1、 IEEE Standard for Extruded and Laminated Dielectric Shielded Cable Joints Rated 2.5 kV to 500 kV Sponsored by the Insulated Conductors Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 18 June 2012 IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for ed
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13、 the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that det
14、ermination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2012 IEEE. All rights reserved. viParticipants At the time this IEEE standard was com
15、pleted, the Revision of IEEE Cable Joint Standard 404 Working Group had the following membership: Glenn J. Luzzi, Chair Saleman Alibhay, Vice Chair Edward Bradley Jim Braun Thomas C. Champion, III Philip Cox David E. Crotty Frank DiGuglielmo Mike Dyer Chad Eckhardt Jon Erickson Robert Gear, Jr. Rich
16、ard L. Harp Harry Hayes, III Jeffrey Helzer David Hughes Mike Jackson Edward M. Jankowich Margaret Jasek Farris Jibril Ivan Jovanovic Sherif Kamel Carlos Katz Dan Kennedy Albert Kong John M. Makal Shoji Mashio Tim McLaughlin Aaron Norris Neal Parker Thomas J. Parker Todd Richardson Tim Robeson Micha
17、el Smalley Gregory Stano Stan Szyszko William Taylor Milan Uzelac Tim Wall Carl Wentzel Jade Wong Vitaliy Yaroslavskiy Harry Yaworski The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Roy Alexander S
18、aleman Alibhay Martin Baur Michael Bayer Vern Buchholz William Byrd Thomas C. Champion, III Robert Christman David E. Crotty Gary Donner Donald Dunn Gary Engmann Michael Faulkenberry James Fitzgerald Robert Gear, Jr. Steven Graham Randall Groves Frank DiGuglielmo Richard L. Harp Jeffrey Hartenberger
19、 Timothy Hayden Jeffrey Helzer Lauri Hiivala Werner Hoelzl David Hughes Edward M. Jankowich A. S. Jones John Kay Dan Kennedy Gael Kennedy Joesph L. Koepfinger Robert Konnik Jim Kulchisky Chung-Yiu Lam Michael Lauxman Glenn J. Luzzi Jeff Madden Arturo Maldonado Gary Michel Jerry Murphy Michael S. New
20、man Joe Nims Lorraine Padden Serge Pelissou Johannes Rickmann Michael Roberts Bartien Sayogo Dennis Schlender Gil Shultz Michael Smalley Jerry Smith Gregory Stano Gary Stoedter William Taylor Peter Tirinzoni Nijam Uddin John Vergis Martin Von Herrmann Carl Wall Mark Walton Yingli Wen Carl Wentzel Ke
21、nneth White Jian Yu Dawn Zhao Tiebin Zhao J. Zimnoch Copyright 2012 IEEE. All rights reserved. viiWhen the IEEE-SA Standards Board approved this standard on 29 March 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past President Judith Gorman,
22、Secretary Satish Aggarwal Masayuki Ariyoshi Peter Balma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosd
23、ahl Mike Seavey Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Julie Alessi IEEE Standards Program Manager, Document Development Malia Zaman IEEE
24、 Standards Program Manager, Technical Program Development Copyright 2012 IEEE. All rights reserved. viiiIntroduction This introduction is not part of IEEE Std 404-2012, IEEE Standard for Extruded and Laminated Dielectric Shielded Cable Joints Rated 2.5 kV to 500 kV. This standard provides manufactur
25、ers and users with a consistent set of qualification test requirements for all cable joints. It also provides production test requirements for many cable joints used on extruded dielectric cables. Material properties and sampling rates are included for joint designs not easily production tested in t
26、heir final form. This revision of the standard provides closer harmonization to international standards for those cable joints used on extruded dielectric cables rated 69 kV and above. It provides more applicable testing protocols to verify appropriate joint operation in the field for extruded diele
27、ctric cable joints in a joint-series. A joint-series is a family of joints designed and manufactured to cover a wide range of cable including various conductor sizes and materials as well as various extruded insulation thicknesses and materials. It changes the format of the design test sequence tabl
28、es to provide a more clear and concise format to eliminate interpretation errors. Copyright 2012 IEEE. All rights reserved. ixContents 1. Overview 1 1.1 Scope . 1 2. Normative references 1 3. Definitions 3 3.1 Cable joint categories 3 3.2 Joint constructions . 3 3.3 Other terms 4 4. Service conditio
29、ns 4 5. Ratings 5 5.1 Voltage 5 5.2 Current and temperature 5 6. General requirements 7 6.1 Identification 7 6.2 Shielding 8 6.2.1 Semiconducting shield 8 6.3 Jacket seal 8 6.4 Sheath/shield sectionalizers . 8 7. Design testing. 8 7.1 Design tests and testing sequence for all joint types 9 7.2 Desig
30、n test conditions 9 7.3 Dielectric integrity tests. 11 7.4 Voltage tests 15 7.5 Short-time current test . 17 7.6 Cyclic aging test for extruded dielectric and transition joints 17 7.7 High-voltage time test 20 7.8 Sectionalizer tests 20 7.9 Shielding test . 21 7.10 Joint metallic-shield and jacketin
31、g components 22 7.11 Connector thermal and mechanical tests 25 8. Routine production testing 25 8.1 Premolded and single-component cold-shrink joints. 26 8.2 Heat-shrink and multi-component cold-shrink joints 26 8.3 Elastomeric taped joint components 27 Annex A (informative) Typical values of heat-s
32、hrinkable and multi-component cold-shrink joint component tests and sampling rates . 30 Annex B (informative) Typical values of elastomeric taped joint component tests and sampling rates . 31 Annex C (informative) DC test voltage reference. 32 Annex D (informative) Bibliography 34 Copyright 2012 IEE
33、E. All rights reserved. xCopyright 2012 IEEE. All rights reserved. 1IEEE Standard for Extruded and Laminated Dielectric Shielded Cable Joints Rated 2.5 kV to 500 kV IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, health, or environmental protection, or ensure against in
34、terference with or from other devices or networks. Implementers of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, environmental, health, and interference protection practices and all applicable laws and regulations. This IEEE document is
35、 made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtai
36、ned on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This standard establishes electrical ratings and test requirements of cable joints used with extruded and laminated dielectric shielded cables rated in preferred voltage steps from 2.5 kV to 50
37、0 kV. In addition, it defines test requirements for joint jacket seal devices and joint metallic-shield devices. This standard also defines a variety of common joint constructions. Joints that connect more than two cables or connect cables with two different conductor sizes are not covered by this s
38、tandard. However, manufacturers and users are encouraged to use appropriate parts of this standard to evaluate these joints. 2. Normative references The following referenced documents are indispensable for the application of this document (i.e., they must be understood and used, so each referenced d
39、ocument is cited in text and its relationship to this document is IEEE Std 404-2012 IEEE Standard for Extruded and Laminated Dielectric Shielded Cable Joints Rated 2.5 kV to 500 kV Copyright 2012 IEEE. All rights reserved. 2explained). For dated references, only the edition cited applies. For undate
40、d references, the latest edition of the referenced document (including any amendments or corrigenda) applies. AEIC CS1, Specification for Impregnated Paper-Insulated Metallic-Sheathed Cable, Solid Type.1AEIC CS2, Specification for Impregnated Paper and Laminated Paper Polypropylene Insulated Cable,
41、High Pressure Pipe Type. AEIC CS3, Specification for Impregnated-Paper-Insulated Metallic Sheathed Cable, Low Pressure Gas-Filled Type. AEIC CS4, Specification for Impregnated-Paper-Insulated Low and Medium Pressure Self-Contained Liquid Filled Cable. AEIC CS8, Specification for Extruded Dielectric
42、Shielded Power Cables Rated 5 Through 46 kV. AEIC CS9, Specification for Extruded Insulation Power Cables and Their Accessories Rated Above 46 kV Through 345 kV ac. ANSI C119.4, Electric ConnectorsConnectors to Use Between Aluminum-to-Aluminum or Aluminum-to-Copper Conductors.2ASTM D149-97a, Standar
43、d Test Method for Dielectric Breakdown Voltage and Dielectric Strength of Solid Electrical Insulating Materials at Commercial Power Frequencies.3ASTM D412-98, Standard Test Methods for Vulcanized Rubber and Thermoplastic Elastomers. ASTM D991-89, Standard Test Method for Rubber Property-Volume Resis
44、tivity of Electrically Conductive and Antistatic Products. ASTM D4325-08, Standard Test Methods for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes. ASTM D4496-04, Standard Test Method for DC Resistance or Conductance of Moderately Conductive Materials. ICEA P-32-382, Short-Circ
45、uit Characteristics of Insulated Cable.4ICEA P-45-482, Short-Circuit Performance of Metallic-shields and Sheaths on Insulated Cable. IEEE Std 4, IEEE Standard Techniques for High-Voltage Testing.5, 6 IEEE Std 82, IEEE Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors. 1AEIC p
46、ublications are available from the Association of Edison Illuminating Companies, 600 N. 18th Street, P.O. Box 2641, Birmingham, AL 35291-0992, USA (http:/www.aeic.org/). AEIC publications are also available from Global Engineering Documents, 15 Inverness Way East, Englewood, CO 80112-5704, USA (http
47、:/ 2ANSI publications are available from the Sales Department, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA (http:/www.ansi.org/). 3ASTM publications are available from the American Society for Testing and Materials, 100 Barr Harbor Drive, West Consh
48、ohocken, PA 19428-2959, USA (http:/www.astm.org/). 4ICEA publications are available from ICEA, P.O. Box 1568, Carrollton, GA 30112, USA (http:/ 5IEEE publications are available from The Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards.ieee.
49、org/). 6The IEEE standards or products referred to in this clause are trademarks of The Institute of Electrical and Electronics Engineers, Inc. IEEE Std 404-2012 IEEE Standard for Extruded and Laminated Dielectric Shielded Cable Joints Rated 2.5 kV to 500 kV Copyright 2012 IEEE. All rights reserved. 3IEEE Std 575-1988, IEEE Guide for the Application of Sheath-Bonding Methods for Single-Conductor Cables and the Calculation of Induced Voltages and Currents in Cable Sheaths.7IEEE Std 592, IEEE Standard for Exposed Semicondu
