1、g44g40g40g40g3g54g87g71g3g38g22g26g17g20g22g17g20g68g140g16g21g19g20g19g36g80g72g81g71g80g72g81g87g3g87g82g44g40g40g40g3g54g87g71g3g38g22g26g17g20g22g17g20g16g21g19g19g25g12g44g40g40g40g3g54g87g68g81g71g68g85g71g3g73g82g85g3g39g72g191g81g76g87g72g16g51g88g85g83g82g86g72g54g90g76g87g70g75g76g81g74g3g
2、39g72g89g76g70g72g86g3g73g82g85g3g56g86g72g3g76g81g3g48g72g87g68g79g16g40g81g70g79g82g86g72g71g3g47g82g90g16g57g82g79g87g68g74g72g3g51g82g90g72g85g3g38g76g85g70g88g76g87g37g85g72g68g78g72g85g3g54g90g76g87g70g75g74g72g68g85g36g80g72g81g71g80g72g81g87g3g20g29g3g53g72g89g76g86g72g3Sg75g82g85g87g16Cg76g
3、85g70g88g76g87Rg68g87g76g81g74g3g68g81g71g3Tg72g86g87g3Rg72g84g88g76g85g72g80g72g81g87g3g44g40g40g40g3g51g82g90g72g85g3g9g3g40g81g72g85g74g92g3g54g82g70g76g72g87g92g3g54g83g82g81g86g82g85g72g71g3g69g92g3g87g75g72g54g90g76g87g70g75g74g72g68g85g3g38g82g80g80g76g87g87g72g72g44g40g40g40g22g3g51g68g85g78
4、g3g36g89g72g81g88g72g3g49g72g90g3g60g82g85g78g15g3g49g60g3g20g19g19g20g25g16g24g28g28g26g15g3g56g54g36g3g33g3Augustg3g21g19g20g19g38g22g26g17g20g22g17g20g68g55g48IEEE Std C37.13.1a-2010 (Amendment to IEEE Std C37.13.1-2006) IEEE Standard for Definite-Purpose Switching Devices for Use in Metal-Enclos
5、ed Low-Voltage Power Circuit Breaker Switchgear Amendment 1: Revise Short-Circuit Rating and Test Requirement Sponsor Switchgear Committee of the IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Cop
6、yright Clearance Center. iv Copyright 2010 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std C37.13.1a-2010, IEEE Standard for Definite-Purpose Switching Devices for Use in Metal-Enclosed Low-Voltage Power Circuit Breaker SwitchgearAmendment 1: Revise Short-Circuit Ra
7、ting and Test Requirement. Comments from users of the base standard, IEEE Std C37.13.1-2006, indicate that the short-circuit rating in 5.5 may be confusing. This amendment addresses this issue by revising 5.5 and adding test requirements to short-circuit tests in 8.1.8. Notice to users Laws and regu
8、lations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulato
9、ry requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public
10、 and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does
11、 not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An
12、 official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, c
13、orrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at
14、 http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. v Copyright 2010 IEEE. All rights reserved. Interp
15、retations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this sta
16、ndard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or
17、determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, an
18、d the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this amendment was completed, the Low-Voltage Switching Devices Working Group had the following membership: Robert J. Puc
19、kett, Chair Paul D. Barnhart Allan Morse Larry E. Yonce The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William J. Ackerman Satish Aggarwal Stan Arnot Paul D. Barnhart Robert Beavers Steven Bezner Chr
20、is Brooks Ted Burse Eldridge Byron Yunxiang Chen Jarrod Coomer Robert Damron Alireza Daneshpooy Gary L. Donner Donald Dunn Douglas J. Edwards Gary Engmann Keith Flowers Marcel Fortin Edwin Goodwin Randall Groves Nancy Gunderson Gary Heuston Mladen Jeftic Andrew Jones Harry Josten John Kay Tanuj Khan
21、delwal Joseph L. Koepfinger Boris Kogan Jim Kulchisky Saumen Kundu Chung-Yiu Lam Ed Larsen John Leach Albert Livshitz R. Long G. Luri William McBride Nigel McQuin Steven Meiners Gary Michel Daleep Mohla Georges Montillet Charles Morse Dennis Neitzel Michael S. Newman T. Olsen Amit Patel Anthony Pica
22、gli Iulian Profir Robert J. Puckett Robert Resuali Michael Roberts Charles Rogers Edward Rowe Thomas Rozek Sukhbir Sachdev Bartien Sayogo Gil Shultz vi Copyright 2010 IEEE. All rights reserved. Michael Sigmon H. Smith James Smith Jerry Smith Gary Stoedter Alan Storms Paul Sullivan David Tepen Eric U
23、dren John Vergis Waldemar Von Miller John Webb James Wilson Larry E. Yonce Sandeep Zope When the IEEE-SA Standards Board approved this amendment on 17 June 2010, it had the following membership: Robert M. Grow, Chair Richard H. Hulett, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary K
24、aren Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gelman Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Hung Ling Oleg Logvinov Ted Olsen Ronald C. Petersen Thomas Prevost Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Don Wright *Member Em
25、eritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Catherine Berger IEEE Standards Project Editor Matthew Ceglia IEEE Standards Program Manager, Technical Pro
26、gram Development vii Copyright 2010 IEEE. All rights reserved. Contents 5.5 Rated short-circuit withstand current 2 8.1 Design (type) tests . 2 1 Copyright 2010 IEEE. All rights reserved. IEEE Standard for Definite-Purpose Switching Devices for Use in Metal-Enclosed Low-Voltage Power Circuit Breaker
27、 Switchgear Amendment 1: Revise Short-Circuit Rating and Test Requirement IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protection. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and hea
28、lth practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and
29、 Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. NOTEThe editing instructions contained in this amendment define how to merge the material contained herein into the existing base standard and its amend
30、ments to form the comprehensive standard. The editing instructions are shown in bold italic. Four editing instructions are used: change, delete, insert, and replace. Change is used to make small corrections in existing text or tables. The editing instruction specifies the location of the change and
31、describes what is being changed by using strikethrough (to remove old material) and underscore (to add new material). Delete removes existing material. Insert adds new material without disturbing the existing material. Replace is used to make large changes in existing text, subclauses, tables, or fi
32、gures by removing existing mater and replacing it with new material. Editorial notes will not be carried over into future editions because the changes will be incorporated into the base document. IEEE Std C37.13.1a-2010 IEEE Standard for Definite-Purpose Switching Devices for Use in Metal-Enclosed L
33、ow-Voltage Power Circuit Breaker SwitchgearAmendment 1: Revise Short-Circuit Rating and Test Requirement 2 Copyright 2010 IEEE. All rights reserved. 5.5 Rated short-circuit withstand current Change 5.5 as follows: The rated short-circuit current of a DPS device is the designated limit of available (
34、prospective) current at which it shall be required to perform its short-circuit current duty cycle at rated voltage under the prescribed test conditions of 8.1.8. The short-circuit current duty cycle consists of and open (O) followed by a close-open (CO) operation. The time between the O and CO oper
35、ations is the time necessary to replace fuses and to reset the open-fuse trip device. This current is expressed as the rms symmetrical value of current measured from the available current wave envelope at a time half-cycle after short-circuit initiation. DPS devices shall be capable of withstanding
36、the short-circuit current duty cycle with all degrees of current asymmetry produced by three-phase or single-phase circuits having a short-circuit power factor of 20% or greater (X/R ration of 4.9 or less). The switching element of the DPS device shall have a short-circuit current withstand rating,
37、the preferred values of which are listed in Table 1 of ANSI C37.16-2000, for a system nominal voltage of 600 V. The fuses are required to operate for short-circuit currents at or below the short-circuit current withstand rating of the switching device up to the ratings in Table 17 in ANSI C37.16-200
38、0. For fuses with peak let-through current (Ip) and I2t limits established for several different short-circuit current levels, the maximum fuse size selected shall not exceed the maximum Ipand I2t limits for the contactor switching element. See UL 248-1(2000) for fuses with maximum Ipand I2t limits.
39、 8.1 Design (type) tests 8.1.8 Short-circuit current test Change 8.1.8 as follows: The DPS device shall be subjected to a duty cycle according to 5.5. consisting of an open (O) followed by a close-open (CO) operation. The time between the O and the CO operations is the time necessary to replace fuse
40、s and to reset the open-fuse trip device. This current is expressed as the rms symmetrical value of current measured from the available current wave envelope at a time one half-cycle after short-circuit initiation. The minimum duration of the first O operation is 0.067 s or the time permitted by the
41、 current-limiting fuses. The C-O duration shall continue until the current-limiting fuse opens the circuit. The contactor switching element shall be given a signal to open one half-cycle after fault initiation. The contacts of the DPS device, including the contacts of the contactor switching element
42、, shall not weld during any portion of the test. The no welding requirement of the contactor switching element is demonstrated by the ability of the contactor switching element to fully open after each duty cycle. If it does not fully open, it has failed the test. The DPS shall pass dielectric withs
43、tand test in item f) of 8.1.3 after the short-circuit current test. IEEE Std C37.13.1a-2010 IEEE Standard for Definite-Purpose Switching Devices for Use in Metal-Enclosed Low-Voltage Power Circuit Breaker SwitchgearAmendment 1: Revise Short-Circuit Rating and Test Requirement 3 Copyright 2010 IEEE.
44、All rights reserved. Insert the following after the last sentence of 8.1.8: The DPS device shall be tested and be capable of performing the short-circuit duty cycle with all degrees of current asymmetry produced by three-phase or single-phase circuits having a short-circuit power factor of 20% laggi
45、ng or less (X/R ratio of 4.9 or greater). The three-phase tests shall be with a line-to-line voltage not less than the rated maximum voltage and the average of the available rms symmetrical components of the available three-phase currents between 90% and 100% of the rated short-circuit current requi
46、rements of 5.5. The single-phase tests require a line-to-line voltage not less than each rated maximum voltage applied across any pole and with the available rms symmetrical current not less than 87% of the applicable rated three-phase short-circuit current. For the first opening operation on each d
47、uty cycle, the current shall be initiated in the test circuit in such a manner as to ensure that the peak current available would not be less than 2.16 times the single-phase rms symmetrical value for the single-phase test and 2.16 times the three-phase rms symmetrical value in one phase for three-p
48、hase test. The test voltage prior to the inception of current flow shall be not less than the rated maximum voltage for the short-circuit current rating being verified. The frequency of the test circuit shall be 50 Hz for a DPS device rated 50 Hz or 60 Hz for a DPS device rated 60 Hz. DPS device rat
49、ed 50/60 Hz shall be required to perform its short-circuit current duty cycle at both 50 Hz and 60 Hz rated power frequency, if the clearing time of the switching element (without fuses) is less than one power-frequency cycle. DPS device rated 50/60 Hz shall be required to perform its short-circuit current duty cycle at power frequency of 50 Hz, if the clearing time of the switching element (without fuses) is one power-frequency cycle or more. On three-phase tests, either the power source or fault connections shall be grounded, but not both. The test enclosure and fr
