1、 IEEE Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events Sponsored by the Transmission and Distribution Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std 1782-2014IEEE Std 1782-2014 IE
2、EE Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events Sponsor Transmission and Distribution Committee of the IEEE Power and Energy Society Approved 27 March 2014 IEEE-SA Standards Board Abstract: Reliability of electric power syst
3、ems remains an important societal issue. While transmission disturbances draw national attention and scrutiny, service interruptions at the distribution level are the primary concern of the end-use customer and their regulatory and governmental representatives. Much effort has been expended in devel
4、oping methods to uniformly and consistently quantify the reliability of distribution service based on electric system performance. However, the results of a nationwide survey of recorded information used for calculating distribution reliability indices performed in 1998 by the Working Group on Syste
5、m Design (now Distribution Reliability) indicate that significant inconsistencies exist in the data, categorization of that data, and in the collection processes used within the industry. This guide discusses the collection, categorization, and use of information related to electric power distributi
6、on interruption events and will be used in the development of industry guidelines. This guide presents a minimal set of data and a consistent categorization structure that, when used in combination with IEEE Std 1366,will promote consistency in how the industry collects data for the purpose of bench
7、marking distribution system performance. Keywords: benchmarking, data collection, IEEE 1782, outage management systems, power distribution reliability, reliability management, sampling methods The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Cop
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37、IEEE. All rights reserved. vi Participants At the time this IEEE guide was completed, the System Design Working Group had the following membership: Rodney Robinson*, Chair (2011-Present) John McDaniel, Vice Chair Val Werner*, Secretary Barney Adler John Ainscough Dave Albergine Daniel Arden Greg Ard
38、rey Ignacio Ares Davood Asgharian Jim Ashkar Dustin Ballacy John Banting Karie Barczakk Philip Barker Ryan Bartlett Ed Beavers Bill Becia James Benaglio Lina Bertling William Beutler Tom Bialek Roy Billinton Chantal Bitton David Blankenheim John Bolinger Jim Bouford* Vilet Bounnam Stephane Brule Jas
39、on Bundren James Burke William Burley Brandy Burnett Thomas Callsen Manuel Camara Mark Carr Patrick Carroll Heide Caswell* Cliff Cayer Donald M. Chamberlin M. L. Chan Baden Chatterton Dave Chetwynd Bill Chisholm Tony Chou Rich Christie Rob Christman George Clark Mike Clodfelder James Cole Betsy Copp
40、ock Larry Conrad Grace Couret Tim Croushore Bill Daily Jeff Deal Herve Delmas Chuck DeNardo Fred Dennert Frank Doherty April Dornbrook R. Clay Doyle Jeff Duff Herman Dyal Mike Engel Russ Erlich Joe Eto Charlie Fijnvandraat Emily Fisher Doug Fitchett Fred Friend Keith Frost* Justin Fuith Anish Gaikwa
41、d David Gilmer Manuel Gonzalez John Goodfellow John Gordon Tom Grisham Tom Gutwin Don Hall* Jane Hammes Randy Harlas Keith Harley Harry Hayes David Haynes Eric Helt Jim Hettrick Ray Hisayasu Paul Hodges Alex Hofmann Tao Hong Ian Hoogendam Bob Howes Mike Hyland Cindy Janke Allan Jirges Joshua Jones R
42、obert Jones Mark Kemper John Kennedy Mort Khodaie Ann Kimber Margaret Kirk Mark Konya* Frank Lambert Dave Lankutis* Ken Lau Roger Lee Jim Lemke Jack Leonard Giancarlo Leone Gene Lindholm Ray Lings Nick Loehlein Andrew Lozano Susan Lovejoy Ning Lu Robert Manning Ethan Matthes Ed Mayer Tom McCarthy To
43、m McDermott Mark McGranaghan Steve McHardy Kale Meade Tom Menten Bill Montgomery J. C. Mathieson Mathieu Mougeot Jerry Murray Peter Nedwick Mike Nekola Terry Nielsen Denise Nikoloff Gregory Obenchain Ray OLeary Gregory Olson Jamie Ortega Anil Pahwa Milorad Papic Marc Patterson Dan Pearson Mike Pehos
44、h Charles Perry Ray Piercy Jeff Pogue Steve Pullins Henry Quach Mike Rafferty William Ranken Alvin Razon Caryn Riley Copyright 2014 IEEE. All rights reserved. vii Sebastian Rios D. Tom Rizy Tim Rogelstad Ziolo Roldan Julio Romero Aguero Chris Root Reed Rosandich Robert Rusch David Russo Dan Sabin Ji
45、m Sagen Bob Saint* N. D. R. Sarma Josh Schellenberg Dave Schepers Steven Schott Andy Schwalm Ken Sedziol Matt Seeley Mike Shepherd David Shibilia Tom Short Cheong Siew Jeff Smith Rusty Soderberg John Spare Joshua Stallings Lee Taylor Jay TeSelle Rao Thallam Mark Thatcher Casey Thompson Betty Tobin T
46、om Tobin S. S. (Mani) Venkata Joe Viglietta* Marek Waclawiak Juli Wagner Reigh Walling David Wang Daniel J. Ward Cheryl A. Warren* Neil Weisenfeld Greg Welch Lee Welch Charlie Williams John Williams Taui Willis Mike Worden Don Yuen Eena Singh Andy Holt Jason Handley Tony Thomas Dave Crudele Bo Van B
47、eekum Le Xu *Primary author The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Ali Al Awazi Wallace Binder James Bouford A. James Braun Gustavo Brunello Ted Burse Robert Christman James
48、Cole Larry Conrad Ray Davis Neal Dowling Frederic Friend Michael Garrels Waymon Goch Edwin Goodwin Randall Groves Donald Hall Dennis Hansen David Haynes Werner Hoelzl Richard Jackson Mayank Jain Laszlo Kadar Gael Kennedy Yuri Khersonsky Morteza Khodaie Joseph L. Koepfinger Jim Kulchisky Saumen Kundu
49、 Greg Luri Thomas McCarthy Christian McCollom John McDaniel John McDonald John Miller Daleep Mohla Jerry Murphy Michael Newman Joe Nims Lorraine Padden Richard Paes Bansi Patel Christopher Petrola Craig Preuss Michael Roberts Charles Rogers Bob Saint Bartien Sayogo Tony Seegers Hamid Sharifnia James Smith Jerry Smith John Spare Gary Stoedter Lee Taylor William Taylor Eric Udren John Vergis Jane Verner Carl Wall Daniel J. Ward Val Werner Kenneth White Luis Zambrano Francisc Zavoda When the IEEE-SA Standards Board approved this guide on 27 March 2014, it had the following me