1、g44g40g40g40g3g54g87g71g3g38g22g26g17g21g19g17g26g140g16g21g19g19g26g18g38g82g85 g20g16g21g19g20g19g3g11g38g82g85g85g76g74g72g81g71g88g80g3g87g82g44g40g40g40g3g54g87g71g3g38g22g26g17g21g19g17g26g16g21g19g19g26g12g44g40g40g40g3g42g88g76g71g72g3g73g82g85g3g55g72g86g87g76g81g74g3g48g72g87g68g79g16g40g8
2、1g70g79g82g86g72g71g3g54g90g76g87g70g75g74g72g68g85g3g53g68g87g72g71g3g88g83g3g87g82g3g22g27g3g78g57g3g73g82g85g3g44g81g87g72g85g81g68g79g3g36g85g70g76g81g74g3g41g68g88g79g87g86g3g38g82g85g85g76g74g72g81g71g88g80g3g20g3g44g40g40g40g3g51g82g90g72g85g3g9g3g40g81g72g85g74g92g3g54g82g70g76g72g87g92g3g54
3、g83g82g81g86g82g85g72g71g3g69g92g3g87g75g72g54g90g76g87g70g75g74g72g68g85g3g38g82g80g80g76g87g87g72g72g44g40g40g40g22g3g51g68g85g78g3g36g89g72g81g88g72g3g49g72g90g3g60g82g85g78g15g3g49g60g3g20g19g19g20g25g16g24g28g28g26g15g3g56g54g36g3g3g20g26g3g48g68g92g3g21g19g20g19g38g22g26g17g21g19g17g26g16g21g1
4、9g19g26g55g48g18g38g82g85g3g20g16g21g19g20g19IEEE Std C37.20.7-2007/Cor 1-2010 (Corrigendum to IEEE Std C37.20.7-2007) IEEE Guide for Testing Metal-Enclosed Switchgear Rated up to 38 kV for Internal Arcing Faults Corrigendum 1 Sponsor Switchgear Committee of the IEEE Power +1 978 750 8400. Permissio
5、n to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Introduction This introduction is not part of IEEE Std C37.20.7-2007/Cor 1-2010, IEEE Guide for Testing Metal-Enclosed Switchgear Rated up to 38 kV for Intern
6、al Arcing FaultsCorrigendum 1. This corrigendum reflects changes to the base document that were deemed necessary as users and laboratories gained experience with the test requirements for (LV) equipment introduced in the 2007 edition of the test guide and corrects an error in the requirements for te
7、st supply frequency that is applicable to all equipment covered by the guide. Specific changes are as follows: Minor grammatical corrections corresponding to changes in (5.2.2). Changes to this section are made for calibration of LV devices (5.2.3). Corrects an error in tolerance requirements for te
8、st supply frequency (5.2.4). Removes the peak current requirement from the exception allowed for arc duration (5.2.5.1). Clarifies the definition for arc initiation wire in LV testing (5.3). Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulati
9、ons. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to u
10、rge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations
11、, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents
12、Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of
13、the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether iv Copyright 2010 IEEE. All rights reserved. a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEE
14、E Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata E
15、rrata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/s
16、tandards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this guide may require use of subject matter covered by patent rights. By publication of this guide, no position is taken with respect to the existence or validity of any patent r
17、ights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with sub
18、mission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this guide are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further
19、 information may be obtained from the IEEE Standards Association. v Copyright 2010 IEEE. All rights reserved. vi Copyright 2010 IEEE. All rights reserved. ParticipantsAt the time this corrigendum was submitted to the IEEE-SA Standards Board for approval, the C37.20.7 Working Group had the following
20、membership: Michael Wactor, ChairT. W. Olsen, Vice ChairC. J. Ball P. Barnhart E. Byron P. Dwyer D. Gohil N. Gunderson R. Hartzel D. Lemmerman D. Mazumdar A. Morgan R. J. Pucket M. Orosz J. Smith C. Tailor J. Zawadzki The following members of the individual balloting committee voted on this guide. B
21、alloters may have voted for approval, disapproval, or abstention. William J. Ackerman Michael Adams Stan Arnot Gary Arnston Paul Barnhart Bill Bergman Steven Bezner Steven Brockschink Chris Brooks David Burns Ted Burse E. Byron Yunxiang Chen Alireza Daneshpooy Gary L. Donner Randall Dotson Louis Dou
22、cet Douglas J. Edwards Gary Engmann Keith Flowers Marcel Fortin Douglas Giraud James Graham Randall Groves N. GundersonBal Gupta Said Hachichi Paul Hamer R. Hartzel Gary Heuston Scott Hietpas Andrew Jones Harry Josten John Kay Tanuj Khandelwal Joseph L. Koepfinger Jim Kulchisky Chung-Yiu Lam Stephen
23、 Lambert Benjamin Lanz Albert Livshitz G. Luri Frank Mayle Gary Michel Georges Montillet Anne Morgan Charles Morse Jerry Murphy Michael S. Newman Joe Nims T. W. Olsen R. Parry Iulian Profir Michael Roberts Charles Rogers Thomas Rozek Vincent Saporita Bartien Sayogo Gil Shultz H. Smith James Smith Je
24、rry Smith Gary Stoedter Paul Sullivan David Tepen John Vergis Waldemar Von Miller Michael Wactor James Wilson Larry Yonce Janusz Zawadzki Sandeep ZopeWhen the IEEE-SA Standards Board approved this corrigendum on 2 February 2010, it had the following membership: Robert M. Grow, Chair Steve M. Mills,
25、Past Chair Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gelman Jim Hughes Richard H. Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Hung Ling Oleg Logvinov Ted Olsen Ronald C. Petersen Thomas Prevost Jon Walter Rosdahl Sam
26、Sciacca Mike Seavey Curtis Siller Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Michelle Turner IEEE Standards Program Manager, Docu
27、ment Development Matthew J. Ceglia IEEE Standards Program Manager, Technical Program Development vii Copyright 2010 IEEE. All rights reserved. Contents 5. Tests . 2 5.2 Test Conditions 2 5.3 Arc initiation 4 viii Copyright 2010 IEEE. All rights reserved. IEEE Guide for Testing Metal-Enclosed Switchg
28、ear Rated up to 38 kV for Internal Arcing Faults Corrigendum 1 IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protection. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practic
29、es or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimer
30、s Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. NOTEThe editing instructions contained in this corrigendum define how to merge the material contained therein into the existing base guide to form the comprehensiv
31、e guide. The editing instructions are shown in bold italic. Four editing instructions are used: change, delete, insert, and replace. Change is used to make corrections in existing text or tables. The editing instruction specifies the location of the change and describes what is being changed by usin
32、g strikethrough (to remove old material) and underscore (to add new material). Delete removes existing material. Insert adds new material without disturbing the existing material. Insertions may require renumbering. If so, renumbering instructions are given in the editing instruction. Replace is use
33、d to make changes in figures or equations by removing the existing figure or equation and replacing it with a new one. Editorial notes will not be carried over into future editions because the changes will be incorporated into the base guide. 1 Copyright 2010 IEEE. All rights reserved. IEEE Std C37.
34、20.7-2007/Cor 1-2010 IEEE Guide for Testing Metal-Enclosed Switchgear Rated up to 38 kV for Internal Arching Faults Corrigendum 1 5. Tests 5.2 Test Conditions 5.2.2 Voltage Change the dashed list in this text as shown below: The preferred value for test voltage is the rated maximum voltage of the eq
35、uipment. Where this value is not possible because of laboratory constraints, a reduced voltage may be used. The tests shall be performed at the rated maximum voltage of the equipment when the performance of the protective means used is voltage sensitive (for example, fuses). If the equipment has a d
36、ual-voltage rating and the device contains voltage sensitive components, both voltage ratings must be tested. To reduce the chances of premature arc extinction, it is suggested that the reduced value be no less than 60% of the rated maximum voltage for the equipment. Reduced voltage testing is not r
37、ecommended for equipment rated 5 kV and below. The following conditions must be met when a reduced voltage is used: a) The true rms current value complies with current requirements of 5.2.3. b) The arc is not extinguished prematurely in any of the phases in which it has been initiated. The arc shoul
38、d not extinguish before the intended arcing duration (rated arcing duration) has elapsed. It is recognized that some designs may have phase spacing large enough to extinguish arcing at maximum rated voltage. Should the arc in a test sample extinguish before completion of the rated arcing duration, t
39、he test is considered valid if the following conditions are met: The test voltage at the start of the test is set to the maximum rated voltage of the equipment; The peak current requirement of 5.2.3 is met The calibration current requirements of 5.2.3 are met; No other phase spacing configurations a
40、re available for this design. If smaller phase spacing exist, the test must be repeated with the minimum spacing. Refer to 5.2.5 for details on test duration. 5.2.3 Current Under DC Component: Calibration value, change words indicated in the third and fourth dashed-list paragraphs. AC Component: Cal
41、ibration value The short-circuit current for which the metal-enclosed switchgear is specified with respect to arcing shall be set within a (+5,0%) tolerance. If the applied voltage is equal to the rated maximum voltage, this tolerance applies to the prospective current. 2 Copyright 2010 IEEE. All ri
42、ghts reserved. IEEE Std C37.20.7-2007/Cor 1-2010 IEEE Guide for Testing Metal-Enclosed Switchgear Rated up to 38 kV for Internal Arching Faults Corrigendum 1 Test value The current should remain constant. If the capability of the test laboratory does not permit this constancy, the test shall be exte
43、nded until the integral of the ac component of the current equals the value specified within a tolerance of (+10, 0%). In this case, the current shall not be less than the specified value at least during the first three half-cycles and shall not be less than 50% of the specified value at the end of
44、the test. The duration of the short-circuit current should not exceed 125% of the rated arcing duration. DC Component: Calibration value The instant of closing should be chosen so that the prospective value of the peak current flowing in one of the outer phases is as follows: 2.6 times the value of
45、the internal arcing short-circuit current for medium-voltage metal-enclosed and metal-clad switchgear applied on a 60 Hz system 2.5 times the value of the internal arcing short-circuit current for medium-voltage metal-enclosed and metal-clad switchgear applied on a 50 Hz system 2.3 times the value o
46、f the internal arcing short-circuit current for low-voltage metal-enclosed power circuit breaker switchgear using unfused LV power circuit breaker assemblies breakers, or using fused LV power circuit breakers when the arcing fault is initiated on the line side of the fuse 2.16 times the value of the
47、 internal arcing short-circuit current for low voltage metal-enclosed power circuit breaker switchgear using fused LV circuit breaker assemblies breakers when the arcing fault is initiated on the load side of the fuse All values should be set within a +5, 0% tolerance. Test value The actual current
48、delivered to the test point will be reduced by the impedance of the arc and the test sample bus. If the voltage at the start of the test is lower than the rated voltage, the peak value of the short-circuit current for the metal-enclosed switchgear under test shall not be less than 90% of the rated p
49、eak value. In the case of two-phase initiation of the arc, the instant of closing shall be chosen to provide the maximum possible DC component. 5.2.4 Frequency of the test supply Change the following paragraph as indicated. The duration of the test must be considered when setting the frequency of the test current and voltage. The arc energy is significantly affected by frequency when the arc duration is less than 50 ms. Where fast acting protective devices will limit the rated arcing duration (duration of test arc) to 50 ms or less, the frequency at the
