欢迎来到麦多课文档分享! | 帮助中心 海量文档,免费浏览,给你所需,享你所想!
麦多课文档分享
全部分类
  • 标准规范>
  • 教学课件>
  • 考试资料>
  • 办公文档>
  • 学术论文>
  • 行业资料>
  • 易语言源码>
  • ImageVerifierCode 换一换
    首页 麦多课文档分享 > 资源分类 > PDF文档下载
    分享到微信 分享到微博 分享到QQ空间

    IEEE 522-2004 en Guide for Testing Turn Insulation of Form-Wound Stator Coils for Alternating-Current Electric Machines《交流电机模绕定子线圈匝间绝缘的试验指南》.pdf

    • 资源ID:1248756       资源大小:214.39KB        全文页数:26页
    • 资源格式: PDF        下载积分:10000积分
    快捷下载 游客一键下载
    账号登录下载
    微信登录下载
    二维码
    微信扫一扫登录
    下载资源需要10000积分(如需开发票,请勿充值!)
    邮箱/手机:
    温馨提示:
    如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
    如需开发票,请勿充值!如填写123,账号就是123,密码也是123。
    支付方式: 支付宝扫码支付    微信扫码支付   
    验证码:   换一换

    加入VIP,交流精品资源
     
    账号:
    密码:
    验证码:   换一换
      忘记密码?
        
    友情提示
    2、PDF文件下载后,可能会被浏览器默认打开,此种情况可以点击浏览器菜单,保存网页到桌面,就可以正常下载了。
    3、本站不支持迅雷下载,请使用电脑自带的IE浏览器,或者360浏览器、谷歌浏览器下载即可。
    4、本站资源下载后的文档和图纸-无水印,预览文档经过压缩,下载后原文更清晰。
    5、试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。

    IEEE 522-2004 en Guide for Testing Turn Insulation of Form-Wound Stator Coils for Alternating-Current Electric Machines《交流电机模绕定子线圈匝间绝缘的试验指南》.pdf

    1、IEEE Std 522-2004(Revision ofIEEE Std 522-1992)IEEE Standards522TMIEEE Guide for Testing Turn Insulationof Form-Wound Stator Coils forAlternating-Current Electric Machines3 Park Avenue, New York, NY 10016-5997, USAIEEE Power Engineering SocietySponsored by theElectric Machinery CommitteeIEEE Standar

    2、ds9 August 2004Print: SH95212PDF: SS95212Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restr

    3、ictions apply. The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2004 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 9 August 2004. Printed in the United States of America.IEEE is a registered

    4、 trademark in the U.S. Patent (2) coils in completely wound stators; (3) coilsand windings for rewinds of used machinery; and (4) windings of machines in service to determinetheir suitability for further service (preventive-maintenance testing). Coil service conditions, testdevices, and test sequenc

    5、e are discussed. Keywords: ac machines, impulses, surges, testing turn insulation, transients Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. iiiCopyright 2009 IEEE. All rights reserved.This is an unapproved IEE

    6、E Standards draft, subject to change.IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees of theIEEE Standards Association (IEEE-SA) Standards Board. The IEEE develops its standards through a consensusdevelopment process, approved by the American

    7、 National Standards Institute, which brings together volunteersrepresenting varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of theInstitute and serve without compensation. While the IEEE administers the process and establishes rules to promote fai

    8、rnessin the consensus development process, the IEEE does not independently evaluate, test, or verify the accuracy of any of theinformation or the soundness of any judgments contained in its standards.Use of an IEEE Standard is wholly voluntary. The IEEE disclaims liability for any personal injury, p

    9、roperty or otherdamage, of any nature whatsoever, whether special, indirect, consequential, or compensatory, directly or indirectly resultingfrom the publication, use of, or reliance upon this, or any other IEEE Standard document.The IEEE does not warrant or represent the accuracy or content of the

    10、material contained herein, and expressly disclaimsany express or implied warranty, including any implied warranty of merchantability or fitness for a specific purpose, or thatthe use of the material contained herein is free from patent infringement. IEEE Standards documents are supplied “AS IS.”The

    11、existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, purchase, market,or provide other goods and services related to the scope of the IEEE Standard. Furthermore, the viewpoint expressed at thetime a standard is approved and issued is subject to change

    12、brought about through developments in the state of the art andcomments received from users of the standard. Every IEEE Standard is subjected to review at least every five years forrevision or reaffirmation, or every ten years for stabilization. When a document is more than five years old and has not

    13、 beenreaffirmed, or more than ten years old and has not been stabilized, it is reasonable to conclude that its contents, although stillof some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have thelatest edition of any IEEE Standard.In

    14、 publishing and making this document available, the IEEE is not suggesting or rendering professional or other servicesfor, or on behalf of, any person or entity. Nor is the IEEE undertaking to perform any duty owed by any other person orentity to another. Any person utilizing this, and any other IEE

    15、E Standards document, should rely upon the advice of acompetent professional in determining the exercise of reasonable care in any given circumstances.Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate to specificapplications. When the nee

    16、d for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepareappropriate responses. Since IEEE Standards represent a consensus of concerned interests, it is important to ensure that anyinterpretation has also received the concurrence of a balance of interes

    17、ts. For this reason, IEEE and the members of itssocieties and Standards Coordinating Committees are not able to provide an instant response to interpretation requests exceptin those cases where the matter has previously received formal consideration. A statement, written or oral, that is notprocesse

    18、d in accordance with the IEEE-SA Standards Board Operations Manual shall not be considered the official positionof IEEE or any of its committees and shall not be considered to be, nor be relied upon as, a formal interpretation of the IEEE.At lectures, symposia, seminars, or educational courses, an i

    19、ndividual presenting information on IEEE standards shall makeit clear that his or her views should be considered the personal views of that individual rather than the formal position,explanation, or interpretation of the IEEE. Comments for revision of IEEE Standards are welcome from any interested p

    20、arty, regardless of membership affiliation withIEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriatesupporting comments. Recommendations to change the status of a stabilized standard should include a rationale as to why arevision or

    21、withdrawal is required. Comments and recommendations on standards, and requests for interpretations should beaddressed to:Secretary, IEEE-SA Standards Board445 Hoes LanePiscataway, NJ 08854USAAuthorization to photocopy portions of any individual standard for internal or personal use is granted by th

    22、e Institute ofElectrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to Copyright Clearance Center. Toarrange for payment of licensing fee, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive,Danvers, MA 01923 USA; +1 978 750 8400. Permissio

    23、n to photocopy portions of any individual standard for educationalclassroom use can also be obtained through the Copyright Clearance Center.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. Copyright 2004 IEEE. Al

    24、l rights reserved. iiiIntroduction(This introduction is not part of IEEE Std 522-2004, IEEE Guide for Testing Turn Insulation of Form-Wound StatorCoils for Alternating-Current Electric Machines.)Many alternating-current, rotating electric machines are designed to have multiturn form-wound stator coi

    25、ls.In these cases, the winding has two separate but interrelated insulating barriers: One between the various turns (turn insulation), and One between the turns and ground (ground insulation).Failure of either of these barriers will prematurely terminate the service life of the machine. A test level

    26、 forthe ground insulation of twice-rated voltage plus 1 kV has been in existence for many years. This guide sug-gests methods and test levels for the turn insulation.Experience has shown that turn insulation failures can be precipitated by abnormal steep-front surges causedby factors such as lightni

    27、ng strokes, faulty breaker closures, or the malfunction of various types of switchingdevices. However, turn insulation failures can also be caused by surges during normal breaker operationswhen the circuit conditions are such that the rise time of the surge at the machine terminals is less than a fe

    28、wmicroseconds. A measure of protection from such surges may be provided by installation of devices such assurge capacitors at the machine terminals and surge arrestors, or by designing the coils with suitable turninsulation capability. When used for this purpose, capacitor ratings are usually chosen

    29、 to extend the rise timeof voltage surges to 5 s or longer.The bibliography (Annex C) contains references that discuss the general surge environment and surgestrength of electric machines.Notice to usersErrataErrata, if any, for this and all other standards can be accessed at the following URL: http

    30、:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL forerrata periodically.InterpretationsCurrent interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/index.html.PatentsAttention is called to the possibilit

    31、y that implementation of this standard may require use of subject mattercovered by patent rights. By publication of this standard, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE shall not be responsible for identifyingpatents or p

    32、atent applications for which a license may be required to implement an IEEE standard or forconducting inquiries into the legal validity or scope of those patents that are brought to its attention.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from

    33、IEEE Xplore. Restrictions apply. iv Copyright 2004 IEEE. All rights reserved.ParticipantsAt the time this standard was completed, the working group had the following membership: Chuck Wilson,ChairDarrell Howell,Secretary*We all wish to express our sorrow that Tom Kluk passed away before this standar

    34、d was published. Hisinput to this document was very valuable and much appreciated by everyone on the working group.The following members of the individual balloting committee voted on this standard. Balloters may havevoted for approval, disapproval, or abstention. Dana ArndtSaber AziziRay BartnikasK

    35、evin BeckerStefano BombenSudhakar CherukupalliDouglas ConleyJim DymondMark FengerShawn FillibenPaul GabersonGeorge GaoNirmal GhaiBal Gupta Guy HalldorsonGary HeustonJeff HudsonPatricia IrwinAleksandra JeremicTom Kluk*Lou LittleBill McDermid Hal MillerGlenn MottersheadBeant NindraJim OliverLori RuxHo

    36、ward SeddingGreg StoneMeredith StrangesJames TimperleyErnesto WiedenbrugJoe WilliamsJohn WilsonKarim Younsi Karl BergerThomas BishopWeijen ChenTommy CooperGuru Dutt DhingraRoger DaughertyByron DavenportGary DonnerJames DymondAmir El-SheikhGary EngmannJorge Fernandez-DaherTrilok GargNirmal GhaiBrian

    37、GottRandall GrovesBal GuptaPaul HamerEdward Horgan Jr.David JacksonKevin LovingJesus MartinezWalter MartinyThomas McCaffreyWilliam McDermidDonald McLarenNigel McQuinJames MichalecKrste NajdenkoskiNils NilssonAlvaro PortilloJohannes RickmannManoj ShahGregory StoneMeredith StrangesErnesto WiedenbrugCh

    38、uck WilsonAuthorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. Copyright 2004 IEEE. All rights reserved. vWhen the IEEE-SA Standards Board approved this standard on 9 February 2004, it had the followingmembership:Don

    39、 Wright,Chair*Member EmeritusAlso included are the following nonvoting IEEE-SA Standards Board liaisons:Satish K. Aggarwal, NRC RepresentativeRichard DeBlasio, DOE RepresentativeAlan Cookson, NIST RepresentativeDon MessinaIEEE Standards Project EditorChuck AdamsH. Stephen BergerMark D. BowmanJoseph

    40、A. BruderBob DavisRoberto de BoissonJulian Forster*Judith GormanArnold M. GreenspanMark S. HalpinRaymond HapemanRichard J. HollemanRichard H. HulettLowell G. JohnsonJoseph L. Koepfinger*Hermann KochThomas J. McGeanDaleep C. MohlaPaul NikolichT. W. OlsenRonald C. PetersenGary S. RobinsonFrank StoneMa

    41、lcolm V. ThadenDoug ToppingJoe D. WatsonAuthorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. vi Copyright 2004 IEEE. All rights reserved.Contents1. Overview 11.1 Scope 11.2 Purpose. 12. References 13. Service conditi

    42、ons 23.1 Operating stress 23.2 Transient stress. 23.3 Withstand requirements . 24. Suggested test devices 34.1 Test requirements. 34.2 Suitable devices . 34.2.1 Conduction-type devices 34.2.2 Induction-type devices.35. Test procedure 35.1 Test sequences . 35.2 Test conditions. 45.3 Voltage levels. 4

    43、6. Surge test levels for new coils . 46.1 General. 46.2 Standard (3.5 p.u.) withstand envelope 56.3 Alternate withstand envelope. 66.4 Definition of surge envelopes 66.5 Abnormal surges 66.6 Precautions. 66.7 Reduction in test levels for uncured coils 77. Maintenance tests or tests after installatio

    44、n of machines.77.1 Test voltage level . 77.2 Conduction-type devices 77.3 Induction-type devices. 77.4 Insufficient coupling 77.5 Other methods/further details 7Annex A (informative) Test procedures and methods. 8Annex B (informative) Sample test form. 13Annex C (informative) Bibliography. 15Authori

    45、zed licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. Copyright 2004 IEEE. All rights reserved. 1IEEE Guide for Testing Turn Insulation of Form-Wound Stator Coils for Alternating-Current Electric Machines1. Overview1.1 Scope

    46、This guide makes suggestions for testing the dielectric strength of the insulation separating the various turnsfrom each other within multiturn form-wound coils to determine the acceptability of the coils. Typical rat-ings of machines employing such coils normally lie within the range of 200 kW to 1

    47、00 MW (270 to 135 000hp). Test voltage levels described herein do not evaluate the ability of the turn insulation to withstandabnormal voltage surges, as contrasted to surges associated with normal operation. The repetitive voltagesurges (spikes) associated with adjustable frequency drives (AFD) are

    48、 also not addressed here. This guideapplies to a) Individual stator coils after manufacture.b) Coils in completely wound stators of original manufacture.c) Coils and windings for rewinds of used machinery.d) Windings of machines in service to determine their suitability for further service (preventi

    49、ve-maintenance testing).1.2 PurposeThe purpose of this guide is toa) Define surge/impulse testing as applied to the windings of an electric machine.b) Review the service conditions that affect voltage levels in a coil.c) Recommend devices suitable for measuring surges, with precautions to avoid erroneous results.d) Describe various points where surge testing may be performed. e) Present suggested surge test levels for various types of electric machines.2. ReferencesASTM D1711-02, Standard Terminology Relating to Electrical Insulation.11ASTM publications are available from the


    注意事项

    本文(IEEE 522-2004 en Guide for Testing Turn Insulation of Form-Wound Stator Coils for Alternating-Current Electric Machines《交流电机模绕定子线圈匝间绝缘的试验指南》.pdf)为本站会员(syndromehi216)主动上传,麦多课文档分享仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文档分享(点击联系客服),我们立即给予删除!




    关于我们 - 网站声明 - 网站地图 - 资源地图 - 友情链接 - 网站客服 - 联系我们

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1 

    收起
    展开