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    IEEE 344-2013 en Seismic Qualification of Equipment for Nuclear Power Generating Stations《核能发电站设备抗震鉴定用IEEE标准》.pdf

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    IEEE 344-2013 en Seismic Qualification of Equipment for Nuclear Power Generating Stations《核能发电站设备抗震鉴定用IEEE标准》.pdf

    1、 IEEE Standard for Seismic Qualification of Equipment for Nuclear Power Generating Stations Sponsored by the Nuclear Power Engineering Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std 344-2013 (Revision of IEEE Std 344-2004) IEEE Std 344-2013 (Revision

    2、of IEEE Std 344-2004) IEEE Standard for Seismic Qualification of Equipment for Nuclear Power Generating Stations Sponsor Nuclear Power Engineering Committee of the IEEE Power and Energy Society Approved 23 August 2013 IEEE-SA Standards Board Abstract: Practices are provided for establishing procedur

    3、es that will yield data to demonstrate that the equipment can meet its performance requirements during and/or following one safe shutdown earthquake event preceded by a number of operating basis earthquake events. This standard may be used to establish tests, analyses, or experienced-based evaluatio

    4、ns that will yield data to demonstrate equipment performance claims or to evaluate and verify performance of devices and assemblies as part of an overall qualification effort. Common methods currently in use for seismic qualification by test are presented. Two approaches to seismic analysis are desc

    5、ribed, one based on dynamic analysis and the other on static coefficient analysis. Two approaches to experienced-based seismic evaluation are described, one based on earthquake experience and the other based on test experience. Keywords: earthquake, earthquake experience, equipment qualification, IE

    6、EE 344, inclusion rules, nuclear, operating basis earthquake, prohibited features, qualification methods, required response spectrum, response spectra, safe shutdown earthquake, safety function, seismic, seismic analysis, test experience, test response spectrum, type testing The Institute of Electri

    7、cal and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 22 November 2013. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fi

    8、tness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of

    9、an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard

    10、is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. In publishing and making its standards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any pers

    11、on or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing any IEEE Standards document, should rely upon his or her own independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the ad

    12、vice of a competent professional in determining the appropriateness of a given IEEE standard. IN NO EVENT SHALL IEEE BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE,

    13、DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH D

    14、AMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consensus development process involves the review of documents in English only. In the event that an IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE stand

    15、ard. Official statements A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manual shall not be considered or inferred to be the official position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a fo

    16、rmal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall make it clear that his or her views should be considered the personal views of that individual rather than the formal position of IEEE. Comments on standards C

    17、omments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with IEEE. However, IEEE does not provide consulting information or advice pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form o

    18、f a proposed change of text, together with appropriate supporting comments. Since IEEE standards represent a consensus of concerned interests, it is important that any responses to comments and questions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of

    19、 its societies and Standards Coordinating Committees are not able to provide an instant response to comments or questions except in those cases where the matter has previously been addressed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to particip

    20、ate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be submitted to the following address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult

    21、 all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, b

    22、y the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights IEEE draft and approved standards are copyrighted by IEEE under U.S. and international copyright laws. They are made available by

    23、 IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making these documents available for use and adopti

    24、on by public authorities and private users, IEEE does not waive any rights in copyright to the documents. Photocopies Subject to payment of the appropriate fee, IEEE will grant users a limited, non-exclusive license to photocopy portions of any individual standard for company or organizational inter

    25、nal use or individual, non-commercial use only. To arrange for payment of licensing fees, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use

    26、 can also be obtained through the Copyright Clearance Center. Updating of IEEE Standards documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendmen

    27、ts, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years ol

    28、d and has not undergone a revision process, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whethe

    29、r a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IE

    30、EEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata

    31、periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection

    32、 therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willin

    33、g or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of As

    34、surance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with su

    35、bmission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Fur

    36、ther information may be obtained from the IEEE Standards Association. Participants At the time this IEEE standard was completed, the SC 2.5 (Seismic) Working Group had the following membership: James Parello, Chair Mostafa A. Ahmed* Paul D. Baughman Melanie Hamner Brown Howard Butler Suresh Channara

    37、sappa Garry V. Chapman Pei-Ying Chen Walter Djordjevic Steve Eisenberg Robert Enis Gregory Ferguson* Gregory Hardy* Paul Ibanez* Robert Kassawara* Mohsin Khan William LaPay Karla-Davina Liebig* Bruce M. Lory Marie Nemier Karur S. Parthasarathy* Daniel J. Pomerening John M. Richards Donald Smith Rich

    38、ard G. Starck II* *Non-voting member At the time this standard was balloted, Subcommittee 2 on Qualification had the following membership: James F. Gleason, Chair John White, Vice Chair Thomas Koshy, Secretary Chris Abernathy Saleem Akhtar Steve Benson Tom Brewington Nissen M. Burstein Steve Casadev

    39、all Suresh Channarasappa Garry V. Chapman Jake Chilek Jonathan Cornelius James Dean Dennis Dellinger Phil DiBenedetto Yikang Dou Michael Dougherty Frank Drumm Yasutaka Eguchi Walter F. Emerson Wells Fargo Sean Foley Robert Francis Patrick Gove Bill Hadovski Charles Hills Jang Hong-Seok Dirk-Christia

    40、n Hopp David A. Horvath Ken Kettle Robert Konnik Kofi Korsah Serena Krause Gerald Liskom Bruce M. Lory Huaxing Lu Tania Martinez-Navedo Matthew McConnell Daniel Mikow Asif Mohiuddin Charles Mohr Edward R. Mohtashemi Marie Nemier Bill Newell Sven-Olof Palm James Parello Janez Pavsek Chris Pegge Jan P

    41、irrong Robert Queenan Sheila Ray Fredrick Roy Steve Sandberg Glen E. Schinzel Kjell Spng Rebecca Steinman Marek Tengler Ying Wang Carl Weber John Wheless Richard Wood Copyright 2013 IEEE. All rights reserved. viAt the time this standard was balloted, Nuclear Power Engineering Committee had the follo

    42、wing membership Satish Aggarwal, Chair George A. Ballassi, Vice Chair James Parello, Secretary Ijaz Ahmad Dheya Al-Othmany George Attarian Farouk D. Baxter* Royce Beacom Mark D. Bowman Daniel F. Brosnan Nissen M. Burstein Keith Bush Robert C. Carruth John P. Carter Suresh Channarasappa Dennis Dellin

    43、ger David R. Desaulniers John Disosway Walter F. Emerson Stephen Fleger Robert J. Fletcher Robert Francis Robert B. Fuld David Gladey James F. Gleason Dale T. Goodney Robert Hall Kuljit Hara Daryl Harmon Dirk C. Hopp David A. Horvath Paul R. Johnson Christopher J. Kerr Bok-Ryul Kim Thomas Koshy Jame

    44、s K. Liming Bruce A. Lord John D. Macdonald J. Scott Malcolm Alexander Marion* Michael H. Miller Edward R. Mohtashemi Yasushi Nakagawa Julius Persensky* Ted Riccio Mark F. Santschi Glen E. Schinzel Zdenko Simic James E. Stoner, Jr.* Marek Tengler James E. Thomas Masafumi Utsumi Michael Waterman Edwa

    45、rd Wenzinger John White Paul L. Yanosy, Sr. Won Young Yun David J. Zaprazny Oon-Pyo Zhu*Non-voting member vii Copyright 2013 IEEE. All rights reserved. The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstentio

    46、n. Michael Dougherty Satish Aggarwal George A. Ballassi Royce Beacom William Bloethe Thomas Brewington Daniel Brosnan Melanie Hamner Brown Nissen M. Burstein Robert C. Carruth Suresh Channarasappa Garry Chapman Weijen Chen Tom Crawford Marie Cuvelier John Disosway Wells Fargo Stephen Fleger Sean Fol

    47、ey Robert B. Fuld Dale Goodney Ron Greenthaler Randall C. Groves Ajit Gwal Daryl Harmon Hamidreza Heidarisafa Werner Hoelzl Dirk Hopp David A. Horvath Paul Johnson John Kay Jim Kulchisky Michael Lauxman Bruce M. Lory John Macdonald Jose Marrero Michael May John Merando Michael S. Newman Charles Nget

    48、he James Parello Jan Pirrong Ted Riccio Fredrick Roy Bartien Sayogo Glen E. Schinzel James Smith Gary Stoedter James E. Thomas John Vergis Michael Waterman John Webb Kenneth White James Wilson Paul L. Yanosy, Sr. Shuhui Zhang viii Copyright 2013 IEEE. All rights reserved. When the IEEE-SA Standards

    49、Board approved this standard on 23 August 2013, it had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Wael William Diab Stephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvotin


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