1、IEEE Standard for Digitizing Waveform Recorders IEEE Std 1057-2017 (Revision of IEEE Std 1057-2007) IEEE Instrumentation Society Sponsored by the Waveform Generation, Testing, and Measurement Committee IEEE 3 Park Avenue New York, NY 10016-5997 USAIEEE Std 1057-2017 (Revision of IEEE Std 1057-2007)
2、IEEE Standard for Digitizing Waveform Recorders Sponsor Waveform Generation, Testing, and Measurement Committee of the IEEE Instrumentation Society Approved 28 September 2017 IEEE-SA Standards BoardAbstract: Terminology and test methods for describing the performance of waveform recorders are presen
3、ted in this standard. Keywords: effective number of bits, frequency response, noise, IEEE 1057, sine fitting, step pulse response, total harmonic distortion, transitions levels, waveform recorders The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA
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33、ty. Further information may be obtained from the IEEE Standards Association.6 Copyright 2018 IEEE. All rights reserved. Participants At the time this IEEE standard was completed, the Waveform Recorder Working Group had the following membership: William B. Boyer, Chair Francisco Alegria Eualia Balest
34、rieri Niclas Bjorsell Jerome Blair Andrea Cataldo Lorenzo Ciani Dominique Dallet Pasquale Daponte Egidio De Benedetto Luca De Vito Izzet Kale Donald Larson Dennis Lia Thomas Linnenbrink Sol Max Kruno Milievi Antonio Moschitta Sergio Rapuano Steve Tilden The following members of the balloting committ
35、ee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Ali Al A wazi Charles Barest Niclas Bjorsell Jerome Blair William Boyer Demetrio Bucaneg Jr. Andrea Cataldo Luca De Vito Sourav Dutta Gearold O. H. Eidhin Randall Groves Werner Hoelzl Ronald Jarrett Donald
36、Larson Dennis Lia Thomas Linnenbrink Sol Max Edward Mccall Kruno Milievi R. Murphy Sergio Rapuano Jeremy Smith Joseph Stanco Walter Struppler Steven Tilden Lisa Ward Jian Y u When the IEEE-SA Standards Board approved this standard on 28 September 2017, it had the following membership: Jean-Philippe
37、Faure, Chair Gary Hoffman, Vice Chair John D. Kulick, Past Chair Konstantinos Karachalios, Secretary Chuck Adams Masayuki Ariyoshi Ted Burse Stephen Dukes Doug Edwards J. Travis Griffith Michael Janezic Thomas Koshy Joseph L. Koepfinger* Kevin Lu Daleep Mohla Damir Novosel Ronald C. Petersen Annette
38、 D. Reilly Robby Robson Dorothy Stanley Adrian Stephens Mehmet Ulema Phil Wennblom Howard Wolfman Y u Y uan *Member Emeritus7 Copyright 2018 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 1057-2017, IEEE Standard for Digitizing Waveform Recorders. This standard is
39、a revision and modernization of the previous standard, IEEE Std 1057-2007. It presents methods for the test and evaluations of digitizing waveform recorders approved by the balloting committee.8 Copyright 2018 IEEE. All rights reserved. Contents 1. Overview . 15 1.1 Scope 15 1.2 Waveform recorder ba
40、ckground . 15 2. Normative references 16 3. Definitions . 17 3.1 Definitions 17 3.2 Symbols and acronyms . 24 4. Test parameters and methods . 28 4.1 Manufacturer supplied information 28 4.2 Test selection 31 4.3 Test setup 32 4.4 Equivalent-time sampling. 39 4.5 Discrete Fourier transform (DFT) 43
41、4.6 Sine wave testing and fitting . 52 4.7 Locating code transition levels . 59 4.8 Step function response measurements 77 4.9 Tests using a dc input 80 5. Input impedance 81 5.1 Test method 81 5.2 Alternate test method using a time domain reflectometer (TDR) 81 5.3 Input impedance for out-of-range
42、signals . 81 6. Static gain and offset 83 6.1 Independently based gain and offset . 83 6.2 Terminal-based gain and offset . 85 7. Linearity 85 7.1 Integral nonlinearity (INL) . 85 7.2 Maximum static error (MSE) 86 7.3 Differential nonlinearity (DNL) and missing codes 86 7.4 Example INL and DNL data
43、. 87 7.5 Monotonicity 89 7.6 Hysteresis . 90 7.7 Total harmonic distortion (THD) 91 7.8 Intermodulation distortion (IMD) . 96 7.9 Noise power ratio (NPR) 98 8. Noise 7104 8.1 Comments on noise 105 8.2 Ratio of signal to noise and distortion (SINAD) . 105 8.3 Signal to noise ratio (SNR) . 106 8.4 Comments on SINAD and SNR . 106 8.5 Effective number of bits (ENOB) . 107 8.6 Random noise . 110 8.7 Spurious components 111 8.8 Spurious-free dynamic range (SFDR) 112
