1、 IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device Sponsored by the Test Technology Standards Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Computer Society IEEE Std 1687-2014 IEEE Std 1687-2014 IEEE Standard for Access and Control of Inst
2、rumentation Embedded within a Semiconductor Device Sponsor Test Technology Standards Committee of the IEEE Computer Society Approved 3 November 2014 IEEE-SA Standards Board Abstract: A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments
3、or their features themselves, via the IEEE 1149.1 test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to descri
4、be this network, and a software language and protocol for communicating with the instruments via this network. Keywords: access network, built-in self-test (BIST), boundary scan, debug, design for testability (DFT), embedded instruments, IEEE 1149.1, IEEE 1687, Instrument Connectivity Language (ICL)
5、, internal JTAG (IJTAG), Joint Test Action Group (JTAG), on-chip instrumentation, Procedural Description Language (PDL), test, Tool Command Language (Tcl) The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electr
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35、leted, the IEEE 1687 Working Group had the following membership: Kenneth Posse, Chair Alfred Crouch, Vice Chair Jeff Rearick, Editor Michael Laisne, Webmaster Paul Abelovski Alan Bair Bill Bruce Krishna Chakravadhanula C. J. Clark Mike Coldewey Jean-Francois Cote Bruce Cowan Adam Cron Romi Datta Sty
36、lianos Diamantidis Jason Doege Richard Dugan Theodore Eaton Heiko Ehrenberg William Eklow Brian Foutz Pradipta Ghosh Kevin Gorman Suresh Goyal J. J. Grealish Scott Hartranft Hong-Shin Jun Rohit Kapur Martin Keim Bruno Latulippe Andrew Levy Guoqing Li Ed Malloy Harrison Miles, Jr. Skip Meyers Jay Nej
37、edlo Thai-Minh Nguyen Hari Nookala Rick Nygaard Victor Orona John Parham Srinivas Patil Michele Portolan John Potter Jeff Remmers Paul Reuter Mike Ricchetti Ben Rice Thomas Rinderknecht Franciso Russi John Seibold Craig Stephan Anthony Suto Steven Terry Brian Turmelle William Tuthill Brad Van Treure
38、n Hans Martin von Staudt Hugh Wallace Brian Wang Mike Wiznerowicz Christian Zoellin Songlin Zuo Copyright 2014 IEEE. All rights reserved. vi The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Saman Ad
39、ham Gobinathan Athimolom John Braden Bill Brown Gunnar Carlsson Krishna Chakravadhanula Keith Chow C. J. Clark Jean-Francois Cote Adam Cron Alfred Crouch Russell Davis Frans G. De Jong Jason Doege Sourav Dutta Theodore Eaton Heiko Ehrenberg Peter Eijnden William Eklow Joshua Ferry Kevin Gorman Chris
40、 Gorringe J. J. Grealish Randall Groves Peter Harrod Kazumi Hatayama Werner Hoelzl Neil Glenn Jacobson Hong-Shin Jun Rohit Kapur Martin Keim Anzou Ken-Ichi Michael Laisne James Langlois Roland R. Latvala Philippe Lebourg Adam Ley Teresa Lopes Greg Luri Colin Maunder Ian Mcintosh Reinhard Meier Harri
41、son Miles, Jr. Jeffrey Moore Richard Morren Zainalabedin Navabi Ion Neag Jim OReilly Kim Petersen Ulrich Pohl Irith Pomeranz Michele Portolan Kenneth Posse John Potter Jeff Rearick Paul Reuter Mike Ricchetti Gordon Robinson Andrzej Rucinski Francisco Russi Bartien Sayogo John Seibold Kapil Sood Roge
42、r Sowada Thomas Starai Craig Stephan Michael Stora Walter Struppler Anthony Suto Efren Taboada David Thompson Brian Turmelle William Tuthill Louis Ungar Srinivasa Vemuru Tom Waayers Hugh Wallace Douglas Way Oren Yuen Janusz Zalewski Daidi Zhong Christian Zoellin Songlin Zuo Copyright 2014 IEEE. All
43、rights reserved. vii When the IEEE-SA Standards Board approved this standard on 3 November 2014, it had the following membership: John Kulick, Chair Jon Walter Rosdahl, Vice-chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplain Steph
44、en Dukes Jean-Phillippe Faure Gary Hoffman Michael Janezic Jeffrey Katz Joseph L. Koepfinger* David J. Law Hung Ling Oleg Logvinov T. W. Olsen Glenn Parsons Ron Peterson Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don Wright Yu Yuan *Member Emeritus Also included are the following no
45、nvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Michelle Turner IEEE-SA Content Publishing Kathryn Bennett IEEE-SA Technical Community Programs Copyright 2014 IEEE. All rights reserved. viii Introduction This introduction is not par
46、t of IEEE Std 1687-2014, IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device. The development of this standard stemmed from two independent (and unaware of each other) efforts at the 2004 International Test Conference to address issues surrounding the use o
47、f the IEEE 1149.1 test access port (TAP) for purposes well beyond boundary scan testing. These efforts were merged, and the Internal JTAG (IJTAG) Working Group was born. The scope of the effort was refined in the following months as more members joined the group to focus on the access to design for
48、testability (DFT) features (more generally called instruments) inside devices. The development of the ideas comprising this standard can be traced by presentations at a series of conferences, workshops, and symposia, including ITC05, BAST06, ITSW06, VTS06, ETS06, ITC06, VTS07, ETS07, ITC07, ETS08, I
49、TC08, and IOLTS09, ITC11, ETS12, ITC12, and ITC13. Frequently asked questions The IEEE 1687 web site will include an FAQ.aaSee http:/grouper.ieee.org/groups/1687/. Copyright 2014 IEEE. All rights reserved. ix Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3 Background 2 1.4 Organization 2 1.5 Context 3 2. Normative references 4 3. Definitions, acronyms, and abbreviations 4 3.1 Definitions . 4 3.2 Acronyms and abbreviations 10 4. Technology 11 4.1 Introduction 11 4.2 Serial access networks 11 4.3 On-chip instruments .18 5. Hardware architecture .19
