system tests for protection applications at various voltage levels. Control functions inherent to the protective systems are included. Importance of line testing
40、, indirect trip applications, open/closed-loop tests, and dynamic/nonlinear tests are also covered. 1.2 Purpose This guide is intended for power system protection professionals. It includes a reference list of type tests for protective devices as well as overall protection scheme performance tests f
41、or various types of protection schemes. The guide describes the methods, extent, and types of protection scheme tests. Interlocking and control functions inherent to the protective schemes are included. IEEE Std C37.233-2009 IEEE Guide for Power System Protection Testing 2 Copyright 2009 IEEE. All r
42、ights reserved. 1.3 General Testing individual relays, or testing within the confines of one traditional protected-zone panel, is not comprehensive enough to demonstrate that the system is ready to respond to a real fault or emergency. This guide focuses on the general approach and procedures for te
43、sting protective relaying systems that include multiple interacting relay components, auxiliary devices, and power apparatus. Many elaborate or wide area protection systems are installed to handle rare and critical events, and these systems must work as designed to avoid major system outages. Sustai
44、ned operation in the field does not give the user benign opportunities to observe and correct performance issues. These systems need accurate and realistic simulation of these rare events for type testing and effective in-service maintenance tests. This guide presents test approaches and procedures
45、for the components of the system and the overall protection and control system functions. The testing of equipment in the system protection scheme, the associated communications equipment, the auxiliary power supplies, and the control of power apparatus are addressed. The system is tested as a funct
46、ional unit when possible, but it may be necessary to test components or portions of the system in overlapping test schemes when it is not practical to test the whole system together. Much of the testing emphasizes a bottom-up approach, in which the basic behavior of scheme components is verified fir
47、st, followed by testing of interconnected components in a function-oriented assembly. The procedures focus separately on design testing, commissioning testing, routine maintenance testing, and ongoing performance assessment with a discussion of what each of these test categories aims to accomplish.
48、Testing recommendations in this document are intended not only to assist engineering and maintenance personnel in developing technical testing procedures, but also to help in planning testing resource requirements for discussion with utility management. 1.4 Types of applications The three overlappin
49、g categories of system design and applications needing these specialized functional testing approaches are listed in 1.4.1 through 1.4.3. 1.4.1 Wide area special protection schemes incorporating power system measurements from multiple substations around the network These types of schemes utilize communications systems to combine results or distribute the control action commands. The testing challenge lies in stimulating and observing the performance of the system as installed over its extended physical domain. The user needs robust verification of both security and d
