1、 IEC 62860-1 Edition 1.0 2013-07 INTERNATIONAL STANDARD Test methods for the characterization of organic transistor-based ring oscillators IEC 62860-1:2013(E)IEEE Std.1620.1-2006IEEE Std 1620.1THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2006 IEEE All rights reserved. IEEE is a registered trade
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17、pressly advised that iv IEC 62860-1:2013(E) IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. International Standard IEC
18、 62860-1/IEEE Std 1620.1-2006 has been processed through IEC technical committee 113: Nanotechnology standardization for electrical and electronic products and systems, under the IEC/IEEE Dual Logo Agreement. The text of this standard is based on the following documents: IEEE Std FDIS Report on voti
19、ng IEEE Std 1620.1-2006 113/185/FDIS 113/195/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The IEC Technical Committee and IEEE Technical Committee have decided that the contents of this publication will remain
20、 unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be g135 reconfirmed, g135 withdrawn, g135 replaced by a revised edition, or g135 amended. A bilingual version of this st
21、andard may be issued at a later date. IEC 62860-1:2013(E) v IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators Sponsor Microprocessor Standards Committee o
22、f the IEEE Computer Society Approved 8 June 2006 IEEE-SA Standards Board vi IEC 62860-1:2013(E) IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. Abstract: Recommended methods and standardized reporting practices for electrical characterization of printed
23、 and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, part
24、icularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed a
25、nd organic ring oscillators. Keywords: electrical characterization, high-impedance printing, organic transistor, printed electronics, ring oscillator IEC 62860-1:2013(E) vii IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. IEEE Introduction This introduc
26、tion is not part of IEEE Std 1620.1-2006, IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators. This standard covers recommended methods and standardized reporting practices for electrical characterization of organic transistor-based ring oscillators.
27、Due to the nature of organic transistors and circuitry, significant measurement errors can be introduced if not properly addressed. This standard describes the most common sources of measurement error and gives recommended practices in order to minimize and/or characterize the effect of each. Standa
28、rd reporting practices are included in order to minimize confusion in analyzing reported data. Disclosure of environmental conditions and design-of-experiment are included so that results can be appropriately assessed by the research community. These reporting practices also support repeatability of
29、 results, so that new discoveries may be confirmed more efficiently. The practices in this standard were compiled from research and industry organizations developing organic transistor devices, materials, circuitry, and manufacturing techniques. These practices are based on standard operating proced
30、ures utilized in laboratories worldwide. The development of this standard was initiated in 2004 to facilitate the evolution of organic transistor circuitry from the laboratory into a sustainable industry. Standardized characterization methods and reporting practices create a means of effective compa
31、rison of information and a foundation for manufacturing readiness. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodic
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34、s into the legal validity or scope of those patents that are brought to its attention. viii IEC 62860-1:2013(E) IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. IEC 62860-1:2013(E) 1 IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEE
35、E. All rights reserved. Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators 1. Overview 1.1 Scope This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and
36、the testing conditions during characterization. 1.2 Purpose The purpose of this standard is to provide a method for systematically characterizing organic transistor-based ring oscillators. This standard is intended to maximize reproducibility of published results by providing a framework for testing
37、 organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets g
38、uidelines for reporting data, so that information is clear and consistent throughout the research community and industry. 1.3 Electrical characterization overview 1.3.1 Testing apparatus Testing shall be performed using an electronic device test system with an accuracy and resolution of at least 0.1
39、% of the measurement values for both signal level and timing or frequency measurements. In order to maintain the necessary accuracy, this test method requires that the instrumentation be calibrated against a known and appropriate set of standards e.g., National Institute of Standards and Technology
40、(NIST). These calibrations may be performed by the equipment user or as a service by the equipment vendor. Calibration is not performed against a known organic field-effect transistor (OFET), organic circuit, or other FET-type device; the basic instrument operations (e.g., voltage, current, and resi
41、stance) are calibrated 2 IEC 62860-1:2013(E) IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. against some method traceable to a NIST (or similar internationally recognized standards organization) physical standard. Recalibration is required according to
42、 the instrument manufacturers recommendations or when the instrument is moved or when the testing conditions change significantly (temperature change greater than 10 C, relative humidity change greater than 30%, etc.). 1.3.2 Measurement techniques 1.3.2.1 Required measurements Characterization of th
43、e organic ring oscillator shall include at minimum the following primary set of measurements: g127 A ring of an odd number (at least three) of inverter stages, operated at a single supply voltage, characterizing output voltage from a single node versus time in seconds. The number of inverter stages
44、should be chosen to be as large as practically possible. Ideally the ring oscillator should comprise at least seven or more stages. Shorter ring oscillators can often oscillate with signal level not closely related to their saturation values. While this results in faster oscillation, the timing numb
45、ers so obtained are much less useful in understanding realistic digital circuit speeds. In addition, ring oscillators with few stages are more affected by the way in which the output voltage is measured, and, in particular, measurement results will depend more on the capacitance with which the node
46、being measured is loaded by the measurement. For all ring oscillators particular care should be taken to report the conditions of the signal measurement at the output node. In all cases the value of the load capacitance in relation to the input capacitance of an inverter stage should be reported. g1
47、27 Both output frequency and output signal level and swing shall be reported. g127 Static measurements of inverter transfer characteristics. Preferably, the inverters for static measurements should have the same size and geometry as those used in the ring oscillator. Geometry information shall be pr
48、ovided for both ring oscillators and static inverters. 1.3.2.2 Recommended measurements The following additional measurements are strongly recommended: g127 Measurement of ring oscillator output using multiple supply voltages. g127 Simultaneous measurement of ring oscillator output at two or more no
49、des, using buffer stages between the ring oscillator and measurement apparatus. This is in addition to, and should not be instead of, measurement of ring oscillator output at one node. 1.3.3 Repeatability and reporting sample size Sample performance between different devices may vary due to variations in the fabrication process. Additionally, it is useful to determine the repeatability of the reported results. Therefore, sample size is to be reported thus: g127 If no sample size is reported, it is assumed that the data represents a samp
