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    IEEE 572-2006 en Qualifcation of Class 1E Connection Assemblies for Nuclear Power Generating Stations《核能发电站1E类连接组件的资格证明》.pdf

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    IEEE 572-2006 en Qualifcation of Class 1E Connection Assemblies for Nuclear Power Generating Stations《核能发电站1E类连接组件的资格证明》.pdf

    1、IEEE Std 572-2006(Revision ofIEEE Std 572-1985)IEEE Standard for Qualifcation ofClass 1E Connection Assembliesfor Nuclear Power Generating StationsI E E E3 Park Avenue New York, NY 10016-5997, USA6 June 2007IEEE Power Engineering SocietySponsored by theNuclear Power Engineering CommitteeIEEE Std 572

    2、-2006(R2011) (Revision of IEEE Std 572-1985) Copyright 2007 IEEE. All rights reserved. IEEE Standard for Qualifcation of Class 1E Connection Assemblies for Nuclear Power Generating Stations Sponsor Nuclear Power Engineering Committee of the IEEE Power Engineering Society Approved 6 December 2006 Rea

    3、ffirmed 10 September 2011 IEEE-SA Standards BoardApproved 11 June 2007 Reaffirmed 11 January 2013 American National Standards Institute ii Copyright 2007 IEEE. All rights reserved. Abstract: The basic requirements for qualifying Class 1E Connection Assemblies and interfaces that are to be used in nu

    4、clear power generating stations are described in this standard. The principles, methods, and procedures described are intended to be used for qualifying Connection Assemblies, maintaining and extending qualification, and updating qualification, as required, if the Connection Assembly is modified. Th

    5、e qualification requirements in this standard, when met, demonstrate and document the ability of the Connection Assembly to perform safety function(s) under applicable service conditions including design basis events, reducing the risk of common-cause Connection Assembly failure. Keywords: age, age

    6、conditioning, aging, baseline parameter, cable, cable assembly, condition monitoring, Connection Assemblies, connector, equipment qualification, generic qualification, harsh environment, interface, margin, mild environment, nuclear, qualification methods, qualified life, radiation, safety-related fu

    7、nction, significant aging mechanism, termination, test plan, test sequence, type testing _ The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2007 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Publis

    8、hed 6 June 2007. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2007 IEEE.

    9、All rights reserved. Introduction This introduction is not part of IEEE Std 572-2006, IEEE Standard for Qualification of Class 1E Connection Assemblies for Nuclear Power Generating Stations. This standard is the result of a review of IEEE Std 572-1985 and present practices in Connection Assembly qua

    10、lification. This revision incorporates current practices and lessons learned from the implementation of previous versions of this standard by the nuclear industry. The following issues are clarified or changed in this revision: The scope of this standard was expanded to provide guidance for the qual

    11、ification of most types of Connection Assemblies. This was accomplished by providing broad-based generic guidelines for the testing of all types of Connection Assemblies. It is the consensus of the working group that this guidance will enable the proper qualification of most types of Connection Asse

    12、mblies. The guidance allows for special cases that may require additional tests and verification to meet specific designs or applications. The wording, definitions, references, and word usage of this standard were updated to be consistent with IEEE Std 323-2003.a An important concept in equipment qu

    13、alification is the recognition that significant degradation could be caused by aging mechanisms occurring from the environments during the service life, and therefore safety-related cables and connector assemblies should be in a state of degradation prior to imposing design basis event simulations.

    14、Previous versions of IEEE Std 572 and IEEE Std 323 recognized that the period of time for which acceptable performance was demonstrated is the qualified life. The concept of qualified life continues in this revision and the latest revision of IEEE Std 323. This revision and the latest revision of IE

    15、EE Std 323 also recognize that the condition of the equipment for which acceptable performance was demonstrated is the qualified condition. Thus, new license renewal and life extension options are available by assuring the qualified equipment continues to remain in a qualified condition. Notice to u

    16、sers Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following

    17、 URL: http:/standards.ieee.org/reading/ieee/interp/index.html. aAdditional information on references can be found in Clause 2. v Copyright 2007 IEEE. All rights reserved. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by

    18、patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IEEE stand

    19、ard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Participants At the time this standard was completed, the Working Group on Qualification of Connection Assemblies (SC2.11) had the following membership: William L. Hadovski, Chair Fre

    20、d Roy, Vice-chair J. Hardy, Secretary R. Boddulas Choon-Hoon Chung Yasutaka Eguchi G. Elam D. Merriman Steve Sandberg J. Tawfik Marek Tengler Marco Van Uffelen Carl Weber Invaluable assistance and support was provided by D. Olsaver. The Subcommittee on Qualification (SC2) of Nuclear Power Engineerin

    21、g Committee that recommended approval of this standard had the following membership: Satish K. Aggarwal, Chair Patrick Gove, Secretary Bohumil Bartonicek Paul D. Baughman Anup K. Behera Steven D. Benson Brij Bharteey Thomas Brewington Nissen M. Burstein Steve Casadevall Suresh Channarasappa Garry V.

    22、 Chapman Javier A. Chicote Sun Yeong Choi Choon-Hoon Chung James M. Dean Liviu Nicolae Delcea Dennis E. Dellinger Philip DiBenedetto Michael Dougherty Quang H. Duong Frank Drumm Yasutaka Eguchi Walter Emerson Artur J. Faya Wells D. Fargo Robert Francis James F. Gleason William L. Hadovski Hideo Hara

    23、da Peter Helander Thomas R. Hencey III Jerrell C. Henley Dirk C. Hopp David Horvath Yao-Tung Hsu In-Koo Hwang Craig S. Irish Serena A. Jagtiani Frank W. Kloer Sushant Kapur Mohsin Khan Henry Leung Bruce M. Lory P. G. McQuillan Daniel R. Mikow Todd Mitton Asif Mohiuddin Edward Mohtashemi Carole Monch

    24、y-Leroy Bill Newell James Parello Janez Pavsek Jan S. Pirrong Daniel J. Pomerening Robert Queenan Edward L. Quinn John M. Richards Fred Roy Steve Sandberg Glen E Schinzel Roderick Simms Kjell Spang Richard G. Starck Hirotsugu Suzuki Marek Tengler Marco Van Uffelen Laszlo Varga Carl Weber John Wheles

    25、s John White Toni Wittamore Richard T. Wood Toshio Yamamoto vi Copyright 2007 IEEE. All rights reserved. At the time this standard was approved, the Nuclear Power Engineering Committee (NPEC) had the following membership: John Disosway, Chair John D. MacDonald, Secretary Satish K. Aggarwal Ijaz Ahma

    26、d George Attarian George Ballassi Farouk D. Baxter Brij M. Bharteey Wesley W. Bowers Daniel F. Brosnan Nissen M. Burstein Robert C. Carruth John P. Carter Stephen Fleger Robert J. Fletcher Robert Fuld James Gleason Dale T. Goodney Britton P. Grim William L. Hadovski David A. Horvath Paul R. Johnson

    27、Harvey C. Leake J. Scott Malcolm Alexander Mario Michael H. Miller Gerald L. Nicely Roger D. Parker James Parello Glen E. Schinzel Neil P. Smith James E. Stoner James E. Thomas John Waclo John White Paul L. Yanosy David J. Zaprazny The following members of the individual balloting committee voted on

    28、 this standard. Balloters may have voted for approval, disapproval, or abstention. Satish K. Aggarwal Munnu Bajpai George A. Ballassi William G. Bloethe Wesley W. Bowers Thomas N. Brewington Daniel F. Brosnan Kent W. Brown Nissen M. Burstein Robert C. Carruth Suresh Channarasappa Weijen Chen Mark S.

    29、 Clark Tommy P. Cooper Dennis E. Dellinger John Disosway Gary R. Engmann Wells D. Fargo Keith Flowers Robert L. Francis James F. Gleason L. Gradin Steven N. Graham Ron K.Greenthaler Randall C. Groves Ajit K. Gwal Hamidreza Heidarisafa Gary A. Heuston David A. Horvath Dennis Horwitz Paul R. Johnson,

    30、Jr. James H. Jones Joseph L. Koepfinger Robert L. Konnik G. L. Luri John D. MacDonald Jose A. Marrero John E. Merando, Jr. Gary L. Michel Kimberly Y. Mosley Michael S. Newman James Parello Jan S. Pirrong Ted Riccio Michael A. Roberts Fredrick L. Roy Stephen J. Sandberg Bartien Sayogo John H. Taylor

    31、S. Thamilarasan James E. Thomas James W. Wilson, Jr. David J. Zaprazny vii Copyright 2007 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 6 December 2006, it had the following membership: Steve M. Mills, Chair Richard H. Hulett, Vice Chair Don Wright, Past Chair

    32、 Judith Gorman, Secretary Mark D. Bowman Dennis B. Brophy Joseph Bruder Richard Cox Bob Davis Julian Forster* Joanna N. Guenin Mark S. Halpin Raymond Hapeman William B. Hopf Lowell G. Johnson Herman Koch Joseph L. Koepfinger* David J. Law Daleep C. Mohla Paul Nikolich T. W. Olsen Glenn Parsons Ronal

    33、d C. Petersen Gary S. Robinson Frank Stone Malcolm V. Thaden Richard L. Townsend Joe D. Watson Howard L. Wolfman *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Alan H. Cookson, N

    34、IST Representative Michael Kipness IEEE Standards Program Manager, Technical Program Development viii Copyright 2007 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Definitions 2 4. Background 3 5. Principles of Connection Assembly qualifica

    35、tion 4 5.1 Qualification by type testing 4 5.2 Qualification by operating experience. 4 5.3 Qualification by analysis . 5 5.4 Ongoing qualification 5 5.5 Combined qualification . 6 6. Qualification procedures and methods . 6 6.1 Qualification specification. 6 6.2 Connection Assemblies type-test proc

    36、edure 9 7. Modifications 16 8. Documentation . 16 8.1 General 16 8.2 Documentation file 17 8.3 Type-testing results 17 8.4 Test report 17 8.5 Operating experience data . 18 8.6 Analysis . 18 Annex A (informative) Suggested margins 19 Annex B (informative) Suggested functional test methods 20 Annex C

    37、 (informative) Glossary 21 Annex D (informative) Bibliography . 22 Copyright 2007 IEEE. All rights reserved. 1IEEE Standard for Qualification of Class 1E Connection Assemblies for Nuclear Power Generating Stations 1. Overview 1.1 Scope This standard provides basic requirements, direction, and method

    38、s for qualifying Class lE Connection Assemblies for service in nuclear power generating stations. These include connectors, terminations, and environmental seals in combination with related cables or wires as assemblies. Qualification of cable with connectors to this standard does not replace qualif

    39、ication to IEEE Std 383TM -2003.1This standard does not apply to containment electric penetrations, fire stops, in-line splices, or components for service within the reactor vessel. The qualification requirements in this standard, when met, demonstrate and document the ability of the equipment to pe

    40、rform safety function(s) under applicable service conditions (including design basis events) reducing the risks of common cause-equipment failures. This standard does not provide environmental stress levels and performance requirements. NOTEOther IEEE standards that present qualification methods for

    41、 specific equipment, specific environments, or specific parts of qualification program may be used to supplement this standard, as applicable. Annex A of IEEE Std 323TM-2003 lists other standards related to equipment qualification.21.2 Purpose The purpose of this standard is to provide specific dire

    42、ction for the implementation of IEEE Std 323-2003 on qualification as it pertains to qualification of connectors, terminations, and environmental seals (related to cables as assemblies). 1Information on references can be found in Clause 2. 2Notes in text, tables, and figures are given for informatio

    43、n only and do not contain requirements needed to implement the standard. IEEE Std 572-2006 IEEE STANDARD FOR THE QUALIFICATI ON CLASS 1E CONNECTION ASSEMBLIES FOR NUCLEAR POWER GENERATING STATIONS 2 Copyright 2007 IEEE. All rights reserved. 2. Normative references The following referenced documents

    44、are indispensable for the application of this standard. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. IEEE Std 323-2003, IEEE Standard for Qualifying Class lE Equipment for

    45、 Nuclear Power Generating Stations.3, 4IEEE Std 344TM-2004, IEEE Recommended Practices for Seismic Qualification of Class IEEE Equipment for Nuclear Power Generating Stations. IEEE Std 383-2003, IEEE Standard for Qualifying Class 1E Electrical Cables and Field Splices for Nuclear Power Generating St

    46、ations. NRC Regulatory Guide 1.180 Revision 1, “Guidelines for Evaluating Electromagnetic and Radio-Frequency Interference in Safety-Related Instrumentation and Control Systems.”53. Definitions For the purposes of this document, the following terms and definitions apply. Definitions of terms that ar

    47、e given in The Authoritative Dictionary of IEEE Standards Terms, B46are included in Annex C for convenience in using this standard. 3.1 baseline parameter: Initial technical data benchmarking acceptable performance of the evaluated qualification test sample. 3.2 condition-based qualification: Qualif

    48、ication based on measurement of one or more condition indicators of equipment, its components, or materials for which acceptance criteria can be correlated to the equipments ability to function as specified during an applicable design basis event. 3.3 design life: The time period during which satisf

    49、actory performance can be expected for a specific set of service conditions. 3.4 operational occurrence: All operational processes deviating from normal operation that are expected to occur once or several times during the operating life of the installation and that, in view of appropriate design provisions, do not cause any significant damage to items important to safety nor lead to accident conditions. 3.5 qualified condition: The condition of equipment prior to the start of design basis event, for which the equipment was demonstra


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