1、Designation: D6966 18Standard Practice forCollection of Settled Dust Samples Using Wipe SamplingMethods for Subsequent Determination of Metals1This standard is issued under the fixed designation D6966; the number immediately following the designation indicates the year oforiginal adoption or, in the
2、 case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This practice covers the collection of settled dust onsurfaces using the wipe sampling
3、method. These samples arecollected in a manner that will permit subsequent extractionand determination of target metals in the wipes using labora-tory analysis techniques such as atomic spectrometry.1.2 This practice does not address the sampling designcriteria (that is, sampling plan which includes
4、 the number andlocation of samples) that are used for clearance, hazardevaluation, risk assessment, and other purposes. To provide forvalid conclusions, sufficient numbers of samples should beobtained as directed by a sampling plan, for example, inaccordance with Guide D7659.1.3 This practice contai
5、ns notes that are explanatory and arenot part of the mandatory requirements of this practice.1.4 The values stated in SI units are to be regarded asstandard. No other units of measurement are included in thisstandard.1.5 This standard does not purport to address all of thesafety concerns, if any, as
6、sociated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety, health, and environmental practices and deter-mine the applicability of regulatory limitations prior to use.1.6 This international standard was developed in accor-dance with internationally
7、recognized principles on standard-ization established in the Decision on Principles for theDevelopment of International Standards, Guides and Recom-mendations issued by the World Trade Organization TechnicalBarriers to Trade (TBT) Committee.2. Referenced Documents2.1 ASTM Standards:2D1356 Terminolog
8、y Relating to Sampling and Analysis ofAtmospheresD4840 Guide for Sample Chain-of-Custody ProceduresD7144 Practice for Collection of Surface Dust by Micro-vacuum Sampling for Subsequent Metals DeterminationD7659 Guide for Strategies for Surface Sampling of Metalsand Metalloids for Worker ProtectionD7
9、707 Specification for Wipe Sampling Materials for Beryl-lium in Surface DustE1792 Specification for Wipe Sampling Materials for Leadin Surface Dust3. Terminology3.1 For definitions of terms not listed here, see TerminologyD1356.3.2 Definitions:3.2.1 batch, na group of field or quality control (QC)sa
10、mples that are collected or processed together at the sametime using the same reagents and equipment.3.2.2 wipe, na disposable towellette that is moistened witha wetting agent. E17923.2.2.1 DiscussionThese towellettes are used to collectsamples of settled dust on surfaces for subsequent determina-ti
11、on of metals content in the collected dust.3.3 Definitions of Terms Specific to This Standard:3.3.1 field blank, na wipe (see 3.2.2) that is exposed to thesame handling as field samples except that no sample iscollected (no surface is actually wiped).3.3.1.1 DiscussionAnalysis results from field bla
12、nks pro-vide information on the analyte background level in the wipe,combined with the potential contamination experienced bysamples collected within the batch (see 3.2.1) resulting fromhandling.4. Summary of Practice4.1 Wipe samples of settled dust are collected on surfacesfrom areas of known dimen
13、sions with wipes satisfying certainrequirements, using a specified pattern of wiping.4.2 The collected wipes are then ready for subsequentsample preparation and analysis for the measurement of metalsof interest.1This practice is under the jurisdiction of ASTM Committee D22 on Air Qualityand is the d
14、irect responsibility of Subcommittee D22.04 on Workplace Air Quality.Current edition approved Nov. 1, 2018. Published November 2018. Originallyapproved in 2003. Last previous edition approved in 2013 as D6966 13. DOI:10.1520/D6966-18.2For referenced ASTM standards, visit the ASTM website, www.astm.o
15、rg, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United StatesThis internati
16、onal standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for theDevelopment of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committ
17、ee.15. Significance and Use5.1 This practice is intended for the collection of settled dustsamples for the subsequent measurement of target metals. Thepractice is meant for use in the collection of settled dustsamples that are of interest in clearance, hazard evaluation, riskassessment, and other pu
18、rposes.5.2 This practice is recommended for the collection ofsettled dust samples from hard, relatively smooth nonporoussurfaces. This practice is less effective for collecting settleddust samples from surfaces with substantial texture such asrough concrete, brickwork, textured ceilings, and soft fi
19、broussurfaces such as upholstery and carpeting. Micro-vacuumsampling using Practice D7144 may be more suitable for thesesurfaces. Collection efficiency for metals such as lead fromsmooth, hard surfaces has been found to exceed 75 % (Speci-fication E1792).6. Apparatus and Materials6.1 Sampling Templa
20、tesOne or more of the following: 10cm by 10 cm (minimum dimensions) reusable or disposablealuminum or plastic template(s), or disposable cardboardtemplates, (full-square, rectangular, square “U-shaped,” rect-angular “U-shaped,” or “L-shaped,” or both); or templates ofalternative areas having accurat
21、ely known dimensions (seeNote 1). Templates shall be capable of lying flat on a surface.NOTE 1For most surfaces, it is recommended to collect settled dustfrom a minimum surface area of 100 cm2to provide sufficient material forsubsequent laboratory analysis. However, larger areas (for example, 30 cmb
22、y 30 cm) may be appropriate for surfaces having little or no visiblesettled dust, while a smaller sampling area (for example, 10 cm by 10 cm)may be appropriate for surfaces with high levels of visible settled dust. Itis recommended to have a suite of templates with various samplingdimensions.6.2 Wip
23、es, for collection of settled dust samples fromsurfaces. Wipes shall be individually wrapped and fully wetted.The background metal(s) content of the wipes should be as lowas possible. At a maximum, the background level of targetmetal(s) shall be no more than one-tenth the target concentra-tion the m
24、etal(s) to be measured.NOTE 2Wipes meeting the requirements of Specifications E1792 orD7707, or both, may be suitable.NOTE 3Wipes made of cellulosic materials may produce feweranalysis problems than wipes made of synthetic polymeric materials.6.3 Sample containers, sealable, rigid-walled, 30-mL mini
25、-mum volume.NOTE 4Screw-top plastic centrifuge tubes are an example of asuitable rigid-walled sample container.NOTE 5Use of a sealable plastic bag for holding and transporting thesettled dust wipe sample is not recommended due to the potential loss ofcollected dust within the plastic bag during tran
26、sportation and laboratoryhandling. Quantitative removal and processing of the settled dust wipesample by the laboratory is significantly improved through the use ofsealable rigid-walled containers.6.4 Measuring tool, tape or ruler, capable of measuring tothe nearest 60.1 cm.6.5 Plastic gloves, powde
27、rless.6.6 Cleaning cloths, for cleaning of templates and otherequipment.NOTE 6Wipes used for dust sampling (6.2) can be used for cleaningtemplates and other sampling equipment, but other cleaning cloths orwipes not meeting the requirements described in (6.2) may be suitable forthis purpose.6.7 Adhes
28、ive tape, suitable for securing the template(s) tothe surface(s) to be sampled, and for demarcating samplingareas if templates are not used.NOTE 7Masking tape, for example, functions well for these purposes.6.8 Disposable shoe covers, optional.7. Procedure7.1 Use one of the following two options whe
29、n collectingsettled dust samples from each sampling location. For wide,flat locations, it is recommended to use the template-assistedsampling procedure (see 7.1.1.2 (1). For small locations (forexample, window sill, section of a piece of equipment, orportion of a vehicle interior), it will ordinaril
30、y be necessary touse the confined-area sampling procedure (see 7.1.1.2 (2).NOTE 8Metal contamination problems during field sampling can besevere and may affect subsequent wipe sample analysis results. Contami-nation can be minimized through frequent changing of gloves, use of shoecovers (see 6.8), a
31、nd regular cleaning of sampling equipment withcleaning cloths (see 6.6). Use of disposable shoe covers between differentlocations, and removal of them prior to leaving the sampling site orentering vehicles, can be helpful in minimizing inadvertent transfer ofcontaminated dust from one location to an
32、other.7.1.1 Sampling Procedure:7.1.1.1 Don a pair of clean, powderless, plastic gloves (see6.5 and Note 8).7.1.1.2 Use either a template-assisted sampling procedure(1) or tape-defined sampling procedure (2):(1) Carefully place a clean template on the surface to besampled in a manner that minimizes d
33、isturbance of settled dustat the sampling location. Tape the outside edge of the templateto prevent the template from moving during sample collection.(2) Alternatively, mark the defined area to be sampled withadhesive tape (6.7) being careful not to disturb the settled dust,and measure the area to b
34、e sampled using the measuring tool(6.4).7.1.1.3 Obtain a wipe (6.2) and, if there is a possibility forthe package containing the wipe to be contaminated with dust,clean the outside of the package with a cleaning cloth (6.6).7.1.1.4 Remove the wipe from its package, and inspect thewipe to ensure that
35、 it is fully wetted and not contaminated withdust or other material. Discard the wipe if it is found to be toodry or contaminated, or both.7.1.1.5 Using an open flat hand with the fingers together,place the wipe on the surface to be sampled. Wipe the selectedsurface area, side to side, in an overlap
36、ping “S” or “Z” patternwhile applying pressure to the fingertips (refer to Figs. 1 and2). Wipe the surface so that the entire selected surface area iscovered. Perform the wiping procedure using the fingers andnot the palm of the hand.7.1.1.6 Repeat 7.1.1.5 using a different brand of wipe (afterselec
37、ting a different sampling location) if the wipe originallyused significantly changes shape (for example, rolls up bycurling) or tears during the wiping process.NOTE 9Some surfaces (for example, rough surfaces) may causecertain wipes to curl up or otherwise significantly change shape during thewiping
38、 process. A type of wipe that maintains its integrity should beselected for each surface sampled.D6966 1827.1.1.7 Fold the wipe in half with the collected dust sidefolded inward and repeat the preceding wiping procedure(7.1.1.5) within the selected sampling area using an up anddown overlapping “S” o
39、r “Z” pattern at right angles to the firstwiping (see Fig. 1, Fig. 2, and Note 10).NOTE 10Wipes are folded to envelop the collected dust within thewipe, to avoid loss of the collected dust, and to expose a clean wipesurface for further dust collection from the sampling location. For sampleareas cont
40、aining large amounts of settled dust, carefully wipe the area toensure as much dust as possible within the wipe is captured.7.1.1.8 Fold the wipe in half again with the collected dustside folded inward and repeat the wiping procedure one moretime, concentrating on collecting settled dust from edges
41、andcorners within the selected surface area (see Fig. 1, Fig. 2, andNote 10).7.1.1.9 Fold the wipe again with the collected dust sidefolded inward and insert the wipe into a sample container (6.3).7.1.1.10 Label the sample container with sufficient informa-tion to uniquely and indelibly identify the
42、 sample.7.1.1.11 Record the dimensions (in square centimetres) ofthe selected sampling area (that is, the internal dimensionsdefined by the template or the taped area) or that the sample isa blank.7.1.1.12 Discard the gloves.7.2 Collect field blanks at a minimum frequency of 5 % (atleast one field b
43、lank for every 20 wipe samples collected). Theminimum number of field blanks to collect for each batch ofwipe samples used should be three. Place field blanks insample containers and label these samples in the same fashionas the collected surface dust samples (see 7.1.1.10).7.3 Follow sampling chain
44、 of custody procedures to ensuresample traceability. Ensure that the documentation whichaccompanies the samples is suitable for a chain of custody tobe established in accordance with Guide D4840.8. Records8.1 Field data related to sample collection shall be docu-mented in a sample log form or field
45、notebook (see Note 11).If field notebooks are used, then they shall be bound withpre-numbered pages.All entries on sample data forms and fieldnotebooks shall be made using ink, with the signature and dateof entry. Any entry errors shall be corrected by using only asingle line through the incorrect e
46、ntry (no scratch outs),accompanied by the initials of the person making thecorrection, and the date of the correction (see Note 12).8.1.1 Electronic Laboratory NotebooksIf electronic labo-ratory notebooks, or ELNs, are used in lieu of a field notebookor sample log, procedures shall be implemented to
47、 assure theintegrity of the data recorded, including prevention of falsifi-cation or other unauthorized changes, and regular backup ofdata.NOTE 11Field notebooks are useful for recording field data even whenpreprinted sample data forms are used.NOTE 1Only the center of the wiping path is shown, not
48、the entire wiping width. Fig. 1a) shows the first “S” wiping pattern over the surface areato be sampled; Fig. 1b) demonstrates the second “S” wiping course over the surface; and Fig. 1c) shows the final wiping which is targeted toward edgesand corners.FIG. 1 Schematic of a Side-to-Side Overlapping “
49、S” Wiping PatternNOTE 1Only the center of the wiping path is shown, not the entire wiping width. Fig. 2a) shows the first “Z” wiping pattern over the surface areato be sampled; Fig. 2b) demonstrates the second “Z” wiping course over the surface; and Fig. 2c) shows the final wiping which is targeted toward edgesand corners.FIG. 2 Schematic of a Side-to-Side Overlapping “Z” Wiping PatternD6966 183NOTE 12These procedures are important to properly document andtrace field data.8.2 At a minimum, the following information shall bedocumented:8.2.1 Project or client
