1、 IEEE Guide for the Use of IEEE Std 1641TM, IEEE Standard for Signal and Test Definition Sponsored by the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems IEEE 3 Park Avenue New York, NY 10016-5997 USA 7 June 2013 IEEE Standards Coordinating Committee 20 IEEE Std
2、 1641.1-2013 (Revision of IEEE Std 1641.1-2006) IEEE Std 1641.1-2013 (Revision of IEEE Std 1641.1-2006) IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 6 March
3、 2013 IEEE-SA Standards Board Abstract: Guidance in the use of the signal and test definition (STD) standard, IEEE Std 1641-2010, is provided. IEEE Std 1641 provides the means to define and describe signals used in testing. This guide describes how to form complex signals usable across all test plat
4、forms. Keywords: ATE, ATLAS, ATML, ATS, automatic test equipment, IEEE 1641.1, signal definitions, test definitions, test requirements, test signals, unit under test, UUT The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Ins
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18、 any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2013 IEEE. All rights reserved. viParticipants At the time this IEEE guide was completed, the Test and ATS Descrip
19、tion Subcommittee had the following membership: Ashley Hulme, Co-Chair Ion Neag, Co-Chair Larry Adams Tony Alwardt Malcolm Brown Matt Cornish Keith Ellis Tony Geneva Chris Gorringe Anand Jain Teresa Lopes Scott Misha Hugh Pritchett Mike Seavey Joseph Stanco Ronald Taylor The following members of the
20、 individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Malcom Brown Keith Chow James Dumser William Frank Chris Gorringe Randall C. Groves Werner Hoelzl Ashley Hulme Anand Jain Yuri Khersonsky Jim Kulchisky James Langlois Teresa Lopes
21、Greg Luri William Maciejewski Ahmad Mahinfallah Ion Neag Michael S. Newman Leslie Orlidge Bansi Patel K. James Phillips Ulrich Pohl Peter Richardson Bartien Sayogo Mike Seavey Gil Shultz Joseph Stanco Michael Stora Walter Struppler Ronald Taylor John Vergis Daidi Zhong Copyright 2013 IEEE. All right
22、s reserved. viiWhen the IEEE-SA Standards Board approved this guide on 6 March 2013, it had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Wael William Diab St
23、ephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the
24、following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Don Messina IEEE Standards Program Manager, Document Development Kathryn Bennett IEEE Standards Program Manager, Technical Program Development Copyright 2013 IEEE. All righ
25、ts reserved. viii Introduction This introduction is not part of IEEE Std 1641.1-2013, IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition. IEEE Std 1641-2010 defines a method of accurately defining signals and their timing as used in test procedures and requirements
26、.aThis guide supplements IEEE Std 1641 and is part of the document set. This guide has been prepared to help all users of IEEE Std 1641. The standard may be used within any test discipline, and with any carrier language, and the examples provided herein should be seen as typical. The guide explains
27、how each of the layers in the standard are built up on the preceding (lower) layer and to inform the user how to use the layer (or layers) that are important to a specific application. It describes how a signal may be created from basic signal components (BSCs) or other signals. It also shows the ap
28、plication and measurement of signals using a text-only format. The need for the guide arose from the experience of users in the creation of signals and tests using IEEE Std 1641. This experience showed that further information in the implementation and application of signal definitions was required.
29、 The purpose of this guide is to provide guidance in the technique of implementation, application, and usage of the basic signals defined in IEEE Std 1641 to create signal definitions and test requirements. This is seen as particularly important in promoting the use of a relatively new and unambiguo
30、us method of describing signals. This document is not intended to be used as an instruction manual for IEEE Std 1641 nor as a substitute for formal training, but by its nature it should find some application in the training environment. The initial clauses are intended as a brief introduction to the
31、 application of signal and test definition (STD). Subsequent clauses concentrate on the description of signals used in test. Stimulus signals, conditioning elements, and the acquisition of information from response signals are all covered. IEEE Std 1641 does not specify any specific carrier (test pr
32、ogram sequencing) language, and this guide does not provide any advice about the selection of a suitable carrier language. It does show STD used within typical carrier languages and includes examples of the definition and use of signal models in different environments. aInformation on references can
33、 be found in Clause 2. Copyright 2013 IEEE. All rights reserved. ixContents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Definitions, acronyms, and abbreviations 2 3.1 Definitions . 2 3.2 Acronyms and abbreviations . 4 4. Introduction to IEEE Std 1641 . 5 4.1 Requirements f
34、or signal and test definition standard. 5 4.2 Features of the standard. 6 4.3 Hierarchy of signal definitions 6 4.4 Improvements to the standard 8 4.5 Signals and streams . 8 4.6 Inclusion of support for Automatic Test Markup Language 11 5. Describing signals using IEEE Std 1641 11 5.1 Overview . 11
35、 5.2 Physical types 13 5.3 Signals . 15 5.4 Using signal graphs to create a signal 19 5.5 Documenting signal descriptions. 23 5.6 Using signal definitions . 28 6. Signal models . 28 6.1 General 28 6.2 TSF model as signal template 29 6.3 Typical signal model (TSF) . 31 6.4 Using TSFs in a test requir
36、ement or program 33 6.5 Measurement models (signal measurement) 34 7. Defining measurements with STD 34 7.1 General 34 7.2 Sensors. 35 7.3 Measurement maps 40 7.4 Intrinsic measurements 40 7.5 Generic measurement 49 7.6 Reference signals description 53 7.7 Different valid measurement methods. 53 8.
37、Describing tests and test requirements . 56 8.1 Structuresequence and signals . 56 8.2 Using tools such as graphical environments 57 8.3 Portable test requirements 58 8.4 ATML Test Description 67 8.5 Examples of test requirements using TPL, ATLAS, and native languages . 67 Copyright 2013 IEEE. All r
38、ights reserved. x9. Basic signal components 91 9.1 Introduction of new BSCs . 91 9.2 BSC interfaces . 91 9.3 Diagrammatic representation of BSCs 92 9.4 SignalFunctions and events . 93 10. Test signal framework 106 10.1 Introduction to test signal framework (TSF) . 106 10.2 Building TSF signal models
39、 using BSCs. 106 10.3 Examples of source signal models. 106 10.4 Dual or multiple use TSF models 114 10.5 Signal models with preset internal attributes. 117 10.6 Examples of signal models that process input signal. 121 10.7 Example of signal models that include connection BSCs 126 10.8 SignalDelay T
40、SF model for SWEEP. 129 10.9 TSF model for linear sweep using frequency modulation BSC. 130 10.10 TSF model for logarithmic sweep using FM BSC. 131 10.11 TSF attributes mappings and formulae 132 10.12 Synchronization of signal model . 134 10.13 Gating a signal model 142 10.14 Use of XML to specify T
41、SF signal model information . 145 10.15 Use of IDL to specify TSF signal model information . 154 11. Digital signals. 158 11.1 Possible states for digital stream 158 11.2 Generating a digital stream 159 11.3 Converting digital data into a physical digital signal. 160 11.4 Using the SelectCase BSC. 1
42、65 11.5 Extracting digital data from a physical digital signal 168 12. More about events and their interaction . 168 12.1 Interaction between streams 168 12.2 Recovering event information from digital streams 173 13. Test Procedure Language . 174 13.1 Introduction to TPL . 174 13.2 Simple test requi
43、rement in TPL. 175 13.3 Further test requirement in TPL. 183 13.4 Examples of test statements in TPL. 191 13.5 Quantities, units, and unit symbols 200 14. Signal Modeling Language. 201 14.1 Introduction to SML 201 14.2 Using SML to define a BSC 202 Annex A (informative) Glossary 208 Annex B (informa
44、tive) Intrinsic measurement . 210 Annex C (informative) Generic measurement 226 Annex D (informative) Role of Resource Adapter Information (RAI) in IEEE Std 1641 242 Copyright 2013 IEEE. All rights reserved. xiAnnex E (informative) Understanding IEEE 1641 capabilities 245 Annex F (informative) Imple
45、mentation of IEEE 1641 application techniques 261 Annex G (informative) Bibliography . 309 Copyright 2013 IEEE. All rights reserved. 1 IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, h
46、ealth, or environmental protection, or ensure against interference with or from other devices or networks. Implementers of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, environmental, health, and interference protection practices and al
47、l applicable laws and regulations. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Discla
48、imers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This guide provides application information and guidance for users who write, develop, implement, and support test requirements, signal d
49、efinitions, and signal responses using IEEE Std 1641-2010, the signal and test definition (STD) standard.1Examples of the definition and use of signal models in different environments are included. 1.2 Purpose This guide explains how signal definitions and test requirements may be implemented in conformance with IEEE Std 1641-2010. It also provides background information, tutorial support, and examples of signal definitions and test requirements for users of the standard. 1Information on references can be found in Clause 2. IEEE Std 1641.1-2013 IEEE Guide
